开关电流电路测试与故障诊断方法研究
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摘要
开关电流(Switched Current, SI)技术是20世纪80年代末提出的一门完全采用数字CMOS工艺技术的模拟采样数据信号处理技术,作为开关电容的替代技术,开关电流电路是基于电流模的电路,它用离散时间的取样数据系统处理连续时间的模拟信号,具有低电压、低功耗、高速度、芯片面积小、高频特性好和动态范围大等优点。开关电流技术不需要线性浮置电容和高性能的运算放大器,从而与标准CMOS工艺完全兼容,有利于大规模集成数模混合电路的实现。在离散时间模拟电路领域,开关电流技术越来越被认为可以取代开关电容技术。
现代电子和计算机技术的迅猛发展促进了片上系统、混合集成电路的大量涌现,也使电子设备的组成和结构越来越复杂,规模越来越庞大,为了提高系统的安全性和可靠性,对电路测试提出了更高、更新的要求,研究高效、顺应电路发展需求的故障诊断理论和方法迫在眉睫。经过多年的发展,模拟电路测试与故障诊断已经取得了一定的研究成果。然而,在开关电流电路的测试和故障诊断方面儿乎仍是空白,这极大地限制了数字工艺的模拟技术—开关电流技术的发展,而且,开关电流电路中MOS晶体管的非理想性、非零输出电导、有限带宽和开关电荷注入等原因决定了开关电流电路测试和故障诊断是一个相当困难的课题,一直没有取得系统性和突破性的进展。基于此,本文对开关电流电路测试与故障诊断方法进行了系统而深入的研究,对基于故障模型的开关电流电路硬故障测试方法作了初步研究,在此基础上,提出了几种新的开关电流电路测试与故障诊断方法并用电路实例进行了验证。本文完成的主要工作包括：
1、综述了开关电流技术的发展及相对开关电容技术的优势。介绍了开关电流仿真软件ASIZ及其基本功能及特点。接着详细分析了开关电流电路硬故障和软故障模型,对基于故障模型的开关电流硬故障测试方法作了初步研究,对两个电路进行了实例测试。
2、提出了一种用伪随机技术进行开关电流电路测试的方法。将伪随机激励信号引入到开关电流电路测试中,讨论了伪随机测试技术在开关电流电路测试的应用,通过检测和对比故障特征信号(脉冲响应样本)与器件容差范围,我们不用明确测量原始性能参数,就能正确地对被测器件进行故障识别。讨论了伪随机激励信号的生成,论述了在工艺制板空间、器件空间、性能空间和识别特征空间进行空间映射的方法以及特征信号的容差范围。以一个5阶巴特沃斯低通开关电流滤波器和一个6阶椭圆带通滤波器为例进行了测试验证,对开关电流电路基本故障类型进行了仿真测试,结果证明了测试和故障诊断方法的有效性。
3、提出了一个新颖的基于故障字典和熵预处理的开关电流电路故障诊断方法。该方法应用信息熵预处理技术来诊断开关电流电路中的故障,使用一个数据采集板从被测电路的输出端提取原始信号,这些原始数据被经过预处理,找到包含在信号中的定量度量——信号的信息熵。该方法通过高精度分析输出端信号,对开关电流电路中的故障晶体管具有检测和识别能力。利用信息熵预处理电路响应大大降低了故障字典的大小,减少了故障检测时间,并简化了故障字典架构。该方法不仅能分类灾难性故障,也能定位参数性故障,它既应用于模拟电路又可应用于开关电流电路。一个低通和带通开关电流滤波器和一个时钟馈通补偿电路被用做电路实例来验证所提出方法的有效性。结果表明,所提出的方法仅仅使用一个特征参数减少了计算和故障诊断时间。
4、提出了一个基于神经网络的开关电流电路故障诊断方法。该方法利用一个数据采集板从被测器件的输出端提取到神经网络的原始训练数据,这些原始数据通过特征选择后,找出信号的峭度和熵,因此能大大减少神经网络分类器输入端数目,简化神经网络的结构,减少训练和处理时间和改善了网络的性能。通过分析电路输出端信号,该系统能够高精度地检测和定位开关电流电路中的故障晶体管,达到98%的故障分类精度。研究表明：利用ASIZ仿真能够提取适当的特征参数来训练神经网络。而且,因为神经网络在噪声环境下能达到鲁棒的分类,该技术不仅能检测和定位硬故障而且能分类软故障。当电路中同时发生故障的故障品体管数目和故障类别数较大时,该方法能获得较高的故障分类率。
Switching Current (Switched Current SI) technology is a simulation sampling data signal processing technology completely adopt digital CMOS process technology which has been bring forward by the late1980s.The switched current technique, based on current mode, is a continuous time analog signal processing technique using discrete time sampled-data system that aims to replace switched-capacitors (SC). It also has the advantages of low-voltage, low-power, high-speed, small size, broadband, good high-frequency characteristics and large dynamic range. Switched Current technology does not require linear floating capacitance and high-performance operational amplifiers and compatible with standard digital CMOS process completely, which is an attractive feature due to the tendency for the integration of large analog/digital systems in a single chip. In the field of discrete-time analog circuits, the SI technique becomes more and more recognized as an interesting alternative to the classical switched capacitor (SC) technique.
