平板介质材料复介电常数单反射法变温测试
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摘要
微波介质材料如今已被广泛应用于雷达、通信、微波遥感遥测、制导等各个领域。众所周知,飞行器和制导武器在高速飞行时,它们的介质天线罩等部位与空气摩擦,经气动加热,其表面温度波动剧烈,温度从负几百摄氏度到几千摄氏度不等。那么,天线罩表面温差,对电磁波传输性能有多大影响呢?国内外对此领域都做了大量的研究工作,并已广泛应用于实际当中,如高速飞行的航天飞机如何实现与地面控制中心通信、高速飞行的制导武器如何完成制导等问题已得到很好的解决。这些问题的解决离不开对微波材料电磁特性随温度变化规律的掌握和应用。
复介电常数是描述微波材料电磁特性最重要的参数之一,对于非磁性介质,有μ≈μ0,故通常对材料的复介电常数进行变温测试。纵观国内外文献,就自由空间法测试材料复介电常数,传输/反射法用的居多,且测试系统和校准技术比较成熟,但对于使用单反射法对材料进行变温测试的文献资料相对较少。本文就是基于单反射法对材料的复介电常数实现变温测试。此方法的优点明显:测试系统对样品加热易于实现;标准件少且易制作,校准过程方便;待测网络为单端口,系统误差项少(只有3项,而二端口网络有12项系统误差),测试精度较高。
本文主要工作一是建立单反射法的物理和数学模型,完成单反射法测试原理的理论分析;二是完成点聚焦透镜圆锥喇叭天线的研制;三是完成温度控制装置的研制;四是完成测试系统的搭建;五是分析误差来源、建立单端口网络误差模型,实现SOL校准。
Microwave dielectric materials have now been widely used in radar, communications, microwave remote sensing, guidance and other fields. Is well known that when flying in high speed, the part of dielectric antenna radome of the aircraft and guided weapons will friction with the air and be Heated by the aerodynamic, the surface temperature of the dielectric antenna radome will volatility seriously, ranging from minus several hundred degree Celsius to several thousand degrees Celsius. So how much influence does the difference in the surface temperature of dielectric antenna radome have on the transmission performance of electromagnetic waves? A great of work have been done in this filed at home and abroad, and have been widely used on practice, the problems such as how the shuttle and flight communicated with the ground control centers, how the high-speed guide weapons finished the guidance and so on have been well handled. These problems can’t be handled without understanding and using the law between the microwave electromagnetic properties of materials and temperature.
Complex permittivity is one of the most important parameters to describe the microwave electromagnetic properties of materials, as for nonmagnetic material, so it is usually test the complex permittivity of material change with temperature. According to the report at home and abroad, In terms of free-space method,the transform-reflection method has been used usually,the test system and calibration technology are mature as well, but relatively few documents using single-reflection method to test the temperature-dependence of complex permittivity of material. This paper is based on single-reflection method to test the temperature-dependence of complex permittivity of material. The advantages of this method are obvious: sample can be heated by the test system easily, only a few standard parts are needed and also made easily, the calibration process is simple, the network be tested is single port, with a little systematic error term and high test precision.
The first work in this paper is to establish the physical and mathematical models of single-reflection method, to complete the Theoretical analysis of single-reflection method‘s test theory, the second is to build the spot focusing lens antenna; the third is to build the temperature control device; the fourth is to build the test system. And the fifth is to analyze the source of error, build the error model of single-port network to attain SOL calibration.
