基于T861测试系统的皮安级漏电流测试方法
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摘要
目前模拟开关的漏电流已达到皮安级,而传统的模拟集成电路测试系统的最小测量精度一般为纳安级,无法满足测试要求。研究了基于宏邦T861数模混合集成电路测试系统的皮安级漏电流测试方法。以ADG436型模拟开关电路为例,利用I-V转换方法设计了基于T861测试系统的漏电流测试方案,实现了基于测试系统对模拟开关皮安级漏电流进行测试。与使用安捷伦B1500A对ADG436电路的漏电流测试结果进行了对比,两者一致性较好。实验结果表明,基于T861测试系统的I-V转换方法测试模拟开关的漏电流具有较高的测量精度,能够满足ADG436型模拟开关的皮安级漏电流测试需求。
At present,the leakage current of the analog switches have reached the level of pA,while the minimum measurement accuracy of traditional analog integrated circuit test system is generally nA-level,which can not meet the test requirements. The pA level leakage test method based on Hongbang T861 digital/analog mixed integrated circuit test system was studied. Taking ADG436 analog switch circuit as an example,the leakage current test scheme based on T861 test system by using I-V conversion was designed. The pA-level leakage current test method based on T861 test machine was realized. By using Agilent B1500 A and T861 test system,the leakage currents of ADG436 circuits were tested and compared. The two results were basically consistent. The experimental results show that the I-V conversion method based on T861 test system has a higher measurement accuracy for the leakage current of the analog switch,and can meet the needs of the pA-level leakage current test of ADG436 circuit.
At present,the leakage current of the analog switches have reached the level of pA,while the minimum measurement accuracy of traditional analog integrated circuit test system is generally nA-level,which can not meet the test requirements. The pA level leakage test method based on Hongbang T861 digital/analog mixed integrated circuit test system was studied. Taking ADG436 analog switch circuit as an example,the leakage current test scheme based on T861 test system by using I-V conversion was designed. The pA-level leakage current test method based on T861 test machine was realized. By using Agilent B1500 A and T861 test system,the leakage currents of ADG436 circuits were tested and compared. The two results were basically consistent. The experimental results show that the I-V conversion method based on T861 test system has a higher measurement accuracy for the leakage current of the analog switch,and can meet the needs of the pA-level leakage current test of ADG436 circuit.
引文
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[2]王俊.电化学分析系统中p A~μA微电流测量[J].电子测量与仪器学报,2011,25(11):972-977.WANG J. p A~μA micro-current measurement in electrochemical analysis system[J]. Journal of Electronic Measurement and Instrument,2011,25(11):972-977(in Chinese).
[3]冯瑞刚,崔保群,马鹰俊,等.在线同位素分离器束测装置中弱电流测量系统[J].核技术,2014,37(8):37-41.FENG R G,CUI B Q,MA Y J,et al. Weak current measurement system in BRISOL[J]. Nuclear Techniques,2014,37(8):37-41(in Chinese).
[4]倪宁,肖雪夫,葛良全,等.微弱电流的I-V变换测量方法研究[J].核电子学与探测技术,2013,33(6):665-669.NI N,XIAO X F,GE L Q,et al. The research on I-V convertor for low-level current measurement[J]. Nuclear Electronics&Detection Technology,2013,33(6):665-669(in Chinese).
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[6]魏立乾,雷升杰,方美华,等.辐射监测的微弱电流测量I-V转换技术[J].仪器仪表与分析监测,2010,(3):28-31.WEI L Q,LEI S J,FANG M H,et al. An I-V converter in picoampere current measurement[J]. Instrumentation Analysis Monitoring,2010,(3):28-31(in Chinese).
[7] JUNG W.运算放大器应用技术手册[M].张乐锋,张鼎,译.北京:人民邮电出版社,2009:40-41.
[8] WEI X Y,HU M,ZHANG K L,et al. Analysis of the resistive switching behaviors of vanadium oxide thin film[J]. Chinese Physics B,2013,22(3):037201-1-037201-5.