改性聚酰亚胺表面稳定性与真空直流沿面闪络抑制方法研究
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  • 英文篇名:Study of the Surface Stability of Modified Polyimide and the Suppression Method of Surface Flashover under DC Voltage in Vacuum
  • 作者:张博 ; 乌江 ; 郑晓泉
  • 英文作者:Zhang Bo;Wu Jiang;Zheng Xiaoquan;State Key Laboratory of Electrical Insulation and Power Equipment Xi'an Jiaotong University;
  • 关键词:沿面闪络 ; 聚酰亚胺 ; 表面稳定性 ; ZnO改性 ; 表面氟化
  • 英文关键词:Surface flashover;;polyimide;;surface stability;;ZnO modification;;surface fluorination
  • 中文刊名:DGJS
  • 英文刊名:Transactions of China Electrotechnical Society
  • 机构:电力设备电气绝缘国家重点实验室(西安交通大学);
  • 出版日期:2019-04-09 15:38
  • 出版单位:电工技术学报
  • 年:2019
  • 期:v.34
  • 基金:国家自然科学基金青年项目(51607134);; 中国博士后科学基金面上项目(2015M570833)资助
  • 语种:中文;
  • 页:DGJS201913020
  • 页数:8
  • CN:13
  • ISSN:11-2188/TM
  • 分类号:180-187
摘要
聚酰亚胺(PI)等介质材料易受到空间环境带电粒子作用而带电,并导致沿面闪络。为了揭示表面闪络的影响因素进而探索闪络抑制方法,建立了表面闪络测试系统,采用纳米、微米ZnO对PI进行改性及表面氟化两种方法对制备的平板PI试样进行闪络特性测试。研究发现,与纯PI试样对比,改性、氟化试样的表面闪络电压均有显著提升,基于二次电子发射雪崩(SEEA)模型,材料表面特性对闪络发展起决定性因素。实验研究表明,纳米及微米ZnO颗粒在PI内部引入了更多的深陷阱,抑制电荷脱陷能力;微粒对PI填隙,降低脱气率,减少表面气体薄层;降低材料表面的二次电子发射系数。表面氟化对闪络提升有多方面因素。ZnO改性与表面氟化综合作用又可进一步提升表面闪络电压。因此,ZnO改性及氟化通过提高PI材料表面稳定性,抑制了SEEA的发展过程,提高了材料闪络电压。
        Polyimide(PI) and other dielectric materials are susceptible to the interaction of charged particles in the space environment,which will lead to the flashover along the surface.In order to reveal the influence factors to the surface flashover and explore the flashover suppression method,a surface flashover test system was established.The flat-plate PI sample was prepared and modified by nano/micron ZnO,also the surface was fluorinated.It is found that compared with the pure PI sample,the surface flashover voltage of the modified and fluorinated samples improved significantly.Based on the secondary electron emission avalanche(SEEA) model,surface characteristic is a decisive factor in the development of flashover.Experiment result shows that ZnO particle introduces more deep traps in the material which suppresses the ability of charge removal;the particle reduces the degassing rate of the PI interstice which restrains the surface gas lamina;the secondary electron emission coefficient on the surface of the material is declined.Surface fluoridation has many factors to the improvement of flashover.The combination of ZnO modification and surface fluorination can further improve the surface flashover voltage.Therefore,we consider that surface stability can be improved by ZnO modification and fluorination,thus restrain the SEEA development process and raise the material flashover voltage.
引文
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