Dielectric Relaxation and Conductivity of Ba(Mg_(1/3)Ta_(2/3))O_3 and Ba(Zn_(1/3)Ta_(2/3))O_3
详细信息    查看全文 | 推荐本文 |
  • 英文篇名:Dielectric Relaxation and Conductivity of Ba(Mg_(1/3)Ta_(2/3))O_3 and Ba(Zn_(1/3)Ta_(2/3))O_3
  • 作者:Md.Monwar ; Hoque ; Alo ; Dutta ; Sanjay ; Kumar ; Tripurari ; Prasad ; Sinha
  • 英文作者:Md.Monwar Hoque;Alo Dutta;Sanjay Kumar;Tripurari Prasad Sinha;Department of Physics,Jadavpur University;Department of Physics,Bose Institute;
  • 英文关键词:Perovskite oxides;;Impedance spectroscopy;;Dielectric properties;;Electrical conductivity
  • 中文刊名:CLKJ
  • 英文刊名:材料科学技术(英文版)
  • 机构:Department of Physics,Jadavpur University;Department of Physics,Bose Institute;
  • 出版日期:2014-04-15
  • 出版单位:Journal of Materials Science & Technology
  • 年:2014
  • 期:v.30
  • 基金:financially supported by the Defence Research Development Organization,Government of India,New Delhi, FIST and PURSE programs of Department of Science and Technology,Government of India
  • 语种:英文;
  • 页:CLKJ201404003
  • 页数:10
  • CN:04
  • ISSN:21-1315/TG
  • 分类号:15-24
摘要
The frequency dependent dielectric properties of barium magnesium tantalate(BMT),Ba(Mg_(1/3)Ta(2/3))O_3 and barium zinc tantalate(BZT),Ba(Zn_(1/3)Ta_(2/3))O_3 synthesized by solid state reaction technique have been investigated at various temperatures by impedance spectroscopy.BMT and BZT possess cubic structure with lattice parameter a = 0.708 and 0.451 nm,respectively.The resonance peaks due to dielectric relaxation processes are observed in the loss tangent of these oxides.The relaxation in the samples is polydispersive in nature.The temperature dependence of dc conductivity,the most probable relaxation frequency(ω_m) obtained from tanδ vs logw plots and ω_m obtained from imaginary parts of the complex electrical modulus vs logw plots follow the Arrhenius behavior.According to these Arrhenius plots the activation energies of BMT and BZT are about 0.54 and 0.40 eV,respectively.Thus the results indicate that samples are semiconducting in nature.The frequency-dependent electrical data are analyzed in the framework of conductivity and electric modulus formalisms.Both these formalisms show qualitative similarities in relaxation time.Our study points that for complex perovskite oxides with general formula A(B'B")O_3,the dielectric properties significantly depend on the atomic radii of both A and B type cations.BMT and BZT exhibit enhancement in dielectric property compared to their niobate counterparts.They may find several technological applications such as in capacitors,resonators and filters owing to their high dielectric constant and low loss tangent.
        The frequency dependent dielectric properties of barium magnesium tantalate(BMT),Ba(Mg_(1/3)Ta(2/3))O_3 and barium zinc tantalate(BZT),Ba(Zn_(1/3)Ta_(2/3))O_3 synthesized by solid state reaction technique have been investigated at various temperatures by impedance spectroscopy.BMT and BZT possess cubic structure with lattice parameter a = 0.708 and 0.451 nm,respectively.The resonance peaks due to dielectric relaxation processes are observed in the loss tangent of these oxides.The relaxation in the samples is polydispersive in nature.The temperature dependence of dc conductivity,the most probable relaxation frequency(ω_m) obtained from tanδ vs logw plots and ω_m obtained from imaginary parts of the complex electrical modulus vs logw plots follow the Arrhenius behavior.According to these Arrhenius plots the activation energies of BMT and BZT are about 0.54 and 0.40 eV,respectively.Thus the results indicate that samples are semiconducting in nature.The frequency-dependent electrical data are analyzed in the framework of conductivity and electric modulus formalisms.Both these formalisms show qualitative similarities in relaxation time.Our study points that for complex perovskite oxides with general formula A(B'B")O_3,the dielectric properties significantly depend on the atomic radii of both A and B type cations.BMT and BZT exhibit enhancement in dielectric property compared to their niobate counterparts.They may find several technological applications such as in capacitors,resonators and filters owing to their high dielectric constant and low loss tangent.
