面向多品种小批量微小偏差的SPC及应用研究
|
摘要
本文综述了小批量生产方式的特点和多品种小批量生产方式下SPC(Statistical Process Control:统计过程控制)应用的动态,指出应用常规控制图理论的SPC系统不适用于多品种小批量生产,可能出现控制图无法建立或者检出力偏低等问题。并分析了通用控制图的特点及优势以及应用通用控制图解决小批量生产中样本数量不足的问题。
针对微小偏差SPC中应用常规控制图检出力偏低的问题,提出应用累积和控制图(Cumulative-Sum:CUSUM)和指数加权移动平均控制图(Exponentially Weighted Moving-Averages:EWMA)加以解决。之后分别分析了累积和控制图和指数加权移动平均控制图的原理、设计方法,并用实例与常规控制图进行了分析比较,例证了累积和控制图和指数加权移动平均控制图针对微小偏差SPC的灵敏性。讨论了通用控制图中的标准变换应用于累积和控制图与指数加权移动平均控制图的可行性,并举例进行了说明。比较了累积和控制图和指数加权移动平均控制图的细微差别,指出累积和控制图对一倍至一点五倍标准差的偏差反映较灵敏,指数加权移动平均控制图针对一倍标准差以内的偏差反应较灵敏,从而提出将通用控制图、累积和控制图、指数加权移动平均控制图相结合的方法,以分别针对三倍标准差以上的偏差及小偏差的面向小批量生产方式的SPC方法。总结出面向多品种小批量微小偏差的SPC方法步骤,并且用实例证明了结合的可行性。利用IDEF0建模工具建立了以质量统计及分析为主要模块的生产过程管理系统模型,分析了系统中质量统计及分析模块及系统功能。
最后对全文研究内容进行了总结,并提出进一步研究和探索的建议。
In this paper, the characteristics of small batch production are illustrated. The application status of statistical process control (SPC) on this production method is summarized. Base on these analyses, it is concluded that the traditional control chart is not suitable for the SPC of small batch production, some problems like setup difficulties or relatively insensitivity to small shifts can happen. The universal control chart is put forward to solve the problem of lower quantity of samples with the analysis of the characteristics of the universal control chart.
Base on the analysis of small-shift quality control using traditional control chart, the defects of lower checkout rate are illustrated, so the CUSUM control chart and EWMA control chart are put forward. The principles and techniques of the CUSUM and EWMA are illustrated separately both in theory and example. The conclusion is that the CUSUM and EWMA are two very effective alternatives to the traditional control chart may be used when detecting small shifts. The feasibility of applying standard transportation into the CUSUM and EWMA is discussed both in theory and example. With the compare of CUSUM and EWMA, it is found that the CUSUM is more sensitive to the shifts between 1 and 1.5 deviations, while the EWMA is more sensitive to the shifts lower than 1 deviation, then a combined SPC method of universal control chart and CUSUM control chart and EWMA control chart are put forward to solve these problems which is also illustrated theoretically and validated by case study. The steps of using the combined SPC are concluded. A production process management system with a master module of quality statistics and analysis is formed and illustrated using IDEF0 model-forming method. The module of quality statistics and analysis is illustrated while the function of this system is explained.
At last, the conclusions of this paper are given; the further research and investigation are suggested.
针对微小偏差SPC中应用常规控制图检出力偏低的问题,提出应用累积和控制图(Cumulative-Sum:CUSUM)和指数加权移动平均控制图(Exponentially Weighted Moving-Averages:EWMA)加以解决。之后分别分析了累积和控制图和指数加权移动平均控制图的原理、设计方法,并用实例与常规控制图进行了分析比较,例证了累积和控制图和指数加权移动平均控制图针对微小偏差SPC的灵敏性。讨论了通用控制图中的标准变换应用于累积和控制图与指数加权移动平均控制图的可行性,并举例进行了说明。比较了累积和控制图和指数加权移动平均控制图的细微差别,指出累积和控制图对一倍至一点五倍标准差的偏差反映较灵敏,指数加权移动平均控制图针对一倍标准差以内的偏差反应较灵敏,从而提出将通用控制图、累积和控制图、指数加权移动平均控制图相结合的方法,以分别针对三倍标准差以上的偏差及小偏差的面向小批量生产方式的SPC方法。总结出面向多品种小批量微小偏差的SPC方法步骤,并且用实例证明了结合的可行性。利用IDEF0建模工具建立了以质量统计及分析为主要模块的生产过程管理系统模型,分析了系统中质量统计及分析模块及系统功能。
最后对全文研究内容进行了总结,并提出进一步研究和探索的建议。
In this paper, the characteristics of small batch production are illustrated. The application status of statistical process control (SPC) on this production method is summarized. Base on these analyses, it is concluded that the traditional control chart is not suitable for the SPC of small batch production, some problems like setup difficulties or relatively insensitivity to small shifts can happen. The universal control chart is put forward to solve the problem of lower quantity of samples with the analysis of the characteristics of the universal control chart.
