Fractional density of states and the overall spontaneous emission control ability of a three-dimensional photonic crystal

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英文篇名：Fractional density of states and the overall spontaneous emission control ability of a three-dimensional photonic crystal 作者：陈梦林 ; 骆志军 ; 刘亚男 ; 甘棕松 英文作者：Menglin Chen;Zhijun Luo;Yanan Liu;Zongsong Gan;Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology;Key Laboratory of Information Storage Systems, Ministry of Education, Huazhong University of Science and Technology;Shenzhen Research Institute of Huazhong University of Science and Technology; 中文刊名：GXKB 英文刊名：中国光学快报(英文版) 机构：Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology;Key Laboratory of Information Storage Systems, Ministry of Education, Huazhong University of Science and Technology;Shenzhen Research Institute of Huazhong University of Science and Technology; 出版日期：2019-04-25 出版单位：Chinese Optics Letters 年：2019 期：v.17 基金：supported by the National Natural Science Foundation of China(NSFC)(No.61775068) 语种：英文; 页：GXKB201904015 页数：5 CN：04 ISSN：31-1890/O4 分类号：79-83

摘要

Fractional density of states(FDOS) hinders the accurate measuring of the overall spontaneous emission(SE)control ability of a three-dimensional(3 D) photonic crystal(PC) with the current widely used SE decay lifetime measurement systems. Based on analyzing the FDOS property of a 3 D PC from theory and simulation,the excitation focal spot position averaged FDOS with a distribution broadening parameter was proposed to accurately reflect the overall SE control ability of the 3 D PC. Experimental work was done to confirm that our proposal is effective, which can contribute to comprehensively characterizing the SE control performance of photonic devices with quantified parameters.
        Fractional density of states(FDOS) hinders the accurate measuring of the overall spontaneous emission(SE)control ability of a three-dimensional(3 D) photonic crystal(PC) with the current widely used SE decay lifetime measurement systems. Based on analyzing the FDOS property of a 3 D PC from theory and simulation,the excitation focal spot position averaged FDOS with a distribution broadening parameter was proposed to accurately reflect the overall SE control ability of the 3 D PC. Experimental work was done to confirm that our proposal is effective, which can contribute to comprehensively characterizing the SE control performance of photonic devices with quantified parameters.

引文

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