GDMS在陶瓷熔块化学分析中的应用
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摘要
针对陶瓷熔块化学组成难确定,传统分析化学、X射线荧光光谱分析测试受限的实际问题,尝试采用辉光放电质谱法(GDMS)测试其化学组成。结果表明:1 000V、3 mA辉光源、钽勺为辅助电极条件下,Astrum GDMS设备可以快速、准确、高效测定陶瓷熔块的化学组成,为釉料配方的准确计算提供了可靠依据。熔块中杂质元素的分析确认,有利于发现工作过程中可能存在的污染源,在陶瓷工艺改进及环保领域具有广阔的应用前景。
Due to the practical problems that the chemical composition of frit was difficult to determine and traditional testing methods of analytical chemistry and XRF were limited, glow discharge mass spectrometry(GDMS)was tried to test the chemical composition. The results indicated that:GDMS can rapidly, accurately and efficiently determine the chemical composition of ceramic frit by using Astrum GDMS equipment,tantalum spoon as auxiliary electrode with the conditon of 1 000 V and 3 mA glow. Moreover, the data of GDMS can provide a reliable basis on the calculation of glaze formula. The analysis and confirmation of impurity elements in ceramic frit was helpful to the discover the possible sources of pollution, which had broad application prospects in the process of ceramic technology upgrading and environmental protection.
Due to the practical problems that the chemical composition of frit was difficult to determine and traditional testing methods of analytical chemistry and XRF were limited, glow discharge mass spectrometry(GDMS)was tried to test the chemical composition. The results indicated that:GDMS can rapidly, accurately and efficiently determine the chemical composition of ceramic frit by using Astrum GDMS equipment,tantalum spoon as auxiliary electrode with the conditon of 1 000 V and 3 mA glow. Moreover, the data of GDMS can provide a reliable basis on the calculation of glaze formula. The analysis and confirmation of impurity elements in ceramic frit was helpful to the discover the possible sources of pollution, which had broad application prospects in the process of ceramic technology upgrading and environmental protection.
引文
[1]徐建华,邱永斌,等.陶瓷花釉与装饰技术[M].北京:中国轻工业出版社.2011.
[2]吴大军.硅酸盐原料和熔块成分的快速分析[J].陶瓷.2009(7)52-55.
[3]苏永选,孙大海,王小如,等.辉光放电质谱研究与应用新进展[J].分析测试学报,1999,18(5):82-86.
[4]张肇瑞,童坚,刘高,等.纯钛的辉光放电质谱法多元素分析[J]分析实验室,2012,31(7):9-12.
[5]胡芳菲.直流辉光放电质谱法测定氧化铝中的杂质元素[J]质谱学报,2014,35(4):335-339.
[6]陈刚,葛爱景,卓尚军,等.辉光放电质谱法在无机非金属材料分析中的应用[J].分析化学,2004,32(1):107-112.
[7]张金娥,刘英,臧慕文,等.GDMS法和ICP-MS法测定太阳能级多晶硅中杂质元素含量[J].分析试验室,2013,32(9):59-62.
[8]王超,黄春娥,陆小荣.R2O-RO-SiO2-Al2O3-Fe2O3-P2O5系分相釉的研究.2014,43(11):3017-3021.
[2]吴大军.硅酸盐原料和熔块成分的快速分析[J].陶瓷.2009(7)52-55.
[3]苏永选,孙大海,王小如,等.辉光放电质谱研究与应用新进展[J].分析测试学报,1999,18(5):82-86.
[4]张肇瑞,童坚,刘高,等.纯钛的辉光放电质谱法多元素分析[J]分析实验室,2012,31(7):9-12.
[5]胡芳菲.直流辉光放电质谱法测定氧化铝中的杂质元素[J]质谱学报,2014,35(4):335-339.
[6]陈刚,葛爱景,卓尚军,等.辉光放电质谱法在无机非金属材料分析中的应用[J].分析化学,2004,32(1):107-112.
[7]张金娥,刘英,臧慕文,等.GDMS法和ICP-MS法测定太阳能级多晶硅中杂质元素含量[J].分析试验室,2013,32(9):59-62.
[8]王超,黄春娥,陆小荣.R2O-RO-SiO2-Al2O3-Fe2O3-P2O5系分相釉的研究.2014,43(11):3017-3021.