Base on the analysis of small-shift quality control using traditional control chart, the defects of lower checkout rate are illustrated, so the CUSUM control chart and EWMA control chart are put forward. The principles and techniques of the CUSUM and EWMA are illustrated separately both in theory and example. The conclusion is that the CUSUM and EWMA are two very effective alternatives to the traditional control chart may be used when detecting small shifts. The feasibility of applying standard transportation into the CUSUM and EWMA is discussed both in theory and example. With the compare of CUSUM and EWMA, it is found that the CUSUM is more sensitive to the shifts between 1 and 1.5 deviations, while the EWMA is more sensitive to the shifts lower than 1 deviation, then a combined SPC method of universal control chart and CUSUM control chart and EWMA control chart are put forward to solve these problems which is also illustrated theoretically and validated by case study. The steps of using the combined SPC are concluded. A production process management system with a master module of quality statistics and analysis is formed and illustrated using IDEF0 model-forming method. The module of quality statistics and analysis is illustrated while the function of this system is explained.
At last, the conclusions of this paper are given; the further research and investigation are suggested.
引文
[1]袁普及,基于成组技术的质量控制的研究:[博士学位论文] ,南京:南京航空航天大学,2003
[2]张公绪,孙静,质量工程师手册,北京:企业管理出版社,2002,356~413
[3]余忠华,吴昭同,面向多品种、小批量制造环境的SPC实施模型的研究,工程设计,2000,(03):28~31
[4]胡波,杨光薰,梁永建,中,少批量生产中JIT拉式生产的实现,成组技术与生产现代化,2005,19~315
[5]苏春,许映秋,张康,等,基于成组技术的多品种小批量产品工艺编码规则研究,成组技术与生产现代化,2005,22(4):53~55
[6] QUESENBERRY C. P. SPC Q charts for a binomial parameter p: short or long runs. Journal of quality technology, 1991, 23(3): 239~246
[7] DEL CASTILLO E., MONTGOMERY D. C. Short run statistical process control: Q chart enhancements and alternative methods. Quality and Reliability Engineering International, 1994, 10(2): 87~97
[8]崔敬巍,谢里阳,面向小批量制造环境的控制图理论的研究,组合机床与自动化加工技术,2006,1~4
[9] HARRISON P. J., STEVENS C. F. Bayesian Forecasting. Journal of the Royal Statistical Society. Series B (Methodological), 1976, 38(3): 205~247
[10]朱慧明,韩玉启,小批量生产的贝叶斯质量控制模型,运筹与管理,2003,12(5):66~701
[11]胡兴才,叶文华,小批量生产条件下的统计过程控制研究,机械研究与应用,2006,19(001):36~38
[12]胡兴才,基于小批量的统计过程控制研究与系统开发:[博士学位论文] ,南京:南京航空航天大学,2006
[13]谢勇,网络环境下在线质量监控系统的研发:[博士学位论文] ,山东:山东理工大学,2007
[14]洪生伟,质量工程师实用手册,北京:中国计量出版社,2004,135~170
[15]张公绪,选控图理论与实践全面质量管理的新方法,北京:人民邮电出版社,1984,73~216
[16]张公绪,阎育苏,质量管理与选控图,北京:人民邮电出版社,1983,1~100
[17]中华人民共和国国家标准局,GB6381-86,中华人民共和国国家标准,北京:中国标准出版社,1986-05-13
[18]阎育苏,控制图的标准变换直接打点法,电子学报,1982,(06):1~10
[19]洪楠,侯军,MINITAB统计分析教程,北京:电子工业出版社,2007,302~266
[20] Levine D M, Ramsey P P, Smidt R K. Applied Statistics for Engineers and Scientists: Using Microsoft Excel and Minitab. Washington DC: Prentice Hall, 2001. 12~98
[21]孙静,接近零不合格过程的质量控制实现6σ质量(六西格玛)的方法,北京:清华大学出版社,2001,77~160
[22]何桢,刘豹,累计和控制图在测量系统稳定性中的应用研究,系统工程学报,2002,17(006):547~550
