半导体激光器噪声测试虚拟系统的研究
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摘要
二十世纪六十年代研制的半导体激光器给光电子领域带来了勃勃
生机，随着应用领域的扩大，半导体激光器的研究和开发以突飞猛进的
速度发展。目前，半导体激光器已广泛的应用于光纤通信、光盘、激光
打印、信息存储、医疗、测量、泵浦固体激光器、集成光学等领域，在
高新技术领域中起到越来越重要的作用。因此，如何正确、方便的检测
半导体激光器的性能、质量并对其可靠性进行评价具有重要的意义。目
前半导体激光器通常采用电老化方法进行可靠性评价和筛选。在电老化
过程中，好的器件也要经受考验，受到热、电冲击，因此使器件寿命缩
短。如果在长时间电老化的过程中遇到系统失控或停电等意外情况，会
使器件成批的损坏，损失将是严重的。而且电老化对器件中的潜在缺陷
不敏感，具体表现为电老化筛选认为合格的器件在使用过程中也会发生
快速失效。因此如何分析影响器件可靠性的因素以及如何把不合格器件
（包括具有潜在缺陷的器件）快速、无损、方便地筛选出去是亟待解决
的问题。
半导体激光器噪声包括光噪声和电噪声，其中光噪声包括相位噪声
和强度噪声，电噪声包括热噪声、散弹噪声、1/f 噪声和 g－r 噪声等。
电噪声反映了材料和器件的不完整性，与器件和材料的质量息息相关，
在评价器件质量和可靠性方面近年来引起了人们的极大兴趣。在半导体
激光器问世不久，人们就开始了对其噪声特性的研]，特别是近年来，
随着半导体激光器在各个领域的广泛应用，器件的噪声问题更是引起了
人们的普遍关注，对噪声的研究也更加深入和全面。
半导体激光器的低频电噪声测试需要频谱分析仪，但其造价很高，
因此本论文提出了能对半导体激光器的噪声进行测试的系统，即基于
PC 机的半导体激光器噪声测试虚拟系统，该系统以“虚拟仪器”来取
代造价高的频谱分析仪，把仪器软件化，降低了系统的成本。本系统能
对噪声进行时域显示、功率谱、功率谱密度、互功率谱、频率响应等测
试，并且可以根据信号的特点选择窗函数、数据平均的方法，以期用此
系统对半导体激光器进行低频电噪声测试和可靠性评估。
67
吉林大学硕士学位论文
本文首先介绍了半导体激光器的噪声特性，特别是对激光器电噪声
作了重点的论述，包括电噪声的种类、特点、产生机制、主要应用等。
然后介绍了半导体激光器噪声测量的几种常用方法，其中基于 PC 机的
数字测量方法是本人在论文期间重点研究内容。该测试系统包括硬件部
分和软件部分：硬件部分主要采用了四种电路，它们是前置放大电路、
第二级放大电路、滤波电路和采集卡保护电路。该系统主要是测量半导
体激光器及其它半导体器件的电噪声，由于这些噪声电压是及其微弱
的，通常在几 nV 到几十 nV 之间。因此需要对他们进行放大，以满足数
据采集卡的分辨范围，同时放大器的本底噪声要低于这些噪声电压。由
于整个系统的本底噪声主要取决于前置放大器，所以本论文采用了英国
EG&G 公司生产的 Model 5184 放大器作为前置级放大器，其噪声电压为
0.8nV/Hz1/2，固定放大倍数为 1000，基本满足了测量要求。第二级放大
电路我们采用了 AD 公司生产的 AD625 仪器放大器，其噪声电压为
5nV/Hz1/2，放大倍数 1－104之间可调。针对该系统的需要，本论文设计
了一个二阶低通滤波电路和采集卡保护电路，滤波器主要是起抗混叠滤
波的作用，而保护电路主要是避免信号过大烧坏采集卡，并且具有一定
的放大作用。最后我们采用了阿尔泰公司生产的 USB2007 数据采集卡，
它是 USB 总线兼容的数据采集卡，可经由 USB 电缆接入计算机，卡上装
有 14Bit 分辨率的 A/D 转换器，为用户提供了 4 路模拟输入通道，A/D
转换器输入信号范围±5V，USB2007 采集卡还具有 16 路开关量输出和
测频功能；软件部分是整个测试系统的核心，本论文利用“虚拟仪器”
技术模仿日本 ADVANTEST 公司生产的 R9211B/C FFT 分析仪的一些功能
设计了一台虚拟的频谱分析仪，主要的功能是频谱分析，其中还包括时
域波形显示、谱分析、谱密度分析、互谱分析和频率响应分析。目前正
在设计将小波分析和 matlab 嵌入到里面。此外软件也包括滤波、加窗、
平均等分析仪必备的功能，使得其具有较完善的分析功能，最大限度的
降低了系统成本，增强了系统的功能与灵活性。编写软件所使用的是美
国 National Instrument 公司开发的 LabVIEW 6.0 语言，它是专为“虚
拟仪器”设计的，是一套专为数据采集与仪器控制、数据分析和数据表
达而设计的图形化编程软件。它增强了用户在标准的计算机上配以高效
68
吉林大学硕士学位论文
经济的硬件设备来构建自己的仪器系统的能力。将 LabVIEW 与一般的数
据采集以及仪器设备加以组合，设计出虚拟仪器，它包含各种功能函数，
从而使编程的工作方便、快捷，编制出的软件界面美观、类似于实际仪
器。数据采集卡的驱动程序采用 Visual C++ 6.0 编写，执行速度较快，
与 LabVIEW 之间采用 DLL 连接，使数据的采集与处理达到完美的结合。
整个系统的最大特点就是用虚拟仪器（即 P
In the 1960s, semiconductor lasers were devised, which brings the
thriving future of the Optoelectronics fields. Along with the rapid extension
of applied fields, the semiconductor lasers’ research and development are
going forward with a very high speed. By now, the laser diodes have been
widely used in optical fiber communication, CD, laser printing, information
memory, medical treatment, pumping solid lasers, measuring, integrated
