SRAM型FPGA单粒子故障传播特性与测试方法研究
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摘要
随着航天事业的蓬勃发展,SRAM型FPGA以其高性能、可重构等优势在卫星等航天器上得以应用,而空间单粒子效应一直是制约该类器件应用的瓶颈。近年来,随着SRAM型FPGA器件特征尺寸减小和工作频率的上升,单粒子效应的表现形式更为复杂:单个的、区域的单粒子效应通过电路的逻辑功能传播,引起相邻区域逻辑功能的故障,甚至导致电路输出的失效。本文称这种特性为单粒子故障在超大规模集成电路SRAM型FPGA中的传播特性。本文围绕SRAM型FPGA单粒子故障传播特性与测试方法问题,从器件应用层面出发,研究FPGA工作负载中局部的单粒子软错误对相关电路单元以及电路输出影响的量化描述和分析测试方法。主要研究内容如下:
(1)根据单粒子效应特点,在分析SRAM型FPGA的结构模型及其单粒子敏感单元基础上,对单粒子故障在其中的传播进行归纳;阐明单粒子故障传播特性的研究内容,包括电路功能模块的耦合参数、故障传播模型和电路输出软错误失效率。
(2)针对SRAM型FPGA单粒子故障传播现象,研究单粒子故障传播的建模方法。根据其动态传播过程特性,建立了基于元胞自动机的单粒子故障传播模型,研究该模型的算法设计与实现,并对该模型进行仿真,分析探讨影响故障传播的因素。
(3)针对SRAM型FPGA的单粒子故障传播特性研究内容,给出了电路功能模块耦合因子的分析方法和软错误失效率的测试方法;研究基于SEU故障注入的原理与关键技术,在分析SEU故障注入系统结构的基础上,设计并实现了本文采用的SEU故障注入系统。
最后,针对部分国际标准测试电路ISCASA'85和ISCASA'89,计算了其电路功能模块的耦合参数,采用SEU故障注入测试系统对电路输出软错误失效率进行了测试。本文研究的意义在于,加深理解SRAM型FPGA应用层的单粒子效应传播特性,为此类器件空间环境防护加固设计提供支撑。
With the rapid development of modern spacecraft, SRAM-based FPGA is adopted to applicate in space due to its excellent performance and programable advantage, however, Single Event Effect (SEE) is tough bottle-neck. In recent years, with device feature size shrinking and fast rising frequency ranges, SEE is becoming more complicated: SEE error is propagating in the logic circuit, affecting the interrelated area and even resuting the failure of circuit function.The thesis focuses on the modeling and testing methodology of SEE soft error propagation in application level, studies the effect of interrelated module and output of specific circuit induced by SEE soft error. The main content researched is as below:
(1) According to the feature of SEE, starting off the structure model and sensitive unit of SRAM-based FPGA, soft error propagation is analysed and the science meaning is stated, the content includes coupling factor of function module, error propagation model and soft error failure rate.
(2) According to the propagation of SEE soft error, the simulation method is proposed to study it. Aiming at the dynamic propagation progress, SEE soft error propagation simulation model which is based on Cellular Automaton is established. The algorithm is researched and carried out, simulation result is analysed and the effect factor is discussed.
(3) Aiming at researching the content of SEE soft error in SRAM-based FPGA, method of coupling factor of function module and soft error failure rate is analysed and SEU fault injection system is introducd. The principle and algorithm of SEU fault injection, experiment system and flow is studied.
At last, the soft error failure rate of the International Symposium of Circuits and Systems in 1985 and 1989 (ISCASA'85 and ISCASA'89), is tested by the SEU fault injection system. And coupling factor of function module is calculated.The experiment shows that the testing data accordants with the SEE soft error propagation model, and the test results were constructive for improving designs to space application. The meaning of the research is to enlarge the comprehendment of SEE soft error propagation in SRAM-based FPGA, and provide material to mitigate the SEE for such device in radiation environment.
(1)根据单粒子效应特点,在分析SRAM型FPGA的结构模型及其单粒子敏感单元基础上,对单粒子故障在其中的传播进行归纳;阐明单粒子故障传播特性的研究内容,包括电路功能模块的耦合参数、故障传播模型和电路输出软错误失效率。
(2)针对SRAM型FPGA单粒子故障传播现象,研究单粒子故障传播的建模方法。根据其动态传播过程特性,建立了基于元胞自动机的单粒子故障传播模型,研究该模型的算法设计与实现,并对该模型进行仿真,分析探讨影响故障传播的因素。
(3)针对SRAM型FPGA的单粒子故障传播特性研究内容,给出了电路功能模块耦合因子的分析方法和软错误失效率的测试方法;研究基于SEU故障注入的原理与关键技术,在分析SEU故障注入系统结构的基础上,设计并实现了本文采用的SEU故障注入系统。
最后,针对部分国际标准测试电路ISCASA'85和ISCASA'89,计算了其电路功能模块的耦合参数,采用SEU故障注入测试系统对电路输出软错误失效率进行了测试。本文研究的意义在于,加深理解SRAM型FPGA应用层的单粒子效应传播特性,为此类器件空间环境防护加固设计提供支撑。
With the rapid development of modern spacecraft, SRAM-based FPGA is adopted to applicate in space due to its excellent performance and programable advantage, however, Single Event Effect (SEE) is tough bottle-neck. In recent years, with device feature size shrinking and fast rising frequency ranges, SEE is becoming more complicated: SEE error is propagating in the logic circuit, affecting the interrelated area and even resuting the failure of circuit function.The thesis focuses on the modeling and testing methodology of SEE soft error propagation in application level, studies the effect of interrelated module and output of specific circuit induced by SEE soft error. The main content researched is as below:
(1) According to the feature of SEE, starting off the structure model and sensitive unit of SRAM-based FPGA, soft error propagation is analysed and the science meaning is stated, the content includes coupling factor of function module, error propagation model and soft error failure rate.
(2) According to the propagation of SEE soft error, the simulation method is proposed to study it. Aiming at the dynamic propagation progress, SEE soft error propagation simulation model which is based on Cellular Automaton is established. The algorithm is researched and carried out, simulation result is analysed and the effect factor is discussed.
(3) Aiming at researching the content of SEE soft error in SRAM-based FPGA, method of coupling factor of function module and soft error failure rate is analysed and SEU fault injection system is introducd. The principle and algorithm of SEU fault injection, experiment system and flow is studied.
At last, the soft error failure rate of the International Symposium of Circuits and Systems in 1985 and 1989 (ISCASA'85 and ISCASA'89), is tested by the SEU fault injection system. And coupling factor of function module is calculated.The experiment shows that the testing data accordants with the SEE soft error propagation model, and the test results were constructive for improving designs to space application. The meaning of the research is to enlarge the comprehendment of SEE soft error propagation in SRAM-based FPGA, and provide material to mitigate the SEE for such device in radiation environment.
引文
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