用于探测电致发光的单光子计数器的设计
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摘要
目前国内普遍采用的检测绝缘聚合物击穿性能的方法是测试其电性能，这种方法可靠性较低；本文提出了用探测电致发光来检测电介质老化、击穿性能的方法，重点研制了用于探测电致发光的单光子计数器，经测试计数器各部件性能良好，具有经济实用的特点。
绝缘聚合物的电致发光一般都非常微弱，功率都在10-16瓦以下，是典型的单光子，这给测试工作带来很大的困难，必须研制特殊的测试仪器。用光电倍增管（photomultiplier PMT）的光子计数模式将电致发光的光信号转换为电信号来进行测试。用幅度甄别器去掉大部分噪声，用脉冲计数器计数。一定时间内的计数值对应着相应的光功率。这就是用于检测微弱光的单光子计数器。经分析比较各种型号光电倍增管的性能及特点，本文采用EMI公司双碱阴极的9789QB管型光电倍增管。该管型的光谱范围在300～650nm，具有暗计数少，有单光子峰的特点，适于做单光子计数器；本文的光电倍增管分压器设计合理而冷却系统采用液氮，该系统体积小、结构简单、加工便利、成本低廉且性能良好。用Max4416放大器件作为前置放大器，用Max900系列比较器件作成窗口比较器，用高速器件74LS393两片作成16位的计数器，用单片机89C51读取数据，并处理后显示在液晶显示模块上。
实验证明本文设计的单光子计数器的噪声、量子效率、总灵敏度等主要指标完全符合设计要求；其最小探测功率比近期国内报道的光子计数器最小探测功率小。本文设计的单光子计数器可应用于聚合物性能的检测及新型绝缘材料的开发利用，也可推广到其他微弱光检测系统。
The present method for testing aging and breaking-down property of polymer is usually carried out by testing its electrical property. This conventional is of low reliability. This paper has established a new method for testing the aging and breaking-down property of polymer to develop new types of insulating materials by probing the electroluminescence of insulated polymers, which is in the highest flight at home. This paper mainly discusses the design of the single-photon-counter.
Electroluminescence (EL) is a weak light with its power under 10-16W, which can,t be detected with conventional method. We consider testing it using photon counting mode of photomultiplier PMT to transform light signals into electric signals. Much of the noise can be eliminated with an amplitude discriminator. The light can be counted with a pulse counter. The value counted in a certain length of time is in accordance with that of light power. This system used for testing weak light is called single-photon counter. The most important parameter in the single-photon counter is the total sensitivity. Noise level should be decreased and quantum efficiency should be raised in order to improve the total sensitivity, which needs a better cooling system. The multiplication system of the electron-multiplier phototube is based on electronic voltage. So, it is especially important to choose a suitable PMT and reasonably design PMT disparted-voltage-device. We adopt double alkali cathodal tube 9789QB, which was made by EMI corporation in England , as our photomultiplier, whose spectrum ranges between 300nm to 650nm, with less noise counters and single-photon apices, which make it suitable as a single-photon-counter. The disparted-voltage device is designed in a reasonable way and the cooling system of iquefied nitrogen which makes it small in size, simple in structure, easy in processing, cheap in cost and good in performance. We also magnify the signal with new IC amplifier, deduct yawp counters, design system to desl with data,total system is control by singlechip and can count in fastness time range and deal with data. This paper is of great importance in the testing of property of the polymer and in the development new type of insulating materials. And it can also be extended to other weak light testing system.
绝缘聚合物的电致发光一般都非常微弱，功率都在10-16瓦以下，是典型的单光子，这给测试工作带来很大的困难，必须研制特殊的测试仪器。用光电倍增管（photomultiplier PMT）的光子计数模式将电致发光的光信号转换为电信号来进行测试。用幅度甄别器去掉大部分噪声，用脉冲计数器计数。一定时间内的计数值对应着相应的光功率。这就是用于检测微弱光的单光子计数器。经分析比较各种型号光电倍增管的性能及特点，本文采用EMI公司双碱阴极的9789QB管型光电倍增管。该管型的光谱范围在300～650nm，具有暗计数少，有单光子峰的特点，适于做单光子计数器；本文的光电倍增管分压器设计合理而冷却系统采用液氮，该系统体积小、结构简单、加工便利、成本低廉且性能良好。用Max4416放大器件作为前置放大器，用Max900系列比较器件作成窗口比较器，用高速器件74LS393两片作成16位的计数器，用单片机89C51读取数据，并处理后显示在液晶显示模块上。
实验证明本文设计的单光子计数器的噪声、量子效率、总灵敏度等主要指标完全符合设计要求；其最小探测功率比近期国内报道的光子计数器最小探测功率小。本文设计的单光子计数器可应用于聚合物性能的检测及新型绝缘材料的开发利用，也可推广到其他微弱光检测系统。
The present method for testing aging and breaking-down property of polymer is usually carried out by testing its electrical property. This conventional is of low reliability. This paper has established a new method for testing the aging and breaking-down property of polymer to develop new types of insulating materials by probing the electroluminescence of insulated polymers, which is in the highest flight at home. This paper mainly discusses the design of the single-photon-counter.
