高可靠长寿命产品可靠性技术研究
|
摘要
随着科学技术的发展和设计、制造水平的大幅度提高,高可靠长寿命产品在军事、航空航天、电子工业、通信等领域应用越来越广泛,如何保障其可靠性与预测其寿命是值得深入研究的重要问题。本论文围绕高可靠长寿命产品可靠性研究中需要解决的关键技术与方法,在可靠性建模分析、可靠性评估、可靠性增长等方面进行了系统、深入的研究,主要研究内容与结论包括:
1、在传统可靠性建模分析方法基础上,对高可靠长寿命产品退化失效模式进行了研究,提出了基于硬、软故障竞争失效模式的可靠性建模分析方法。基于该方法,分析了某高可靠长寿命航天机电产品的可靠性、失效率及平均故障时间与失效阈值的关系。研究结果表明,这种建模分析方法更加符合高可靠长寿命产品的失效规律,有助于优化产品的可靠性设计。
2、分析了性能退化数据的特点,在寿命试验数据统计分析方法的基础上,提出了基于伪失效寿命的退化数据可靠性评估方法;分析了产品性能退化量分布随时间的变化规律,提出了基于性能退化量分布的退化数据可靠性评估方法。采用这两种方法,对高可靠长寿命GaAs激光器的可靠性进行了评估。研究表明,性能退化数据包含大量高可靠长寿命产品的可靠性信息,在寿命试验与加速寿命试验无法获得失效数据的情况下,利用性能退化数据可以有效地对高可靠长寿命产品进行可靠性评估与寿命预测。
3、分析了加速退化数据的特点,总结了加速退化试验退化过程的加速性条件和常用的加速方程。将加速方程引入到加速退化试验数据的处理中,提出了基于伪失效寿命的加速退化试验数据可靠性评估方法;提出了基于退化量分布的加速退化试验数据可靠性评估方法。基于这两种方法,对高可靠长寿命碳膜电阻器的可靠性进行了评估。研究表明,对于性能退化十分缓慢的高可靠长寿命产品,可以利用加速退化试验的方法来评估产品可靠性并预测其寿命。
4、研究了高可靠长寿命产品基于可靠性强化试验的可靠性增长关键技术,给出了可靠性强化试验的应用流程和剖面制定准则,提出了利用常规试验设备完成部分可靠性强化试验内容的方法,并将上述方法应用于我国新研制的××卫星有效载荷的可靠性增长研究。研究结果表明,对于高可靠长寿命产品,可靠性强化试验可以在短期内激发其潜在缺陷,大幅缩短产品可靠性增长所需时间,节省试验费用。
总之,本文在高可靠长寿命产品可靠性保障与寿命预测应用需求的牵引下,通过理论分析,深化了对高可靠长寿命产品失效过程的认识,系统地研究了如何分析其可靠性、评估其可靠性、增长其可靠性等相关理论和技术问题。本文的研究成果,对于解决高可靠长寿命产品的可靠性保障和寿命预测问题具有一定的理论意义和工程价值。
With the development of science and technology, the increasing improvement of manufacture techniques, the high-reliability & long-lifetime products are commonly used in such fields as Military, Astronautics & Aeronautics, Electronic industries and Communications. The problem of how to enhance their reliability and forecast their lifetime have become an important question deserving an in-depth study. This dissertation mainly carries on a systemic research on the key technologies and methods of high-reliability & long-lifetime products' reliability engineering, include reliability modeling analysis, reliability assessment and reliability growth. The main contributions of this dissertation are summarized as follows:
1. Based on traditional reliability analysis methods, the degradation failure modes of high-reliability & long-lifetime products are investigated, the reliability modeling analysis method based on competing mode of hard and soft failure is presented. The relations between reliability, failure rate, MTBF and failure threshold are analyzed by this method. The results reveal that this modeling analysis method adheres to the rules of products' failure, and can help to optimize product reliability design.
2. The characteristics of performance degradation data are analyzed. Based on statistical analysis methods for life test data, the reliability assessment methods with performance degradation data based on pseud-failure lifetime is presented. The disciplinarians of product performance degradation data with time are analyzed, the reliability assessment methods with performance degradation data based on performance degradation distribution is presented. These methods of reliability assessment are respectively applied to evaluating reliability of GaAs lasers. The application shows that performance degradation data contain abundant product reliability information, the reliability and lifetime of the high-reliability & long-lifetime products can be evaluated with performance degradation data availably, even if the failure time cannot be obtained by life testing(LT) or accelerated life testing(ALT).
3. The characteristics of accelerated degradation data are analyzed, and the accelerative condition and common accelerated equations of accelerated degradation process are summarized. Introducing accelerated equations into analysis of accelerated degradation testing(ADT) data, the reliability assessment methods with accelerated degradation data based on pseud-failure lifetime is presented, and the reliability assessment methods with accelerated degradation data based on performance degradation distribution is presented. These methods based on ADT data are respectively applied to evaluating reliability of carbon-film resistors. The application shows that the ADT methods can be applied to evaluate reliability and forecast lifetime even when the performance degradation process of high-reliability & long-lifetime product is quite slow.
4. The key technologies of reliability growth methods based on reliability enhancement testing(RET) are studied, the principles of RET's profiles and the steps of RET are summarized. The method that utilizes traditional test equipments to accomplish partial content of RET is presented. The RET methods are applied to××satellite payload, and the test results are carefully analyzed, the methods of improving on this product's design are presented. The test results indicate that RET can effectively stimulate potential defaults of typical high-reliability & long-lifetime products such as××satellite payload, and RET is an effective method which can improve reliability of high-reliability & long-lifetime products quickly.
In summary, the dissertation has deepened the understanding of failure process of high-reliability & long-lifetime products by theory analysis and resolved the questions of how to analyze their reliability, assess their reliability, forecast their lifetime, enhancement their reliability. These research results are meaningful for the application of reliability assurance and lifetime forecast of high-reliability & long-lifetime products.