optics and so on. It becomes more important in advanced technology fields.
Then, it is very important to measure the performance of LDs exactly and
conveniently and to assess the quality and reliability of LDs. At present, the
usual method of screen is electric aging in which all devices are aged with a
constant power or a constant current under high temperature and then the
early failed devices are selected. In the aging, the reliable devices are also
subject to screening, and the lifetime of devices is affected because of the
hot and electric hurt. It can cause batches of devices damage when some
accidence happens, for instance, the out of control system or power cut. On
the other hand, electric aging is not sensitive for latent defects, for example,
some devices after electric aging screening are usually found fail rapidly.
Thus, the urgent problems are how to analyses the factors which affect the
device reliability, and how to select the unqualified devices with a fast,
nondestructive and conveniently method.
Semiconductor laser noise includes light noise and electric noise ,light
noise includes phase noise and intensity noise, electric noise includes
thermal noise 、shot noise、1/f noise、 g-r noise and so on. Electric noise
indicates the defect of material and device, especially, it is very sensitive for
various reliability-dependent defects. So the electric noise is becoming a
useful tool to characterize device quality and reliability. Of late years, it has
given rise to the person much interest. So since the semiconductor lasers
were developed, the people have studied its noise characteristics. Especially
70
吉林大学硕士学位论文
of late years, with the semiconductor lasers’ applying extensively in a
variety of domains, the questions of the appliance noise have given rise to
the universal concerns of the people, and the studying about the noise is
more earnester and all-rounder.
The low-noise measurement of the semiconductor lasers needs
frequency spectrum analyzer. Because it is very expensive, this paper put
forward the noise testing system of semiconductor lasers. The system uses
virtual instruments instead of the analyzer, so the cost of the system is
reduced. The system can carry out the function of the time domain
displaying、the spectral analysis、the spectrum density analysis 、cross
spectrum analysis and the frequency response analysis, and select the
methods of windowing function and the data averaging according to the
signal feature. We expect the system can carry out the low-noise
measurements and the reliability evaluation of the semiconductor lasers.