复介电常数是描述微波材料电磁特性最重要的参数之一,对于非磁性介质,有μ≈μ0,故通常对材料的复介电常数进行变温测试。纵观国内外文献,就自由空间法测试材料复介电常数,传输/反射法用的居多,且测试系统和校准技术比较成熟,但对于使用单反射法对材料进行变温测试的文献资料相对较少。本文就是基于单反射法对材料的复介电常数实现变温测试。此方法的优点明显:测试系统对样品加热易于实现;标准件少且易制作,校准过程方便;待测网络为单端口,系统误差项少(只有3项,而二端口网络有12项系统误差),测试精度较高。
本文主要工作一是建立单反射法的物理和数学模型,完成单反射法测试原理的理论分析;二是完成点聚焦透镜圆锥喇叭天线的研制;三是完成温度控制装置的研制;四是完成测试系统的搭建;五是分析误差来源、建立单端口网络误差模型,实现SOL校准。
Microwave dielectric materials have now been widely used in radar, communications, microwave remote sensing, guidance and other fields. Is well known that when flying in high speed, the part of dielectric antenna radome of the aircraft and guided weapons will friction with the air and be Heated by the aerodynamic, the surface temperature of the dielectric antenna radome will volatility seriously, ranging from minus several hundred degree Celsius to several thousand degrees Celsius. So how much influence does the difference in the surface temperature of dielectric antenna radome have on the transmission performance of electromagnetic waves? A great of work have been done in this filed at home and abroad, and have been widely used on practice, the problems such as how the shuttle and flight communicated with the ground control centers, how the high-speed guide weapons finished the guidance and so on have been well handled. These problems can’t be handled without understanding and using the law between the microwave electromagnetic properties of materials and temperature.
Complex permittivity is one of the most important parameters to describe the microwave electromagnetic properties of materials, as for nonmagnetic material, so it is usually test the complex permittivity of material change with temperature. According to the report at home and abroad, In terms of free-space method,the transform-reflection method has been used usually,the test system and calibration technology are mature as well, but relatively few documents using single-reflection method to test the temperature-dependence of complex permittivity of material. This paper is based on single-reflection method to test the temperature-dependence of complex permittivity of material. The advantages of this method are obvious: sample can be heated by the test system easily, only a few standard parts are needed and also made easily, the calibration process is simple, the network be tested is single port, with a little systematic error term and high test precision.
The first work in this paper is to establish the physical and mathematical models of single-reflection method, to complete the Theoretical analysis of single-reflection method‘s test theory, the second is to build the spot focusing lens antenna; the third is to build the temperature control device; the fourth is to build the test system. And the fifth is to analyze the source of error, build the error model of single-port network to attain SOL calibration.
引文
[01]何小瓦,李恩,张其邵,郭高凤,介质材料复介电常数变温测量技术综述.宇航材料工艺.2005年第1期
[02]曹江,介质材料电磁参数测量综述,《宇航计测技术》,1994年6月,13卷3期。
[03] E. Li, Z. Nie, G. Guo, et al,“Broadband measurements of dielectric properties of low-loss materials at high temperatures using circular cavity method,”PIER 92, 103–120, 2009
[04] Gaofeng Guo, En Li, Zhongping Li, et al .“A test system for complex permittivity measurements of low-loss materials at high temperatures up to 2000 ?C,”Meas. Sci. Technol. 22 (2011) 045707 (6pp)
[05]郭高凤,高温介质材料介电性能终端短路法测试系统研究,电子科大博士学位论文,2008.
[06]李恩,吸波材料电磁参数在X波段的变温测试。硕士学位论文,成都:电子科技大学,2003.
[07] Y. Zhou, E. Li, G. Guo, et al.“Broadband complex permittivity measurement of low loss materials over large temperature ranges by strip-line resonator cavity using segmentation calculation method,”PIER, Vol. 113, 143-160, 2011
[08] Hasar, U. C.,“Unique permittivity determination of low-loss dielectric materials from transmission measurements at microwave frequencies,”Progress In Electromagnetic Research, Vol. 107, 31-46, 2010.
[09] Hasar, U. C. and E. A. OralA,“Metric function for fast and accurate permittivity determination of low-to-high-loss materials from reflection measurements,”Progress In Electromagnetics Research, Vol. 107, 394-412, 2010.
[10] Hauschild, T. and R. K. Ochel,“Measurement of complex permittivity of solids up to 1000 o C,”Microwave Symposium Digest, 1687-1690, San Francisco, CA, USA, June 17-21, 1996.
[11] Gershon, D. L., J. P. Calame, Y. Carmel, et al.“Open-ended coaxial probe for high-temperature and broad-band dielectric measurements,”IEEE Transactions on Microwave Theory and Technology, Vol. 56, No. 3, 684-692, 2008.