1、在传统可靠性建模分析方法基础上,对高可靠长寿命产品退化失效模式进行了研究,提出了基于硬、软故障竞争失效模式的可靠性建模分析方法。基于该方法,分析了某高可靠长寿命航天机电产品的可靠性、失效率及平均故障时间与失效阈值的关系。研究结果表明,这种建模分析方法更加符合高可靠长寿命产品的失效规律,有助于优化产品的可靠性设计。
2、分析了性能退化数据的特点,在寿命试验数据统计分析方法的基础上,提出了基于伪失效寿命的退化数据可靠性评估方法;分析了产品性能退化量分布随时间的变化规律,提出了基于性能退化量分布的退化数据可靠性评估方法。采用这两种方法,对高可靠长寿命GaAs激光器的可靠性进行了评估。研究表明,性能退化数据包含大量高可靠长寿命产品的可靠性信息,在寿命试验与加速寿命试验无法获得失效数据的情况下,利用性能退化数据可以有效地对高可靠长寿命产品进行可靠性评估与寿命预测。
3、分析了加速退化数据的特点,总结了加速退化试验退化过程的加速性条件和常用的加速方程。将加速方程引入到加速退化试验数据的处理中,提出了基于伪失效寿命的加速退化试验数据可靠性评估方法;提出了基于退化量分布的加速退化试验数据可靠性评估方法。基于这两种方法,对高可靠长寿命碳膜电阻器的可靠性进行了评估。研究表明,对于性能退化十分缓慢的高可靠长寿命产品,可以利用加速退化试验的方法来评估产品可靠性并预测其寿命。
4、研究了高可靠长寿命产品基于可靠性强化试验的可靠性增长关键技术,给出了可靠性强化试验的应用流程和剖面制定准则,提出了利用常规试验设备完成部分可靠性强化试验内容的方法,并将上述方法应用于我国新研制的××卫星有效载荷的可靠性增长研究。研究结果表明,对于高可靠长寿命产品,可靠性强化试验可以在短期内激发其潜在缺陷,大幅缩短产品可靠性增长所需时间,节省试验费用。
总之,本文在高可靠长寿命产品可靠性保障与寿命预测应用需求的牵引下,通过理论分析,深化了对高可靠长寿命产品失效过程的认识,系统地研究了如何分析其可靠性、评估其可靠性、增长其可靠性等相关理论和技术问题。本文的研究成果,对于解决高可靠长寿命产品的可靠性保障和寿命预测问题具有一定的理论意义和工程价值。
With the development of science and technology, the increasing improvement of manufacture techniques, the high-reliability & long-lifetime products are commonly used in such fields as Military, Astronautics & Aeronautics, Electronic industries and Communications. The problem of how to enhance their reliability and forecast their lifetime have become an important question deserving an in-depth study. This dissertation mainly carries on a systemic research on the key technologies and methods of high-reliability & long-lifetime products' reliability engineering, include reliability modeling analysis, reliability assessment and reliability growth. The main contributions of this dissertation are summarized as follows:
1. Based on traditional reliability analysis methods, the degradation failure modes of high-reliability & long-lifetime products are investigated, the reliability modeling analysis method based on competing mode of hard and soft failure is presented. The relations between reliability, failure rate, MTBF and failure threshold are analyzed by this method. The results reveal that this modeling analysis method adheres to the rules of products' failure, and can help to optimize product reliability design.
2. The characteristics of performance degradation data are analyzed. Based on statistical analysis methods for life test data, the reliability assessment methods with performance degradation data based on pseud-failure lifetime is presented. The disciplinarians of product performance degradation data with time are analyzed, the reliability assessment methods with performance degradation data based on performance degradation distribution is presented. These methods of reliability assessment are respectively applied to evaluating reliability of GaAs lasers. The application shows that performance degradation data contain abundant product reliability information, the reliability and lifetime of the high-reliability & long-lifetime products can be evaluated with performance degradation data availably, even if the failure time cannot be obtained by life testing(LT) or accelerated life testing(ALT).
3. The characteristics of accelerated degradation data are analyzed, and the accelerative condition and common accelerated equations of accelerated degradation process are summarized. Introducing accelerated equations into analysis of accelerated degradation testing(ADT) data, the reliability assessment methods with accelerated degradation data based on pseud-failure lifetime is presented, and the reliability assessment methods with accelerated degradation data based on performance degradation distribution is presented. These methods based on ADT data are respectively applied to evaluating reliability of carbon-film resistors. The application shows that the ADT methods can be applied to evaluate reliability and forecast lifetime even when the performance degradation process of high-reliability & long-lifetime product is quite slow.
4. The key technologies of reliability growth methods based on reliability enhancement testing(RET) are studied, the principles of RET's profiles and the steps of RET are summarized. The method that utilizes traditional test equipments to accomplish partial content of RET is presented. The RET methods are applied to××satellite payload, and the test results are carefully analyzed, the methods of improving on this product's design are presented. The test results indicate that RET can effectively stimulate potential defaults of typical high-reliability & long-lifetime products such as××satellite payload, and RET is an effective method which can improve reliability of high-reliability & long-lifetime products quickly.
In summary, the dissertation has deepened the understanding of failure process of high-reliability & long-lifetime products by theory analysis and resolved the questions of how to analyze their reliability, assess their reliability, forecast their lifetime, enhancement their reliability. These research results are meaningful for the application of reliability assurance and lifetime forecast of high-reliability & long-lifetime products.
引文
[1]Dasgupta,A.,Pecht,M.Material Failure Mechanisms and Damage Models.IEEE Transactions on Reliability,1991,40(5):531-536
[2]韩明.无失效数据的可靠性分析.北京:中国统计出版社.1999
[3]Chenoweth,H.B.Soft failures and reliability.Proceedings Annual Reliability and Maintainability Symposium.1990:419-424
[4]Gerstsbackh,I.B.,Kordonskiy,K.B.Models of Failure(Translation from the Russian version).New York:Wiley.1969
[5]Nair,V.N.Estimation of Reliability in Field-Performance Studies:Discussion.Technometrics,1988,30(4):379-383
[6]Misra,R.B.Reliability assessment for static electricity meters.Metering and Tariffs for Energy Supply,1999.Ninth International Conference on(Conf.Publ.No.462).1999:151-155
[7]Yang,K.,Xue,J.Continuous state reliability analysis.Proceedings Annual Reliability and Maintainability Symposium.1996:251-257
[8]Zuo,M.J.,Jiang,R.Y.,Yam,R.C.M.Approaches for reliability modeling of continuous state devices.IEEE Transaction on Reliability,1999,48(1):9-18.
