摘要
双倍数据速率(Double Data Rate,DDR)DRAM由于其速度快、容量大,而且价格便宜,在各种需求大量数据缓存的场合得到了广泛使用。论文介绍了DDR器件的基本工作原理及需重点关注的操作过程,通过建立合适的时序关系,基于ATE设计测试向量,实现DDR器件的功能测试。
Compared with other memory technologies,DDR(Double Data Rate)has the faster processing speed,the larger storage potential and the more affordable price. And for those reasons,more and more major manufacturers are used on the way topurchase this storage memory. In this paper,the operating principle and using process of DDR DRAM(Dynamic Random AccessMemory)are recommended. After that,a test method about DDR DRAM is presented. This test technology focuses on the reason-able sequence,based on the ATE(Automatic Test Equipment)test vectors designing,and displays a useful,simple and universal test method.
引文
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