[12] Ma, L. X, H. Zhang, and C. X. Zhang,“Analysis on the reflection characteristic of electromagnetic wave incidence in closed nonmagnetized plasma,”Journal of Electromagnetic Waves and Applications, Vol. 22, No. 17-18, 2285-2296, 2008.
[13] Wang, Z., W. Che, and L. Zhou.,“Uncertainty analysis of the rational function model used in the complex permittivity measurement of biological tissues using PMCT probes within awide microwave frequency band,”Progress In Electromagnetic Research, Vol. 90, 137-150, 2009.
[14] Baeraky, T. A.,“Microwave measurements of dielectric properties of zinc oxide at high temperature,”Egyptian Journal of Solids, Vol. 30, No. 1, 13-18, 2007.
[15] Li, Y., J. Li, and X. He,“Study on high temperature dielectric properties of magnetic window materials by cavity resonator method,”Journal of Infrared and Millimeter Waves, Vol. 23, No. 2, 157-160, April 2004.
[16] Baker-Jarvis J.“Transmission/reflection and short-circuit line permittivity measurements. NIST Technical Note 1341,1990
[17] VaradanV V. , Hollinger R D, Ghodgaonkar D K, et al.“Free-space, broadband measurements of high-temperature, complex dielectric properties at microwave frequencies,”Instrumentation and Measurement, IEEE Transactions,1991; 40: 842~846
[18] A. Bretenoux, CI. Marzat, Rene Sardos.“Turnstile reflecto-polarimeter using the principal incidence method: Determination of permittivities up to 1 200 degrees C and industrial applications,”Microwave Theory and Techniques, IEEE Transactions,1993; 41: 1 945~1 949
[19]卢子焱,微波介质材料自由空间测试方法的研究,硕士学位论文,成都:电子科技大学,2006.
[20] D.K.Ghodgaonkar,V.V.Varadan and V.K.Varadan.“A free space method for measurement of dielectric constants and loss tangents at microwave frequencies,”IEEE Trans.Instrumentation and Measurement,1989,37(3):789-793
[21] D.K.Ghodgaonkar,V.V.Varadan,and V.K.Varadan.“Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies,”IEEE Trans. Instrumentation and Measurement,1990,39(2):387-394
[22] Rene Grignon,Mohammed N.Afsar,Yong Wang,et al.“Microwave broadband free-space complex dielectric permittivity measurements on low loss solids,”IMTC'03.Proceedings of the 20th IEEE,USA,2003:865-870
[23] Zhihong Maand Seichi Okamura,“Permittivity determination using amplitudes of transmission and reflection coefficients at microwave frequency,”IEEE Trans.MTT,1999,47(5):546-550
[24]王思青,张长瑞等,重复使用运载器陶瓷热防护系统。导弹与航天运载技术,2004年第3期,总第270期
[25]史丽萍,赫晓东,可重复使用航天器的热防护系统概述。航空制造技术,2004年第7期
[26] Harold L.Bassett.“A Free-Space Focused Microwave System to Determine the Complex Permittivity of Materials to Temperatures Exceeding 2000°C,”The Review of Scientific Instruments Volume 42, Number 2 February 1971
[27]谢处方,饶克谨编,杨显清,王园,赵家升修订,电磁场与电磁波,第四版北京:高等教育出版社,2006.
[28]廖承恩编著,微波技术基础,西安:西安电子科技大学出版社,2007.
[29]马岱,毫米波宽扫描介质透镜天线的研究,硕士学位论文,南京:南京理工大学,2006.
