一种新的SRAM型胚胎电子细胞SEU自检结构
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- 英文论文题名：A Novel SEU Self-checking Structure of SRAM based Embryonic Electronic Cell
- 论文作者：李丹阳 ; 蔡金燕 ; 朱赛 ; 孟亚峰
- 英文论文作者：LI Dan-Yang ; CAI Jin-Yan ; ZHU Sai ; Meng Ya-Feng ; Department of Electronic and Optical Engineering ; Ordnance Engineering College
- 年：2015
- 作者机构：军械工程学院电子与光学工程系;
- 论文关键词：SRAM ; 胚胎电子细胞 ; 自检 ; 延迟比较 ; 单粒子翻转
- 英文论文关键词：electromagnetic pulse ; SRAM ; embryonic electronic cell ; self-test ; delay comparison ; SEU
- 会议召开时间：2015-08-12
- 会议录名称：静电放电：从地面新技术应用到空间卫星安全防护—中国物理学会第二十届全国静电学术会议论文集
- 语种：中文
- 分类号：R594.8;TP333
- 学会代码：WLJD
- 会议名称：静电放电 ; 从地面新技术应用到空间卫星安全防护—中国物理学会第二十届全国静电学术会议
- 会议地点：中国河北石家庄
- 主办单位：中国物理学会静电专业委员会
- 学会名称：中国物理学会静电专业委员会
- 页数：8
- 文件大小：610k
- 原文格式：D
- 会议级别：全国
摘要
SRAM型胚胎电子细胞在辐射空间容易受到单粒子翻转(SEU,Single Event Upset)影响,由于缺乏有效的自检手段,严重制约了胚胎电子阵列在深空、强电磁等辐射环境中的应用。本文基于经典胚胎电子细胞结构,在配置存储模块和逻辑功能模块中分别采用延迟比较、双模比较等自检方法,设计了一种新型的具有自检能力的胚胎电子细胞,可以实时有效的检测配置存储模块和逻辑功能模块发生的一位和多位SEU,并且通过列移除的自修复机制,实现系统故障的实时自修复并保持系统正常工作。以4bit进位加法器为例,通过仿真实验,验证了胚胎电子细胞的自检能力和电子细胞阵列的故障自修复能力。
SRAM-based embryonic electronic cell is susceptible to SEU(Single-Event Upset)in radiation space.Due to the lack of effective means of self-test,the application of embryonic electronic array system on deep space and strong electromagnetic radiation environment,etc.is severely restricted.Based on the classic embryonic electronic cell structure,delay comparison and dual-mode comparison are respectively used in configurable storage module and logic function module to design a novel self-checking embryonic electronic cell.The proposed method can effectively detect 1bit and multi-bit SEUs in both configuration storage module and logic function module in real time.In addition,by column elimination,the embryonic electronic cell array can achieve real-time self-repair in case of a fault and keep embryonic electronic array system working normally.Results of simulations in a 4-bit ripple carry adder verify the self-test ability of the embryonic electronic cell and self-repair ability of the embryonic electronic cell array.
SRAM-based embryonic electronic cell is susceptible to SEU(Single-Event Upset)in radiation space.Due to the lack of effective means of self-test,the application of embryonic electronic array system on deep space and strong electromagnetic radiation environment,etc.is severely restricted.Based on the classic embryonic electronic cell structure,delay comparison and dual-mode comparison are respectively used in configurable storage module and logic function module to design a novel self-checking embryonic electronic cell.The proposed method can effectively detect 1bit and multi-bit SEUs in both configuration storage module and logic function module in real time.In addition,by column elimination,the embryonic electronic cell array can achieve real-time self-repair in case of a fault and keep embryonic electronic array system working normally.Results of simulations in a 4-bit ripple carry adder verify the self-test ability of the embryonic electronic cell and self-repair ability of the embryonic electronic cell array.
引文
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[22]Yuan Zhang,Youren Wang,Shanshan Yang,Min Xie.Design of a Cell in Embryonic Systems with Improved Efficiency and Fault-Tolerance[C].Proceedings of the Second International Conference on Evolvable Systems:From Biology to Hardware.Lecture Notes in Computer Science.Heidelberg,Berlin:Springer,2007:129-139.
[23]Mohammad Samie,Gabriel Dragffy,Tony Pipe.Bio-Inspired Self-Test for Evolvable Fault Tolerant Hardware Systems[C].2010 NASA/ESAConference on Adaptive Hardware and Systems.Anaheim,CA,USA:IEEE,2010:325-332.
[2]陈京平,刘尚合,谭智良等.ESD脉冲对集成电路损伤效应的实验研究[J].高电压技术,2007,33(3):121-124.CHEN Jing-ping,LIU Shang-he,TAN Zhi-liang,et al.Experimental Study of the Damage Effects of Integrated Circuits Stressed with ESD Pulse[J].High Voltage Engineering,2007,33(3):121-124.
[3]陈京平,刘尚合,谭智良等.ESD和方波脉冲对集成电路损伤效应异同性[J].高电压技术,2007,33(7):102-106.CHEN Jing-ping,LIU Shang-he,TAN Zhi-liang,et al.Similarities and Differences of Damage Effects of Integrated Circuits Injected by ESD Pulse and Rectangular Pulse[J].High Voltage Engineering,2007,33(7):102-106.
[4]褚杰,满梦华,常小龙等.复杂电磁环境中高可靠性TMR-EHW电机控制电路设计[J].高电压技术,2012,38(9):2314-2321.CHU Jie,MAN Menghua,CHANG Xiaolong,et al.Design of Motor Control Circuit Based on TMR-EHW in Complex Electromagnetic Environment[J].High Voltage Engineering,2012,38(9):2314-2321.