Electroluminescence (EL) is a weak light with its power under 10-16W, which can,t be detected with conventional method. We consider testing it using photon counting mode of photomultiplier PMT to transform light signals into electric signals. Much of the noise can be eliminated with an amplitude discriminator. The light can be counted with a pulse counter. The value counted in a certain length of time is in accordance with that of light power. This system used for testing weak light is called single-photon counter. The most important parameter in the single-photon counter is the total sensitivity. Noise level should be decreased and quantum efficiency should be raised in order to improve the total sensitivity, which needs a better cooling system. The multiplication system of the electron-multiplier phototube is based on electronic voltage. So, it is especially important to choose a suitable PMT and reasonably design PMT disparted-voltage-device. We adopt double alkali cathodal tube 9789QB, which was made by EMI corporation in England , as our photomultiplier, whose spectrum ranges between 300nm to 650nm, with less noise counters and single-photon apices, which make it suitable as a single-photon-counter. The disparted-voltage device is designed in a reasonable way and the cooling system of iquefied nitrogen which makes it small in size, simple in structure, easy in processing, cheap in cost and good in performance. We also magnify the signal with new IC amplifier, deduct yawp counters, design system to desl with data,total system is control by singlechip and can count in fastness time range and deal with data. This paper is of great importance in the testing of property of the polymer and in the development new type of insulating materials. And it can also be extended to other weak light testing system.
引文
1 电介质物理. 北京：机械工业出版社， 1983
2 绝缘材料标准汇编. 北京：技术标准出版社，1983
3 徐传骧, 刘辅宜. 工程电介质物理基础与进展. 西安：西安交通大学硕士讲义， 1995
4 G. Teyssedre,C.Laurent.Comparison between photo-,cathodo-,and electrical aging. France, 543-546, Proceeds IEEE,2000
5 W.Becher and Hichl, C.Zander and K.H.Drexhage, M.Sauer, S.Siebert, and J.Wolfrum. Time-reslolved detedtion and identification of single analyte molecules in microcapillaries by time-correlated single-photon counting Review of scientific instruments. 1999, Vol 70: Number 3
6 徐华盛, 孙键, 申屠军. 门控微通道板光电倍增管组件. 光电子技术. 1999,19 (2)
7 宋登元，王小平. APD、PMT及其混合型灵敏光电探测器. 半导体技术，25卷，3期 2000
8 阎金良，石中和. 微通道板防离子反馈膜新工艺 光子学报 Vol.27 No.7 1998
9 陈成杰, 徐正卜. 光电倍增管. 北京：原子能出版社，1988
10 林晓东. 光电倍增管热噪声特性实验研究. 深圳大学学报（理工版）. 1998，4 24-27
11 Shigeki takeuchi、Jungsang ,Yoshihisa Yamamoto,Henry H.Hogue. Development of a high-quantum-efficiency single-photon counting system. Applied Physics Letters. 1999, Volume 74( Number 8): 22
12 F.Kabir, J.M..Braun, R.J.Densley R.N.Hampton, and M.Walton. The Role of XLPE Type on Electroluminescence and Subsequent Electrical Treeing. Proceeds ,IEEE Int.Symp. Elect.Insul, Montreal Canada. 1996, pp691-694
