微电子产品视觉检测中关键技术研究
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摘要
微电子产业无疑是信息产业的核心和基础,是推动国民经济信息化的重要保证。随着微电子产品(集成电路芯片、印刷电路板等)向着高密度、细间距和低缺陷方向发展,对其检测技术在精密、高效、通用和智能化等方面提出了更高要求。由此,本文对微电子产品视觉检测中的关键技术进行研究,弥补了传统检测在精确快速定位、图像全景组合和精细缺陷检测等方面的不足,最终完成基于机器视觉的微电子产品外形尺寸和缺陷检测的理论研究和样机研制,并进行了大量实验证明其正确性和可行性,力图为我国自主创新的微电子产品视觉检测技术提供理论和实际借鉴。主要研究工作如下:
     (1)根据自动视觉检测原理和现代检测要求,设计了适用于微电子产品的新的视觉检测系统(PVMS)。针对微电子产品视觉检测的精密、高效、检测精度和测量范围变换大的特点,设计了伺服驱动、精密光栅采集组成闭环控制系统以保证运动精密、平稳、高效,和大的尺寸测量范围;设计了由CCD摄像机、大范围自动变倍镜头和自适应光源组成的图像采集系统,集不同精度等级的检测于一体;设计了电气控制和软件系统使检测方便快捷。最后研制了集光、机、电等高新技术于一体的样机。
     (2)针对遗传算法的初始参数对算法结果影响较大和易陷入局部最优的问题,在阐述基本数学理论模式定理的基础上,对自适应遗传算法进行了深入的研究,提出了一种优势遗传的新观点,由此设计了基于优势遗传的自适应遗传算法,通过实验表明,该算法能够达到理想全局最优解,有很强的全局搜索能力,在准确性、稳定性和重复性方面优于当前自适应遗传算法。并把它应用于微电子产品视觉检测的快速匹配定位和配准中,提高了图像匹配的速度和准确度。
     (3)针对圆形定位标志定位运算复杂、效率低的不足,结合点Hough变换的快速性和亚像素细分的精确性,提出基于点Hough变换的圆亚像素检测算法,有效提高了圆标志定位的准确性、快速性和鲁棒性。
     (4)针对高放大倍数显微镜头景深小、视场小的缺憾,对图像全景组合技术进行了研究。针对传统的基于软件的图像拼接算法复杂、速度慢的不足,和微电子产品视觉检测中大量序列图像快速精确拼接的要求,充分考虑本文研制设备的精密闭环运动系统,提出基于基准位置的快速精确图像拼接算法,拼接速度大大提高,精度达到亚像素级。
Microelectronic industry is the kernel and foundation of the information industry, it is the important assurance to improve national economy. With the development of microelectronic products(integrated circuit, printed circuit board, etc) directing to high density, thin separation and low defect ratio, its inspection requirement is higher on aspects of precision, efficiency, universal, and intelligence etc. Therefore, this paper researched on the general key techniques in the field of microelectronic products vision inspection, covered the shortage of traditional inspection on aspects of fast and precision locating, image mosaic, and fine defect test, completed theory study on physical dimension and defect inspection of microelectronic products based on machine vision, developed the prototype and used lots of experiments to prove its correctness and feasibility. The main research works in this dissertation are as follows:
     (1) Based on the automatic vision inspection principle and modern inspection requirement, designed a new vision inspection system for microelectronic products (PVMS). According to the features of precision, efficiency, inspection dimension and accuracy varying great range, designed closed-loop control system composition of servomechanism and grating to assure system’s precision, smooth, efficiency, and to realize the great dimension range measurement; designed image capture system composition of CCD, automatic variable power lens and self-adaptive lighting, to realize integration of large inspection precision range; designed electric control and software system to make the inspection convenience and fast. Finally, developed the prototype instrument.
     (2) Considering the problem that genetic algorithm running result is affected greatly by the initial parameter and it’s easy to trap in local optimum, based on its mathematic theory, studied deeply on self-adaptive genetic algorithm, presented a new viewpoint -- superiority inheritance, furthermore, designed adaptive genetic algorithm based on superiority inheritance. The experiment showed that this algorithm could find the global best solution, and had strongly global hunting capability. It is prior to traditional adaptive genetic algorithms on aspects of accuracy, stability, and repeatability etc. It was applied in fast image
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