[5]巨政权,原亮,满梦华等.FPGA静电损伤容错系统设计及演化修复能力研究[J].高电压技术,2012,38(11):2848-2857.JU Zhengquan,YUAN Liang,MAN Menghua,et al.Design of Fault-tolerant System and Research of Evolvable Repairing Capability for the ESDDamaging Effects of FPGA[J].High Voltage Engineering,2012,38(11):2848-2857.
[6]满梦华,巨政权,原青云等.基于电磁仿生概念的静电放电注入损伤防护模型设计[J].高电压技术,2011,37(2):375-381.MAN Meng-hua,JU Zheng-quan,YUAN Qing-yun,et al.Design of Protection Model for Electrostatic Discharge Injection Injury Based on the Electromagnetic Bionics[J].High Voltage Engineering,2011,37(2):375-381.
[7]满梦华,刘尚合,常小龙等.可演化组合逻辑数字电路的静电放电抗扰特性[J].高电压技术,2012,38(9):2322-2328.MAN Menghua,LIU Shanghe,CHANG Xiaolong,et al.Anti-electrostatic Discharge Interference Characteristics of Evolvable Combinational Circuits[J].High Voltage Engineering,2012,38(9):2322-2328.
[8]常小龙,刘尚合,满梦华等.静电放电损伤自修复数字电路模型的建立与优化[J].高电压技术,2012,38(9):2329-2335.CHANG Xiaolong,LIU Shanghe,MAN Menghua,et al.Construction and Improvement of Self-repairing Digital Circuit Model for Electrostatic Discharge Damage[J].High Voltage Engineering,2012,38(9):2329-2335.
[9]Hugo de Garis.Genetic Programming:Artificial Nervous Systems,Artificial Embryos and Embryological Electronics[C].Proceedings of the 1st Workshop on Parallel Problem Solving from Nature.London,UK:Springer,1990:117-123.
[10]Daniel MANGE,Serge DURAND,Eduardo SANCHEZ,et al.A New Paradigm for Developing Digital Systems Based on a Multi-Cellular Organization[C].IEEE International Symposium on Circuits and Systems.Seattle,WA,USA:IEEE,1995:2193-2196.
[11]Sai Zhu,Jinyan Cai,Yafeng Meng,Danyang Li,Junbin Zhang,Tianzhen Meng.A Novel Structure of Embryonics Electronic Cell Array[J].WSEASTRANSACTIONS on CIRCUITS and SYSTEMS.2014,13:224-232.
[12]M.Samie,E.Farjah,G.Dragffy.Cyclic metamorhpic memory for cellular bio-inspired electronic systesms[J].Genet Program Evolvable Mach,2008,9:183-201.
[13]S.M.Achasova.Self-Replicating Structure as an Artificial Multicellular Organism[J].Cybernetics and Systems Analysis,2014,50:316-323.
[14]Can Ozturkeri,Colin G.Johnson.Self-repair ability of evolved self-assembling systems in cellular automata[J].Genetic Programming and Evolvable Machines,2014,15:313-341.
[15]Isaak Yang,Sung Hoon Jung,Kwang-Hyun Cho.Self-Repairing Digital System With Unified Recovery Process Inspired by Endocrine Cellular Communication[J].IEEE TRANSACTIONS ONVERY LARGE SCALE INTEGRATION(VLSI)SYSTEM,2013,21:1027-1040.
[16]M.Aarthi,S.Karthigailakshmi.Modeling of Bio-Inspired Self-Repairing Digital System[J].IOSRJournal of Electronics and Communication Engineering,2014,9:29-36.
[17]Zhai Zhang,Youren Wang.Method to self-repairing reconfiguration strategy selection of embryonic cellular array on reliability analysis[C].2014NASA/ESA Conference on Adaptive Hardware and Systems.Leicester,UK:IEEE,2014:225-232.
[18]Daniel Mange,Andre Stauffer,and Gianluca Tempesti.Embryonics:A Microscopic View of the Molecular Architecture[C].Proceedings of the Second International Conference on Evolvable Systems:From Biology to Hardware.Lecture Notes in Computer Science.Heidelberg,Berlin:Springer,1998:185-195.
[19]SESAR ORTEGA-SANCHEZ,DANIEL MANGE,STEVE SMITH,et al.Embryonics:A Bio-Inspired Cellular Architecture with Fault-Tolerant Properties[J].Genetic Programming and Evolvable Machines,2000,1:187-215.
[20]Daryl Bradley,Cesar Ortega-Sanchez,Andy Tyrrell.Embryonics+Immunotronics:A Bio-Inspired Approach to Fault Tolerance[C].Proceedings of the Second NASA/Do D Workshop on Evolvable Hardware.Palo Alto,CA,USA:IEEE,2000:215-223.
[21]Lucian Prodan,Mihai Udrescu,Mircea Vladutiu.Self-Repairing Embryonic Memory Arrays[C].Proceedings of the 2004 NASA/Do D Conference on Evolution Hardware.Seattle,WA,USA:IEEE,2004:130-137.
[22]Yuan Zhang,Youren Wang,Shanshan Yang,Min Xie.Design of a Cell in Embryonic Systems with Improved Efficiency and Fault-Tolerance[C].Proceedings of the Second International Conference on Evolvable Systems:From Biology to Hardware.Lecture Notes in Computer Science.Heidelberg,Berlin:Springer,2007:129-139.
[23]Mohammad Samie,Gabriel Dragffy,Tony Pipe.Bio-Inspired Self-Test for Evolvable Fault Tolerant Hardware Systems[C].2010 NASA/ESAConference on Adaptive Hardware and Systems.Anaheim,CA,USA:IEEE,2010:325-332.