[30]林昌禄,聂在平,天线工程手册(上),北京:电子工业出版社,2002.6
[31]任冬梅,刘述章等,8mm点聚焦透镜天线的工程设计,电子科技大学学报,第35卷第3期,2006.6
[32]何昌委,刘述章,点聚焦透镜天线及分辨率的分析与测量,电子测量与仪器学报,第18卷第2期,2004.7
[33]吕善伟,张岩,余慧龙,李玉莹,聚焦透镜天线焦斑宽度估算,北京航空航天大学学报,第34卷第5期,2008.5
[34]欧陆2604可编程温度控制仪使用手册
[35]楼仁海,符果行,袁敬闳.电磁理论.成都:电子科技大学出版社,1996
[36]汤世贤,微波测量(修订版),北京:国防工业出版社,1991
[37]侯正嘉,矢量网络分析仪误差模型及校准理论的研究,硕士学位论文,成都:电子科技大学,2005
[38]李伟,王志功,李智群,S参数校准技术中SOLT和TRL校准方法的比较,第五届中国测试学术会议论文集,中国苏州,2008.5
[39]费业泰.误差理论与数据处理.北京:机械工业出版社,2001
[40]董树义.近代微波测量技术.北京:电子工业出版社,1995
[41]李恩,向志军,郭高风,等.脊波导TRL校准技术研究.仪器仪表学报,2006,27(9):1041.1 043
[42] James F Shackelford,William Alexander.“CRC Materials Materials Science and Engineering Handbook,”111M Edition.CRC Press LLC,2001
[43] Westphal W B , Iglesias J .“Dielectric Measurements on Higll-Temperature Materials,”Laboratoryfor Insulation Research , Massachusetts Institute of Technology Cambridge,AD873038
[02]曹江,介质材料电磁参数测量综述,《宇航计测技术》,1994年6月,13卷3期。
[03] E. Li, Z. Nie, G. Guo, et al,“Broadband measurements of dielectric properties of low-loss materials at high temperatures using circular cavity method,”PIER 92, 103–120, 2009
[04] Gaofeng Guo, En Li, Zhongping Li, et al .“A test system for complex permittivity measurements of low-loss materials at high temperatures up to 2000 ?C,”Meas. Sci. Technol. 22 (2011) 045707 (6pp)
[05]郭高凤,高温介质材料介电性能终端短路法测试系统研究,电子科大博士学位论文,2008.
[06]李恩,吸波材料电磁参数在X波段的变温测试。硕士学位论文,成都:电子科技大学,2003.
[07] Y. Zhou, E. Li, G. Guo, et al.“Broadband complex permittivity measurement of low loss materials over large temperature ranges by strip-line resonator cavity using segmentation calculation method,”PIER, Vol. 113, 143-160, 2011
[08] Hasar, U. C.,“Unique permittivity determination of low-loss dielectric materials from transmission measurements at microwave frequencies,”Progress In Electromagnetic Research, Vol. 107, 31-46, 2010.
[09] Hasar, U. C. and E. A. OralA,“Metric function for fast and accurate permittivity determination of low-to-high-loss materials from reflection measurements,”Progress In Electromagnetics Research, Vol. 107, 394-412, 2010.
[10] Hauschild, T. and R. K. Ochel,“Measurement of complex permittivity of solids up to 1000 o C,”Microwave Symposium Digest, 1687-1690, San Francisco, CA, USA, June 17-21, 1996.
[11] Gershon, D. L., J. P. Calame, Y. Carmel, et al.“Open-ended coaxial probe for high-temperature and broad-band dielectric measurements,”IEEE Transactions on Microwave Theory and Technology, Vol. 56, No. 3, 684-692, 2008.
[12] Ma, L. X, H. Zhang, and C. X. Zhang,“Analysis on the reflection characteristic of electromagnetic wave incidence in closed nonmagnetized plasma,”Journal of Electromagnetic Waves and Applications, Vol. 22, No. 17-18, 2285-2296, 2008.
[13] Wang, Z., W. Che, and L. Zhou.,“Uncertainty analysis of the rational function model used in the complex permittivity measurement of biological tissues using PMCT probes within awide microwave frequency band,”Progress In Electromagnetic Research, Vol. 90, 137-150, 2009.
[14] Baeraky, T. A.,“Microwave measurements of dielectric properties of zinc oxide at high temperature,”Egyptian Journal of Solids, Vol. 30, No. 1, 13-18, 2007.
[15] Li, Y., J. Li, and X. He,“Study on high temperature dielectric properties of magnetic window materials by cavity resonator method,”Journal of Infrared and Millimeter Waves, Vol. 23, No. 2, 157-160, April 2004.
