金属化薄膜储能电容器脉冲放电寿命研究
|
摘要
随着我国武器装备的发展,小体积、高可靠、高性能的金属化薄膜储能电容器得到了更广泛的应用。
论文通过对金属化薄膜储能电容器脉冲放电失容机理研究,找到金属化薄膜电容器充放电寿命的与放电回路及电极结构设计的关系,用以评估产品在脉冲放电领域充放电寿命应用的可靠性,为用户选型使用提供可靠的依据。本课题从有机薄膜储能脉冲电容器的耐温度冲击能力、耐电压能力、脉冲放电能力等方面试验数据的积累摸索,完成了以下工作:
1、获得有机薄膜储能电容器耐温度冲击能力评估;
2、获得有机薄膜储能电容器耐电压能力评估;
3、获得有机薄膜储能电容器耐电流能力评估。
With the development of China's weapons and equipment, small size, high reliability, high-performance energy storage metallized film capacitors has been more widely used.
In order to evaluate charge and discharge life reliability of metallized film capacitors and better usage of products for a reliable basis, the mechanism of pulse discharge loss of capacity of energy storage metallized film capacitors has been found. The metal film capacitors charge and discharge circuit, the life of the discharge electrode structure and design of their relationship have been also investigated. Moreover, the works of this paper focused on capacitor performance with capacity of resistance to thermal shock resistance, voltage capacity, pulse discharge abilities of the accumulation, and the related performance of devices were tested. The main works as follows:
1.Reliability evaluation about capacity of resistance to thermal shock of organic thin-film energy storage capacitor has been investigated;
2.Evaluation of anti-voltage endurance ability of thin-film energy storage capacitor capacity was studied;
3. Evaluation of anti-current endurance ability of thin-film energy storage capacitor was established.
论文通过对金属化薄膜储能电容器脉冲放电失容机理研究,找到金属化薄膜电容器充放电寿命的与放电回路及电极结构设计的关系,用以评估产品在脉冲放电领域充放电寿命应用的可靠性,为用户选型使用提供可靠的依据。本课题从有机薄膜储能脉冲电容器的耐温度冲击能力、耐电压能力、脉冲放电能力等方面试验数据的积累摸索,完成了以下工作:
1、获得有机薄膜储能电容器耐温度冲击能力评估;
2、获得有机薄膜储能电容器耐电压能力评估;
3、获得有机薄膜储能电容器耐电流能力评估。
With the development of China's weapons and equipment, small size, high reliability, high-performance energy storage metallized film capacitors has been more widely used.
In order to evaluate charge and discharge life reliability of metallized film capacitors and better usage of products for a reliable basis, the mechanism of pulse discharge loss of capacity of energy storage metallized film capacitors has been found. The metal film capacitors charge and discharge circuit, the life of the discharge electrode structure and design of their relationship have been also investigated. Moreover, the works of this paper focused on capacitor performance with capacity of resistance to thermal shock resistance, voltage capacity, pulse discharge abilities of the accumulation, and the related performance of devices were tested. The main works as follows:
1.Reliability evaluation about capacity of resistance to thermal shock of organic thin-film energy storage capacitor has been investigated;
2.Evaluation of anti-voltage endurance ability of thin-film energy storage capacitor capacity was studied;