引文
[1]R.J.Cava,J.Mater.Chem.11(2001)54—62.
    [2]K.H.Yoon,H.R.Lee,J.Am.Cemm.Soc.83(2001)2603—2698.
    [3]Z.Yang,Y.Zhang,G.You,K.Zhang,R.Xiong,J.Shi,J.Mater.Sci.Technol.28(2012)1145—1150.
    [4]I.Norezan,A.K.Yahya,M.K.Talari,J.Mater.Sci.Technol.28(2012)1137—1144.
    [5]C.M.Wang,S.Y.Lin,K.S.Kao,Y.C.Chen,S.C.Weng,J.Alloy.Compd.491(2010)423—430.
    [6]S.Kwon,C.C.Huang,M.A.Subramaniarn,D.P.Carm,J.Alloy.Compd.473(2009)433—436.
    [7]A.F.L.Almeida,P.B.A.Feehine,L.C.Kretly,A.S.B.Sombre,J.Mater.Sci.41(2006)4623—4631.
    [8]C.H.Mu,P.Liu,Y.He,J.P.Zhou,H.W.Zhang,J.Alloy.Compd.417(2009)137—141.
    [9]G.Zang,J.Zhang,P.Zheng,J.Feng,C.Wang,J.Phys.D Appl.Phys.38(2005)1824—1827.
    [10]M.R.Shah,A.K.M.Akther Hossain,J.Mater.Sci.Technol.29(2013)323—329.
    [11]B.J.Fang,Z.Q.Cheng,R.B.Sun,C.L.Ding,J.Alloy.Compd.471(2009)539—543.
    [12]X.J.Chou,Z.Y.Zhao,M.X.Du,J.Liu,J.W.Zhai,J.Mater.Sci.Technol.28(2012)280—284.
    [13]C.T.Chen,C.Y.Huang,Y.M.Lin,C.T.Lee,Jpn.J.Appl.Phys.50(2011)091503.
    [14]M.S.Fu,X.Q.Liu,X.M.Chen,Y.W.Zeng,J.Am.Ceram.Soc.93(2010)787—795.
    [15]L.Saroj,G.Samal,L.N.Rao,K.C.J.Raju,A.K.Ganguli,Jpn.J.Appl.Phys,48(2009)061401.
    [16]A.Belous,O.Ovehar,O.Kramarenko,D.Misehuk,B.Janear,M.Spreitzer,D.Suvorov,G.Annino,D.Grebennikov,P.Mascher,Ferroelectrics 387(2009)36—45.
    [17]O.Ovchar,A.Belous,O.Kramarenko,D.Misehuk,B.Jancar,M.Spreitzer,D.Suvorov,G.Annino,D.Grebermikov,P.Mascher,Ferroelectrics 387(2009)189—196.
    [18]Z.Q.Tian,H.Wang,W.J.Huang,C.Y.Zhang,J.Mater.Sei.Mater.Electron.19(2008)227—232.
    [19]A.G.Belous,O.V.Ovchar,O.V.Kramarenko,J.Bezjak,B.Jancar,D.Suvorov,G.Annino,Ferroelectrics 367(2008)149—162.
    [20]P.K.Bajpai,K.N.Singh,Physica B 406(2011)1226—1232.
    [21]P.K.Bajpai,M.Pastor,K.N.Singh,J.Appl.Phys.109(2011)014114.
    [22]J.Macutkevic,J.Banys,J.Appl.Phys.109(2011)116101.