[9]周源泉,翁朝曦.可靠性评定.北京:科学出版社.1990年03月第1版
[10]周源泉,刘振德,陈宝延等.某型涡扇发动机的可靠性增长分析与评估.质量与可靠性,2004,(3):42-45
[11]夏红娟.某无线电定高装置可靠性评估.上海航天,2003,20(4):46-49
[12]王凭慧,范本尧,傅惠民.卫星推力器可靠性评估和寿命预测.航空动力学报,2004,19(6):745-748
[13]刘国俊,周晓明.威布尔型产品的可靠性评估方法研究.上海航天,2002,19(2):13-16
[14]Dey,D.K.,Lee,T.M.Bayes computation for life testing and reliability estimation.IEEE Transactions on Reliability,1992,41(4):621-626
[15]Mroczkowski,R.S.,Maynard,J.M.Estimating the reliability of electrical connectors.IEEE Transactions on Reliability,1991,40(5):507-512
[16]Thiagarajah,K.R.Homogeneity tests for scale parameters of 2-parameter exponential populations under time censoring.IEEE Transactions on Reliability,1995,44(2):297-301
[17]Chun Kin,C.,Seraidaridia,C.I.,Tortorella,M.Sequential sampling plans for early-life reliability assessment.Proceedings Annual Reliability and Maintainability Symposium.1997:131-135
[18]Gibson,D.Statistical reliability prediction.International Integrated Reliability Workshop.1995:161
[19]Barnett,T.S.,Grady,M.,Purdy,K.et al.Exploiting defect clustering for yield and reliability prediction.Computers and Digital Techniques,lie Proceedings-,2005,152(3):407-413
[20]葛广平.我国加速寿命试验研究的现状与展望.数理统计与管理,2000,19(1):25-29
[21]Nelson,W.B.,Meeker,W.Q.Theory for Optimum Censored Accelerated Life Tests for Weibull and Extreme Value Distributions,Technometrics,1978,20(2):171-177
[22]Nelson,W.B.Accelerated Life Testing-Step-stress Models and Data Analysis.liEE Transactions on Reliability,1980,29(2):103-108
[23]Bluvband,Z.,Peshes,L.Accelerated life testing for products without sequence effect.Proceedings Annual Reliability and Maintainability Symposium.1996:341-347
[24]Bai,D.S.,Yun,H.J.Accelerated life tests for products of unequal size.Reliability,IEEE Transactions on,1996,45(4):611-618
[25]Barbosa,E.P.,Colosimo,E.A.,Louzada-Neto,E Accelerated life tests analyzed by a piecewise exponential distribution via generalized linear models.Reliability,IEEE Transactions on,1996,45(4):619-623
[26]Guang-Bin,Y.Optimum constant-stress accelerated life-test plans.Reliability,IEEE.Transactions on,1994,43(4):575-581
[27]Guerin,F.,Dumon,B.,Lantieri,P.Accelerated life testing on repairable systems.Reliability and Maintainability,2004 Annual Symposium - RAMS.2004:340-345
[28]McDonald,K.Humidity Control in Accelerated Life Tests.Components,Hybrids,and Manufacturing Technology,liEE Transactions on[see also liEE Trans.on Components,Packaging,and Manufacturing Technology,Part A,B,C],1984,7(3):268-275
[29]Watkins,A.J.Accelerated life testing in product design and prototyping.Proof of Designed Reliability(Digest No.1994/239),lie Colloquium on.1994:7/1-7/4
[30]Yang,C.R.,Kim,J.T.Temperature accelerated life test(ALT)at the circuit board level.Electronics Manufacturing Technology Symposium,1995.'Manufacturing Technologies-Present and Future',Seventoenth IEEE/CPMT International.1995:158-165
[31]Chaloner,K.,Larntz,K.Bayesian design for accelerated life testing.Journal of Statistical Planning and Inference,1992,33(2):245-259
[32]Erkanli,A.,Soyer,R.Simulation-based designs for accelerated life tests.Journal of Statistical Planning and Inference,2000,90(2):335-348
[33]茆诗松,王玲玲.加速寿命试验.北京:科学出版社.1997
[34]张春华,温熙森,陈循.加速寿命试验技术综述.兵工学报,2004,25(4):485-490
[35]张志华.加速寿命试验及其统计分析.北京:北京工业大学出版社.2002
[36]程依明.步进应力加速寿命试验的最优设计.应用概率统计,1994,10(1):52-61
[37]费鹤良.指数模型步进应力加速寿命试验的区间估计.应用概率统计,1995,11(3):297-304
[38]葛广平,刘立喜.竞争失效产品恒定应力加速寿命试验的优化设计.应用概率统计,2002,18(3):260-268
[39]茆诗松.加速寿命试验的加速模型.质量与可靠性,2003,(2):15-17
[40]茆诗松.加速系数与指数分布下的步加速试验.质量与可靠性,2003,(4):5-10
[41]宋乾坤.双参数指数分布下两应力交叉步加试验的统计分析.工程数学学报,1997,14(1):45-51
[42]孙利民,张志华.Weibull分布下恒定应力加速寿命的试验分析.江苏理工大学学报:自然科学版,2000,21(4):78-81
[43]王炳兴.竞争失效产品加速寿命试验的统计分析.应用数学学报,2002,25(2):254-262
[44]王炳兴,王玲玲.加速寿命试验的参数估计.华东师范大学学报:自然科学版,1996,(3):27-32
[45]王炳兴,王玲玲.加速寿命试验参数估计的改进.电子产品可靠性与环境试验,1996,(3):1-4
[46]李祚东,顾长鸿.无失效情况下威布尔分布的可靠性评估方法研究.质量与可靠性,1995,(5):31-36,46
[47]茆诗松,陆淑兰.恒定应力加速寿命试验中无失效数据的处理.应用概率统计,1993,9(2):216-218
[48]Lall,P.Challenges in accelerated life testing.Thermal and Thermomechanical Phenomena in Electronic Systems,2004.1THERM '04.The Ninth Intersociety Conference on.2004,2:727 Vol.2
[49]Nelson,W.B.Analysis of performance-degradation data from accelerated tests.IEEE Transactions on Reliability,1981,30(2):149-154
[50]Lu,C.J.,Meeker,W.Q.Using Degradation Measures to Estimate a Time-to-Failure Distribution.Technometrics,1993,35(2):161-174
[51]Yu,H.F.,Tseng S.T.Designing a Screening Experiment for Highly Reliable Products.Naval Research Logistics,2002,(49):514-526