13 M.Kaufhold, S.S.Bamji and A.T.Bulinski . Time Resolved Measurements of Electroluminescence in XLPE under Impulse Voltage Conditions . Proceeds IEEE, Int ,Symp.elect.Insul ,Montreal ,Canada ,pp686-690 1996
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15 F.Massines P.Tiemblo G.Tesseydre and C.Laurent . On the Nature of the Luminescence Emitted By a Polypropylene Film after Interaction with a Cold Plasma at Low Temperature ,.Applied physic . 1997, Vol 81: pp 937-943
16 王欲知. 真空技术. 成都：四川人民出版社，1981
17 翁渝民等. 单光子计数器. 复旦学报. 1979, 2
18（加）W·比尤迪 光辐射实用探测器 机械工业出版社 1988
19 李琼瑞. 国外最新应用电路设计精选 北京：电子工业出版社 1998
20 刘卫东，刘延冰，刘建国. 检测微弱信号的PIN光电检测电路的设计 电测与仪表 第四期 1999
21 武兴建. 光电倍增管原理特性及应用. 国外电子元器件. 2001, 8 13-17
22 孙慕渊. 光电倍增管的探测能力. 咸宁师专学报. 2001, 3 41-42
23 颜严, 罗山. 光电倍增管引导弱光探测. 激光与光电子学进展. 2000, 2 38
24 周荣楣. 光电倍增管展望. 光电子技术. 2000, 2 84-89
25 宋登元, 孙同文. 光电倍增管的特性结构及选取考虑. 中国仪器仪表. 1999, 5 33～35
26 Vasills Nlziachristos Xuhui Ma and Britton Chance Time-correlated single photon counting imager for simultaneous magnetic resonance and near-infrared Mammography Review of Scientific instruments Vol 69, Number 12 1998
27 G.B.Turner, M.G.Stapelbroek, M.D.Petroff, E.W.Atkins, and H.H.Hogue. In scifi 93-workshop on scintillating fiber detectors. Edited by A.D.Bross,R.C.Ruchti,and W.R.Wayne 1998
28 胡乃生, 孙京红. 半导体制冷技术及应用. 河南科技. 2000, 5 23
29马乔矢. 半导体制冷技术的应用和发展. 河南建筑工程学院学报. 1999,1 82-86
30谈欣柏, 章毛连 半导体制冷技术及其应用. 安徽农业技术师范学院学报. 1996, 10 56-60
31 任静, 罗经纬. 低温制冷技术在光电器件中的应用及发展. 低温与超导. 2000, 4 6-12
32杭州建华半导体制冷器有限公司. 半导体致冷片规格与型号. http:go1.163.com
33 徐德盛 半导体制冷与应用技术 上海交通大学出版社. 1999
34 A.B.Davis, C.Ho, and S.P.love, Off-beam lidar returns from stratus ,2: Space-time measurement in a laboratory simulation , In Proceeding of the 19th International laser radar conference ,U.singh , S.Ismail,and G.Schwenmmer, eds pp.55-58 1998
35 Cheng Ho, Kevin L.Albright, Alan W.bird, Jeffrey Bradley, Donald E.Casperson,Miles Hindman, Willim C.Priedhorsky, W.Robert Scarlet, R.Clayton Smith, James Theiler, and S.Kerry Wilson Demonstration of literal three-dimensional imaging APPLIED OPTICS Vol.38 No.9 1999
36 Jungsang Kim, Shigeki Takeuchi, and Yoshihisa Yamamoto Multiphoton detection using visible light photon counter Applied physics letters Volume74, Number 7 1999
37 颜荣江，詹树仁. MAXIM热门集成电路使用手册. 北京：人民邮电出版社, 1999
38 阎石. 数字电子技术基础. 北京：高等教育出版社, 1997
39 张振荣，晋明武，王毅平. MCS-51单片机原理及实用技术. 北京：人民邮电出版社, 2000
40 朱宇光，陆锦军，黄忠良，高玉芹. 单片机应用新技术教程. 北京：电子工业出版社, 2000
41 刘乐善，欧阳星明，刘学清. 微型计算机接口技术及应用. 武汉：华中理工大学出版社, 2001
42 熊燕玲. 热激电流和热释光联合测量装置的研制. 哈尔滨电工学院硕士论文. 1995
43 王暄. 新型的热激电流自动测量. 西安交通大学博士论文. 1991
44 童诗白. 模拟电子技术基础. 北京：高等教育出版社, 2000
2 绝缘材料标准汇编. 北京：技术标准出版社，1983
3 徐传骧, 刘辅宜. 工程电介质物理基础与进展. 西安：西安交通大学硕士讲义， 1995
4 G. Teyssedre,C.Laurent.Comparison between photo-,cathodo-,and electrical aging. France, 543-546, Proceeds IEEE,2000
5 W.Becher and Hichl, C.Zander and K.H.Drexhage, M.Sauer, S.Siebert, and J.Wolfrum. Time-reslolved detedtion and identification of single analyte molecules in microcapillaries by time-correlated single-photon counting Review of scientific instruments. 1999, Vol 70: Number 3
6 徐华盛, 孙键, 申屠军. 门控微通道板光电倍增管组件. 光电子技术. 1999,19 (2)