[23] Page E. S. Continuous Inspection Schemes. Biometrika, 1954, 41(1/2): 100~115
[24] WOODALL W. H., ADAMS B. M. THE STATISTICAL DESIGN OF CUSUM CHARTS. Quality Engineering, 1993, 5(4): 559~570
[25] EWAN W. D. When and how to use cu-sum charts. Technometrics, 1963, 5(1): 1~22
[26] Montgomery D C. Introduction to statistical quality control. New York. New York: John Wiley, 2001. 332~341
[27] LUCAS J. M. The Design and Use of V-Mask Control Schemes. Journal of Quality Technology, 1976, 8(1): 1~12
[28] LUCAS J. M. A modified V-mask control scheme. Technometrics, 1973, 15(4): 833~847
[29]王淑君,常规控制图与累积和控制图,北京:国防工业出版社,1990,90~128
[30] ROBERTS S. Control Chart Tests Based on Geometric Moving Averages. Technometrics, 1959, 1(3): 239~250
[31] HUNTER J. The exponentially weighted moving average. J.QUALITY TECHNOL., 1986, 18(4): 203~210
[32] LUCAS J. M., SACCUCCI M. S. Exponentially Weighted Moving Average Control Schemes: Properties and Enhancements. Technometrics, 1990, 32(1): 1~12
[33] CROWDER S. V. Average run lengths of exponentially weighted moving average control charts. Journal of Quality Technology, 1987, 19(3): 161~164
[34] CROWDER S. V. Design of exponentially weighted moving average schemes. Journal of Quality Technology, 1989, 21(3): 155~162
[35]张根保,何桢,刘英,质量管理与可靠性,北京:中国科学技术出版社,2005, 99~173
[36] Steven M, Zimmerman, Marjorie L,Ice ogle,使用EXCEL实施统计质量控制,北京:机械工业出版社,2007,328~341
[37] de Vargas, Vera do Carmo C., DIAS LOPES L. F., MENDON?A SOUZA A. Comparative study of the performance of the Cusum and EWMA control charts. Computers & Industrial Engineering, 2004/7, 46(4): 707~724
[38] LUCAS J. M. Combined Shewhart-CUSUM quality control schemes. Journal of Quality Technology, 1982, 14: 51~59
[39] IEEE Std,1320.1-1998,IEEE standard for functional modeling language-syntax and semantics for IDEF0,New York:IEEE,1998-06-25
[40]陈禹六,IDEF建模分析和设计方法,北京:清华大学出版社,1999,3~39
[41] COLQUHOUN G. J., GAMBLE J. D., BRAINES R. W. The use of IDEF0 to link design and manufacture in a CIM environment. International Journal of Operations and Production Management, 1989, 9(4): 48~65
[42]云舟工作室,轻松掌握Visio2000绘图,北京:人民邮电出版社,2000,263~298
[43]孙晓艳,基于IDEF方法的柔性制造系统模型的研究,中国制造业信息化,2007,14(21):47~52
[44]余忠华,吴昭同,面向小批量制造过程的质量控制方法研究,机械工程学报,2001,37(008):6~60
[2]张公绪,孙静,质量工程师手册,北京:企业管理出版社,2002,356~413
[3]余忠华,吴昭同,面向多品种、小批量制造环境的SPC实施模型的研究,工程设计,2000,(03):28~31
[4]胡波,杨光薰,梁永建,中,少批量生产中JIT拉式生产的实现,成组技术与生产现代化,2005,19~315
[5]苏春,许映秋,张康,等,基于成组技术的多品种小批量产品工艺编码规则研究,成组技术与生产现代化,2005,22(4):53~55
[6] QUESENBERRY C. P. SPC Q charts for a binomial parameter p: short or long runs. Journal of quality technology, 1991, 23(3): 239~246
[7] DEL CASTILLO E., MONTGOMERY D. C. Short run statistical process control: Q chart enhancements and alternative methods. Quality and Reliability Engineering International, 1994, 10(2): 87~97
[8]崔敬巍,谢里阳,面向小批量制造环境的控制图理论的研究,组合机床与自动化加工技术,2006,1~4
[9] HARRISON P. J., STEVENS C. F. Bayesian Forecasting. Journal of the Royal Statistical Society. Series B (Methodological), 1976, 38(3): 205~247
[10]朱慧明,韩玉启,小批量生产的贝叶斯质量控制模型,运筹与管理,2003,12(5):66~701
