摘要
为了降低掩模台位置测量的位置误差,首先阐述了二维衍射平面光栅尺在掩模台上的布局与信号采集模块;然后运用两个二维衍射平面光栅尺建立掩模台位置测量模型;最后以双频激光干涉仪作为参考测量系统,对比两个测量系统的不确定度。实验证明:二维衍射平面光栅尺测量系统的不确定度比较低,可以有效地实现掩模台的三自由度位置超高精密测量。
In order to reduce the position error of the reticle stage's position measurement, this paper first expounds the layout and signal acquisition module of the two-dimensional diffraction plane scale on the reticle stage, and then uses two two-dimensional diffraction plane grating to establish the reticle stage's position measurement. Model; finally, the dual-frequency laser interferometer is used as a reference measurement system to compare the uncertainty of the two measurement systems. The experiment proves that the uncertainty of the two-dimensional diffraction plane grating measuring system is relatively low, which can effectively realize the ultra-high precision measurement of the three-degree-of-freedom displacement of the reticle stage.
引文
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