[52]Yang,K.,Yang G.Degradation Reliability Assessment Using Severe Critical Values.International Journal of Reliability,Quality and safety Engineering,1998,5(1):85-95
[53]Tseng,S.T.,Hamada M.S.,Chiao C.H.Using degradation data from a fractional factorial experiment to improve fluorescent lamp reliability.Journal of Quality Technology,1995,27(4):363-369
[54]Chuang,S.L.,Ishibashi A.Kinetic Model for Degradation of Light Emitting Diodes.IEEE Journal of Quantum Electronics,1997,33(6):970-979
[55]Chiao,C.H.,Hamada M.S.Robust reliability for light emitting diodes using degradation measurements.Quality & Reliability Engineering International,1996,(12):89-94
[56]Andonova,A.,Philippov,P.,Atanasova,N.Methodology of estimate reliability of highly reliable components by monitoring performance degradation.Electronics Technology:Concurrent Engineering in Electronic Packaging,2001.24th International Spring Seminar on.2001:125-128
[57]Shaw,S.R.Instrumentation for PEM fuel cell transient degradation monitoring.Power Engineering Society General Meeting,2004.IEEE.2004:1646-1649 Vol.2
[58]Crk,V.Reliability assessment from degradation data.Proceedings Annual Reliability and Maintainability Symposium.2000:155-161
[59]Zehua,C.,Shurong,Z.Lifetime distribution based degradation analysis.IEEE Transactions on Reliability,2005,54(1):3-10
[60]Carey,M.B.,Tortorella,M.Analysis of degradation data applied to MOS devices,the 6th International Conference on Reliability and Maintainability,Strasbourg,France.1988:
[61]Jiang,M.,Zhang,Y.Dynamic modeling of degradation data.Proceedings Annual Reliability and Maintainability Symposium.2002:607-611
[62]V.Lista,P.G.,T.Tomasi,M.Borgarino,F.Fantini,L.Gherardi,A.Righetti,M.Villa.Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications.Microelectronics Reliability,2002,(42):1389-1392
[63]William Q Meeker,N.D.,Gerald J Hahn.Using degradation data for product reliability analysis.Quality Progress,2001,34(6):60-65
[64]Jayaram,J.S.R.,Girish,T.Reliability prediction through degradation data modeling using a quasi-likelihood approach.Proceedings Annual Reliability and Maintainability Symposium.2005:193-199
[65]Peng,W.,Coit,D.W.Reliability prediction based on degradation modeling for systems with multiple degradation measures.Reliability and Maintainability,2004 Annual Symposium - RAMS.2004:302-307
[66]E.Ioannides,E.Beghini,G.Bergling et al.Cleanliness and its importance for bearing performance.Ball Bearing Journal,1993:242-248
[67]Carey,M.B.,Koenig R.H.Reliability assessment based on accelerated degradation:a case study.IEEE Transactions on Reliability,1991,40(5):499-506
[68]Meeker,W.Q.,Hamada,M.Statistical tools for the rapid development and evaluation of high-reliability products.IEEE Transactions on Reliability,1995,44(2):187-198
[69]T.S.Tseng,M.Hamada,C.H.Chiao.Using Degradation Data to Improve Fluorescent Lamp Reliability.Journal of Quality Technology,1995,27(4):195-206
[70]Feinberg,A.A.,Widom,A.Connecting Parametric Aging to Catastrophic Failure Through Thermodynamics.IEEE Transaction on Reliability,1996,45(1):28-33
[71]L.Gallais,Natoli,J.Y.,C.Amra.Statistical study of single and multiple pulse laser-induced damage in glasses.Optics Express,2002,10(25):2-6
[72]Viviane Ribeiro Branco de Oliveiral,E.A.o.C.Comparison of Methods to Estimate the Time-to-failure Distribution in Degradation Tests.Quality and Reliability Engineering International,2004,(20):363-373
[73]庄东辰.退化失效模型及其统计分析[博士学位论文].上海:华东师范大学研究生院,1994
[74]Meeker,W.Q.,Escobar,L.A.,C.,L.J.Accelerated degradation tests:modeling and analysis.Technometrics,1998,40(2):89-99
[75]Chan,C.K.,Boulanger,M.,Tortorella,M.Analysis of parameter-degradation data using life-data analysis programs.Proceedings Annual Reliability and Maintainability Symposium. 1994:288-291
[76]Meeker,W.Q.,Escobar,L.A.Statistical Methods for Reliability Data.New York:John Wiley & Sons,Inc.1998
[77]Lu,J.C.,Park J.,Yang Q.Statistical Inference of a Time-to-Failure Distribution Derived From Linear Degradation Data.Technometrics,1997,39(4):391-400
[78]Andonova,A.,Philippov,P.,Atanasova,N.Methodology of estimation reliability of highly reliable components by monitoring performance degradation.24th International Spring Seminar on Electronics Technology.2001:
[79]苏德清.微波低噪声GaAsFET加速寿命试验参数退化模型的研究报告.中国电子技术标准化研究所.1992
[80]Yang,G B.,Yang K.Accelerated Degradation Tests with Tightened Critical Values.IEEE Transactions on Reliability,2002,51(4):463-468.