First, the article introduces the noise characteristic of semiconductor
lasers , especially, the electric noise characteristic is mainly summarized,
including the varieties、the features、the generation mechanism and the
principally applying. Secondly, the measuring methods of noise in
semiconductor lasers are introduced, in which the ultralow-noise PC-Based
measurement system is especially studied. The system includes the
hardware part and the software part: the hardware part adopts four circuits,
the preamplifier、the second level amplifying circuit、the filtering circuit and
the acquisition card protection circuit. The system is to measure electrical
noise of semiconductor lasers and the other semiconductor devices, and the
voltage of noise is very small, usually between several nV and several ten
nV. So they need amplifying, in order to achieve the differentiating range of
the data acquisition card,
生机，随着应用领域的扩大，半导体激光器的研究和开发以突飞猛进的
速度发展。目前，半导体激光器已广泛的应用于光纤通信、光盘、激光
打印、信息存储、医疗、测量、泵浦固体激光器、集成光学等领域，在
高新技术领域中起到越来越重要的作用。因此，如何正确、方便的检测
半导体激光器的性能、质量并对其可靠性进行评价具有重要的意义。目
前半导体激光器通常采用电老化方法进行可靠性评价和筛选。在电老化
过程中，好的器件也要经受考验，受到热、电冲击，因此使器件寿命缩
短。如果在长时间电老化的过程中遇到系统失控或停电等意外情况，会
使器件成批的损坏，损失将是严重的。而且电老化对器件中的潜在缺陷
不敏感，具体表现为电老化筛选认为合格的器件在使用过程中也会发生
快速失效。因此如何分析影响器件可靠性的因素以及如何把不合格器件
（包括具有潜在缺陷的器件）快速、无损、方便地筛选出去是亟待解决
的问题。
半导体激光器噪声包括光噪声和电噪声，其中光噪声包括相位噪声
和强度噪声，电噪声包括热噪声、散弹噪声、1/f 噪声和 g－r 噪声等。
电噪声反映了材料和器件的不完整性，与器件和材料的质量息息相关，
在评价器件质量和可靠性方面近年来引起了人们的极大兴趣。在半导体
激光器问世不久，人们就开始了对其噪声特性的研]，特别是近年来，
随着半导体激光器在各个领域的广泛应用，器件的噪声问题更是引起了
人们的普遍关注，对噪声的研究也更加深入和全面。
半导体激光器的低频电噪声测试需要频谱分析仪，但其造价很高，
因此本论文提出了能对半导体激光器的噪声进行测试的系统，即基于
PC 机的半导体激光器噪声测试虚拟系统，该系统以“虚拟仪器”来取
代造价高的频谱分析仪，把仪器软件化，降低了系统的成本。本系统能
对噪声进行时域显示、功率谱、功率谱密度、互功率谱、频率响应等测
试，并且可以根据信号的特点选择窗函数、数据平均的方法，以期用此
系统对半导体激光器进行低频电噪声测试和可靠性评估。
67
吉林大学硕士学位论文
本文首先介绍了半导体激光器的噪声特性，特别是对激光器电噪声
作了重点的论述，包括电噪声的种类、特点、产生机制、主要应用等。
然后介绍了半导体激光器噪声测量的几种常用方法，其中基于 PC 机的
数字测量方法是本人在论文期间重点研究内容。该测试系统包括硬件部
分和软件部分：硬件部分主要采用了四种电路，它们是前置放大电路、
第二级放大电路、滤波电路和采集卡保护电路。该系统主要是测量半导
体激光器及其它半导体器件的电噪声，由于这些噪声电压是及其微弱
的，通常在几 nV 到几十 nV 之间。因此需要对他们进行放大，以满足数
据采集卡的分辨范围，同时放大器的本底噪声要低于这些噪声电压。由
于整个系统的本底噪声主要取决于前置放大器，所以本论文采用了英国
EG&G 公司生产的 Model 5184 放大器作为前置级放大器，其噪声电压为
0.8nV/Hz1/2，固定放大倍数为 1000，基本满足了测量要求。第二级放大
电路我们采用了 AD 公司生产的 AD625 仪器放大器，其噪声电压为
5nV/Hz1/2，放大倍数 1－104之间可调。针对该系统的需要，本论文设计
了一个二阶低通滤波电路和采集卡保护电路，滤波器主要是起抗混叠滤
波的作用，而保护电路主要是避免信号过大烧坏采集卡，并且具有一定
的放大作用。最后我们采用了阿尔泰公司生产的 USB2007 数据采集卡，
它是 USB 总线兼容的数据采集卡，可经由 USB 电缆接入计算机，卡上装
有 14Bit 分辨率的 A/D 转换器，为用户提供了 4 路模拟输入通道，A/D
转换器输入信号范围±5V，USB2007 采集卡还具有 16 路开关量输出和
测频功能；软件部分是整个测试系统的核心，本论文利用“虚拟仪器”
技术模仿日本 ADVANTEST 公司生产的 R9211B/C FFT 分析仪的一些功能
设计了一台虚拟的频谱分析仪，主要的功能是频谱分析，其中还包括时
域波形显示、谱分析、谱密度分析、互谱分析和频率响应分析。目前正
在设计将小波分析和 matlab 嵌入到里面。此外软件也包括滤波、加窗、
平均等分析仪必备的功能，使得其具有较完善的分析功能，最大限度的
降低了系统成本，增强了系统的功能与灵活性。编写软件所使用的是美
国 National Instrument 公司开发的 LabVIEW 6.0 语言，它是专为“虚
拟仪器”设计的，是一套专为数据采集与仪器控制、数据分析和数据表
达而设计的图形化编程软件。它增强了用户在标准的计算机上配以高效
68
吉林大学硕士学位论文
经济的硬件设备来构建自己的仪器系统的能力。将 LabVIEW 与一般的数
据采集以及仪器设备加以组合，设计出虚拟仪器，它包含各种功能函数，
从而使编程的工作方便、快捷，编制出的软件界面美观、类似于实际仪
器。数据采集卡的驱动程序采用 Visual C++ 6.0 编写，执行速度较快，
与 LabVIEW 之间采用 DLL 连接，使数据的采集与处理达到完美的结合。
整个系统的最大特点就是用虚拟仪器（即 P
In the 1960s, semiconductor lasers were devised, which brings the
thriving future of the Optoelectronics fields. Along with the rapid extension
of applied fields, the semiconductor lasers’ research and development are
going forward with a very high speed. By now, the laser diodes have been
widely used in optical fiber communication, CD, laser printing, information
memory, medical treatment, pumping solid lasers, measuring, integrated
optics and so on. It becomes more important in advanced technology fields.
Then, it is very important to measure the performance of LDs exactly and
