智能回弹仪系统的研究
摘要
回弹仪是用来检测混凝土抗压强度的一种无损检测仪器,广泛应用于混凝土施工的整个过程之中。目前国内普遍使用的是机械式回弹仪,操作过程中需要人工记录数据,且数据处理过程繁琐,现场难以直接分析检测结果。本文的研究成果是合肥市重点科研项目“混凝土抗压强度智能检测系统”的重要组成部分。通过对国内外回弹仪系统的分析比较,根据回弹仪系统的检测原理,结合现代光电转换技术和电子技术的应用,提出了基于线阵CCD的智能回弹仪系统。
回弹仪滑块(游标)位置的检测是本系统的关键,为了保证回弹仪滑块的阻尼不变,我们采用了完全非接触式的位移检测方法——线阵CCD成像获取游标的位置。CCD(电荷耦合器件)是一种性能独特的半导体光电器件,近年来在摄像、工业检测等科技领域里得到了广泛的应用。将CCD技术应用于几何测量可以实现高精度和非接触测量的要求,尤其是对小尺寸的测量具有很强的优势。根据CCD特点,提出在系统上采用CCD作为游标位移传感器,并在光路设计上采用双CCD拼接直接投影方式,减少了光学系统的复杂度,同时通过软件方法实现无缝拼接。从而实现了对信号的无损检测,且光学系统易实现。
系统充分利用了PIC单片机集成的多个功能模块,外围电路简单。首先采用PWM方式驱动CCD芯片,在完成原始信号的放大、滤波和二值化处理后,再通过单片机两路计数器对输出脉冲信号采样计数,获得测量值,并可对数据进行储存和显示。最后用户还可以通过PIC单片机的USB接口,将数据导入到上位机系统。
上位机数据处理系统主要完成对现场检测数据的接收,并根据国家标准对现场检测的数据进行处理和分析,最后输出一个评估结果。
试验证明该系统具有硬件结构简单、使用方便、抗干扰性好、采集数据可靠等特点。
Rebound hammer is a sort of nondestructive instrument, which used to detect concrete's resisting pressure intensity. Abroad used in the whole process of construction. Presently most of rebound hammers are manual instrument, need people record and process data, can not get the result directly. The paper is a important part of intelligent rebound hammer system, which is Heifei key scientific project. Via compare with domestic and aboard rebound hammer, according the principle of rebound hammer, combining the photo-electricity and electronic technology, we design a new intelligent system of rebound hammer based on linear CCD.Detecting rebound hammer's nonius position is the key of system, in order to keep the damp of nonius doesn't change. We use the completely non-contact detect method, which uses linear CCD imaging to obtain the position of nonius. CCD (Charge Coupled Device) is a particular photo-electricity semiconductor, which is abroad used in camera, industry detection and other area. The technology of CCD can realize high precise and non-contact detection requirement, especially in the small size detection. According to CCD character, we connect two CCD in a line and use directly reflect method image the nonius to it. Then we use software method realize non-gap connection. Those methods realize nondestructive detection and simple phonics system can be easily realized.System utilizes PIC microchip's integrated functions, so periphery circuit is simple. Firstly using PWM function driver CCD chip, after magnifying original signal, flitting and binarization, then via chip's two counters get the value of detection. Value can be stored and displayed. At last user can use the USB transfer data to computer.Data process system of computer can accept detecting data and process those data according to national standard, then give a evaluative result.The system has the excellence of simple hardware structure, using convenience, good interference rejection, and data collection reliable in the experimentation.
回弹仪滑块(游标)位置的检测是本系统的关键,为了保证回弹仪滑块的阻尼不变,我们采用了完全非接触式的位移检测方法——线阵CCD成像获取游标的位置。CCD(电荷耦合器件)是一种性能独特的半导体光电器件,近年来在摄像、工业检测等科技领域里得到了广泛的应用。将CCD技术应用于几何测量可以实现高精度和非接触测量的要求,尤其是对小尺寸的测量具有很强的优势。根据CCD特点,提出在系统上采用CCD作为游标位移传感器,并在光路设计上采用双CCD拼接直接投影方式,减少了光学系统的复杂度,同时通过软件方法实现无缝拼接。从而实现了对信号的无损检测,且光学系统易实现。
系统充分利用了PIC单片机集成的多个功能模块,外围电路简单。首先采用PWM方式驱动CCD芯片,在完成原始信号的放大、滤波和二值化处理后,再通过单片机两路计数器对输出脉冲信号采样计数,获得测量值,并可对数据进行储存和显示。最后用户还可以通过PIC单片机的USB接口,将数据导入到上位机系统。
上位机数据处理系统主要完成对现场检测数据的接收,并根据国家标准对现场检测的数据进行处理和分析,最后输出一个评估结果。
试验证明该系统具有硬件结构简单、使用方便、抗干扰性好、采集数据可靠等特点。
Rebound hammer is a sort of nondestructive instrument, which used to detect concrete's resisting pressure intensity. Abroad used in the whole process of construction. Presently most of rebound hammers are manual instrument, need people record and process data, can not get the result directly. The paper is a important part of intelligent rebound hammer system, which is Heifei key scientific project. Via compare with domestic and aboard rebound hammer, according the principle of rebound hammer, combining the photo-electricity and electronic technology, we design a new intelligent system of rebound hammer based on linear CCD.Detecting rebound hammer's nonius position is the key of system, in order to keep the damp of nonius doesn't change. We use the completely non-contact detect method, which uses linear CCD imaging to obtain the position of nonius. CCD (Charge Coupled Device) is a particular photo-electricity semiconductor, which is abroad used in camera, industry detection and other area. The technology of CCD can realize high precise and non-contact detection requirement, especially in the small size detection. According to CCD character, we connect two CCD in a line and use directly reflect method image the nonius to it. Then we use software method realize non-gap connection. Those methods realize nondestructive detection and simple phonics system can be easily realized.System utilizes PIC microchip's integrated functions, so periphery circuit is simple. Firstly using PWM function driver CCD chip, after magnifying original signal, flitting and binarization, then via chip's two counters get the value of detection. Value can be stored and displayed. At last user can use the USB transfer data to computer.Data process system of computer can accept detecting data and process those data according to national standard, then give a evaluative result.The system has the excellence of simple hardware structure, using convenience, good interference rejection, and data collection reliable in the experimentation.