[81]Shiau,J.J.H.,Lin H.H.Analyzing accelerated degradation data by nonparametric regression.IEEE Transactions on Reliability,1999,48(2):149-158
[82]Hong,F.Y.,Sheng,T.T.On-Line Procedure for Terminating an Accelerated Degradation Test.Statistica Sinica,1998,(8):207-220
[83]Wendai,W.,Dragomir-Daescu,D.Reliability quantification of induction motors-accelerated degradation testing approach.Proceedings Annual Reliability and Maintainability Symposium.2002:325-331.
[84]Guangbin,Y.,Kai,Y.Accelerated degradation-tests with tightened critical values.IEEE Transactions on Reliability,2002,51(4):463-468
[85]Boulanger,M.,Escobar,L.A.Experimental design for a class of accelerated degradation tests.Technometdcs,1994,36(4):260-272
[86]Chang,D.S.Analysis of accelerated degradation data in a two-way design.Reliability Engineering and System Safety,1992,39(1):65-69
[87]Chang,L.C.T.D.S.Reliability prediction using nondestructive accelerated-degradation data:case study on power supplies.IEEE Transactions on Reliability,1995,44(4):562-566
[88]Yanagisawa,T.,Kojima,T.Degradation of InGaN blue light-emitting.diodes under continuous and low-speed pulse operations.Microelectronics Reliability,2003,43(6):977-980
[89]周源泉,翁朝曦.可靠性增长.北京:科学出版社.1992年01月第1版
[90]Gaudoin,O.,Bo,Y.,Min,X.A simple goodness-of-fit test for the power-law process,based on the Duane plot.IEEE Transactions on Reliability,2003,52(1):69-74
[91]Demko,E.On nonlinear reliability growth.Proceedings Annual Reliability and Maintainability Symposium.1993:411-416
[92]Crow,L.H.Estimation procedures for Duane model.ADA019372.1972
[93]Mortin,D.E.,McCarthy,M.J.,Querido,D.M.et al.Developing a subsystem reliability growth program.Proceedings Annual Reliability and Maintainability Symposium.1994:130-135
[94]Clark,J.A.Modeling reliability growth late in development.Proceedings Annual Reliability and Maintainability Symposium.1999:201-207
[95]Ziad,T.,Ellner,P.M.Statistical precision androbustness of the AMSAA continuous reliability growth estimators.Proceedings Annual Reliability and Maintainability Symposium.1990:210-214
[96]周源泉,翁朝曦.AMSAA模型对一次性使用产品的应用.质量与可靠性,1995,(6):30-34
[97]梅文华.利用AMSAA模型预测产品可靠性增长.空军工程大学学报:自然科学版,2003,4(2):81-83
[98]刘鸿翔,田国梁.AMSAA模型的参数估计方法.培训与研究:湖北教育学院学报,2003,20(2):4-9
[99]黄舜琪.AMSAA模型在飞机试飞阶段可靠性评定中的应用.飞行试验,2001,17(4):37-44
[100]董蕙茹,黄燕锋,等.AMSAA模型用于可靠性增长预测时的改进.空军工程大学学报:自然科学版,2002,3(5):79-82
[101]Duane,J.T.Learning curve approach to reliability monitoring.IEEE Transactions on Aerospace,1964,2(2):563-566
[102]Crow,L.H.AMSAA reliability growth symposium.ADA027053.1974
[103]Crow,L.H.Reliability analysis for complex,repairable system.ADA020296.1975
[104]Crow,L.H.Confidence interval procedures for reliability growth.analysis.ADA044788.1982
[105]Crow,L.H.Confidence interval procedures for the Weibull process with applications to reliability growth.Technometrics,1982,24(1):67-72
[106]周源泉,翁朝曦.可靠性增长管理的综合公式.系统工程与屯子技术,1992,(2):77-80,76
[107]姜同敏.可靠性增长技术的现状和发展.环境技术,1995,13(2):1-6
[108]Andonova,A.S.,Atanasova,N.G Accelerated reliability growth of electronic devices.27th International Spring Seminar on Electronics Technology:Meeting the Challenges of Electronics Technology Progress.2004,2:242-246.
[109]Klyatis,L.M.Step-by-step accelerated testing.Proceedings Annual Reliability and Maintainability Symposium.1999:57-61
[110]Klyatis,L.M.Conditions of environmental accelerated testing.Proceedings Annual Reliability and Maintainability Symposium.1998:372-377
[111]陈循,陶俊勇,张春华.可靠性强化试验与加速寿命试验综述.国防科技大学学报,2002,24(4):29-32
[112]杨宇航,周源泉.加速寿命试验的理论基础(Ⅰ).推进技术,2001,22(4):276-278,318
[113]杨宇航,周源泉.加速寿命试验的理论基础(Ⅱ).推进技术,2001,22(5):353-356
[114]Mingxiao,J.,Yongcang,z.Dynamic modeling of degradation data.Proceedings Annual Reliability and Maintainability Symposium.2002:607-611
[115]Boulanger,M.,Escobar L.A.Experimental design for a class of accelerated degradation tests.Technometrics,1994,36(4):260-272
[116]Tang,L.C.,Yang,G.Y.,Xie,M.Planning of step-stress accelerated degradation test.Reliability and Maintainability,2004 Annual Symposium - RAMS.2004:287-292
[117]Gregg,K.H.Accelerated Reliability Engineering:HALT and HASS:Chichester:John Wiley & Sons LTD.2000
[118]褚卫华,陈循,陶俊勇等.高加速寿命试验(HALT)与高加速应力筛选(HAss).强度与环境,2002,29(4):23-37
[119]蒋培,陈循,张春华.可靠性强化试验技术综述.强度与环境,2003,30(1):58-64
[120]Robert,W.D.,Edward,O.M.Reliability Enhancement Testing.Proceedings Annual Reliability and Maintainability Symposium.1994:91-98
[121]陈奇妙.国外可靠性强化试验技术文集.国防科工委质量与可靠性研究中心.1998年3月
[122]陈奇妙.美国可靠性强化试验技术发展点评.质量与可靠性,1998,(4):44-47
[123]Ascarrunz,C.HALT:bridging the gap between theory and practice.Test Conference,1994.Proceedings.,International.1994:548-554
[124]Munikoti,R.,Dhar,P.Highly accelerated life testing(HALT)for multilayer ceramic capacitor qualification.Components,Hybrids,and Manufacturing Technology,IEEE Transactions on[see also IEEE Trans.on Components,Packaging,and Manufacturing Technology,Part A,B,C],1988,11(4):342-345
[125]Polcawich,R.G.,Feng,C.,Vanatta,P.et al.Highly accelerated lifetime testing(HALT)of lead zirconate titanate(PZT)thin films.Applications of Ferroelectrics,2000.ISAF 2000.Proceedings of the 2000 12th IEEE International Symposium on.2000,1:357-360 vol.1
[126]Wang,E F.Modified highly accelerated life test for aerospace electronics.Thermal and Thermomechanical Phenomena in Electronic Systems,2002.ITHERM 2002.The Eighth Intersociety Conference on.2002:940-945
[127]Rahe,D.The HASS development process.Reliability and Maintainability Symposium,2000.Proceedi gs.Annual.2000:389-394
[128]Silverman,M.HAS S development method:screen development,change schedule,and reprove schedule.Proceedings Annual Reliability and Maintainability Symposium.2000:245-247
[129]Anderson,J.A.,Poikinghorne,M.N.Application of HALT and HASS techniques in an advanced factory environment.Factory 2000 - The Technology Exploitation Process,Fifth International Conference on(Conf.Publ.No.435).1997:223-228
[130]Silverman,M.Summary of HALT and HASS results at an accelerated reliability test center.Proceedings Annual Reliability and Maintainability Symposium.1998:30-36
[131]http://www.computer.com/literature/pg170_oem750_series.htm.
