阵列式自动光学检测方法研究
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摘要
AOI(Automated Optical Inspection)为自动光学检测,是用高性能数码相机(camera)摄取影像,而影像是由像素组成,系统将实际影像进行分析,与标准影像比对之后,即可判定是通过或错误,称为pixel grid processing,属于一种外观检验的方式。随着产业工艺进化,元件微型化趋势不断推进,AOI在SMT(表面贴装技术)业内蓬勃发展,新的元件规格对原有的AOI系统的处理精度及速度提出了挑战,而另一种AOI系统架构更显优势:阵列影像侦测系统。
     针对影像模组,为适应里面的硬件式编和各存储器大小的限制,提出了图像数值化的检测方法,是用图像的几项特征值代表图像本身进行检测。
     对于PC本身,提出了图像对比方法,这时一种模版匹配方法,是计算检测图与模版图(标准图)的相似程度一种检测方法。在检测前,进行了放缩与模糊的操作。
     针对元件、电路板上的文字本身,提出了文字投射检测方法,这是用文字进行投影后,计算投影曲线与标准曲线的差异程度来检测的方法。在检测前,进行收缩膨胀、图像增强的预处理操作。
     这些方法适用于阵列式AOI的各个部分,可以在各自的地方进行检测工作,以达到全部检测的目的。
AOI is short for Automated Optical Inspection,using high-performance digital camera to take images, while the images are formed by the pixels.This system analysis the actual image ,compared with standard imaging features, after, you can determine this is right or wrong.This process is known as the pixel grid processing ,belong the appearance test approach.. With the development of the industry techniques, AOI is flourished and progressing quickly. Facing the challenge, which from the new part specification, another AOI system architecture is brought forward, that is Array, arranged Image System.
     For the image module, In order to meet the hardware-based series inside and the memory size limit, we make the image values method .This detection method is using several image characteristic values as the image itself , then use they to test.
     For the PC itself, we make the method of image compare, one of a template matching method . It is a method that calculate degree of similitude between the inspect image and the template image(standard image) .Before that we can use zoom operation and fuzzy operaton as pretreatement.
     For the text on components and circuit board. We make the character text projection inspect method . After project character, we calculate the degree of difference between text projection cruve and the standard projection cruve. Before that we use corrosion expansion operation and image enhance operation as pretreatement.
     These methods applied to various parts of AOI array and can be tested in their respective areas of work in order to achieve the purpose of all inspection.
引文
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