ESD模拟器全波模型的仿真与验证
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摘要
针对静电放电ESD测试结果的可重复性较差的问题,在CST中建立了ESD模拟器全波模型,从仿真的角度探讨解决静电放电测试可重复性问题的方法。通过放电电流对全波模型进行初步验证;对印刷电路板PCB进行静电放电测试,得到了电磁场耦合电压和电磁场耦合规律;建立了抗扰度测试平台和PCB的全波模型,结合ESD模拟器全波模型对PCB静电放电测试进行仿真。全波模型的建立和有效性的验证表明,在电磁场耦合规律上,测量和仿真可以相互验证,为ESD模拟器全波模型的实际应用提供了参考。
Aiming at the problem of poor repeatability of ESD test results,a full-wave model of ESD simulator is established in CST. The method to solve the repeatability of ESD test is discussed from the simulation point of view.The full wave model is preliminarily verified by discharge current. ESD test is applied to the(printed circuit board)PCB to obtain the electromagnetic field coupling voltage and the electromagnetic field coupling law. The full wave models of the immunity test platform and the PCB are established,and combined with the full wave model of ESD simulator,the ESD test to PCB is simulated. The establishment and validation of full wave model shows that simulation and measurement can verify each other in electromagnetic coupling law,which provides a reference for the practical application of full wave model of ESD simulator.
Aiming at the problem of poor repeatability of ESD test results,a full-wave model of ESD simulator is established in CST. The method to solve the repeatability of ESD test is discussed from the simulation point of view.The full wave model is preliminarily verified by discharge current. ESD test is applied to the(printed circuit board)PCB to obtain the electromagnetic field coupling voltage and the electromagnetic field coupling law. The full wave models of the immunity test platform and the PCB are established,and combined with the full wave model of ESD simulator,the ESD test to PCB is simulated. The establishment and validation of full wave model shows that simulation and measurement can verify each other in electromagnetic coupling law,which provides a reference for the practical application of full wave model of ESD simulator.
引文
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[10]汪项伟,万发雨,冯超超,等.静电放电辐射场模拟及干扰预测[J].高电压技术,2017,43(10):3396-3402.
[11] Li Zhang Darwin,Marathe S,Wei P Y,et al. Full-wave simulation of system-level disruption during secondary ESD events in a smartphone[J].IEEE Transactions on Electromagnetic Compatibility,2018,61(1):40-47.
[12]许文婷,杨兰兰,屠彦. PCB板静电放电的仿真分析[J].真空科学与技术学报,2018,38(4):272-278.
[2]刘进,陈永光,谭志良,等.静电放电电磁场的特性及分布规律[J].高电压技术,2012,38(2):435-443.
[3] Hirata M,Takahashi T,Schibuya N.Evaluation of falling time restriction of ESD immunity test current waveform:the result of IEC 61000-4-2 round robin test in Japan[C]//IEEE International Symposium on Electromagnetic Compatibility.Honolulu:[s.n.],2007.
[4]刘进,陈永光,谭志良,等.静电放电电磁脉冲辐照效应研究[J].北京理工大学学报,2011,31(10):1203-1207.
[5] Centola F,Pommerenke D,Wang Kai,et al.ESD excitation model for susceptibility study[C]//IEEE International Symposium on Electromagnetic Compatibility. Boston:[s.n.],2003.
[6] Cai Qing, Koo J, Nandy A, et al. Advanced full wave ESD generator model for system level coupling simulation[C]//IEEE International Symposium on Electromagnetic Compatibility. Detroit:[s.n.],2008.
[7] Liu Dazhao,Nandy A,Pommerenke D,et al. Full wave model for simulating a Noiseken ESD generator[C]//IEEE International Symposium on Electromagnetic Compatibility. Austin:[s.n.],2009.
[8]张鑫,白超平.基于三维场路协同方法的静电损伤仿真测试平台[J].北京航空航天大学学报,2016,42(8):1739-1746.
[9] Zhou J C,Shinde S,Guo Y D,et al. IEC 61000-4-2 ESD test in display down configuration for cell phones[C]//IEEE International Symposium on Electromagnetic Compatibility. Ottawa:[s.n.],2016.
[10]汪项伟,万发雨,冯超超,等.静电放电辐射场模拟及干扰预测[J].高电压技术,2017,43(10):3396-3402.
[11] Li Zhang Darwin,Marathe S,Wei P Y,et al. Full-wave simulation of system-level disruption during secondary ESD events in a smartphone[J].IEEE Transactions on Electromagnetic Compatibility,2018,61(1):40-47.
[12]许文婷,杨兰兰,屠彦. PCB板静电放电的仿真分析[J].真空科学与技术学报,2018,38(4):272-278.