[132]http://www.msl.com/about_msl/about.html.
[133]http://www.tnacorp.com/about.asp.
[134]姜同敏.可靠性强化试验.环境技术,2000,18(1):3-6
[135]姜同敏,金玫.可靠性强化试验技术及在航空工程中的应用.航空工程与维修,2000,(1):32-34
[136]褚卫华.模块级电子产品可靠性强化试验方法研究[博士学位论文].长沙:国防科学技术大学研究生院,2004
[137]蒋培.全轴随机振动环境的疲劳强化机理研究[博士学位论文].长沙:国防科学技术大学研究生院,2004
[138]孙炜.插装型电子元器件强化振动试验疲劳仿真研究[硕士学位论文].长沙:国防科学技术大学研究生院,2004
[139]朱文献.印制电路板可靠性强化试验技术与应用[硕士学位论文].长沙:国防科学技术大学研究生院,2002
[140]蒋瑜.频谱可控的超高斯随机振动环境模拟技术及其应用研究[博士学位论文].长沙:国防科学技术大学研究生院,2005
[141]Kececioglu,D.B.Reliability Engineering Handbook,Vol.1.New Jersey:PTR Prentice Hall.1991
[142]Misra,K.B.Reliability Analysis and Prediction.New York:Elsevier.1992
[143]Di,X.,Wenbiao,Z.Reliability prediction using multivariate degradation data.Proceedings Annual Reliability and Maintainability Symposium.2005:337-341
[144]Lu,J.C.,Meeker,W.Q.Using degradation measures to estimate a time-to-failure distribution.Technometdcs,1993,35(2):161-174
[145]Meeker,W.Q.,Escobar,L.A.A review of research and current issues in accelerated testing.International Statistical Review,1993,(61):147-168
[146]Carey,M.B,Challenges of reliability assessment based on degradation data:an example.the American Statistical Association 150th Annual Meeting,Washington,D.C.1989:
[147]Elsayed,E.A.,Liao,H.T.A Geometric Brownian Motion model for field degradation data.International Journal of Material and Product Technology,2003,19(6):9-12
[148]Meeker,W.Q.,Hamada,M.Statistical Tools for Rapid Development & Evaluation of High-Reliability Products.IEEE Transactions on Reliability,1995,44(2):187-198
[149]张苹苹.航空产品加速寿命试验研究及应用.北京航空航天大学学报,1995,21(4):124-129
[150][日]盐见弘.可靠性工程基础.北京:科学出版社.1982年03月第1版
[151]Pieruschka,E.Relation Between Lifetime Distribution and the Stress Level Causing Failure,LMSD-400800.Located Missile and Space Division,Sunnyvale,California.1961
[152]Nelson,W.Accelerated Testing:Statistical Methods,Test Plans,and data Analysis.New York:John Wiley.1990
[153]张春华.步降应力加速寿命试验的理论和方法[博士学位论文].长沙:国防科学技术大学研究生院,2002
[154][日]盐见弘.失效物理基础.北京:科学出版社.1982年11月第1版
[155]胡寿昌.航天可靠性设计手册.北京:机械工业出版社.1999
[156]胡寿昌.可靠性工程-设计、试验、分析、管理.北京:宇航出版社.1989
[157]陈循,朱文献,陶俊勇.可靠性强化试验应力剖面的研究.电子产品可靠性与环境试验,2003,(1):46-50
[158]中华人民共和国国家军用标准(GJB150-86).军用设备环境试验方法.国防科学技术工业委员会.1986
[159]何国伟,戴慈庄.可靠性试验技术.北京:国防工业出版社.1996年07月第1版
[160]Bloch,M.,Mancini,O.,McClelland,T.Performance of rubidium and quartz clocks in space.Frequency Control Symposium and PDA Exhibition,2002.IEEE International.2002:505-509
[161]Couplet,C.,Rochat,P.,Mileti,G.et al.Miniaturized rubidium clocks for space and industrial applications.Frequency Control Symposium,1995.49th.,Proceedings of the 1995 IEEE International.1995:53-59
[162]Daly,P.,Kitching,I.D.Characterization of NAVSTAR GPS and GLONASS on-board clocks.Aerospace and Electronic Systems Magazine,IEEE,1990,5(7):3-9
[163]Gevorkyan,A.G.,Smirnova,G.M.,Khutorshikov,V.I.On the development of the rubidium frequency standards.Conference on Precision Electromagnetic Measurements.1994:443-444
[164]Riley,W.J.Rubidium atomic frequency standards for GPS Block ⅡR.Proceedings of the 22nd Annual Precise Time and Time Interval(PTT1)Applications and Planning Meeting.1990:221-230
[165]A.Jeanmaire,Rochat,P.,Emma,F.Rubidium Atomic Clock for Galileo.Proceedings of the 31st PTTI Applications and Planning Meeting.1999,31:627-639
[166]Bloch,M.,Pascaru,I.,Stone,C.et al.Subminiature rubidium frequency standard for commercial applications.Frequency Control Symposium,1993.47th.,Proceedings of the 1993 IEEE International.1993:164-177
[167]Davidovits,P.,Novick,R.The optically pumped rubidium maser.Proceedings of the IEEE,1966,54(2):155-170