The rapid progress in modern electronic and computer technology promotes the advent of system-on-chip and mixed-signal integrated circuits. On the other hand, the structure of electronic equipment become more complex and the scale become huger. Higher and newly demands on circuit test are put in order to improving the reliability of electronic equipment. Intensive study on fault diagnosis theories and methods is urgent task. With many years'development, the analog circuit tests acquire some research progress. However, concerning the testing aspect, the test and fault diagnosis techniques proposed for switched current circuit are still almost empty, which greatly limits the development of switched current technology. Moreover, because of non-ideal characteristics, non-zero output conductance, limited bandwidth and switch charge injection of MOS transistor in the switched current circuit, these factors determine that the switched-current circuit testing and fault diagnosis is a very difficult tast, and the systematic and breakthrough progress has not made. Based on this, in the paper, the testing and fault diagnosis methods for switched current circuit are deeply researched systematically. The hard fault test method of switched current circuit based on fault model is preliminary studied. On this basis, several new switching current circuit test and fault diagnosis methods are proposed, and circuit examples are used to verify. The main contributions of this dissertation are presented as follows:
1. The development and advantages of switched-current technology are summaried compared with SC technique. The basic functions and features of switching current ASIZ simulation software are introduced. Then the hard fault and soft fault model of switched current circuit are analysised systematically. The hard fault test method of switched current circuit based on fault model is preliminary studied. The two examples of switched current circuit are tested.
2. Switched current circuits test using Pseudo Random method is proposed. Pseudo-random excitation signal is introduced to the SI circuits test, and the application of pseudo-random testing techniques is discussed. By checking the constructed signatures (impulse response samples) against the derived tolerance ranges, we can infer the correctness of the device under test (DUT) without explicitly measuring the original performance parameters. The generation of pseudo-random excitation signal. We also describe a technique of mapping the tolerance ranges in the process board space, the device space, performance space and the signature space. A fifth order Butterworth low-pass filter and a sixth order Elliptic band-pass filter have been used as test benches to assess the effectiveness of the proposed technique. Test results demonstrate that high fault coverage can be achieved with low cost test equipments.
3. A novel method based on a fault dictionary that uses entropy as a preprocessor to diagnose faulty behavior in switched-current (SI) circuit is presented. The proposed method uses a data acquisition board to extract the original signal form the output terminals of the circuit-under-test (CUTs). These original data are fed to the preprocessors for feature extraction and finds out the entropies of the signals which are a quantitative measure of the information contained in the signals. The proposed method has the capability to detect and identify faulty transistors in SI circuit by analyzing its output signals with high accuracy. Using entropy of signals to preprocess the circuit response drastically reduces the size of fault dictionary, minimizing fault detect time and simplifying fault dictionary architecture. The method can classify not only parametric faults but also catastrophic faults. It is applicable to analog circuits as well as switched-current ones. A low-pass and a band-pass SI filter and a Clock feedthrough cancellation circuit (CKFT) have been used as test beached to verify the effectiveness of the proposed method. The result reveals that our method requiring one feature parameter reduces the computation and fault diagnosis time.
4. A switched-current (SI) circuit fault diagnosis system based an backpropagation (BP) neural networks is proposed. Our system uses a data acquisition board to extract the original training data for the neural network from the output terminals of the circuit-under-test (CUT). The original data are preprocessed by feature extraction to find out the entropy and kurtosis of signals. As a result, using entropy and kurtosis of signals to preprocess the impulse responses drastically reduces the number of inputs to the neural network classifier, simplifying its architecture, minimizing its training and processing time and improving the performance of the network. Our fault diagnostic system, trained and tested using our proposed preprocessing techniques, achieves98%accuracy in classifying faulty transistors. Our work also shows that ASIZ simulations can be used to extract appropriate features for training the neural network. Moreover, the neural network based preprocessing and fault dictionary technique can locate and identify not only hard faults but also soft fault because neural networks are capable of robust classification even in noisy environment. When there are a large number transistors occurring failure simultaneously, the method can achieve high rates of fault classification.
