基于CPLD技术的双光路补偿法玻璃测厚系统
摘要
在我国,玻璃生产能力早已达到发达国家的水平,但玻璃厚度的检测仍多采用人工测量的方法,不仅检测效率不高,而且检测结果易受人为因素影响,因此在线玻璃测厚技术显得特别重要。将CCD应用于厚度测量可实现高精度、在线动态检测和非接触测量等要求,尤其对微小厚度变化量测量具有很强的优势。
基于光的折射反射原理,根据浮法玻璃生产工艺,玻璃在传输过程中易发生抖动这一不足,对该原理进行改进,提出双光路补偿测量方法。选用半导体激光器为光源,对线阵CCD外围电路进行了理论设计和实验研究,最后设计了以CCD为光电转换元件,由计算机进行数据处理的非接触式厚度测量系统。经理论分析,该系统的测厚范围在1～20 mm,精度可达0.01 mm。
测量系统采用CPLD(复杂可编程逻辑器件)设计调试CCD时序驱动电路,提高了电路的可靠性和灵活性。CPLD设计采用MAX+PLUS II开发环境完成器件的全部工作。视频信号处理电路完成了原始信号的初级捕捉、视频的放大,CDS(相关双取样)滤波和浮动阈值二值化。二值化后的数据通过区域标定、厚度判断等处理后,将最终数据送入单片机进行存储和显示。
对CCD驱动时序电路进行仿真实验,结果表明该电路能很好地驱动CCD,充分发挥CCD光电转换特性,输出稳定可靠的电信号。实验模拟了玻璃生产现场环境,对不同厚度的玻璃进行多次测量,得到检测数据,并对数据进行了分析处理。
In our country, glass production capacity has already reached the level of developed countries, but the thickness of glass is still used artificial measurement method. Detection efficiency is not high enough, and test results are vulnerable to man-made factors. Therefore research on the thickness of glass-detection technology is particularly important. The measurement system with CCD has an advantage on geometrical measurement such as thickness for achieving high accuracy, on-line dynamic detection, non-contact measurement, especially adapts to measure little thickness alternation.
Based on refraction and reflection principle,according to the production technology of float glass, glass will quiver in the transmission. As to this deficiency, the refraction and reflection principle is improved, and the method of double beam path compensation is advanced. The semiconductor laser is chosen as light source, and peripheral circuit of linear CCD is designed in theory and studied in experiment. Finally non-contact thickness measurement instrument is constructed, using CCD as photoelectric transformation element and computer as the controller. After theory analysis, measurement range of the system is between 1 mm to 20 mm, and the precision is 0.01 mm.
The time order driving circuit of CCD is designed and debugged with CPLD (Complicated Progra mmable Logic Device), which enhance reliability and agility of circuit. The CPLD designing under MAX+PLUS II can complete all work. The video signal processing circuit realizes the primary catching, signal amplifying, CDS filtering and variable threshold binarization. The binary data is regional calibrated and thickness judged, and then the final data is input to computer.
The experiment of CCD time order driving circuit shows the circuit can drive CCD perfectly; take advantage of the characteristic of CCD photoelectric transition and output steady and reliable electric signal. Experiments simulate condition of producing glass, carry on several measurements for glass with different thickness, get and analyze measured data.
基于光的折射反射原理,根据浮法玻璃生产工艺,玻璃在传输过程中易发生抖动这一不足,对该原理进行改进,提出双光路补偿测量方法。选用半导体激光器为光源,对线阵CCD外围电路进行了理论设计和实验研究,最后设计了以CCD为光电转换元件,由计算机进行数据处理的非接触式厚度测量系统。经理论分析,该系统的测厚范围在1～20 mm,精度可达0.01 mm。
测量系统采用CPLD(复杂可编程逻辑器件)设计调试CCD时序驱动电路,提高了电路的可靠性和灵活性。CPLD设计采用MAX+PLUS II开发环境完成器件的全部工作。视频信号处理电路完成了原始信号的初级捕捉、视频的放大,CDS(相关双取样)滤波和浮动阈值二值化。二值化后的数据通过区域标定、厚度判断等处理后,将最终数据送入单片机进行存储和显示。
对CCD驱动时序电路进行仿真实验,结果表明该电路能很好地驱动CCD,充分发挥CCD光电转换特性,输出稳定可靠的电信号。实验模拟了玻璃生产现场环境,对不同厚度的玻璃进行多次测量,得到检测数据,并对数据进行了分析处理。
In our country, glass production capacity has already reached the level of developed countries, but the thickness of glass is still used artificial measurement method. Detection efficiency is not high enough, and test results are vulnerable to man-made factors. Therefore research on the thickness of glass-detection technology is particularly important. The measurement system with CCD has an advantage on geometrical measurement such as thickness for achieving high accuracy, on-line dynamic detection, non-contact measurement, especially adapts to measure little thickness alternation.
Based on refraction and reflection principle,according to the production technology of float glass, glass will quiver in the transmission. As to this deficiency, the refraction and reflection principle is improved, and the method of double beam path compensation is advanced. The semiconductor laser is chosen as light source, and peripheral circuit of linear CCD is designed in theory and studied in experiment. Finally non-contact thickness measurement instrument is constructed, using CCD as photoelectric transformation element and computer as the controller. After theory analysis, measurement range of the system is between 1 mm to 20 mm, and the precision is 0.01 mm.
