基于p-GaN结构的GaN HEMT功率电子器件和数字电路单片集成技术
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  • 英文篇名:Monolithic Integration of GaN HEMT Power Electronic Devices and Digital Circuit Based on p-GaN Structure
  • 作者:倪金玉 ; 孔岑 ; 周建军 ; 孔月婵
  • 英文作者:NI Jinyu;KONG Cen;ZHOU Jianjun;KONG Yuechan;Science and Technology on Monolithic Integrated Circuits and Modules Laboratory;
  • 关键词:单片集成 ; p-GaN帽层 ; 增强型GaN功率电子器件 ; 数字电路
  • 英文关键词:monolithic integration;;p-GaN cap;;enhancement-mode GaN power electronic device;;digital circuit
  • 中文刊名:DYXB
  • 英文刊名:Journal of Power Supply
  • 机构:微波毫米波单片集成和模块电路重点实验室;
  • 出版日期:2019-05-15
  • 出版单位:电源学报
  • 年:2019
  • 期:v.17;No.83
  • 基金:国家重点研发计划资助项目(2017YFB0402802)~~
  • 语种:中文;
  • 页:DYXB201903008
  • 页数:4
  • CN:03
  • ISSN:12-1420/TM
  • 分类号:56-59
摘要
基于含p-GaN帽层的Si基GaN材料,实现了增强型GaN功率电子器件与数字电路单片集成技术的开发。在同一片晶圆上实现了增强型高压GaN器件、DCFL结构反相器和17级环形振荡器。高压GaN功率电子器件阈值电压VTH达到1.2 V,击穿电压V_(BD)达到700 V,输出电流I_D达到8 A,导通电阻R_(ON)为300 mΩ。基于E/D集成技术的DCFL结构反相器低噪声和高噪声容限分别为0.63 V和0.95 V;所研制17级环形振荡器在输入6 V条件下振荡频率345 MHz,级延时为85 ps。
        GaN power electronic devices and digital circuits were fabricated on Si-based GaN material with p-GaN cap monolithically. An enhancement-mode GaN power device with high breakdown voltage, a direct-coupled FET logic(DCFL) inverter and a 17-stage ring oscillator were realized on one same wafer. The threshold voltage VTH, breakdown voltage V_(BD), output current I_D and on-resistance R_(ON) of the GaN HEMT were 1.2 V, 700 V, 8 A, and 300 mΩ,respectively. The DCFL inverter was realized based on the enhancement-and depletion-mode integration technology, and its logic-low and logic-high noise margins were 0.63 V and 0.95 V, respectively. The 17-stage ring oscillator showed an oscillation frequency of 435 MHz and a propagation delay of 85 ps at a supply voltage of 6 V.
引文
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