conveniently and to assess the quality and reliability of LDs. At present, the
usual method of screen is electric aging in which all devices are aged with a
constant power or a constant current under high temperature and then the
early failed devices are selected. In the aging, the reliable devices are also
subject to screening, and the lifetime of devices is affected because of the
hot and electric hurt. It can cause batches of devices damage when some
accidence happens, for instance, the out of control system or power cut. On
the other hand, electric aging is not sensitive for latent defects, for example,
some devices after electric aging screening are usually found fail rapidly.
Thus, the urgent problems are how to analyses the factors which affect the
device reliability, and how to select the unqualified devices with a fast,
nondestructive and conveniently method.
Semiconductor laser noise includes light noise and electric noise ,light
noise includes phase noise and intensity noise, electric noise includes
thermal noise 、shot noise、1/f noise、 g-r noise and so on. Electric noise
indicates the defect of material and device, especially, it is very sensitive for
various reliability-dependent defects. So the electric noise is becoming a
useful tool to characterize device quality and reliability. Of late years, it has
given rise to the person much interest. So since the semiconductor lasers
were developed, the people have studied its noise characteristics. Especially
70
吉林大学硕士学位论文
of late years, with the semiconductor lasers’ applying extensively in a
variety of domains, the questions of the appliance noise have given rise to
the universal concerns of the people, and the studying about the noise is
more earnester and all-rounder.
The low-noise measurement of the semiconductor lasers needs
frequency spectrum analyzer. Because it is very expensive, this paper put
forward the noise testing system of semiconductor lasers. The system uses
virtual instruments instead of the analyzer, so the cost of the system is
reduced. The system can carry out the function of the time domain
displaying、the spectral analysis、the spectrum density analysis 、cross
spectrum analysis and the frequency response analysis, and select the
methods of windowing function and the data averaging according to the
signal feature. We expect the system can carry out the low-noise
measurements and the reliability evaluation of the semiconductor lasers.
First, the article introduces the noise characteristic of semiconductor
lasers , especially, the electric noise characteristic is mainly summarized,
including the varieties、the features、the generation mechanism and the
principally applying. Secondly, the measuring methods of noise in
semiconductor lasers are introduced, in which the ultralow-noise PC-Based
measurement system is especially studied. The system includes the
hardware part and the software part: the hardware part adopts four circuits,
the preamplifier、the second level amplifying circuit、the filtering circuit and
the acquisition card protection circuit. The system is to measure electrical
noise of semiconductor lasers and the other semiconductor devices, and the
voltage of noise is very small, usually between several nV and several ten
nV. So they need amplifying, in order to achieve the differentiating range of
the data acquisition card,
引文
[1] Tenchio G. Low-frequency Intensity Fluctuation of CW DH GaAlAs
Diode Lasers. Electronics letters. 1976, 12(21), 562-563
[2] Orsal B, sigaoret P, Peransin J.M, et al.Correlation between Electrical
and optical photocurrent Noise in Semiconductor Laser Diode. IEEE
Trans. Electron Devices. 1994, 41(11) 2151-2161.
