~(241)Am中微量~(242)Cm测量技术研究
详细信息    查看官网全文
摘要
测量了PIPS半导体探测器的本底谱,得出~(242)Cmα粒子可测量的计数率下限为6.3×10~(-6)cps。用~(241)Amα源开展了实验测量工作,研究了不同~(241)Am能峰强度对~(242)Cmα粒子测量的影响,推算了~(241)Am能峰不同计数率情况下可测量的~(241)Am与~(242)Cm最大强度差。在一定的~(241)Am能峰计数率情况下,采用组合测量方法获取了~(242)Cmα谱,谱中~(241)Am与~(242)Cm强度差与理论推算结果基本一致。
The background signal spectra of measuring system with Passivated Implanted Planar Silicon(PIPS) Detector was experimental researched and then the lower limit of measuring count rate was deduced as 6.3×10~(-6) cps.With ~(241)Am alpha source,experiments was conducted to study the influence of peak strength of ~(241)Am alpha source on measurement of ~(242)Cm alpha source.Based on the experiments,the maximum strength gap of typical alpha peak of ~(241)Am and ~(242)Cm was estimated for the condition of different count rate of ~(241)Am peak.For the specific counting rate condition of~(241)Am alpha source,alpha spectra of ~(242)Cm was obtained using combination measuring method.The strength gap of typical alpha peak of ~(241)Am and ~(242)Cm well agreed the calculation.
引文
[1]国防科学技术工业委员会科学技术部.中国军事百科全书:核武器分册[M].北京:军事科学出版社,1990.
    [2]钱绍钧.核武器装备[M].北京:原子能出版社,2003.
    [3]乔登江.地下核爆炸及其应用[M].北京:国防工业出版社,2002.
    [4]杨波,应阳君,李金鸿,等.地下核爆的中子反照效应研究[J].原子能科学技术,2013,47(8):1281-1285.
    [5]何贤文,姜山,何明,等.检测4.2 K低温金属环境下(210)Po-α衰变半衰期变化的实验方法[J].核技术,2011,34(7):503-506.
    [6]朱传新,郑普.Al活化法测量反应截面技术研究[J].中国核科技报告,2009,(1):43-51.
    [7]倪建忠,代义华,张海涛,等.α能谱法测定~(241)Am(n,γ)~(242)Am~(g,m)的反应分支比[,].原子能科学技术,2007,41(6):671-673.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700