亚太赫兹频段介电性能的共面波导测量
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摘要
利用共面波导的S参数建立了一种计算亚太赫兹频率下材料介电常数实部和虚部的模型,并给出了该模型的详细推导过程和应用实例。基于该模型,利用测试得到的共面波导的S参数计算了200 GHz下衬底材料的介电常数,计算值与理论结果相符。建立的模型可广泛应用于各类材料在亚太赫兹频段介电性能的表征。
This study proposes a model to measure the real and imaginary parts of the permittivity of a dielectric material using the S-parameters of a coplanar waveguide(CPW), and discusses the detailed derivation and application of the proposed model. Based on this model, the permittivity of the substrate material is calculated at 200 GHz using the measured S-parameters of the CPW. The calculated result agrees well with the theoretical value. The proposed model can be employed to characterize the dielectric properties of many materials within the sub-terahertz frequency regime.
This study proposes a model to measure the real and imaginary parts of the permittivity of a dielectric material using the S-parameters of a coplanar waveguide(CPW), and discusses the detailed derivation and application of the proposed model. Based on this model, the permittivity of the substrate material is calculated at 200 GHz using the measured S-parameters of the CPW. The calculated result agrees well with the theoretical value. The proposed model can be employed to characterize the dielectric properties of many materials within the sub-terahertz frequency regime.
引文
[1] Li X L,Li B.Review on progress of real-time THz sensing and imaging technology[J].Laser & Optoelectronics Progress,2012,49(9):090008.李昕磊,李飚.实时太赫兹探测与成像技术新进展[J].激光与光电子学进展,2012,49(9):090008.
[2] Wang D,Bokov A A,Ye Z G,et al.Subterahertz dielectric relaxation in lead-free Ba(Zr,Ti)O3 relaxor ferroelectrics[J].Nature Communications,2016,7:11014.
[3] Akyildiz I F,Jornet J M,Han C.Terahertz band:next frontier for wireless communications[J].Physical Communication,2014,12:16-32.
[4] Koenig S,Lopez-Diaz D,Antes J,et al.Wireless sub-THz communication system with high data rate[J].Nature Photonics,2013,7(12):977-981.
[5] Liang L R,Wei A X,Mo Z.Bi3.95Er0.05Ti3O12 thin films synthesized by pulsed laser deposition technique and their dielectric properties at room temperature[J].Chinese Journal of Lasers,2018,45(9):0902002.梁立容,魏爱香,莫忠.室温脉冲激光沉积法合成Bi3.95Er0.05Ti3O12薄膜及其介电性能研究[J].中国激光,2018,45(9):0902002.
[6] Dai X S,Zhao Z Y,He X Y,et al.Terahertz dielectric properties of CaCu3Ti4O12 ceramics[J].Acta Optica Sinica,2015,35(5):0516005.代秀松,赵振宇,何晓勇,等.CaCu3Ti4O12陶瓷在太赫兹频段的介电特性研究[J].光学学报,2015,35(5):0516005.
[7] Gong S L.Measurement of dielectric properties of BST using the cavity perturbation technique at microwave frequencies[D].Wuhan:Huazhong University of Science and Technology,2009:2-8.龚淑亮.高介电常数BST微波参数谐振腔法测量 [D].武汉:华中科技大学,2009:2-8.
[8] Yang M H.Study of microwave dielectric measurement method and its application[D].Shenyang:Shenyang University of Technology,2018:17-28.杨茗惠.微波测量介电常数方法研究及应用[D].沈阳:沈阳工业大学,2018:17-28.
[9] Wen C P.Coplanar-waveguide directional couplers[J].IEEE Transactions on Microwave Theory and Techniques,1970,18(6):318-322.
[10] Gupta K C,Grag R,Chada R.Computer aided design of microwave circuits[M].Dedham,MA:Artech House,Inc.,1981:25-43.
[11] Eisenstadt W R,Eo Y.S-parameter-based IC interconnect transmission line characterization[J].IEEE Transactions on Components,Hybrids,and Manufacturing Technology,1992,15(4):483-490.
[12] Gupta R,Bahl I,Bozzi M.Microstrip lines and slotlines[M].Boston & London:Artech House,1996:386-389.
[13] Deo P,Mirshekar-Syahkal D,Seddon L,et al.Microstrip device for broadband (15-65 GHz) measurement of dielectric properties of nematic liquid crystals[J].IEEE Transactions on Microwave Theory and Techniques,2015,63(4):1388-1398.
