HLS Ⅱ束流横向截面测量系统的研制及相关研究
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摘要
对于同步辐射光源,束流横向截面是表征束流性能的一个很重要的参数。在电子储存环中可以通过测量束流横向截面尺寸计算得到束流的横向发射度,束流横向截面的大小可以直观地反映同步辐射光的品质。针对合肥光源升级维修改造(HLSⅡ),为了给机器研究人员及用户提供光源品质的直观反映,我们研制了束流横向截面的测量系统,该系统可完成束流横向截面状态的监测,束流横向尺寸的精确测量以及束流横向发射度的测量。
通过对国内外束流横向截面测量技术的调研,我们确定使用同步光中可见光成像进行束流横向截面观测以及可见光干涉进行束流横向尺寸的精确测量。
首先从电子的横向运动出发给出了储存环束流横向截面尺寸及横向发射度的定义。然后分析了电子束流经弯铁的辐射及其传播成像的波动光学特性,并利用SRW仿真了同步光的自偏差及偏振性对成像结果的影响；详细推导了同步光双缝干涉图样的强度分布,以及干涉法测量束流横向截面尺寸的原理。
针对合肥光源重大维修改造工程,设计了用于束流测量的光束线,包括同步光引出系统,可见光成像和可见光干涉等束流测量的光学系统,并完成对所设计的光学系统的优化,质量评价及加工。利用SRW软件对HLSⅡ束流横向截面像的强度分布进行了仿真。并对束流横向截面测量系统的误差做了分析。
研制了成像法测量束流横向截面及干涉法测量束流横向截面的数据采集及处理系统。选购GigE Vision工业数字相机作为HLSⅡ束流横向截面测量的图像获取设备,完成了束流横向截面测量系统的搭建及应用程序开发。针对干涉法在线测量束流横向截面尺寸的要求,开发了基于峰值检测的干涉图样处理算法并对该算法做了测试。使用CA Lab实现束流横向截面参数测量结果的网络发布。对基于工业CCD相机测量系统的噪声做了较详细的分析。
利用研制的数据采集处理系统对改造前合肥光源的束流横向尺寸及发射度做了测量实验,并给出了实验结果。使用Lucy-Richardson算法对束流横向截面图像做了复原处理,取得了一定效果。最后给出了局部凸轨法对HLS Ⅱ同步光干涉测量系统标定的原理及方案,并提出使用干涉法测量光源点处的色散函数。
Beam tansverse profile is the important parameter for synchrotron radiation source, which could represent the quality of electron beam quality. In storage ring beam emittance could be estimated by beam transeverse size, so the size of beam profile can reflect the quality of synchrotron radiation light visually. A new electron beam transverse profile measurement system was developed at HLS Ⅱ to provide visual information of SR quality to SR user and machine researcher. The status of beam profile will be monitored by the system, and the beam transversal size will be measured accurately by this system.
The visible light imaging method and visible light interferometry were determined to measure beam transeverse profile at HLS Ⅱ
Firstly, the electron beam profile and emittance are derivated from electron transeverse motion. The wave properties of SR emitted from a bending magnet are analyzed, and then the self aberration and polarization of SR effecting on imaging result are simulated by using SRW Code. The SR inference pattern formed by two slits is deviated, and the principle of beam traseverse sizes measured by interometry is introduced in this paper.
For HLS Ⅱ, SR beamlines are designed for beam diagnostics in this paper, which included the SR extraction system, visible light imaging optic system, visible light intefering optic system and other optic systems for beam measurement. All the optic systems have been optimized and evaluated by ZEMAX, and the quality of optic systems could fulfill the beam diagnostics for HLS Ⅱ. Electron beam profile images of HLS Ⅱ are caculated by SRW code that formed by SR imaging optics.
The GigE Vision industrial digital camera is chosen for acquiring images of beam profile and interference pattern. The measurement system structure is built, and the application program is developed for processing the images from SR imaging system and interference system. To achieve beam size measured real-time by interometry, the algorithm for processing interference pattern based on peak detection is developed in this paper, and some tests is made for this algorithm. Beam parameters measured by beam profile measurement system are delivered on ethernet through CA Lab.
