一种集成运放多参数自动测试的实验装置
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摘要
为了开发一款功能全面而系统又不是太复杂的集成运放多参数自动测试实验装置,以满足面向高校的实验测试需求,以单片机ARM TM4C128G为控制核心、模数转换器DAC0832产生信号源、开关芯片CD4066BE为切换开关,利用液晶显示装置显示测试结果,同时还能实现语音播报输出的实验装置系统。该装置能完成运算放大器的失调电压,失调电流,共模抑制比,开环放大倍数等参数的测量,该装置经测试表明能准确的对集成运放的多参数进行自动测试,具有人性化菜单设计,使用方便。
In order to develop a integrated operational amplifier multi-parameter automatic test laboratory equipment with comprehensive function and simple system to meet the needs of college experiment,the experimental device system was developed based on the control core micro-control unit( MCU) ARM TM4 C128 G,and the analog-to-digital converter DAC0832,and switch chip CD4066 BE. The device can test the operational amplifier offset voltage,offset current,common mode rejection ratio,open-loop magnification and other parameters of the measurement automatically,the test results not only can be displayed by the liquid crystal display( LCD) device,but also can be output by voice broadcast. The results of verification test shows that the multi-parameter automatic test experiment device for integrated operational amplifier can realize automatically measure with accuracy result,user-friendly menu and simple operation.
In order to develop a integrated operational amplifier multi-parameter automatic test laboratory equipment with comprehensive function and simple system to meet the needs of college experiment,the experimental device system was developed based on the control core micro-control unit( MCU) ARM TM4 C128 G,and the analog-to-digital converter DAC0832,and switch chip CD4066 BE. The device can test the operational amplifier offset voltage,offset current,common mode rejection ratio,open-loop magnification and other parameters of the measurement automatically,the test results not only can be displayed by the liquid crystal display( LCD) device,but also can be output by voice broadcast. The results of verification test shows that the multi-parameter automatic test experiment device for integrated operational amplifier can realize automatically measure with accuracy result,user-friendly menu and simple operation.
引文
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[2]王强,蒙萱,方开洪,等.集成运放的线性与非线性应用分析[J].自动化与仪器仪表,2015(4):186-188.
[3]艾伦.CMOS模拟集成电路设计[M].冯军,李智群,译.北京:电子工业出版,2011.
[4]国营光华无线电仪器厂.GH3183模拟集成电路测试系统简介[Z].新产品介绍,1998:40.
[5]北京金三航科技发展有限公司.GT2200A仪器介绍[EB/OL].2016.http:∥www.bjshtek.net.
[6]刘敬猛,吴星明,胡晓光.模拟集成电路测试仪的设计与开发[J].实验室研究与探索,2009,28(4):192-195.
[7]吴浩,李忠意,范志强.集成运放参数测试仪[EB/OL].2016.http:∥www.cediy.com/web Html/Article/test/9697200805-07005100.html.
[8]易指松.模拟集成电路测试系统及网络设计[D].成都:电子科技大学,2012.
[9]戴澜,张扬.集成运算放大器参数测试研究[J].北方工业大学学报,2016,28(3):20-28.
[10]左全生.集成运放性能的简易测试[J].电子测试,2016(5):11.