3. Evaluation of anti-current endurance ability of thin-film energy storage capacitor was established.
引文
[1]何国瑞等.可靠性试验.中国电子产品可靠性与环境试验研究所. 1987
[2]何国伟等.可靠性试验技术.国防工业出版社.1999
[3]冲击大电流技术.清华大学电力系高压技术专业.科学出版社1978
[4] GJB360A-96电子及电气元件试验方法1996.6
[5]市田篙(日本)等.可靠性试验-环境、设备.北京机械工业出版社. 1987
[6]盐见弘(日本)等.可靠性试验-概论、部件.北京机械工业出版社. 1987
[7]胡昌寿等.可靠性工程-设计、试验、分析、管理(上册).北京宇航出版社. 1989
[8]王蕴辉等主编.电子元器件可靠性设计.科学出版社出版. 2007.9
[9]卢昆祥等主编.电子产品可靠性试验.天津科学技术出版社. 1987
[10] GB/T2693-2001(IEC60384-1).电子设备用固定电容器第一部分:总规范
[11] GB/T14579-93(IEC60384-17).电子设备用固定电容器第17部分:金属化聚丙烯膜介质交流和脉冲固定电容器
[12] GB1772-79.电子元器件失效率试验方法
[13]孔学东,恩云飞.电子元器件失效分析与典型案例.国防工业出版社. 2006
[14]陈才明.金属化电容器的电流负荷试验.西安电力电容器研究所编制. 2004
[15] JB/T8168-1999.脉冲电容器及直流电容器标准
[16] GB/T12802-1996.电容器用聚丙烯薄膜国家标准
[17]盐见弘(日)等,陈祝同译.失效分析及应用.北京.机械工业出版社. 1988
[18]应根裕等.电子器件.北京.清华大学出版社. 1989
[19]孙承永.电子元器件的失效分析.西安.西安电子科技大学出版社. 1988
[20]夏泓,郑鹏洲.电子元器件失效分析及应用.北京.国防工业出版社. 1998
[21]杨邦朝,王文生.薄膜物理与技术.电子科技大学出版社. 1994
[22]杨烈宇等.材料表面薄膜技术.人民交通出版社. 1991
[23]徐恒钧.材料科学基础.北京工业大学出版社. 2001
[24]陈季丹,刘子玉.电介质物理.机械工业出版社. 1982
[25]陈首兴等.脉冲电容器的快速寿命试验方法.电力电容器. 1990
[26]吴盛刚,姚斯立,杨海芳,李炜.高压脉冲电容器耐久性试验线路的设计及实施[J].电力电容器. 2006年03期
[27] Severns,r.:Electronic Design V.28,2,3,5,1980. 24～91
[28] Dekker,E.H.L.J: Electronic Components & ApplicationV.3,4,1981 . 201～206
[29] Lover,G,R: Proc.of 34th Electronic Components Conf.1984. 161～162
[30] Igarashi,Hitoshi:IEEE Trans,on CHMT ,V.6,4,1983. 360～363
[31] A.Nucci.S.Pirani.Pulse withstand capability of self-healing metallized polypropylene capacitors in power applications, IEEE Trans,Elect.Insul,Feb.1991
[32] C.W.Reed and S.W.Cichanowski,The fundamental of ageing in HV polymer-film capacitors, IEEE Trans,Elect.Insul,904～922,Oct.1994
[33] G.Picci and F.Poletti,Endurance test circuit for power capacitor,presented at the 23th International Power Modulator Symposium,Mirage,CA,1998
[34] H.Wada,K,Unami,S.Okuno,and K.Sudoh.Dry type low voltage power capacitor with safely mechanism, CIGRE,no,1992
[35]赵建印,刘芳,孙权,周经伦等.基于耗损失效模型的金属化膜脉冲电容器可靠性评估[J].强激光与粒子束. 2005年07期
[36]陈永真编著.电容器及其应用[M].科学出版社, 2005
[37]曾正中编著.实用脉冲功率技术引论[M].陕西科学技术出版社, 2003
[38]刘恩科等.半导体物理学.北京.电子工业出版社. 2003
[39]孔庆升.薄膜电子学.北京.电子工业出版社. 1994
[40]赵智大主编.高电压技术[M].中国电力出版社, 1999
[41]孔中华.金属化膜脉冲电容器若干问题的研究[D].华中科技大学2008
[42]刘明治编著.可靠性试验.电子工业出版社出版. 2004
[43]国家标准局. GB2693-2001固定电容器试验方法.国家标准总局.2001
[44] SJ/T10694-1996电子产品制造防静电系统测试方法.标准化研究所出版. 1997
[45]罗辑,赵和义.军用电子元器件质量管理与质量控制.国防工业出版社. 2004
