基于旋光色散效应的波长检测及其应用研究
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摘要
随着现代科技水平的不断提高和新兴技术的出现,波长检测的应用范围遍及生产、生活、军事和科研等多个领域,方便快捷的测量波长也正成为一种迫切的需求。目前测量波长的设备主要分成色散型、干涉型和滤波型三类,其中色散型波长检测技术是利用色散元件(光栅或棱镜)将复色光色散,再用探测器测量每一谱线元的强度,从而确定波长。干涉型波长检测技术是同时测量所有谱线元的干涉强度,再对干涉图进行逆傅里叶变换而得到目标的光谱图：滤波型波长检测技术是利用可调谐滤波片进行波长检测。这些检测方法各有优缺点,适用于不同的应用场合。本文提出一种基于石英晶体旋光色散效应的全新的波长检测方法,通过检测偏振光的旋光角度来确定波长。实验证实本系统的波长检测范围大于1000nm,波长检测分辨率优于0.1pm,波长检测精度优于±2pm,与目前波长检测的最好水平相当。
提出并设计了利用可调谐激光器和双光路检测方法构成的旋光色散测试系统,并对石英晶体在光纤通信低损窗口三个波段的旋光色散特性进行了测试。得到了各波段对应的旋光色散曲线和拟合公式。利用得到的旋光色散曲线,准确地测得了石英晶体在850nm、1310nm和1550nm三个波段的旋光率。通过实验数据求得了Sellmeier方程中的常数,并构建了Sellmeier方程。在上述三个波段得到的实验曲线,均与由Sellmeier方程计算出的旋光色散曲线很好吻合,而且在1342nm处得到的旋光率与光学手册中给出的数值完全一致。上述结果表明,本文提出的旋光色散测试系统,为光学材料的旋光色散特性的检测提供了可靠的手段。
在850nm、1310nm和1550nm三个波段,我们给出了石英晶体在可调谐激光器整个输出波长范围内连续的旋光率数值,目前还没有文献给出相关的信息。在1310nm波段,研究了石英晶体旋光效应的温度特性,给出了Sellmeier方程中常数与温度的关系。这些数据对石英晶体在近红外波段的进一步开发与应用具有实际意义。
提出了利用石英晶体的旋光色散效应标定法布里-珀罗可调谐滤波器扫描波长的新方法。该方法可实现对法布里-珀罗可调谐滤波器整个扫描波长范围的全程标定,而且是利用旋光色散曲线直接读出波长数值。目前已报道的光纤光栅阵列法、法布里-珀罗半导体激光器法以及气体吸收法等方法,只能在其梳状特征峰处对波长进行标定,然后再对法布里-珀罗可调谐滤波器的波长与电压间非线性关系曲线进行拟合,无法实现大范围的实时波长标定。我们对1550nm波段的光纤法布里-珀罗可调谐滤波器进行了实际标定研究。实验结果表明本系统的波长扫描分辨率优于1pm,波长扫描精度优于±2pm,处于目前已报道的各种波长标定方法中的最好水平。
提出了利用旋光色散效应研发波长计的新方法。利用实验室现有条件,在近红外波段开展了波长检测的实验研究。对光纤光栅的布喇格反射波长和可调谐激光器的输出波长进行了检测,并对测量结果进行了详细的误差分析。实验证实本系统波长检测实验值与可调谐激光器自身显示值之间的绝对误差小于±10pm,相对误差小于±2×10-6。并且整个波长测量系统没有采用精密机械扫描和干涉仪结构,有利于提高系统机械、温度稳定性及重复性。另外从价格上看,本系统的成本远低于同样检测精度设备的价格。所以本波长检测系统在核心指标、稳定性、可靠性和成本方面都极具竞争力,具有很好的实际应用前景。
With the continuous improvement of the modern science and technology level and emergence of new technologies, wavelength measurement range of applications is throughout the production, life, military, scientific and other fields. Convenient measurement of wavelength is also becoming a pressing demand. At present wavelength measurements are mainly divided into three types including dispersion-type, interference-type and filter-type. The dispersion-type is based on dispersive elements (diffraction grating or prism) which are used to separate the polychromatic light, and then the intensity of each spectral line element is detected to determine the wavelength. The wavelength measurement in interference-type is to detect the interference intensity of all line elements simultaneously, then to obtain the spectrum by carrying on the inverse Fourier transformation of the interference figure. Filter-type wavelength measurement uses tunable filter to determine wavelength. These wavelength measurement methods have advantages and disadvantages when used in different applications. A new method of wavelength measurement based on optical rotatory dispersion effect of quartz is investigated in this paper. Wavelength can be determined by detecting the rotation angle of plane polarized light. Experimental results show that the wavelength range of this system is greater than 1000nm, and wavelength measurement resolution is better than 0.1pm, wavelength absolute accuracy is better than±2pm, which is now at the best level of wavelength measurement.
