雨滴对微波大气击穿过程的影响
详细信息    查看官网全文
摘要
将描述电磁波的Maxwell方程组和简化的等离子体流体方程组耦合数值求解,研究了雨滴对微波大气击穿过程的影响。由于雨滴介电常数的模远大于大气介电常数,故雨滴的存在可使局部场强增加到2倍(三维下为3倍),从而降低大气击穿所需的入射微波能量。雨滴的作用相当于一个局部的场强增强器,增加局部场强,诱导微波大气击穿,从而在雨滴附近形成丝状放电。等离子体丝出现后,其尖端取代雨滴成为新的场强增强器。多雨滴模拟结果显示微波上游雨滴附近的等离子体丝比下游有更好的发展。
The effect of raindrop on the microwave air breakdown is investigated by numerical solution of fluid-based plasmas equations coupled with the Maxwell equations. The electric field at the poles of raindrop is twice(triple in 3D) of the incident field, because the magnitude of dielectric constant of raindrop is much larger than that of air. It is found that the raindrop is like a field amplifier, initialize the microwave air breakdown and form the filamentary plasma. After that, the tip of filamentary plasma replaces the raindrop and works as a new field amplifier. As for multiple raindrops, the filamentary plasma develops longer near the upstream raindrops than that near downstream ones.
引文
[1]K.V.Khodatatev,Investigation of the surface filamentary discharge in focus of microwave radiation,Final Technical Report on Project ISTC#3784.2010.
    [2]Qianhong Zhou,and Zhiwei Dong,Modeling study on pressure dependence of plasma structure and formation in 110 GHz microwave air breakdown,Appl.Phys.Lett.2011,98:161504
    [3]周前红,董志伟,陈京元:110 GHz微波电离大气产生等离子体过程的理论研究,物理学报2011,60:125202
    [4]J T Krile,Surface flashover under RF and unipolar excitation at atmospheric conditions,Ph D thesis,Texas Tech University 2006
    [5]Marshall J S and Palm er W M.T he distribut ion of raindrops with size.J Meteor,1948,5:165~166
    [6]R Gunn,and G D Kinzer,1949 The Terminal Velocity of Fall for water Droplets in Stagnant Air,J.Meteor.,6,243-248
    [7]Taflove A 2005 Computational Electrodynamics:the Finite Difference Time Domain Method 3rd Ed.(MA:Artech House)
    [8]L Tsang,J A Kong,K H Ding,2000 Scattering of Electromagnetic Waves:Theories and Applications.John Wiley&Sons,Inc.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700