[16] Baker-Jarvis J.“Transmission/reflection and short-circuit line permittivity measurements. NIST Technical Note 1341,1990
[17] VaradanV V. , Hollinger R D, Ghodgaonkar D K, et al.“Free-space, broadband measurements of high-temperature, complex dielectric properties at microwave frequencies,”Instrumentation and Measurement, IEEE Transactions,1991; 40: 842~846
[18] A. Bretenoux, CI. Marzat, Rene Sardos.“Turnstile reflecto-polarimeter using the principal incidence method: Determination of permittivities up to 1 200 degrees C and industrial applications,”Microwave Theory and Techniques, IEEE Transactions,1993; 41: 1 945~1 949
[19]卢子焱,微波介质材料自由空间测试方法的研究,硕士学位论文,成都:电子科技大学,2006.
[20] D.K.Ghodgaonkar,V.V.Varadan and V.K.Varadan.“A free space method for measurement of dielectric constants and loss tangents at microwave frequencies,”IEEE Trans.Instrumentation and Measurement,1989,37(3):789-793
[21] D.K.Ghodgaonkar,V.V.Varadan,and V.K.Varadan.“Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies,”IEEE Trans. Instrumentation and Measurement,1990,39(2):387-394
[22] Rene Grignon,Mohammed N.Afsar,Yong Wang,et al.“Microwave broadband free-space complex dielectric permittivity measurements on low loss solids,”IMTC'03.Proceedings of the 20th IEEE,USA,2003:865-870
[23] Zhihong Maand Seichi Okamura,“Permittivity determination using amplitudes of transmission and reflection coefficients at microwave frequency,”IEEE Trans.MTT,1999,47(5):546-550
[24]王思青,张长瑞等,重复使用运载器陶瓷热防护系统。导弹与航天运载技术,2004年第3期,总第270期
[25]史丽萍,赫晓东,可重复使用航天器的热防护系统概述。航空制造技术,2004年第7期
[26] Harold L.Bassett.“A Free-Space Focused Microwave System to Determine the Complex Permittivity of Materials to Temperatures Exceeding 2000°C,”The Review of Scientific Instruments Volume 42, Number 2 February 1971
[27]谢处方,饶克谨编,杨显清,王园,赵家升修订,电磁场与电磁波,第四版北京:高等教育出版社,2006.
[28]廖承恩编著,微波技术基础,西安:西安电子科技大学出版社,2007.
[29]马岱,毫米波宽扫描介质透镜天线的研究,硕士学位论文,南京:南京理工大学,2006.
[30]林昌禄,聂在平,天线工程手册(上),北京:电子工业出版社,2002.6
[31]任冬梅,刘述章等,8mm点聚焦透镜天线的工程设计,电子科技大学学报,第35卷第3期,2006.6
[32]何昌委,刘述章,点聚焦透镜天线及分辨率的分析与测量,电子测量与仪器学报,第18卷第2期,2004.7
[33]吕善伟,张岩,余慧龙,李玉莹,聚焦透镜天线焦斑宽度估算,北京航空航天大学学报,第34卷第5期,2008.5
[34]欧陆2604可编程温度控制仪使用手册
[35]楼仁海,符果行,袁敬闳.电磁理论.成都:电子科技大学出版社,1996
[36]汤世贤,微波测量(修订版),北京:国防工业出版社,1991
[37]侯正嘉,矢量网络分析仪误差模型及校准理论的研究,硕士学位论文,成都:电子科技大学,2005
[38]李伟,王志功,李智群,S参数校准技术中SOLT和TRL校准方法的比较,第五届中国测试学术会议论文集,中国苏州,2008.5
[39]费业泰.误差理论与数据处理.北京:机械工业出版社,2001
[40]董树义.近代微波测量技术.北京:电子工业出版社,1995
[41]李恩,向志军,郭高风,等.脊波导TRL校准技术研究.仪器仪表学报,2006,27(9):1041.1 043
[42] James F Shackelford,William Alexander.“CRC Materials Materials Science and Engineering Handbook,”111M Edition.CRC Press LLC,2001
[43] Westphal W B , Iglesias J .“Dielectric Measurements on Higll-Temperature Materials,”Laboratoryfor Insulation Research , Massachusetts Institute of Technology Cambridge,AD873038