电路板故障诊断算法及故障仿真研究
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摘要
电子线路在使用过程中发生故障是不可避免的，对于发生故障的电路板，在实践中，我们总是想出很多办法来找出它的故障所在，进而对以后的维修提供参考。本文针对电子线路在使用过程中发生的故障，提出了几种测试方法，主要讲述测试向量的生成算法及使用故障仿真的方法来检测测试矢量在故障检测过程中的故障覆盖程度。
测试向量生成算法包括：伪穷举法、D算法、主通路敏化法、故障字典法。
故障仿真方法包括：并行故障仿真和演绎故障仿真。
在对测试向量生成算法及故障仿真方法研究的基础上，结合所做的课题，使用故障仿真来检验测试过程中测试向量的有效性，同时指出课题中所使用测试方法的局限性，并提出了改进。
Fault is inevitable during the using of electron circuit. In practice, we think out of all kinds of methods to detect the fault existing in the electron circuit board. Then, we can supply reference for repair. This particle gives out some detection method, mainly about creation algorithm of detection vector and checking up the fault-cover rate of detection vector by the way of fault simulation.
Creation algorithm of detection vector contains: Pseudo-exhaustive testing, D algorithm, fault dictionary algorithm.
Fault simulation contains: parallel fault simulation and deductive fault simulation.
In the base of research of creation algorithm of detection vector and fault simulation, we examined the fault-cover rate in our task using fault simulation. At the same time, we pointed out the problem in this application and amended fault simulation to fit our task.
测试向量生成算法包括：伪穷举法、D算法、主通路敏化法、故障字典法。
故障仿真方法包括：并行故障仿真和演绎故障仿真。
在对测试向量生成算法及故障仿真方法研究的基础上，结合所做的课题，使用故障仿真来检验测试过程中测试向量的有效性，同时指出课题中所使用测试方法的局限性，并提出了改进。
Fault is inevitable during the using of electron circuit. In practice, we think out of all kinds of methods to detect the fault existing in the electron circuit board. Then, we can supply reference for repair. This particle gives out some detection method, mainly about creation algorithm of detection vector and checking up the fault-cover rate of detection vector by the way of fault simulation.
Creation algorithm of detection vector contains: Pseudo-exhaustive testing, D algorithm, fault dictionary algorithm.
Fault simulation contains: parallel fault simulation and deductive fault simulation.
In the base of research of creation algorithm of detection vector and fault simulation, we examined the fault-cover rate in our task using fault simulation. At the same time, we pointed out the problem in this application and amended fault simulation to fit our task.
引文
[1]陈媛，杨武．系统级故障诊断方法概述．计算机应用研究．1999,16(2)：19～21
[2]杨士元，数字系统的故障诊断和可靠性设计
[3]杨士元，模拟系统的故障诊断和可靠性设计
[4]杨龙祥，黄唯一．数字电路板(DPCB)在线测试仪研制．微电子测试．1995，9(3)：25～31
[5]李迪，吕昌玲．一种集成电路离线／在线测试系统平台的设计与实现．电子技术．1996，(5)：19～20
[6]J.P.Shen,W.Maly and F.J.Ferguson. Inductive. Fault Analysis of MOS Integrated Circuits. IEEE Design and Test. 1985,(12):13～26
[7]Roth,J.P.;and W.G.Bouricius, "Programmed Algorithms to Computer Tests to Detect and to Distinguish Between Failure in Logic Circuits ", IEEE Trans. Comput. Nov. 1967.
[8]Yau, S.S., Y.S.Tang, "An Efficient Algorithm for generation Complete Tests for Combination Logic Circuits", IEEE Trans. Compute Volc-20, Nov.1971.
[9]魏道政，“产生功能级数字电路测试码的一种算法—主路径敏化法”，计算机学报，No．2，1982．
[10]Seshu, S., "On an Improved Diagnosis Program" IEEE Trans. Electron. Comput.EC-12(2), 1965.
[11]Hardie, F. H., "Design and Use of Fault Simulation for Saturn Computer Design",IEEE Trans. Elec. Comput. EC16(8), 1967.
[12]Armstrong, D. B., "A Deductive Method for Simulation Faults in Logic Circuits",IEEE Trans. Comput. C-21(5), 1972.
[13]Chappell, S. G. et al, "Comparision of Parallel and Deductive Fault Simulation Method", IEEE Trans. Comput. C-23(11), 1974.
[14]S. Seshu, R. Waxman, "Fault Isolation in Conventional Linear Systems ", IEEE Trans.Reliab. R-15, p11-16, 1966.
[15]G. O. Martens, J. D. Dyck, "Fault Identification in Electronic Circuits with the Aid of Bilinear Transformation ", IEEE Trans. Reliab R-21, p99-104, 1972.
[16]孟宪蔷．控制工程基础，航空工业出版社，1993．3第一版．
[2]杨士元，数字系统的故障诊断和可靠性设计
[3]杨士元，模拟系统的故障诊断和可靠性设计
[4]杨龙祥，黄唯一．数字电路板(DPCB)在线测试仪研制．微电子测试．1995，9(3)：25～31
[5]李迪，吕昌玲．一种集成电路离线／在线测试系统平台的设计与实现．电子技术．1996，(5)：19～20
[6]J.P.Shen,W.Maly and F.J.Ferguson. Inductive. Fault Analysis of MOS Integrated Circuits. IEEE Design and Test. 1985,(12):13～26
[7]Roth,J.P.;and W.G.Bouricius, "Programmed Algorithms to Computer Tests to Detect and to Distinguish Between Failure in Logic Circuits ", IEEE Trans. Comput. Nov. 1967.
[8]Yau, S.S., Y.S.Tang, "An Efficient Algorithm for generation Complete Tests for Combination Logic Circuits", IEEE Trans. Compute Volc-20, Nov.1971.
[9]魏道政，“产生功能级数字电路测试码的一种算法—主路径敏化法”，计算机学报，No．2，1982．
[10]Seshu, S., "On an Improved Diagnosis Program" IEEE Trans. Electron. Comput.EC-12(2), 1965.
[11]Hardie, F. H., "Design and Use of Fault Simulation for Saturn Computer Design",IEEE Trans. Elec. Comput. EC16(8), 1967.
[12]Armstrong, D. B., "A Deductive Method for Simulation Faults in Logic Circuits",IEEE Trans. Comput. C-21(5), 1972.
[13]Chappell, S. G. et al, "Comparision of Parallel and Deductive Fault Simulation Method", IEEE Trans. Comput. C-23(11), 1974.
[14]S. Seshu, R. Waxman, "Fault Isolation in Conventional Linear Systems ", IEEE Trans.Reliab. R-15, p11-16, 1966.
[15]G. O. Martens, J. D. Dyck, "Fault Identification in Electronic Circuits with the Aid of Bilinear Transformation ", IEEE Trans. Reliab R-21, p99-104, 1972.
[16]孟宪蔷．控制工程基础，航空工业出版社，1993．3第一版．