某遥测数据采编与固态记录综合测试装置的设计
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摘要
为记录高速、远距离、高过载等条件下子弹的飞行试验数据,采用遥测与固态存储相结合的工作方式,遥测数据与硬回收数据互为备份,互相取舍,配合地面测试装置,实现设备的单元自检、联合测试和数据回收,为子弹设计提供数据参考。
     结合常用弹载采集存储器的设计特点,根据实际需求和环境约束,设计了总体方案和分立方案,利用一套采编器、一套硬回收存储器组成弹上系统,完成状态信号的采编、数据遥测发射和存储。地面综合测试平台检测弹上设备工作情况并完成存储器数据的回收。整套系统以FPGA为逻辑控制中心,以FLASH为存储介质,以LVDS为通信标准。
     针对不同设备的技术、功能要求,分别介绍了采编器、存储器、地面转接器和地面综合测试台的软硬件设计方法,研究了模拟信号调理采集、RS485电平信号的收发、PCM码流的收发、FLASH的读写擦除控制等,突出介绍了LVDS的通讯原理,并通过同轴电缆与光纤实现了数据的远程通信。
     基于存储器硬回收的环境条件,设计了防护结构以保障存储电路在高温、高过载等恶劣环境下正常工作,包括多层壳体结构设计、缓冲设计和热防护设计,通过计算和ANSYS软件仿真,理论验证了结构的可靠性。
     全套测试装置顺利完成了靶射试验工作,取得了完整的试验数据。
To record bullet’s flight test data under high-speed, long distance and high overload conditions, using combination of telemetry and solid-state storage to recovery its states. Those two manners back up test data for each other. Choose valid data between them could verify its correctness. With ground testing device which could make self-test, joint test and data reading give the data reference for the bullet design.
     Combined common acquisition and storage method in the bullet with the actual demands and environmental constraints, the paper made the overall and discrete design. The collecting and storing system in the bullet is composed by an acquisition framing device and a solid-state recorder. Ground integrated test platform, which could test equipment state in the bullet and recovery FLASH memory’s data. The entire system uses FPGA as the logic control center, FLASH as the storage medium and LVDS interface as the communication standard.
     For different technique and function requirements, the hardware and software design method was introduced including the acquisition framing device, solid-state recorder, ground adapter and ground test station. The paper researched analog signal conditioning and acquisition, RS485 and PCM streams’sending and receiving, FLASH memory’s reading and writing, and highlighting introduced the principle of LVDS and its telecommunication transmitted on coaxial cable and fiber optic.
     Based on recorder recycling environmental conditions, the paper designed a protective structure which could protect the memory circuit in the high temperature, high overload and other harsh working environments. The protective design includes multi-layer shells, pressure buffer and thermal protection. Having analyzed by calculation and ANSYS software simulation, verified the reliability of the structure in theory.
     The design of the whole system had finished target shooting test successfully and acquired integral testing data.
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