双V型专用测具检测方法探讨研究
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摘要
通过生成模拟圆和测得的双Ⅴ型面数据得到理论轴线,确定测量基准,从而实现对测具几何尺寸和形位公差的检测,提高了工装检测的精确度,为同类型测具的检测起到指导性作用。
Theoretical axis is obtained by generating simulated circle and measured double V-type surface data,and the measurement reference is determined,the detection of gauge geometric dimensions and tolerances of form and position is achieved,the accuracy of the tool detection is improved,which plays a guiding role for the same type of measuring tool detection.
引文
[1]李宗扬.国防科工委科技与质量司.计量技术基础[M].北京.原子能出版社,2002.
    [2]罗南星.测量误差及数据处理[M].北京:中国计量出版社,1984.
    [3]朱正辉,国防科工委科技与质量司.几何量计量[M].北京:原子能出版社,2002.

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