[168]McClelland,T.A.,Pascaru,I.,Meirs,M.Development of Rubidium Frequency Standard for the Milstar Satellite System.Proceedings of the 41 st Annual Symposium on Frequency Control.1987:66-74
[169]Mileti,G.,Deng,J.Q.,Walls,F.L.et al.Recent progress in laser-pumped rubidium gas-cell frequency standards.Frequency Control Symposium,1996.50th.,Proceedings of the 1996 IEEE International.1996:1066-1072
[170]董太乾.被动式铷原子频标近十余年来发展概况.陕西天文台台刊,1994,17(A00):24-26
[171]刘淑琴,董太乾.利用慢波结构的小型化铷原子频标.计量学报,1991,12(2):157-158
[172]刘淑琴,秦守正.铷原子频标中微波功率频移的实验研究.计量学报,1996,17(1): 67-69
[173]王玉泰.铷原子频标调频电路的研究.山东师范大学学报:自然科学版,1998,13(3):279-281
[174]王玉泰,聂士忠.铷原子频标长期稳定度的研究.山东建材学院学报,1999,13(2):117-118,127
[175]夏白桦,钟达,安绍锋等.一种新型铷原子频标腔泡系统的光频移研究.波谱学杂志,2004,21(1):41-48
[176]夏萍,刘淑琴.铷原子频标中的微波慢波结构.计量学报,1990,11(2):92-93,100
[177]赵家铭,周善钰.铷原子频标物理部分的小型化.计量学报,1992,13(3):226-227
[178]周忠石,王亮,郭鹏翔.铷原子频率标准的小型化研究.宇航计测技术,2002,22(1):1-6,12
[179]王义遒,王庆吉,傅济时等.量子频标原理.北京:科学出版社.1986
[180]邓爱民,陈循,张春华等.星载铷钟的故障模式及影响分析.国防科技大学学报,2005,27(2):102-106
[181]陈志红,管妮娜.星载铷原子频标功耗研究.空间电子技术,2001,(1):100.106
[182]Frueholz,R.P.,Wun-fogle,M.Lamp Reliability Studies for Improved Satellite Rubidium Frequency Standard.Proceedings of the 13th Annual Precise Time and Time Interval(FTTI)Applications and Planning Meeting.1981:767-788
[183]McClelland,T.A.Reliability Studies of Lamp Cells for Use in Rubidium Vapor Frequency Standards.Proceedings of the 21st Annual Precise Time and Time Interval(PTTI)Applications and Planning Meeting.1989:431-443
[184]Volk,C.H.,Frueholz,R.F.,English,T.C.et al.Lifetime and Reliability of Rubidium Discharge Lamps for Use Atomic Frequency Standards.Proceedings of the 38th Annual Symposium on Frequency Control.1984:387-400
[185]黄本诚,马有礼.航天器空间环境试验技术.北京:国防工业出版社.2002
[186]Riley,W.J.The Physics of the Environmental Sensitivity of Rubidium Gas Cell Atomic Frequency Standards.Proceedings of the 22rid Annual Precise Time and Time Interval(PTTI)Applications and Planning Meeting.1990:441-452
[187]Riley,W.J.,Jr.The physics of the environmental sensitivity of rubidium gas cell atomic frequency standards.Ultrasonics,Ferroelectrics and Frequency Control,IEEE Transactions on,1992,39(2):232-240
[188]Weidemann,W.Application critical parameters for rubidium standards.Frequency Control Symposium,1998.Proceedings of the 1998 IEEE International.1998:84-87
[189]邓爱民,陈循,张春华等.星载铷原子频标的可靠性强化试验.宇航学报,2005,26(6):598-603
[190]Beard,R.,Buisson,J.,Danzy,F.et al.GPS Block ⅡR Rubidium Frequency Standard Life Test Results.IEEE International Frequency Control Symposium and PDA Exhibition.2002:499-504
[191]Bhaskar,N.D.,Matt,A.D.,Russo,N.et al.On-orbit performance of Milstar rubidium and quartz frequency standards.Frequency Control Symposium,1997.,Proceedings of the 1997 IEEE International.1997:329-337
[192]Oyamada,H.,Takahashi,K.,Sato,Y.et al.Rubidium Lamp Stability and Reliability for Rubidium Frequency Standard.Proceedings of the 28th Annual Symposium on Frequency Control.1974:340-343
[2]韩明.无失效数据的可靠性分析.北京:中国统计出版社.1999
[3]Chenoweth,H.B.Soft failures and reliability.Proceedings Annual Reliability and Maintainability Symposium.1990:419-424
[4]Gerstsbackh,I.B.,Kordonskiy,K.B.Models of Failure(Translation from the Russian version).New York:Wiley.1969
[5]Nair,V.N.Estimation of Reliability in Field-Performance Studies:Discussion.Technometrics,1988,30(4):379-383
[6]Misra,R.B.Reliability assessment for static electricity meters.Metering and Tariffs for Energy Supply,1999.Ninth International Conference on(Conf.Publ.No.462).1999:151-155
[7]Yang,K.,Xue,J.Continuous state reliability analysis.Proceedings Annual Reliability and Maintainability Symposium.1996:251-257
[8]Zuo,M.J.,Jiang,R.Y.,Yam,R.C.M.Approaches for reliability modeling of continuous state devices.IEEE Transaction on Reliability,1999,48(1):9-18.