引文
[1] 余红发著.混凝土非破损测强技术研究.中国建材工业出版社,1999:42-43.
[2] 吴新璇主编,混凝土无损检测技术手册。人民交通出版社,2003:16-17.
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[4] 张广军主编.光电检测技术.中国计量出版社,2003:23—25
[5] Toshiba Semiconductor Corporation.TCD 1200D. http://www.semicom.toshiba.co.jp/.2002(12).
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[10] 张化朋.用单片机驱动线阵CCD的探讨[J].光学技术,2000(7):342-347.
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[14] 王庆有主编.图像传感器应用技术.电子工业出版社,2003:246-248.
[15] National Semiconductor Corporation. LF357 JFET Input Operational amplifiers http://www.national.com/.2001(11).
[16] 张建辉,宋平岗.线阵CCD技术及其在非接触检测中的应用[J].机械与电子,2004(8):63-65.
[17] Atmeil corporation.AT45DB081B Datasheet.http://www.atmel.com/.2004.
[18] 梅晓东.串行FLASH存储器.AT45DB021B在电力参数检测中的应用.世界电子元器件,2004(5):78-80
[19] 陈世利,孙墨杰,栗大超等.SPI串行Flash在数据存储系统中的应用[J],外电子元器件,2001(10):20—23.
[20] Vishay Telefunken TCRT1000/TCRT1010 Reflective Optical Sensor with Transistor Output. http://www.vishay.com/. 1999(5).
[21] 张斌,陈昌旺,周英.点阵式液晶显示器LM12864与51单片机的接口设计[J].世界电子元器件,2004(2):42—43.
[22] 景小健,尹清华,陈清林.MG212864液晶显示器在智能仪表中的应用[J],化工自动化及仪表,2003(6):62—64.
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[24] 薛永毅编著.新型电源电路应用实例.电子工业出版社,2001:189-190.
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[26] National Semiconductor Corporation. LM117/LM317A/LM317 3-Terminal Adjustable Regulator Datasheet. http://www.national.com/.2001(9).
[27] 刘征宇.电子电路设计与制作.福建科学技术出版社,2003:208—212.
[28] Henry W.Ott著,王培清,李迪译.电子系统中噪声的抑制与衰减技术.电子工业出版社,2003:106-109.
[29] Mark I.Montrose著,刘元安等译.电磁兼容和印刷电路板理论、设计和布线.人民邮电出版社,2002:150—154.
[30] 汪盛,时亚弘.USB2.0技术概括[J].计算机应用研究,2001(113):4-6.
[31] 刘益成.USB接口技术—USB简介[J].石油仪器,2002(16):57-58.
[32] CHANG J, EVANS J. USB 2.0 design chanllenges[J].世界电子元器件,2001(79):8-10
[33] 边海龙,贾少华等.USB 2_0设备的设计与开发.人民邮电出版社,2004.
[34] Universal Serial Bus Specification, Revisionl. 1. 1998(9)
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[36] Walter Oney著,马少华译.Programming the Microsoft Windows Driver Model. 1999
[37] 张弘编著.USB接口设计.西安电子科技大学出版社,2002:136—159
[38] 申柏权,王玉艳.USB设备控制器中串行接口引擎的设计[J].计算机工程,2004(11):183-185.
[39] 王晖.USB接口器件ISP1581的接口应用设计[J].新器件新技术,2004(8):40-43.
[40] Mircochip Technology Inc. PIC16C745/765 Datasheet. http://www.microchip.com/.2004(7)
[41] 蔡纯洁,杨维坚,伍先达,等.PIC全系列单片机原理与开发[M].合肥:中国科技大学出版社,2003:342-378.
[42] 江萍.基于光电检测的智能回弹仪系统[J].电子设计应用,2003(9):18-22.
