低温条件下小麦返白系叶片中H_2O_2累积的原因初探
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  • 英文篇名:The Reasons for H_2O_2 Accumulation in Leaves of Wheat Albinism line under Low Temperature
  • 作者:肖磊 ; 杨苑 ; 李瑞航 ; 谢利萍 ; 邵景侠 ; 郭蔼光 ; 徐虹
  • 英文作者:XIAO Lei;YANG Yuan;LI Ruihang;XIE Liping;SHAO Jingxia;GUO Aiguang;XU Hong;College of Life Sciences,Northwest A&F University;State Key Laboratory of Crop Stress Biology for Arid Areas;
  • 关键词:小麦返白系 ; H_2O_2 ; 叶绿素荧光参数 ; 基因表达分析
  • 英文关键词:Wheat Albinism line;;H_2O_2;;Chlorophyll fluorescence parameters;;Expression analysis
  • 中文刊名:MLZW
  • 英文刊名:Journal of Triticeae Crops
  • 机构:西北农林科技大学生命学院;旱区作物逆境生物学国家重点实验室;
  • 出版日期:2019-03-08 11:39
  • 出版单位:麦类作物学报
  • 年:2019
  • 期:v.39;No.257
  • 基金:国家自然科学基金项目(30971769,31371541)
  • 语种:中文;
  • 页:MLZW201903013
  • 页数:8
  • CN:03
  • ISSN:61-1359/S
  • 分类号:90-97
摘要
为了研究低温处理下小麦叶色阶段性白化品种返白系与对照品种矮变1号叶片的H_2O_2含量是否存在差异,并初步分析导致差异的原因,采用DAB组织染色法检测返白系和矮变1号在4℃低温处理90 d、25℃下恢复培养10 d时叶片H_2O_2含量的动态变化,测定4℃低温处理下返白系和矮变1号中表征光合电子传递效率的荧光参数F_v/F_m和qP,并采用qRT-PCR方法分析返白系和矮变1号中几个光合电子传递体基因及质体H_2O_2清除相关基因的表达模式。结果显示,低温处理下,矮变1号叶片中H_2O_2含量变化不大,返白系叶片中H_2O_2会大量累积;低温处理下,返白系叶片的叶绿素荧光参数F_v/F_m、qP都明显低于矮变1号。同时,低温下返白系光合电子传递链中部分电子传递体亚基基因petD、petN、ndhB和ndhK,以及质体H_2O_2清除相关基因 APX4和 HO1的表达量低于矮变1号。这些结果表明,低温处理下,相较于矮变1号,返白系叶片中会累积大量的H_2O_2。返白系质体中光合电子传递受阻引起电子泄露,同时质体中清除活性氧的能力下降,可能是导致返白系叶片中积累大量H_2O_2的原因。
        Wheat Albinism line,discovered from winter wheat Aibian 1, shows stage albinism phenomena from interior leaves under low temperature(4 ℃) for about 35 to 40 days, and then returns green when temperature rises. In order to study whether there is difference in leaf H_2O_2 content between Albinism line and Aibian 1 under low temperature, and analyze the reasons, the content of H_2O_2 was detected using the diaminobenzidine histochemical staining technique after low temperature treatment, and the chlorophyll fluorescence parameters F_v/F_m and qP of wheat leaves were measured by chlorophyll fluorescence imaging system, and the expression of photosynthetic electron transport related genes and elimination of reactive oxygen species related genes were analyzed. It was indicated that Albinism line accumulated much more H_2O_2 under low temperature compared with that in Aibian 1.The chlorophyll fluorescence parameters F_v/F_m and qP in wheat Albinism line that represent photosynthetic electron transfer capacity were significantly lower than those of Aibian 1 in low temperature. The expression levels of petD, petN, ndhB, and ndhK, the key genes correlated with electron transfer, and APX4 and 1 the key genes related to elimination of excessive H_2O_2 of plastids, were significantly declined in Albinism line compared with those in Aibian 1 under low temperature.To conclude, the electronic leakage caused by the destroy of photosynthetic electron transfer capacity is the main reason for cold-sensitive wheat Albinism line accumulating excess H_2O_2 compared with Aibian 1 under low temperature. This situation was exacerbated by inadequate elimination capacity of excessive H_2O_2 of plastids in Albinism line.
引文
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