锡原子插入MFI结构分子筛骨架位置的判据
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摘要
近年来,Sn-MFI的合成及其催化的含氧烃的转化反应已经成为研究热点。四配位骨架锡物种是Sn-MFI分子筛的活性中心,因此确定Sn原子是否插入骨架对拓宽其催化应用具有重要意义。XRD Rietveld结构精修结果表明Sn-MFI的"五指峰"位置随着锡硅比增加而向小角度偏移,这是由于锡原子插入MFI结构使得晶胞膨胀,使晶胞的层间距增大。Sn-MFI分子筛在FT-IR中960 cm-1处存在吸收峰,证明了Sn-O-Si键的不对称振动。UV-Vis谱中210 nm吸收峰归属于四配位的骨架锡物种,230-350 nm处的宽峰归属为五配位或者六配位的锡物种。XPS表征表明Sn-MFI的电子结合能较SnO_2向增大,这是因为锡原子进入骨架后形成Si-O-Sn键。~(29)Si MAS NMR结果表明,锡原子的插入导致了-116ppm处肩峰的产生,这是骨架锡原子对骨架硅物种的诱导效应所致。TEM和HRTEM表明,分子筛由小晶粒堆叠而成;且分子筛的晶粒无明显的Sn粒子聚集(如Fig.1b),表明Sn原子高分散插入到了分子筛骨架位置。
Recently,the synthesis of Sn-MFI zeolite and its catalytic application in oxygenated hydrocarbons conversion have been a hot spot in chemistry.As tetrahedral framework Sn species are active sites,thus it is important to confirm the Sn incorporation,for extending its application region.The characteristic peaks of Sn-MFI slightly move to lower 2θ with the increasing of Sn/Si ratio,owing to the swelling of unit cell by Sn incorporation.The peaks at 960cm~(-1)in FTIR and 210 nm in UV-Vis are considered as the evidence of Sn incorporation into framework sites.Interestingly,Sn-MFI shows higher binding energy than SnO_2 in XPS spectra,indicating the formation Sn-O-Si bonds.It agrees well with the Si(OSi)_3(OSn)_1 species assigned by ~(29)Si MAS NMR at-116 ppm.Moreover,no Sn-rich nanoparticles are detected in HRTEM image,which means the Sn atoms are highly dispersed in the bulk crystal.Consequently,the incorporation of Sn atoms has been confirmed.
引文
[1]Fejes,P.;Nagy,J.,Kovács,K.,Vankó,G.Appl.Catal.A-Gen.1996,145:155.
    [2]Cho,H.J.;Dornath,P.;Fan,W.ACS Catal.2014,4:2029.

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