We propose and design a measurement system by using tunable laser and double-beam testing technique, with which we have measured the optical rotatory dispersion properties of quartz crystal at three low loss wavebands in optical fiber communication. We get the optical rotatory dispersion curves and the fitting formula at the three wavebands. Using the optical rotatory dispersion curves, we measure the rotatory power of quartz crystal at 850nm,1310nm and 1550nm waveband accurately. From the experimental data we also calculate the coefficients in Sellmeier equation, and then constructe Sellmeier equation in near-infrared waveband. Optical rotatory dispersion plots from the constructed equation are well coincide with the experimental results in all the three wavebands, and furthermore the calculated rotatory power at 1342nm from the equation are completely consistent with that in optics handbook. These results show that the optical rotatory dispersion test system proposed by us provides a reliable means of detecting the optical rotatory dispersion characteristics of optical materials.
At 850nm,1310nm and 1550nm waveband, we obtain the continuous rotation rate of quartz crystal in the whole wavelength range of tunable lasers. Up to now there is no literature to give the relative information. We also investigate the temperature effect of the optical rotation of quartz crystal at 1310nm waveband. The relation of Sellmeier equation's coefficient to temperature is calculated. These data have practical significance to the further development and application of quartz crystal in the near-infrared waveband.
A new method of calibrate wavelength of Fabry-Perot tunable filter based on optical rotatory dispersion effect has been investigated. With this method wavelength calibration of Fabry-Perot tunable filter in the whole scanning range can be realized. We can readout the wavelength directly through the optical rotatory dispersion curve. The reported methods, such as grating array method, Fabry-Perot semiconductor lasers method, gas absorption method and other methods, can only calibrate wavelength in their comb characteristic peaks, and then the non-linear relationship curves between wavelength and voltage of Fabry-Perot tunable filter are fitted, they can not achieve a real-time and wide range wavelength calibration. We carry out the wavelength calibration of optical fiber Fabry-Perot tunable filter at 1550nm band. Experimental results show that the wavelength scanning resolution of this system is better than lpm, wavelength scanning accuracy is better than±2pm, it is at the best level of wavelength calibration methods that have been reported.
A new method of building wavemeter based on rotatory dispersion effect is proposed. The wavelength of near-infrared waveband is measured by using the existing conditions of laboratory. We measure the wavelength of fiber Bragg grating and tunable laser, and analyzed the error in detail. The absolute error between experimental values and display value of tunable laser is less than±10pm, the relative error is less than±2x10-6. Because there are no precision mechanical scanning system and no use of interferometer; the system machinery stability, temperature stability and repeatability can be improved. Also from the point of price, the cost of this testing method is far less than the price of same accuracy equipment. Therefore, this wavelength measurement method is very competitive in the core parameter, stability, reliability and cost, it has good prospects for practical application.
提出并设计了利用可调谐激光器和双光路检测方法构成的旋光色散测试系统,并对石英晶体在光纤通信低损窗口三个波段的旋光色散特性进行了测试。得到了各波段对应的旋光色散曲线和拟合公式。利用得到的旋光色散曲线,准确地测得了石英晶体在850nm、1310nm和1550nm三个波段的旋光率。通过实验数据求得了Sellmeier方程中的常数,并构建了Sellmeier方程。在上述三个波段得到的实验曲线,均与由Sellmeier方程计算出的旋光色散曲线很好吻合,而且在1342nm处得到的旋光率与光学手册中给出的数值完全一致。上述结果表明,本文提出的旋光色散测试系统,为光学材料的旋光色散特性的检测提供了可靠的手段。
在850nm、1310nm和1550nm三个波段,我们给出了石英晶体在可调谐激光器整个输出波长范围内连续的旋光率数值,目前还没有文献给出相关的信息。在1310nm波段,研究了石英晶体旋光效应的温度特性,给出了Sellmeier方程中常数与温度的关系。这些数据对石英晶体在近红外波段的进一步开发与应用具有实际意义。
提出了利用石英晶体的旋光色散效应标定法布里-珀罗可调谐滤波器扫描波长的新方法。该方法可实现对法布里-珀罗可调谐滤波器整个扫描波长范围的全程标定,而且是利用旋光色散曲线直接读出波长数值。目前已报道的光纤光栅阵列法、法布里-珀罗半导体激光器法以及气体吸收法等方法,只能在其梳状特征峰处对波长进行标定,然后再对法布里-珀罗可调谐滤波器的波长与电压间非线性关系曲线进行拟合,无法实现大范围的实时波长标定。我们对1550nm波段的光纤法布里-珀罗可调谐滤波器进行了实际标定研究。实验结果表明本系统的波长扫描分辨率优于1pm,波长扫描精度优于±2pm,处于目前已报道的各种波长标定方法中的最好水平。
提出了利用旋光色散效应研发波长计的新方法。利用实验室现有条件,在近红外波段开展了波长检测的实验研究。对光纤光栅的布喇格反射波长和可调谐激光器的输出波长进行了检测,并对测量结果进行了详细的误差分析。实验证实本系统波长检测实验值与可调谐激光器自身显示值之间的绝对误差小于±10pm,相对误差小于±2×10-6。并且整个波长测量系统没有采用精密机械扫描和干涉仪结构,有利于提高系统机械、温度稳定性及重复性。另外从价格上看,本系统的成本远低于同样检测精度设备的价格。所以本波长检测系统在核心指标、稳定性、可靠性和成本方面都极具竞争力,具有很好的实际应用前景。