[46]余振醒.军用元器件使用质量保证指南.北京航空工业出版社. 2003
[47]彭波.金属化膜电容器自愈关键参数研究[D].华中科技大学2010
[2]何国伟等.可靠性试验技术.国防工业出版社.1999
[3]冲击大电流技术.清华大学电力系高压技术专业.科学出版社1978
[4] GJB360A-96电子及电气元件试验方法1996.6
[5]市田篙(日本)等.可靠性试验-环境、设备.北京机械工业出版社. 1987
[6]盐见弘(日本)等.可靠性试验-概论、部件.北京机械工业出版社. 1987
[7]胡昌寿等.可靠性工程-设计、试验、分析、管理(上册).北京宇航出版社. 1989
[8]王蕴辉等主编.电子元器件可靠性设计.科学出版社出版. 2007.9
[9]卢昆祥等主编.电子产品可靠性试验.天津科学技术出版社. 1987
[10] GB/T2693-2001(IEC60384-1).电子设备用固定电容器第一部分:总规范
[11] GB/T14579-93(IEC60384-17).电子设备用固定电容器第17部分:金属化聚丙烯膜介质交流和脉冲固定电容器
[12] GB1772-79.电子元器件失效率试验方法
[13]孔学东,恩云飞.电子元器件失效分析与典型案例.国防工业出版社. 2006
[14]陈才明.金属化电容器的电流负荷试验.西安电力电容器研究所编制. 2004
[15] JB/T8168-1999.脉冲电容器及直流电容器标准
[16] GB/T12802-1996.电容器用聚丙烯薄膜国家标准
[17]盐见弘(日)等,陈祝同译.失效分析及应用.北京.机械工业出版社. 1988
[18]应根裕等.电子器件.北京.清华大学出版社. 1989
[19]孙承永.电子元器件的失效分析.西安.西安电子科技大学出版社. 1988
[20]夏泓,郑鹏洲.电子元器件失效分析及应用.北京.国防工业出版社. 1998
[21]杨邦朝,王文生.薄膜物理与技术.电子科技大学出版社. 1994
[22]杨烈宇等.材料表面薄膜技术.人民交通出版社. 1991
[23]徐恒钧.材料科学基础.北京工业大学出版社. 2001
[24]陈季丹,刘子玉.电介质物理.机械工业出版社. 1982
[25]陈首兴等.脉冲电容器的快速寿命试验方法.电力电容器. 1990
[26]吴盛刚,姚斯立,杨海芳,李炜.高压脉冲电容器耐久性试验线路的设计及实施[J].电力电容器. 2006年03期
[27] Severns,r.:Electronic Design V.28,2,3,5,1980. 24～91
[28] Dekker,E.H.L.J: Electronic Components & ApplicationV.3,4,1981 . 201～206
[29] Lover,G,R: Proc.of 34th Electronic Components Conf.1984. 161～162
[30] Igarashi,Hitoshi:IEEE Trans,on CHMT ,V.6,4,1983. 360～363
[31] A.Nucci.S.Pirani.Pulse withstand capability of self-healing metallized polypropylene capacitors in power applications, IEEE Trans,Elect.Insul,Feb.1991
[32] C.W.Reed and S.W.Cichanowski,The fundamental of ageing in HV polymer-film capacitors, IEEE Trans,Elect.Insul,904～922,Oct.1994
[33] G.Picci and F.Poletti,Endurance test circuit for power capacitor,presented at the 23th International Power Modulator Symposium,Mirage,CA,1998
[34] H.Wada,K,Unami,S.Okuno,and K.Sudoh.Dry type low voltage power capacitor with safely mechanism, CIGRE,no,1992
[35]赵建印,刘芳,孙权,周经伦等.基于耗损失效模型的金属化膜脉冲电容器可靠性评估[J].强激光与粒子束. 2005年07期
[36]陈永真编著.电容器及其应用[M].科学出版社, 2005
[37]曾正中编著.实用脉冲功率技术引论[M].陕西科学技术出版社, 2003
[38]刘恩科等.半导体物理学.北京.电子工业出版社. 2003
[39]孔庆升.薄膜电子学.北京.电子工业出版社. 1994
[40]赵智大主编.高电压技术[M].中国电力出版社, 1999
[41]孔中华.金属化膜脉冲电容器若干问题的研究[D].华中科技大学2008
[42]刘明治编著.可靠性试验.电子工业出版社出版. 2004
[43]国家标准局. GB2693-2001固定电容器试验方法.国家标准总局.2001
[44] SJ/T10694-1996电子产品制造防静电系统测试方法.标准化研究所出版. 1997
[45]罗辑,赵和义.军用电子元器件质量管理与质量控制.国防工业出版社. 2004
[46]余振醒.军用元器件使用质量保证指南.北京航空工业出版社. 2003
[47]彭波.金属化膜电容器自愈关键参数研究[D].华中科技大学2010