现代电子和计算机技术的迅猛发展促进了片上系统、混合集成电路的大量涌现,也使电子设备的组成和结构越来越复杂,规模越来越庞大,为了提高系统的安全性和可靠性,对电路测试提出了更高、更新的要求,研究高效、顺应电路发展需求的故障诊断理论和方法迫在眉睫。经过多年的发展,模拟电路测试与故障诊断已经取得了一定的研究成果。然而,在开关电流电路的测试和故障诊断方面儿乎仍是空白,这极大地限制了数字工艺的模拟技术—开关电流技术的发展,而且,开关电流电路中MOS晶体管的非理想性、非零输出电导、有限带宽和开关电荷注入等原因决定了开关电流电路测试和故障诊断是一个相当困难的课题,一直没有取得系统性和突破性的进展。基于此,本文对开关电流电路测试与故障诊断方法进行了系统而深入的研究,对基于故障模型的开关电流电路硬故障测试方法作了初步研究,在此基础上,提出了几种新的开关电流电路测试与故障诊断方法并用电路实例进行了验证。本文完成的主要工作包括：
1、综述了开关电流技术的发展及相对开关电容技术的优势。介绍了开关电流仿真软件ASIZ及其基本功能及特点。接着详细分析了开关电流电路硬故障和软故障模型,对基于故障模型的开关电流硬故障测试方法作了初步研究,对两个电路进行了实例测试。
2、提出了一种用伪随机技术进行开关电流电路测试的方法。将伪随机激励信号引入到开关电流电路测试中,讨论了伪随机测试技术在开关电流电路测试的应用,通过检测和对比故障特征信号(脉冲响应样本)与器件容差范围,我们不用明确测量原始性能参数,就能正确地对被测器件进行故障识别。讨论了伪随机激励信号的生成,论述了在工艺制板空间、器件空间、性能空间和识别特征空间进行空间映射的方法以及特征信号的容差范围。以一个5阶巴特沃斯低通开关电流滤波器和一个6阶椭圆带通滤波器为例进行了测试验证,对开关电流电路基本故障类型进行了仿真测试,结果证明了测试和故障诊断方法的有效性。
3、提出了一个新颖的基于故障字典和熵预处理的开关电流电路故障诊断方法。该方法应用信息熵预处理技术来诊断开关电流电路中的故障,使用一个数据采集板从被测电路的输出端提取原始信号,这些原始数据被经过预处理,找到包含在信号中的定量度量——信号的信息熵。该方法通过高精度分析输出端信号,对开关电流电路中的故障晶体管具有检测和识别能力。利用信息熵预处理电路响应大大降低了故障字典的大小,减少了故障检测时间,并简化了故障字典架构。该方法不仅能分类灾难性故障,也能定位参数性故障,它既应用于模拟电路又可应用于开关电流电路。一个低通和带通开关电流滤波器和一个时钟馈通补偿电路被用做电路实例来验证所提出方法的有效性。结果表明,所提出的方法仅仅使用一个特征参数减少了计算和故障诊断时间。
4、提出了一个基于神经网络的开关电流电路故障诊断方法。该方法利用一个数据采集板从被测器件的输出端提取到神经网络的原始训练数据,这些原始数据通过特征选择后,找出信号的峭度和熵,因此能大大减少神经网络分类器输入端数目,简化神经网络的结构,减少训练和处理时间和改善了网络的性能。通过分析电路输出端信号,该系统能够高精度地检测和定位开关电流电路中的故障晶体管,达到98%的故障分类精度。研究表明：利用ASIZ仿真能够提取适当的特征参数来训练神经网络。而且,因为神经网络在噪声环境下能达到鲁棒的分类,该技术不仅能检测和定位硬故障而且能分类软故障。当电路中同时发生故障的故障品体管数目和故障类别数较大时,该方法能获得较高的故障分类率。
Switching Current (Switched Current SI) technology is a simulation sampling data signal processing technology completely adopt digital CMOS process technology which has been bring forward by the late1980s.The switched current technique, based on current mode, is a continuous time analog signal processing technique using discrete time sampled-data system that aims to replace switched-capacitors (SC). It also has the advantages of low-voltage, low-power, high-speed, small size, broadband, good high-frequency characteristics and large dynamic range. Switched Current technology does not require linear floating capacitance and high-performance operational amplifiers and compatible with standard digital CMOS process completely, which is an attractive feature due to the tendency for the integration of large analog/digital systems in a single chip. In the field of discrete-time analog circuits, the SI technique becomes more and more recognized as an interesting alternative to the classical switched capacitor (SC) technique.