With the continuous improvement of the modern science and technology level and emergence of new technologies, wavelength measurement range of applications is throughout the production, life, military, scientific and other fields. Convenient measurement of wavelength is also becoming a pressing demand. At present wavelength measurements are mainly divided into three types including dispersion-type, interference-type and filter-type. The dispersion-type is based on dispersive elements (diffraction grating or prism) which are used to separate the polychromatic light, and then the intensity of each spectral line element is detected to determine the wavelength. The wavelength measurement in interference-type is to detect the interference intensity of all line elements simultaneously, then to obtain the spectrum by carrying on the inverse Fourier transformation of the interference figure. Filter-type wavelength measurement uses tunable filter to determine wavelength. These wavelength measurement methods have advantages and disadvantages when used in different applications. A new method of wavelength measurement based on optical rotatory dispersion effect of quartz is investigated in this paper. Wavelength can be determined by detecting the rotation angle of plane polarized light. Experimental results show that the wavelength range of this system is greater than 1000nm, and wavelength measurement resolution is better than 0.1pm, wavelength absolute accuracy is better than±2pm, which is now at the best level of wavelength measurement.
We propose and design a measurement system by using tunable laser and double-beam testing technique, with which we have measured the optical rotatory dispersion properties of quartz crystal at three low loss wavebands in optical fiber communication. We get the optical rotatory dispersion curves and the fitting formula at the three wavebands. Using the optical rotatory dispersion curves, we measure the rotatory power of quartz crystal at 850nm,1310nm and 1550nm waveband accurately. From the experimental data we also calculate the coefficients in Sellmeier equation, and then constructe Sellmeier equation in near-infrared waveband. Optical rotatory dispersion plots from the constructed equation are well coincide with the experimental results in all the three wavebands, and furthermore the calculated rotatory power at 1342nm from the equation are completely consistent with that in optics handbook. These results show that the optical rotatory dispersion test system proposed by us provides a reliable means of detecting the optical rotatory dispersion characteristics of optical materials.
At 850nm,1310nm and 1550nm waveband, we obtain the continuous rotation rate of quartz crystal in the whole wavelength range of tunable lasers. Up to now there is no literature to give the relative information. We also investigate the temperature effect of the optical rotation of quartz crystal at 1310nm waveband. The relation of Sellmeier equation's coefficient to temperature is calculated. These data have practical significance to the further development and application of quartz crystal in the near-infrared waveband.
A new method of calibrate wavelength of Fabry-Perot tunable filter based on optical rotatory dispersion effect has been investigated. With this method wavelength calibration of Fabry-Perot tunable filter in the whole scanning range can be realized. We can readout the wavelength directly through the optical rotatory dispersion curve. The reported methods, such as grating array method, Fabry-Perot semiconductor lasers method, gas absorption method and other methods, can only calibrate wavelength in their comb characteristic peaks, and then the non-linear relationship curves between wavelength and voltage of Fabry-Perot tunable filter are fitted, they can not achieve a real-time and wide range wavelength calibration. We carry out the wavelength calibration of optical fiber Fabry-Perot tunable filter at 1550nm band. Experimental results show that the wavelength scanning resolution of this system is better than lpm, wavelength scanning accuracy is better than±2pm, it is at the best level of wavelength calibration methods that have been reported.
A new method of building wavemeter based on rotatory dispersion effect is proposed. The wavelength of near-infrared waveband is measured by using the existing conditions of laboratory. We measure the wavelength of fiber Bragg grating and tunable laser, and analyzed the error in detail. The absolute error between experimental values and display value of tunable laser is less than±10pm, the relative error is less than±2x10-6. Because there are no precision mechanical scanning system and no use of interferometer; the system machinery stability, temperature stability and repeatability can be improved. Also from the point of price, the cost of this testing method is far less than the price of same accuracy equipment. Therefore, this wavelength measurement method is very competitive in the core parameter, stability, reliability and cost, it has good prospects for practical application.
引文
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