[11]胡兴才,叶文华,小批量生产条件下的统计过程控制研究,机械研究与应用,2006,19(001):36~38
[12]胡兴才,基于小批量的统计过程控制研究与系统开发:[博士学位论文] ,南京:南京航空航天大学,2006
[13]谢勇,网络环境下在线质量监控系统的研发:[博士学位论文] ,山东:山东理工大学,2007
[14]洪生伟,质量工程师实用手册,北京:中国计量出版社,2004,135~170
[15]张公绪,选控图理论与实践全面质量管理的新方法,北京:人民邮电出版社,1984,73~216
[16]张公绪,阎育苏,质量管理与选控图,北京:人民邮电出版社,1983,1~100
[17]中华人民共和国国家标准局,GB6381-86,中华人民共和国国家标准,北京:中国标准出版社,1986-05-13
[18]阎育苏,控制图的标准变换直接打点法,电子学报,1982,(06):1~10
[19]洪楠,侯军,MINITAB统计分析教程,北京:电子工业出版社,2007,302~266
[20] Levine D M, Ramsey P P, Smidt R K. Applied Statistics for Engineers and Scientists: Using Microsoft Excel and Minitab. Washington DC: Prentice Hall, 2001. 12~98
[21]孙静,接近零不合格过程的质量控制实现6σ质量(六西格玛)的方法,北京:清华大学出版社,2001,77~160
[22]何桢,刘豹,累计和控制图在测量系统稳定性中的应用研究,系统工程学报,2002,17(006):547~550
[23] Page E. S. Continuous Inspection Schemes. Biometrika, 1954, 41(1/2): 100~115
[24] WOODALL W. H., ADAMS B. M. THE STATISTICAL DESIGN OF CUSUM CHARTS. Quality Engineering, 1993, 5(4): 559~570
[25] EWAN W. D. When and how to use cu-sum charts. Technometrics, 1963, 5(1): 1~22
[26] Montgomery D C. Introduction to statistical quality control. New York. New York: John Wiley, 2001. 332~341
[27] LUCAS J. M. The Design and Use of V-Mask Control Schemes. Journal of Quality Technology, 1976, 8(1): 1~12
[28] LUCAS J. M. A modified V-mask control scheme. Technometrics, 1973, 15(4): 833~847
[29]王淑君,常规控制图与累积和控制图,北京:国防工业出版社,1990,90~128
[30] ROBERTS S. Control Chart Tests Based on Geometric Moving Averages. Technometrics, 1959, 1(3): 239~250
[31] HUNTER J. The exponentially weighted moving average. J.QUALITY TECHNOL., 1986, 18(4): 203~210
[32] LUCAS J. M., SACCUCCI M. S. Exponentially Weighted Moving Average Control Schemes: Properties and Enhancements. Technometrics, 1990, 32(1): 1~12
[33] CROWDER S. V. Average run lengths of exponentially weighted moving average control charts. Journal of Quality Technology, 1987, 19(3): 161~164
[34] CROWDER S. V. Design of exponentially weighted moving average schemes. Journal of Quality Technology, 1989, 21(3): 155~162
[35]张根保,何桢,刘英,质量管理与可靠性,北京:中国科学技术出版社,2005, 99~173
[36] Steven M, Zimmerman, Marjorie L,Ice ogle,使用EXCEL实施统计质量控制,北京:机械工业出版社,2007,328~341
[37] de Vargas, Vera do Carmo C., DIAS LOPES L. F., MENDON?A SOUZA A. Comparative study of the performance of the Cusum and EWMA control charts. Computers & Industrial Engineering, 2004/7, 46(4): 707~724
[38] LUCAS J. M. Combined Shewhart-CUSUM quality control schemes. Journal of Quality Technology, 1982, 14: 51~59
[39] IEEE Std,1320.1-1998,IEEE standard for functional modeling language-syntax and semantics for IDEF0,New York:IEEE,1998-06-25
[40]陈禹六,IDEF建模分析和设计方法,北京:清华大学出版社,1999,3~39
[41] COLQUHOUN G. J., GAMBLE J. D., BRAINES R. W. The use of IDEF0 to link design and manufacture in a CIM environment. International Journal of Operations and Production Management, 1989, 9(4): 48~65
[42]云舟工作室,轻松掌握Visio2000绘图,北京:人民邮电出版社,2000,263~298
[43]孙晓艳,基于IDEF方法的柔性制造系统模型的研究,中国制造业信息化,2007,14(21):47~52
[44]余忠华,吴昭同,面向小批量制造过程的质量控制方法研究,机械工程学报,2001,37(008):6~60