[3] Sheng-Lyang Jong,Jim-Yat Wu. Low-frequency Current and Intensity
Noise in AlGaAs Laser Diodes. solide-state Electronics. 1995, 36(2),
189-196
[4] X.Y. Chen, A. Pedersen, O.G. Helleso et al. Electrical noise of laser
diodes measured over a wide range of bias currents. Microelectronics
Reliab. 40(2000), 1925-1928.
[5] J.Morgan,J.Horrison,S.R.Adods et al. low-frequency Electrical Noise
characteristics of Broad Area 808nm semiconductor Laser Diodes.
Conference proceeding Leos'97,10th Annual meeting.
[6] Gisela Hartler, Ute Golze, Katrain paschke. Extended noise analysis-a
novel tool for reliability screening. Microelectronics Reliek,
Vol.38(1998), 1159-1198
[7] 胡贵军 石家伟 李红岩等 808nm 大功率半导体激光器的低频电噪
声. 吉林大学自然科学学报 NO.3, 2000, 58_60
[8] P.A.Andrekson, P. Andersson, A. Alping et al. In situ characterization of
laser Diodes from wide-Band Electrical Noise Measurements. IEEE
Journal of lightwave technology.1986, vol.LT-4, no.7, 804-811.
[9] P.A.Andrekson, P.Andersson,and A. Alping. Linewidth determination
from electrical noise measurements on semiconductor Lasers.
Electron.lett. 1985, 21, 1097-1099.
[10] PAAndrekson, P. Andersson, A .Alping. Electrical Noise
Measurement on Laser Diodes for Monitoring of optical Feedback and
Mode Hopping. Electron.lett. 1986, 22, 195-196.
[11] Hu Guijun, Shi Jiawei, Zhang Sumei et al, Low-frequency electrical
noise as reliability estimation for high-power semiconductor lasers.
Optical and Quantum electronics, is accepted.
[12] Shi JiaWei,Jin EnSun,Ma Jing et al. An Improved Approach and
Experimental Results of A low-frequency Noise Measurement
Technique used for Reliability Estimation of Diode Lasers.
Microelectron Reliab., 1994, 34(7), 1261-1264.
[13] Yisong Dai. A study of optical Noise Measurement as Reliabity
63
赵玲：半导体激光器噪声测试虚拟系统的研究
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frequency electrical noise of high-power quantum well lasers and device
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InGaAs/GaAs strained quantum well lasers and correlation with aging.
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980nm InGaAs/GaAs Strained quantum well laser. Phys. III, France,
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power single-quantum-well AlGaAs ridge Lasers. J.Appl.phy.
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Discharge Performance of InGaP Semiconductor Lasers by Facet
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[22] R. Hakimi and M-C Amann. Reduction on 1/f carrier noise in
ZnGaAsP/ZnP heterostructures by Sulphur passivation of facets.
Semicond. Sci. Technol. 12(1997),778-780.
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Sulphur Passivation of Facets in InGaAs-AlGaAs(λ=0.98μm) Laser
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1945.
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吉林大学硕士学位论文
[26] Hu Guijun, Shi Jiawei, Qi Liyun et al. High-power Quantum Well
Remote Junction Laser and Its Electrical Noise Characteristics.
Optical & Laser Technology, is accepted
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计量学报, Vol.12 No.4、oct,1991
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laser Diodes : An Experimental study .IEEE J . Quantum Electron
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出版社，2001 年 8 月第一版，1－4。
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[36] 应怀憔，波形和频谱分析与随机数据处理，427－430
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[38] 陈其津，低噪声电路，1988 年
[39] 庄奕琪, 孙青,半导体器件中的噪声及其低噪声化技术，国防工业
出版社 1993.10
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63
赵玲：半导体激光器噪声测试虚拟系统的研究
Estimation for Laser Diodes. Microelectron Reliab.,1995, 35(4),
731-734.
[14] Mitsuo Fukuda, Takuo Hirono, Takeshi Kurosaki et al. 1/f Noise
Behavior in semiconductor Laser Regradation.IEEE Photonics
Technology Letters. 1993, 5(10), 1165-1167.
[15] Hu Guijun, Shi jiawei, zhang Sumei et al. Correlation between the low-
frequency electrical noise of high-power quantum well lasers and device
quality. Proceeding of SPIE. Vol.4220, 2000, 217-220.