[43] 回弹法检测混凝土抗压强度技术规程(JGJ/T23-2001):36
[2] 吴新璇主编,混凝土无损检测技术手册。人民交通出版社,2003:16-17.
[3] 王庆有,孙学珠.CCD应用技术[M].天津:天津大学出版社,2000(11).
[4] 张广军主编.光电检测技术.中国计量出版社,2003:23—25
[5] Toshiba Semiconductor Corporation.TCD 1200D. http://www.semicom.toshiba.co.jp/.2002(12).
[6] 俞光昀等编著.PIC系列单片机开发应用技术.电子工业出版社,2000.
[7] 王道宪主编.Microchip PIC系列单片机原理、应用与开发.国防工业出版社,2004:4-9
[8] 张智辉,田地,杨义先.线阵CCD驱动电路设计的几种方法[J].仪表技术与传感器,2004(6):32-33
[9] 陈国先主编.PIC单片机原理与接口技术.电子工业出版社.2004.
[10] 张化朋.用单片机驱动线阵CCD的探讨[J].光学技术,2000(7):342-347.
[11] Micro Commercial Component. 2SA105 datasheet.http://www.mccsemi.com.2003(6)
[12] 孙肖子,张企民编著.模拟电子技术基础.西安电子科技大学出版社.2001:208—220
[13] 王世一编著.数字信号处理.北京理工大学出版社,1997:12-13.
[14] 王庆有主编.图像传感器应用技术.电子工业出版社,2003:246-248.
[15] National Semiconductor Corporation. LF357 JFET Input Operational amplifiers http://www.national.com/.2001(11).
[16] 张建辉,宋平岗.线阵CCD技术及其在非接触检测中的应用[J].机械与电子,2004(8):63-65.
[17] Atmeil corporation.AT45DB081B Datasheet.http://www.atmel.com/.2004.
[18] 梅晓东.串行FLASH存储器.AT45DB021B在电力参数检测中的应用.世界电子元器件,2004(5):78-80
[19] 陈世利,孙墨杰,栗大超等.SPI串行Flash在数据存储系统中的应用[J],外电子元器件,2001(10):20—23.
[20] Vishay Telefunken TCRT1000/TCRT1010 Reflective Optical Sensor with Transistor Output. http://www.vishay.com/. 1999(5).
[21] 张斌,陈昌旺,周英.点阵式液晶显示器LM12864与51单片机的接口设计[J].世界电子元器件,2004(2):42—43.
[22] 景小健,尹清华,陈清林.MG212864液晶显示器在智能仪表中的应用[J],化工自动化及仪表,2003(6):62—64.
[23] Texas Instruments Incorporated. Low-Dropout Voltage Regulators. http://www.ti.com.1999(11).
[24] 薛永毅编著.新型电源电路应用实例.电子工业出版社,2001:189-190.
[25] Analog Integrations Corporation. MC34063A Datasheet. http://www.analog.com.tw/.2003(12).
[26] National Semiconductor Corporation. LM117/LM317A/LM317 3-Terminal Adjustable Regulator Datasheet. http://www.national.com/.2001(9).
[27] 刘征宇.电子电路设计与制作.福建科学技术出版社,2003:208—212.
[28] Henry W.Ott著,王培清,李迪译.电子系统中噪声的抑制与衰减技术.电子工业出版社,2003:106-109.
[29] Mark I.Montrose著,刘元安等译.电磁兼容和印刷电路板理论、设计和布线.人民邮电出版社,2002:150—154.
[30] 汪盛,时亚弘.USB2.0技术概括[J].计算机应用研究,2001(113):4-6.
[31] 刘益成.USB接口技术—USB简介[J].石油仪器,2002(16):57-58.
[32] CHANG J, EVANS J. USB 2.0 design chanllenges[J].世界电子元器件,2001(79):8-10
[33] 边海龙,贾少华等.USB 2_0设备的设计与开发.人民邮电出版社,2004.
[34] Universal Serial Bus Specification, Revisionl. 1. 1998(9)
[35] 张念淮,江浩.USB总线接口开发指南.北京:国防工业出版社,2001(3).41-43
[36] Walter Oney著,马少华译.Programming the Microsoft Windows Driver Model. 1999
[37] 张弘编著.USB接口设计.西安电子科技大学出版社,2002:136—159
[38] 申柏权,王玉艳.USB设备控制器中串行接口引擎的设计[J].计算机工程,2004(11):183-185.
[39] 王晖.USB接口器件ISP1581的接口应用设计[J].新器件新技术,2004(8):40-43.
[40] Mircochip Technology Inc. PIC16C745/765 Datasheet. http://www.microchip.com/.2004(7)
[41] 蔡纯洁,杨维坚,伍先达,等.PIC全系列单片机原理与开发[M].合肥:中国科技大学出版社,2003:342-378.
[42] 江萍.基于光电检测的智能回弹仪系统[J].电子设计应用,2003(9):18-22.
[43] 回弹法检测混凝土抗压强度技术规程(JGJ/T23-2001):36