PIN-FET探测器噪声特性分析与测试方法研究
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摘要
PIN-FET探测器输出噪声是衡量其工作性能的重要指标。针对PIN-FET探测器不同的噪声来源,对不同噪声进行了全面的理论分析,并给出了不同噪声电流的理论计算关系;详细讨论分析了三种测量噪声大小的方法,对比分析了他们之间的优劣;介绍了PIN-FET探测器噪声测试系统的原理,着重分析了采用外差频谱仪测量噪声的原理,并采用标准白噪声源替代探测器进行了测试实验,实验论证了测试方法的可行性;为进一步研究光纤陀螺用探测器的噪声特性打下了一定的基础,也对提高器件工作性能的研究具有指导意义。
The PIN-FET detectors' output noise is an important index of the performance. In this paper, noises of the different sources are analyzed and theoretical calculation of different noise current are given; Three methods of measuring noise are discussed in detail, and the advantages and disadvantages of them are compared and analyzed; The principle of noise measurement system is introduced. The principle of measuring noise by spectrum analyzer is analyzed, and the test experiment was carried out using the standard white noise source instead of the detector, which verified the test method is feasible. These studies provide a foundation for the further analysis of PIN-FET detector noise characteristics and useful for improving device performance.
引文
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