摘要
采用硝酸-盐酸-氢氟酸体系进行微波消解消化样品,电感耦合等离子发射光谱法选用钇做内标测定总硅。结果表明:食用盐中硅的加标回收率为90.4%~105.9%。此方法可有效避免生成四氟化硅气体逸出,导致硅的损失,同时加入钇内标可有效去除钠的基体干扰,此方法准确性好、精密度高。
The samples are digested by microwave digestion with nitric acid-hydrochloric acid-hydrofluoric acid system,and the total silicon is determined by inductively coupled plasma atomic emission spectrometry using yttrium as the internal standard.The results show that the recovery of silicon in edible salt is 90.4%~105.9%.This method can effectively avoid the gas escaping of silicon tetrafluoride,resulting in the loss of silicon.At the same time,adding yttrium internal standard can effectively remove the matrix interference of sodium.This method has good accuracy and high precision.
引文
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