摘要
In the inverted structure, an interfacial layer plays a significant role in high-efficiency PSCs such as offering favorable ohmic contacts with electrodes, suppressing charge recombination and serving as an optical spacer layer for light manipulation.We prepared a highly efficient inverted polymer photovoltaic cell based on P3HT:PC_(61)BM by incorporating a SnO_2/ZnO stacked structure as a cathode interfacial layer.Compared to the inverted polymer photovoltaic cells with ZnO interfacial layer, the stacked SnO_2/ZnO not only facilitate electron injection and reduce the energy loss in the process of charge separation due to the optimum band matching, but also inhibit carrier recombination and enhance exciton dissociation at the interface of photoactive layer and cathode, hence all the device parameters of P3HT-based solar cells are simultaneously improved, yielding higher power conversion efficiency(PCE) up to 4.25% compared with the control one(PCE 3.10%).Furthermore, the PCE of device with stacked SnO_2/ZnO still remained 85% of its initial value during the device storage in a glove box for 23 day.
In the inverted structure, an interfacial layer plays a significant role in high-efficiency PSCs such as offering favorable ohmic contacts with electrodes, suppressing charge recombination and serving as an optical spacer layer for light manipulation.We prepared a highly efficient inverted polymer photovoltaic cell based on P3HT:PC_(61)BM by incorporating a SnO_2/ZnO stacked structure as a cathode interfacial layer.Compared to the inverted polymer photovoltaic cells with ZnO interfacial layer, the stacked SnO_2/ZnO not only facilitate electron injection and reduce the energy loss in the process of charge separation due to the optimum band matching, but also inhibit carrier recombination and enhance exciton dissociation at the interface of photoactive layer and cathode, hence all the device parameters of P3HT-based solar cells are simultaneously improved, yielding higher power conversion efficiency(PCE) up to 4.25% compared with the control one(PCE 3.10%).Furthermore, the PCE of device with stacked SnO_2/ZnO still remained 85% of its initial value during the device storage in a glove box for 23 day.
引文
[1]Liu,J.;Wu,J.;Shao,S.;Deng,Y.;Meng,B.;Xie,Z.;Geng,Y.;Wang,L.;Zhang,F,ACS Appl.Mater.Interfaces,2014,6,8237-8245.
[2]Lee,J.H.;Cho,S.;Roy,A.;Jung,H.T.;Heeger,A.J,Appl.Phys.Lett,2010,96,163303.