7 宋登元，王小平. APD、PMT及其混合型灵敏光电探测器. 半导体技术，25卷，3期 2000
8 阎金良，石中和. 微通道板防离子反馈膜新工艺 光子学报 Vol.27 No.7 1998
9 陈成杰, 徐正卜. 光电倍增管. 北京：原子能出版社，1988
10 林晓东. 光电倍增管热噪声特性实验研究. 深圳大学学报（理工版）. 1998，4 24-27
11 Shigeki takeuchi、Jungsang ,Yoshihisa Yamamoto,Henry H.Hogue. Development of a high-quantum-efficiency single-photon counting system. Applied Physics Letters. 1999, Volume 74( Number 8): 22
12 F.Kabir, J.M..Braun, R.J.Densley R.N.Hampton, and M.Walton. The Role of XLPE Type on Electroluminescence and Subsequent Electrical Treeing. Proceeds ,IEEE Int.Symp. Elect.Insul, Montreal Canada. 1996, pp691-694
13 M.Kaufhold, S.S.Bamji and A.T.Bulinski . Time Resolved Measurements of Electroluminescence in XLPE under Impulse Voltage Conditions . Proceeds IEEE, Int ,Symp.elect.Insul ,Montreal ,Canada ,pp686-690 1996
15 F.Massines P.Tiemblo G.Tesseydre and C.Laurent . On the Nature of the Luminescence Emitted By a Polypropylene Film after Interaction with a Cold Plasma at Low Temperature ,.Applied physic . 1997, Vol 81: pp 937-943
16 王欲知. 真空技术. 成都：四川人民出版社，1981
17 翁渝民等. 单光子计数器. 复旦学报. 1979, 2
18（加）W·比尤迪 光辐射实用探测器 机械工业出版社 1988
19 李琼瑞. 国外最新应用电路设计精选 北京：电子工业出版社 1998
20 刘卫东，刘延冰，刘建国. 检测微弱信号的PIN光电检测电路的设计 电测与仪表 第四期 1999
21 武兴建. 光电倍增管原理特性及应用. 国外电子元器件. 2001, 8 13-17
22 孙慕渊. 光电倍增管的探测能力. 咸宁师专学报. 2001, 3 41-42
23 颜严, 罗山. 光电倍增管引导弱光探测. 激光与光电子学进展. 2000, 2 38
24 周荣楣. 光电倍增管展望. 光电子技术. 2000, 2 84-89
25 宋登元, 孙同文. 光电倍增管的特性结构及选取考虑. 中国仪器仪表. 1999, 5 33～35
26 Vasills Nlziachristos Xuhui Ma and Britton Chance Time-correlated single photon counting imager for simultaneous magnetic resonance and near-infrared Mammography Review of Scientific instruments Vol 69, Number 12 1998
27 G.B.Turner, M.G.Stapelbroek, M.D.Petroff, E.W.Atkins, and H.H.Hogue. In scifi 93-workshop on scintillating fiber detectors. Edited by A.D.Bross,R.C.Ruchti,and W.R.Wayne 1998
28 胡乃生, 孙京红. 半导体制冷技术及应用. 河南科技. 2000, 5 23
29马乔矢. 半导体制冷技术的应用和发展. 河南建筑工程学院学报. 1999,1 82-86
30谈欣柏, 章毛连 半导体制冷技术及其应用. 安徽农业技术师范学院学报. 1996, 10 56-60
31 任静, 罗经纬. 低温制冷技术在光电器件中的应用及发展. 低温与超导. 2000, 4 6-12
33 徐德盛 半导体制冷与应用技术 上海交通大学出版社. 1999
34 A.B.Davis, C.Ho, and S.P.love, Off-beam lidar returns from stratus ,2: Space-time measurement in a laboratory simulation , In Proceeding of the 19th International laser radar conference ,U.singh , S.Ismail,and G.Schwenmmer, eds pp.55-58 1998
35 Cheng Ho, Kevin L.Albright, Alan W.bird, Jeffrey Bradley, Donald E.Casperson,Miles Hindman, Willim C.Priedhorsky, W.Robert Scarlet, R.Clayton Smith, James Theiler, and S.Kerry Wilson Demonstration of literal three-dimensional imaging APPLIED OPTICS Vol.38 No.9 1999
36 Jungsang Kim, Shigeki Takeuchi, and Yoshihisa Yamamoto Multiphoton detection using visible light photon counter Applied physics letters Volume74, Number 7 1999
37 颜荣江，詹树仁. MAXIM热门集成电路使用手册. 北京：人民邮电出版社, 1999
38 阎石. 数字电子技术基础. 北京：高等教育出版社, 1997
39 张振荣，晋明武，王毅平. MCS-51单片机原理及实用技术. 北京：人民邮电出版社, 2000
40 朱宇光，陆锦军，黄忠良，高玉芹. 单片机应用新技术教程. 北京：电子工业出版社, 2000
41 刘乐善，欧阳星明，刘学清. 微型计算机接口技术及应用. 武汉：华中理工大学出版社, 2001
42 熊燕玲. 热激电流和热释光联合测量装置的研制. 哈尔滨电工学院硕士论文. 1995
43 王暄. 新型的热激电流自动测量. 西安交通大学博士论文. 1991
44 童诗白. 模拟电子技术基础. 北京：高等教育出版社, 2000