[14] Ocket I,Song L,Grillet D,et al.Dielectric characterization of biological liquids and tissues up to 110 GHz using an LTCC CPW sensor[C]//2013 IEEE Topical Conference on Biomedical Wireless Technologies,Networks,and Sensing Systems,January 20-23,2013,Austin,TX,USA.New York:IEEE,2013:43-45.
[15] Hammou D,Djerafi T,Nedil M,et al.Considerations for on-wafer millimeter-wave measurements on thin ceramic substrate[J].IEEE Transactions on Instrumentation and Measurement,2016,65(2):441-447.
[16] Williams D F,Arz U,Grabinski H.Characteristic-impedance measurement error on lossy substrates[J].IEEE Microwave and Wireless Components Letters,2001,11(7):299-301.
[2] Wang D,Bokov A A,Ye Z G,et al.Subterahertz dielectric relaxation in lead-free Ba(Zr,Ti)O3 relaxor ferroelectrics[J].Nature Communications,2016,7:11014.
[3] Akyildiz I F,Jornet J M,Han C.Terahertz band:next frontier for wireless communications[J].Physical Communication,2014,12:16-32.
[4] Koenig S,Lopez-Diaz D,Antes J,et al.Wireless sub-THz communication system with high data rate[J].Nature Photonics,2013,7(12):977-981.
[5] Liang L R,Wei A X,Mo Z.Bi3.95Er0.05Ti3O12 thin films synthesized by pulsed laser deposition technique and their dielectric properties at room temperature[J].Chinese Journal of Lasers,2018,45(9):0902002.梁立容,魏爱香,莫忠.室温脉冲激光沉积法合成Bi3.95Er0.05Ti3O12薄膜及其介电性能研究[J].中国激光,2018,45(9):0902002.
[6] Dai X S,Zhao Z Y,He X Y,et al.Terahertz dielectric properties of CaCu3Ti4O12 ceramics[J].Acta Optica Sinica,2015,35(5):0516005.代秀松,赵振宇,何晓勇,等.CaCu3Ti4O12陶瓷在太赫兹频段的介电特性研究[J].光学学报,2015,35(5):0516005.
[7] Gong S L.Measurement of dielectric properties of BST using the cavity perturbation technique at microwave frequencies[D].Wuhan:Huazhong University of Science and Technology,2009:2-8.龚淑亮.高介电常数BST微波参数谐振腔法测量 [D].武汉:华中科技大学,2009:2-8.
[8] Yang M H.Study of microwave dielectric measurement method and its application[D].Shenyang:Shenyang University of Technology,2018:17-28.杨茗惠.微波测量介电常数方法研究及应用[D].沈阳:沈阳工业大学,2018:17-28.
[9] Wen C P.Coplanar-waveguide directional couplers[J].IEEE Transactions on Microwave Theory and Techniques,1970,18(6):318-322.
[10] Gupta K C,Grag R,Chada R.Computer aided design of microwave circuits[M].Dedham,MA:Artech House,Inc.,1981:25-43.
[11] Eisenstadt W R,Eo Y.S-parameter-based IC interconnect transmission line characterization[J].IEEE Transactions on Components,Hybrids,and Manufacturing Technology,1992,15(4):483-490.
[12] Gupta R,Bahl I,Bozzi M.Microstrip lines and slotlines[M].Boston & London:Artech House,1996:386-389.
[13] Deo P,Mirshekar-Syahkal D,Seddon L,et al.Microstrip device for broadband (15-65 GHz) measurement of dielectric properties of nematic liquid crystals[J].IEEE Transactions on Microwave Theory and Techniques,2015,63(4):1388-1398.
[14] Ocket I,Song L,Grillet D,et al.Dielectric characterization of biological liquids and tissues up to 110 GHz using an LTCC CPW sensor[C]//2013 IEEE Topical Conference on Biomedical Wireless Technologies,Networks,and Sensing Systems,January 20-23,2013,Austin,TX,USA.New York:IEEE,2013:43-45.
[15] Hammou D,Djerafi T,Nedil M,et al.Considerations for on-wafer millimeter-wave measurements on thin ceramic substrate[J].IEEE Transactions on Instrumentation and Measurement,2016,65(2):441-447.
[16] Williams D F,Arz U,Grabinski H.Characteristic-impedance measurement error on lossy substrates[J].IEEE Microwave and Wireless Components Letters,2001,11(7):299-301.