The time order driving circuit of CCD is designed and debugged with CPLD (Complicated Progra mmable Logic Device), which enhance reliability and agility of circuit. The CPLD designing under MAX+PLUS II can complete all work. The video signal processing circuit realizes the primary catching, signal amplifying, CDS filtering and variable threshold binarization. The binary data is regional calibrated and thickness judged, and then the final data is input to computer.
The experiment of CCD time order driving circuit shows the circuit can drive CCD perfectly; take advantage of the characteristic of CCD photoelectric transition and output steady and reliable electric signal. Experiments simulate condition of producing glass, carry on several measurements for glass with different thickness, get and analyze measured data.
引文
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3韩永奇.我国平板玻璃工业面临的新问题及其对策选择.行业论坛,2007,(5):24-27
4张生芳,郭东明等.天线罩制造中的电厚度测量技术.第二届全国信息获取与处理学术会议论文集,2004:17-46
5张秦艳,林文坡,李冬生.浮法玻璃气电测厚部件的研究与设计.仪表技术与传感器, 2001,(5):37-39
6孙忠林,张守涛.CCD的原理及其在计量领域的应用.计量技术,1997,(7):14-16
7 Mc Manus G J. Automatic Surface Inspection of Steel Sheet. Iron and Steel Engineer, 1996,73:56-58
8 Liam Kehoe, Vincent Guenebaut. Automated Digital Image Correlation Metrology of FC-BGA First Level Interconnect In-Plane Deformation, Strain and Out-of-Plane Warpage. 38th International Symposium on Microelectronics, 2005:594-605
9 L.S. Tanwar. An Electro Optical Sensor for Microdisplacement Measurement and Control. Apparatus and Techniques, 1991,(17):43-48
10 P.T. Albrech, B.D. Michaelis. Improvement of The Spatial Resolution of an Optical 3-D Measurement Precedure. IEEE Tranactions on Instrumentation and Measurement, 1998,47(1):158-162
11 M.T. Takeuchi, T.K. Kubono. A Spectroscopic Detecting System for Measuring the Temperature Distribution of Silver Arc Using a CCD Color Camera. IEEE Tranactions on Instrumentaction and Measurement, June,1999,48(3):678-683
12 Jinghui Wang.Industrial Monitoring and Controlling System of Integrated Single Chip Computer with Linear CCD Image Sensor.The International Society for Optical Enginering,1999,3589(3):3-4
13陈东雷,王清元,张天顺.CCD传感器及其应用研究.技术与应用,2000:173-249
14袁祥辉.固体图像传感器及其应用.重庆:重庆大学出版社,1996:23-54
15赵育良,王伟.基于CCD的航空相机平板玻璃厚度测量系统.传感器技术,2003,22 (1):58-60
16张国玉.非接触光电尺寸检测仪研究.敏通科技,1996,(9):34-36
17邵德奇,王伟.线阵CCD测量技术及其在马钢连轧坯测量中的应用.光学测量工程, 1999,7(1):130-134
18宋元鹤,陈文艺,赵宏.一种新型用于覆铜板生产线的在线厚度测量系统.半导体光电, 1997,18(6):426-429
19杨刚.浮法玻璃激光在线测厚的研究.[西安交通大学硕士学位论文].2001:2-24
20糜强.CCD器件用于板材生产线的活套检测.红外技术,1998,20(4):40-42
21王玉田,杨妮,林晓琳.基于CCD技术的浮法玻璃厚度测量系统的研究.仪表技术与传感器,2007,(6):72-74
22刘力双.基于CCD的玻璃厚度在线测量系统.传感技术学报,2006,19(3):1-3
23 Mamedov F I, Dateshow M G. Device for Continuous Glass Thickness Determination. Glass and Ceramics. 1991,47:184-186
24王伟,王召巴.基于CCD位移传感器在玻璃厚度测量时的性能研究.仪表技术与传感器,2006, (9):44-45
25朱辉.光电特性综合测试实验系统研究. [浙江大学硕士学位论文].2005:2-24
26刘利明.发光二极管及半导体激光器特性参数测试研究.[浙江大学硕士学位论文].2007:2-24
27甘巧强等.半导体激光器光束特性的计算机模拟及实验研究.激光技术,2004,28(3): 298-232
28沈柯.激光原理教程.北京:北京工业学院出版社,1986:12-35
29王庆有.CCD应用技术.天津:天津大学出版社,2000:173-249
30袁祥辉.固体图象传感器及其应用.重庆:重庆大学出版社,1996:23-54
31 R. S. Sirohi, F. S. Chau. Optical Methods of Measurement. Marcel Dekker, Inc. New York, 1999:56-70
32日本东芝公司.线阵CCD数据手册,1997:368-376
33张以谟.应用光学.北京:机械工业出版社,1998:66-91
34廖宁放.实用CCD外围电路设计.电子技术,1993,(12):22-25
35赵洋,郝群,李达成.CCD高速信号采集和处理系统.光电工程,1998,25(5):42-45
36 Kaoli Huang, Changqing Zhu, Application of Liner CCD Sensor. Proceedings of The International Symposium on Test and Measurement,1999:951-953
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