测试总线的发展与展望
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  • 英文篇名:Review and Outlook of Test Bus
  • 作者:朱利文 ; 于雷 ; 金传喜
  • 英文作者:ZHU Li-wen;YU Lei;JIN Chuan-xi;Naval University of Engineering,College of Nuclear Science and Technology;
  • 关键词:测试总线 ; 自动测试系统 ; GPIB ; VXI ; PXI ; PXIe ; LXI ; AXIe
  • 英文关键词:test bus;;automatic test system(ATS);;general purpose interface bus(GPIB);;VME bus extension for instrumentation(VXI);;PCI extensions for instrumentation(PXI);;PCIExpress extensions for instrumentation(PXIe);;LAN extensions for instrumentation(LXI);;AdvancedTCA extensions for instrumentation and test(AXIe)
  • 中文刊名:XDFJ
  • 英文刊名:Modern Defence Technology
  • 机构:海军工程大学核科学技术学院;
  • 出版日期:2019-02-15
  • 出版单位:现代防御技术
  • 年:2019
  • 期:v.47;No.269
  • 语种:中文;
  • 页:XDFJ201901023
  • 页数:11
  • CN:01
  • ISSN:11-3019/TJ
  • 分类号:156-166
摘要
测试总线是自动测试系统中控制器与仪器模块之间、仪器模块与仪器模块之间、系统与系统之间的信息通道,在自动测试系统中占据重要地位。随着测试总线技术的不断发展,先后出现了GPIB,VXI,PXI,PXIe,LXI和AXIe等测试总线标准。对测试总线的发展历程进行了回顾,对六种测试总线的特点和应用进行了总结,并比较了不同测试总线的性能,重点对测试总线的未来发展方向进行了分析与展望。
        Test bus is the data transmission channel in automatic test system( ATS) between the controller and the instrument module,between various instrument modules and between the systems,which plays an important role in ATS. With the development of test bus technology,many test buses have come into being,such as general purpose interface bus( GPIB),VME bus extension for instrumentation( VXI),PCI extensions for instrumentation( PXI),PCIExpress extensions for instrumentation( PXIe),LAN extensions for instrumentation( LXI) and AdvancedTCA extensions for instrumentation and test( AXIe),etc. The history of test bus is reviewed; the features and applications of the six test buses are summarized; the performances of different test buses are compared; and the future development of test bus are analyzed and forecast.
引文
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