    [23]T.Hungro,M.Alguero,Alicia Castro,J.Am.Ceram.Soc.90(2007)2122—2127.
    [24]A.Dutta,C.Bharti,T.P.Sinha,Physiea B 403(2008)3389—3393.
    [25]A.Dutta,T.P.Sinha,Physica B 405(2010)1475—1479.
    [26]A.Dutta,C.Bharti,T.P.Sinha,Mater.Res.Bull.43(2008)1246—1254.
    [27]S.Nomura,K.Toyama,K.Kaneta,Jpn.J.Appl.Phys.21(1982)L624—L626.
    [28]Y.Kawashima,M.Nishida,I.Ueda,H.Ouchi,J.Am.Ceram.Soc.66(1983)421—423.
    [29]P.K.Davies,J.Tong,T.Negas,J.Am.Ceram.Soc.80(1997)1727—1740.
    [30]J.I.Yang,S.Nahn,C.H.Choi,H.J.Lee,H.M.Park,J.Am.Ceram.Soc.85(2002)165—168.
    [31]S.B.Desu,H.M.O'Bryan,J.Am.Ceram.Soc.68(1985)546—551.
    [32]C.C.Tsai,H.S.Teng,J.Am.Ceram.Soc.87(2004)2080—2085.
    [33]Md.M.Hoque,A.Dutta,S.Kumar,T.P.Sinha,Physica B 407(2012)3740—3748.
    [34]F.Galasso,J.Pyle,Inorg.Chem.2(1963)482—484.
    [35]B.Y.Ahn,N.K.Kirn,Mater.Res.Bull.35(2000)1677—1687.
    [36]B.Y.Ahn,N.K.Kim,J.Mater.Sci.37(2002)4697—4701.
    [37]L.Nedelcu,N.B.Mandaehe,M.I.Toacsan,A.M.Vlaicu,M.G.Banciu,A.Ioachim,F.Gherendi,C.R.Luculescu,M.Nistor,Thin Solid Films 522(2012)112—116.
    [38]A.Ioachim,M.I.Toacsan,M.G.Banciu,L.Nedelcu,C.A.Dutu,H.V.Alexandm,S.Antohe,E.Andronescu,S.Jinga,P.Nita,Thin Solid Films 516(2008)1558—1562.
    [39]H.Lu,L.Zhu,J.P.Kim,S.H.Son,J.H.Park,J.Mater.Sci.Technol.28(2012)654—660.
    [40]R.D.Shannon,Acta Crystallogr.A 32(1976)751—767.
    [41]A.Dutta,T.E Sinha,Mater.Res.Bull.46(2011)518—524.
    [42]Y.Tokura,Y.Tomioka,J.Magu.Magn.Mater.200(1999)1—23.
    [43]P.Debye,Polar Molecules,Chemical Catalogue Company,New York,1929.
    [44]C.Bharti,T.E Sinha,Solid State Sci.12(2010)498—502.
    [45]T.Ishii,T.Abe,H.Shirai,Solid State Commun.127(2003)737—741.
    [46]J.Liu,Ch.G.Duan,W.G.Yin,W.N.Mei,R.W.Smith,J.R.Hardy,J.Chem.Phys.119(2003)2812—2819.
    [47]P.B.Macedo,C.T.Moynihan,R.Bose,Phys.Chem.Glasses 13(1972)171—179.
    [48]S.L.Ginzburg,Irreversible Phenomena of Spin Glasses,Nauka,Moscow,1989.
    [49]L.Lindgren,P.Svedlindh,O.J.Beckman,J.Magn.Magn.Mater.25(1981)33—36.
    [50]G.M.Tsangaris,G.C.Psarras,N.Kouloumbi,J.Mater.Sci.33(1998)2027—2037.
    [51]N.Kumar,A.Dutta,S.Prasad,T.P.Sinha,Physica B 405(2010)4413—4417.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700