The rapid progress in modern electronic and computer technology promotes the advent of system-on-chip and mixed-signal integrated circuits. On the other hand, the structure of electronic equipment become more complex and the scale become huger. Higher and newly demands on circuit test are put in order to improving the reliability of electronic equipment. Intensive study on fault diagnosis theories and methods is urgent task. With many years'development, the analog circuit tests acquire some research progress. However, concerning the testing aspect, the test and fault diagnosis techniques proposed for switched current circuit are still almost empty, which greatly limits the development of switched current technology. Moreover, because of non-ideal characteristics, non-zero output conductance, limited bandwidth and switch charge injection of MOS transistor in the switched current circuit, these factors determine that the switched-current circuit testing and fault diagnosis is a very difficult tast, and the systematic and breakthrough progress has not made. Based on this, in the paper, the testing and fault diagnosis methods for switched current circuit are deeply researched systematically. The hard fault test method of switched current circuit based on fault model is preliminary studied. On this basis, several new switching current circuit test and fault diagnosis methods are proposed, and circuit examples are used to verify. The main contributions of this dissertation are presented as follows:
1. The development and advantages of switched-current technology are summaried compared with SC technique. The basic functions and features of switching current ASIZ simulation software are introduced. Then the hard fault and soft fault model of switched current circuit are analysised systematically. The hard fault test method of switched current circuit based on fault model is preliminary studied. The two examples of switched current circuit are tested.
2. Switched current circuits test using Pseudo Random method is proposed. Pseudo-random excitation signal is introduced to the SI circuits test, and the application of pseudo-random testing techniques is discussed. By checking the constructed signatures (impulse response samples) against the derived tolerance ranges, we can infer the correctness of the device under test (DUT) without explicitly measuring the original performance parameters. The generation of pseudo-random excitation signal. We also describe a technique of mapping the tolerance ranges in the process board space, the device space, performance space and the signature space. A fifth order Butterworth low-pass filter and a sixth order Elliptic band-pass filter have been used as test benches to assess the effectiveness of the proposed technique. Test results demonstrate that high fault coverage can be achieved with low cost test equipments.
3. A novel method based on a fault dictionary that uses entropy as a preprocessor to diagnose faulty behavior in switched-current (SI) circuit is presented. The proposed method uses a data acquisition board to extract the original signal form the output terminals of the circuit-under-test (CUTs). These original data are fed to the preprocessors for feature extraction and finds out the entropies of the signals which are a quantitative measure of the information contained in the signals. The proposed method has the capability to detect and identify faulty transistors in SI circuit by analyzing its output signals with high accuracy. Using entropy of signals to preprocess the circuit response drastically reduces the size of fault dictionary, minimizing fault detect time and simplifying fault dictionary architecture. The method can classify not only parametric faults but also catastrophic faults. It is applicable to analog circuits as well as switched-current ones. A low-pass and a band-pass SI filter and a Clock feedthrough cancellation circuit (CKFT) have been used as test beached to verify the effectiveness of the proposed method. The result reveals that our method requiring one feature parameter reduces the computation and fault diagnosis time.
4. A switched-current (SI) circuit fault diagnosis system based an backpropagation (BP) neural networks is proposed. Our system uses a data acquisition board to extract the original training data for the neural network from the output terminals of the circuit-under-test (CUT). The original data are preprocessed by feature extraction to find out the entropy and kurtosis of signals. As a result, using entropy and kurtosis of signals to preprocess the impulse responses drastically reduces the number of inputs to the neural network classifier, simplifying its architecture, minimizing its training and processing time and improving the performance of the network. Our fault diagnostic system, trained and tested using our proposed preprocessing techniques, achieves98%accuracy in classifying faulty transistors. Our work also shows that ASIZ simulations can be used to extract appropriate features for training the neural network. Moreover, the neural network based preprocessing and fault dictionary technique can locate and identify not only hard faults but also soft fault because neural networks are capable of robust classification even in noisy environment. When there are a large number transistors occurring failure simultaneously, the method can achieve high rates of fault classification.
引文
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