分层提取匹配印刷电路板元器件缺陷检测
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  • 英文篇名:Hierarchical Extraction Matching Printed Circuit Board Components Defect Detection
  • 作者:赵翔宇 ; 周亚同 ; 何峰 ; 王帅 ; 张忠伟
  • 英文作者:ZHAO Xiang-yu;ZHOU Ya-tong;HE Feng;WANG Shuai;ZHANG Zhong-wei;School of Electronics and Information Engineering,Hebei University of Technology,Tianjin Key Laboratory of Electronic Materials and Devices;Beijing An shi zhong dian Technology Co.,Ltd.;
  • 关键词:机器视觉 ; 电路板元器件检测 ; 数学形态学 ; 种子填充 ; 分层提取 ; 模板分类匹配
  • 英文关键词:machine vision;;circuit board components detection;;mathematical morphology;;seed filling;;layered extraction;;template classification match
  • 中文刊名:YBJS
  • 英文刊名:Instrument Technique and Sensor
  • 机构:河北工业大学电子信息工程学院天津市电子材料与器件重点实验室;北京市安视中电科技有限公司;
  • 出版日期:2018-08-15
  • 出版单位:仪表技术与传感器
  • 年:2018
  • 期:No.427
  • 基金:中国博士后基金(F2013202254);; 河北省自然科学基金(E2016202341);; 教育部人文社会科学研究规划基金(15YJA630108);; 2017年省级研究生创新资助项目(CXZZSS2017035)
  • 语种:中文;
  • 页:YBJS201808024
  • 页数:6
  • CN:08
  • ISSN:21-1154/TH
  • 分类号:88-93
摘要
文中提出了一种基于数学形态学与种子填充相结合的分层提取匹配算法,检测印刷电路板(PCB)中的贴片电阻和电容丢失与立碑、集成电路(IC)芯片丢失与极性错误等缺陷。算法分为PCB图像预处理、分层提取、模板分类匹配3部分。算法的关键在于消除无关信息干扰并通过种子填充算法对各类元器件进行分层提取,然后将不同元器件分别进行基于单链表的模板分类匹配。本算法在检测长度为19 cm、宽度为13.5 cm的PCB样本时,在确保精度为0.1 mm以上的情况下最快检测速度可以达到2 s/块。
        A hierarchical extraction classification matching algorithm based on mathematical morphology and seed filling is proposed,to detect the defects of printed circuit board( PCB),include the missing and cocked of chip resistors and capacitors,also include the missing and polarity errors of IC chip.The algorithm is divided into three parts: PCB image preprocessing,hierarchical extraction and template classification.The key to the algorithm is to eliminate irrelevant information interference and the various components of PCB are extracted by seed filling algorithm.And then different components were based on single-linked list of template classification and matching.This algorithm is used to detect PCB samples with a length of 19 cm and a width of 13.5 cm,in the case of ensuring a precision of 0.1 mm or more,the fastest detection speed can be up to 2 sec/block.
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