[16] Christoph Harder, Joseph Katz, S.Margalit et al. Noise Equivalent
circuit of a Semiconductor Laser Diodes. IEEE J. quantum
electronics.1982, QE-18(3), 333-337.
[17] B.Orsal, R. Alabedra, P.signoret et al. InGaAsP/InP Distribute
Feedback lasers for long wavelength optical communication systems of
λ=1.55um :Electrical and optical noise study. Proceeding of SPIE
Vol.1512, 1991, 112-123.
[18] B.Orsal, J.M.peransin, K.Daulasim et al. Noise of 980nm
InGaAs/GaAs strained quantum well lasers and correlation with aging.
Proceeding of SPIE, Vol.1856, 1993, 222-237.
[19] B.Orsal,J. M. Peransin,P. Singnoret et al.Low frequency noise of a
980nm InGaAs/GaAs Strained quantum well laser. Phys. III, France,
3(1993), 1739-1749.
[20] F.R.Gfeller and D.J.webb. Degradation and lifetime studies of high-
power single-quantum-well AlGaAs ridge Lasers. J.Appl.phy.
1990,68(1),14-20.
[21] Dechiaro L.F. and Sandroff E.J. Improvements in Electronstatic
Discharge Performance of InGaP Semiconductor Lasers by Facet
Passivation.IEEE Trans. Electron Devices.39, 561-565.
[22] R. Hakimi and M-C Amann. Reduction on 1/f carrier noise in
ZnGaAsP/ZnP heterostructures by Sulphur passivation of facets.
Semicond. Sci. Technol. 12(1997),778-780.
[23]Beister G, Maege J, Gutsche D. et al. Simple Method for Examining
Sulphur Passivation of Facets in InGaAs-AlGaAs(λ=0.98μm) Laser
Diodes. Appl. Phys. Lett. 1996, 68(18), 2467-2468.
[24] 胡贵军，石家纬，张素梅等，激光器电噪声和非辐射复合电流的
相关性。半导体光电，2001，22（1）, 12-14。
[25] Belster G. Non-radiative Current in InGaAs/AlGaAs laser diodes as a
measure of facet stability. Solid Stade Electron. 1998, 42(11), 1938-
1945.
64
吉林大学硕士学位论文
[26] Hu Guijun, Shi Jiawei, Qi Liyun et al. High-power Quantum Well
Remote Junction Laser and Its Electrical Noise Characteristics.
Optical & Laser Technology, is accepted
[27] 戴逸松，微弱随机信号功率谱互相关测量原理及性能研究。
计量学报, Vol.12 No.4、oct,1991
[28] R.J.Fronen. Wavelength Dependence of 1/f noise in the light output of
laser Diodes : An Experimental study .IEEE J . Quantum Electron
Vol.26 no.10 Oct.1990
[29] Carnin ciofo,Marco De Marinis,and Bruno Neri. Ultralow-noise PC-
Based Measurement System for the characterization of the
Metallizations of Integrated Circuits. IEEE Trans.nstrum.Meas
Vol,46,No.4,Aug1997.
[30] ShiYuanUang; Tsuneki sasaki et al. Measurements on Low-Frequency
Fluctuation in the laser Diodes. IEEE Trans. Electron. Device.
Vol.41,No.11,Nov 1994.
[31] [美]罗伯特.A.威特，频谱和网络测量，李景威 张伦译，蒙西 学
锋审，科学技术文献出版社，1997 年 5 月第一版，36－52，115－
122，140－147。
[32] 刘君华等，虚拟仪器编程语言 LabWindows/CVI 教程，电子工业
出版社，2001 年 8 月第一版，1－4。
[33] 李刚等，LabVIEW/易学易用的计算机图形化编程语言，北京航
空航天大学出版社，2001 年 10 月第一版，144－151。
[34] 段尚枢，运算放大器应用基础，哈尔滨工业大学出版社，1992 年 12
月第一版，54－57。
[35] 杨索行，模拟电子技术基础简明教程（第二版），371－374。
[36] 应怀憔，波形和频谱分析与随机数据处理，427－430
[37] [美]C.D.莫特钦巴切尔 F.C.菲特钦，低噪声电子设计，1977 年
[38] 陈其津，低噪声电路，1988 年
[39] 庄奕琪, 孙青,半导体器件中的噪声及其低噪声化技术，国防工业
出版社 1993.10