基于EMTP/ATP电容器组故障跳闸原因分析
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摘要
通过对某110 k V变电站21C电容器组故障跳闸的检查试验、故障录波分析以及EMTP/ATP仿真计算,找出造成该电容器故障的原因主要有:一是B5电容器在合闸前便存在绝缘薄弱的缺陷,一经合闸发生绝缘击穿;二是B5电容器的熔断器在合闸前存在接触不良缺陷,一经合闸熔断器内部发生间隙放电,受高频放电电流的作用B5电容器发生击穿。引入EMTP/ATP仿真计算为电容器类似故障原因分析提供新的方法,积累经验,具有一定的工程实际意义。
The fault reason of capacitor is found through the inspection and test of the tripping,fault recordwave analysis and EMTP/ATP simulation calculation of 21 C capacitor bank of certain a 110 k V substationas follows:The first reason is that B5 capacitor has the defect of weak insulation before closing operation and,in case of closing operation,the insulation breakdown occurs;the second one is that the fuse of B5 capacitorhas the defect of weak contact before closing operation and,in case of closing operation,the gap dischargesoccurs inside the fuse and therefore the B5 capacitor occurs breakdown due to the action of high frequencydischarge current.The EMTP/ATP simulation calculation is introduced so to provide new method for theanalysis of the similar fault of capacitor,accumulate experience,which has a definite engineering practicalsignificance.
The fault reason of capacitor is found through the inspection and test of the tripping,fault recordwave analysis and EMTP/ATP simulation calculation of 21 C capacitor bank of certain a 110 k V substationas follows:The first reason is that B5 capacitor has the defect of weak insulation before closing operation and,in case of closing operation,the insulation breakdown occurs;the second one is that the fuse of B5 capacitorhas the defect of weak contact before closing operation and,in case of closing operation,the gap dischargesoccurs inside the fuse and therefore the B5 capacitor occurs breakdown due to the action of high frequencydischarge current.The EMTP/ATP simulation calculation is introduced so to provide new method for theanalysis of the similar fault of capacitor,accumulate experience,which has a definite engineering practicalsignificance.
引文
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[12]DL/T 442—1991高压并联电容器单台保护用熔断器订货技术条件[S].DL/T 4421991 Technical conditions for ordering fusesused for protecting individual high-voltage parallel capaci-tor[S].
[13]陈维贤.内部过电压基础[M].北京:中国电力出版社,1981.
[14]刘文泽,蔡泽祥,冯顺萍.并联电容器组中电容器击穿的特征分析与仿真研究[J].高压电器,2009,45(5):73-79.LIU Wenze,CAI Zexiang,FENG Shunping.Characteristicanalysis and simulation of power capacitor breakdown inshunt capacitor bank[J].High Voltage Apparatus,2009,45(5):73-79.
[15]李化,王文娟,李智威,等.2.7 MJ/m3高储能密度脉冲电容器的研制[J].高压电器,2016,52(3):69-70.LI Hua,WANG Wenjuan,LI Zhiwei,et al.Development ofhigh energy density(2.7 MJ/m3)pulse capacitor[J].HighVoltage Apparatus,2016,52(3):69-70.
[2]倪学锋,盛国钊,林浩.我国电力电容器的运行与改进建议[J].电力设备,2004,5(9):10-13.NI Xuefeng,SHENG Guozhao,LIN Hao.Operation andimproving suggestion for power capacitor in China[J].Electrical Equipment,2004,5(9):10-13.
[3]房金兰.无熔丝电容器技术的发展与应用[J].电力电容器与无功补偿,2008,29(1):13.FANG Jinlan.Development and application of fuseless ca-pacitor technology[J].Power Capacitor&Reactive PowerCompensation,2008,29(1):13.
[4]NATARAJAN R.电力电容器[M].北京:机械工业出版社,2007.
[5]张军阳,赵二冬,张德惠.并联无功补偿电容器组熔断器群爆现象分析和对策研究[J].电力电容器与无功补偿,2008,29(6):49-53.ZHANG Junyang,ZHAO Erdong,ZHANG Dehui.Analysisand solution of fuse multi-explosion failures of reactivecompensation shunt capacitor bank[J].Power Capacitor&Raective Power Compensation,2008,29(6):49-53.
[6]倪学锋,姜胜宝,林浩,等.内熔丝电容器保护配合元件过电压倍数选择的原则和依据[J].电力电容器与无功补偿,2008,29(3):13.NI Xuefeng,JIANG Shengbao,LIN Hao,et al.Selectionprinciple and basis of overvoltage multiple of the protectionmatching element of capacitor with internal fuse[J].PowerCapacitor&Reactive Power Compensation,2008,29(3):13.
[7]孙进科,贺应华,史海洋.电容器单元爆破能量与电容器组接线结构方式之关系[J].电力电容器与无功补偿,2007,28(5):44-58.SUN Jinke,HE Yinghua,SHI Haiyang.The relation be-tween explosion energy of capacitor unit and wiring struc-ture mode of capacitor bank[J].Power Capacitor&Raective Power Compensation,2007,28(5):44-58.
[8]倪学锋,刘瑞云,林浩,等.关于无熔丝电容器和内熔丝电容器优劣的一点看法[J].电力电容器与无功补偿,2012,33(5):28-32.NI Xuefeng,LIU Ruiyun,LIN Hao,et al.Opinion aboutmerits and demerits of internally fused capacitor andfuseless capacitor[J].Power Capacitor&Raective PowerCompensation,2012,33(5):28-32.
[9]宋森,电力行业电力电容器标准化技术委员会.并联电容器装置技术及应用[M].北京:中国电力出版社,2011.
[10]盛国钊,倪学锋,严飞.单台电容器内部故障保护的合理选择[J].电力设备,2008,29(11):61-63.SHENG Guozhao,NI Xuefeng,YAN Fei.Reasonable selec-tion of internal fault protection for single capacitor[J].Elec-trical Equipment,2008,29(11):61-63.
[11]靳建峰,沈黎明,翁利民,等.集中补偿并联电容器组熔断器“群爆”的解决方法[J].电力自动化设备,2003,23(6):74-76.JIN Jianfeng,SHEN Liming,WENG Limin,et al.Solutionfor colony fusing failure of centralized-compensate shunt-capacitors fuses[J].Electric Power Automation Equipment,2003,23(6):74-76.
[12]DL/T 442—1991高压并联电容器单台保护用熔断器订货技术条件[S].DL/T 4421991 Technical conditions for ordering fusesused for protecting individual high-voltage parallel capaci-tor[S].
[13]陈维贤.内部过电压基础[M].北京:中国电力出版社,1981.
[14]刘文泽,蔡泽祥,冯顺萍.并联电容器组中电容器击穿的特征分析与仿真研究[J].高压电器,2009,45(5):73-79.LIU Wenze,CAI Zexiang,FENG Shunping.Characteristicanalysis and simulation of power capacitor breakdown inshunt capacitor bank[J].High Voltage Apparatus,2009,45(5):73-79.
[15]李化,王文娟,李智威,等.2.7 MJ/m3高储能密度脉冲电容器的研制[J].高压电器,2016,52(3):69-70.LI Hua,WANG Wenjuan,LI Zhiwei,et al.Development ofhigh energy density(2.7 MJ/m3)pulse capacitor[J].HighVoltage Apparatus,2016,52(3):69-70.