Study of Thin Film Morphologies by Grazing Incidence Small Angle X-ray Scattering(GISAXS)

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• 英文论文题名：Study of Thin Film Morphologies by Grazing Incidence Small Angle X-ray Scattering(GISAXS)
• 论文作者：Tomomi Irita ; Thomas Russell ; Xuefa Li ; Hirokazu Aoyama
• 英文论文作者：Tomomi Irita ; Thomas Russell ; Xuefa Li ; Hirokazu Aoyama ; Technology Innovation Center ; Daikin Industries ; Ltd. ; Polymer Science and Engineering ; University of Massachusetts ; Advanced Photon Source ; Argonne National Laboratory
• 年：2016
• 作者机构：Technology Innovation Center,Daikin Industries,Ltd.;Polymer Science and Engineering,University of Massachusetts;Advanced Photon Source,Argonne National Laboratory;
• 会议召开时间：2016-11-01
• 会议录名称：2016年全国高分子材料科学与工程研讨会论文摘要集
• 语种：英文
• 分类号：TB383.2
• 学会代码：ZGHY
• 会议名称：2016年全国高分子材料科学与工程研讨会
• 会议地点：中国广西桂林
• 主办单位：中国化学会、中国机械工程学会、中国材料研究学会
• 学会名称：中国化学会
• 页数：1
• 文件大小：191k
• 原文格式：O
• 会议级别：全国

摘要

<正>Grazing incidence small angle x-ray scattering(GISAXS)experiments were performed on thin films of Nafion solutions as a function of temperature under humidity control,and as a function of humidity at constant temperature.The development and orientation of the structure and morphology inthe thin films,at the free surtace and in the bulk of the film,was charactenzed by the scattering below and above the critical angle.The scattering profiles indicated that Nafion thin film morphology was strongly influenced by the

引文

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    3.Nafion Technical Information Data Sheet.Nafion Glooal Customer Service,DuPont,1996.