The developed data acquisition and processing system had been used for beam transeverse size and emittance measurement on HLS before it upgrated, and experiment results are presented in this paper. Lucy-Richardson algorithm is suggested to restore electron beam profile image here. Lastly, the principle and scheme of SR interferometers calibrated by local bump are presented, and the dispersion function measured by SR interferometer is proposed in this paper.
通过对国内外束流横向截面测量技术的调研,我们确定使用同步光中可见光成像进行束流横向截面观测以及可见光干涉进行束流横向尺寸的精确测量。
首先从电子的横向运动出发给出了储存环束流横向截面尺寸及横向发射度的定义。然后分析了电子束流经弯铁的辐射及其传播成像的波动光学特性,并利用SRW仿真了同步光的自偏差及偏振性对成像结果的影响；详细推导了同步光双缝干涉图样的强度分布,以及干涉法测量束流横向截面尺寸的原理。
针对合肥光源重大维修改造工程,设计了用于束流测量的光束线,包括同步光引出系统,可见光成像和可见光干涉等束流测量的光学系统,并完成对所设计的光学系统的优化,质量评价及加工。利用SRW软件对HLSⅡ束流横向截面像的强度分布进行了仿真。并对束流横向截面测量系统的误差做了分析。
研制了成像法测量束流横向截面及干涉法测量束流横向截面的数据采集及处理系统。选购GigE Vision工业数字相机作为HLSⅡ束流横向截面测量的图像获取设备,完成了束流横向截面测量系统的搭建及应用程序开发。针对干涉法在线测量束流横向截面尺寸的要求,开发了基于峰值检测的干涉图样处理算法并对该算法做了测试。使用CA Lab实现束流横向截面参数测量结果的网络发布。对基于工业CCD相机测量系统的噪声做了较详细的分析。
利用研制的数据采集处理系统对改造前合肥光源的束流横向尺寸及发射度做了测量实验,并给出了实验结果。使用Lucy-Richardson算法对束流横向截面图像做了复原处理,取得了一定效果。最后给出了局部凸轨法对HLS Ⅱ同步光干涉测量系统标定的原理及方案,并提出使用干涉法测量光源点处的色散函数。
Beam tansverse profile is the important parameter for synchrotron radiation source, which could represent the quality of electron beam quality. In storage ring beam emittance could be estimated by beam transeverse size, so the size of beam profile can reflect the quality of synchrotron radiation light visually. A new electron beam transverse profile measurement system was developed at HLS Ⅱ to provide visual information of SR quality to SR user and machine researcher. The status of beam profile will be monitored by the system, and the beam transversal size will be measured accurately by this system.
The visible light imaging method and visible light interferometry were determined to measure beam transeverse profile at HLS Ⅱ
Firstly, the electron beam profile and emittance are derivated from electron transeverse motion. The wave properties of SR emitted from a bending magnet are analyzed, and then the self aberration and polarization of SR effecting on imaging result are simulated by using SRW Code. The SR inference pattern formed by two slits is deviated, and the principle of beam traseverse sizes measured by interometry is introduced in this paper.
For HLS Ⅱ, SR beamlines are designed for beam diagnostics in this paper, which included the SR extraction system, visible light imaging optic system, visible light intefering optic system and other optic systems for beam measurement. All the optic systems have been optimized and evaluated by ZEMAX, and the quality of optic systems could fulfill the beam diagnostics for HLS Ⅱ. Electron beam profile images of HLS Ⅱ are caculated by SRW code that formed by SR imaging optics.
The GigE Vision industrial digital camera is chosen for acquiring images of beam profile and interference pattern. The measurement system structure is built, and the application program is developed for processing the images from SR imaging system and interference system. To achieve beam size measured real-time by interometry, the algorithm for processing interference pattern based on peak detection is developed in this paper, and some tests is made for this algorithm. Beam parameters measured by beam profile measurement system are delivered on ethernet through CA Lab.
The developed data acquisition and processing system had been used for beam transeverse size and emittance measurement on HLS before it upgrated, and experiment results are presented in this paper. Lucy-Richardson algorithm is suggested to restore electron beam profile image here. Lastly, the principle and scheme of SR interferometers calibrated by local bump are presented, and the dispersion function measured by SR interferometer is proposed in this paper.
引文
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