[9]周源泉,翁朝曦.可靠性评定.北京:科学出版社.1990年03月第1版
[10]周源泉,刘振德,陈宝延等.某型涡扇发动机的可靠性增长分析与评估.质量与可靠性,2004,(3):42-45
[11]夏红娟.某无线电定高装置可靠性评估.上海航天,2003,20(4):46-49
[12]王凭慧,范本尧,傅惠民.卫星推力器可靠性评估和寿命预测.航空动力学报,2004,19(6):745-748
[13]刘国俊,周晓明.威布尔型产品的可靠性评估方法研究.上海航天,2002,19(2):13-16
[14]Dey,D.K.,Lee,T.M.Bayes computation for life testing and reliability estimation.IEEE Transactions on Reliability,1992,41(4):621-626
[15]Mroczkowski,R.S.,Maynard,J.M.Estimating the reliability of electrical connectors.IEEE Transactions on Reliability,1991,40(5):507-512
[16]Thiagarajah,K.R.Homogeneity tests for scale parameters of 2-parameter exponential populations under time censoring.IEEE Transactions on Reliability,1995,44(2):297-301
[17]Chun Kin,C.,Seraidaridia,C.I.,Tortorella,M.Sequential sampling plans for early-life reliability assessment.Proceedings Annual Reliability and Maintainability Symposium.1997:131-135
[18]Gibson,D.Statistical reliability prediction.International Integrated Reliability Workshop.1995:161
[19]Barnett,T.S.,Grady,M.,Purdy,K.et al.Exploiting defect clustering for yield and reliability prediction.Computers and Digital Techniques,lie Proceedings-,2005,152(3):407-413
[20]葛广平.我国加速寿命试验研究的现状与展望.数理统计与管理,2000,19(1):25-29
[21]Nelson,W.B.,Meeker,W.Q.Theory for Optimum Censored Accelerated Life Tests for Weibull and Extreme Value Distributions,Technometrics,1978,20(2):171-177
[22]Nelson,W.B.Accelerated Life Testing-Step-stress Models and Data Analysis.liEE Transactions on Reliability,1980,29(2):103-108
[23]Bluvband,Z.,Peshes,L.Accelerated life testing for products without sequence effect.Proceedings Annual Reliability and Maintainability Symposium.1996:341-347
[24]Bai,D.S.,Yun,H.J.Accelerated life tests for products of unequal size.Reliability,IEEE Transactions on,1996,45(4):611-618
[25]Barbosa,E.P.,Colosimo,E.A.,Louzada-Neto,E Accelerated life tests analyzed by a piecewise exponential distribution via generalized linear models.Reliability,IEEE Transactions on,1996,45(4):619-623
[26]Guang-Bin,Y.Optimum constant-stress accelerated life-test plans.Reliability,IEEE.Transactions on,1994,43(4):575-581
[27]Guerin,F.,Dumon,B.,Lantieri,P.Accelerated life testing on repairable systems.Reliability and Maintainability,2004 Annual Symposium - RAMS.2004:340-345
[28]McDonald,K.Humidity Control in Accelerated Life Tests.Components,Hybrids,and Manufacturing Technology,liEE Transactions on[see also liEE Trans.on Components,Packaging,and Manufacturing Technology,Part A,B,C],1984,7(3):268-275
[29]Watkins,A.J.Accelerated life testing in product design and prototyping.Proof of Designed Reliability(Digest No.1994/239),lie Colloquium on.1994:7/1-7/4
[30]Yang,C.R.,Kim,J.T.Temperature accelerated life test(ALT)at the circuit board level.Electronics Manufacturing Technology Symposium,1995.'Manufacturing Technologies-Present and Future',Seventoenth IEEE/CPMT International.1995:158-165
[31]Chaloner,K.,Larntz,K.Bayesian design for accelerated life testing.Journal of Statistical Planning and Inference,1992,33(2):245-259
[32]Erkanli,A.,Soyer,R.Simulation-based designs for accelerated life tests.Journal of Statistical Planning and Inference,2000,90(2):335-348
[33]茆诗松,王玲玲.加速寿命试验.北京:科学出版社.1997
[34]张春华,温熙森,陈循.加速寿命试验技术综述.兵工学报,2004,25(4):485-490
[35]张志华.加速寿命试验及其统计分析.北京:北京工业大学出版社.2002
[36]程依明.步进应力加速寿命试验的最优设计.应用概率统计,1994,10(1):52-61
[37]费鹤良.指数模型步进应力加速寿命试验的区间估计.应用概率统计,1995,11(3):297-304
[38]葛广平,刘立喜.竞争失效产品恒定应力加速寿命试验的优化设计.应用概率统计,2002,18(3):260-268
[39]茆诗松.加速寿命试验的加速模型.质量与可靠性,2003,(2):15-17
[40]茆诗松.加速系数与指数分布下的步加速试验.质量与可靠性,2003,(4):5-10
[41]宋乾坤.双参数指数分布下两应力交叉步加试验的统计分析.工程数学学报,1997,14(1):45-51
[42]孙利民,张志华.Weibull分布下恒定应力加速寿命的试验分析.江苏理工大学学报:自然科学版,2000,21(4):78-81
[43]王炳兴.竞争失效产品加速寿命试验的统计分析.应用数学学报,2002,25(2):254-262
[44]王炳兴,王玲玲.加速寿命试验的参数估计.华东师范大学学报:自然科学版,1996,(3):27-32
[45]王炳兴,王玲玲.加速寿命试验参数估计的改进.电子产品可靠性与环境试验,1996,(3):1-4
[46]李祚东,顾长鸿.无失效情况下威布尔分布的可靠性评估方法研究.质量与可靠性,1995,(5):31-36,46
[47]茆诗松,陆淑兰.恒定应力加速寿命试验中无失效数据的处理.应用概率统计,1993,9(2):216-218
[48]Lall,P.Challenges in accelerated life testing.Thermal and Thermomechanical Phenomena in Electronic Systems,2004.1THERM '04.The Ninth Intersociety Conference on.2004,2:727 Vol.2
[49]Nelson,W.B.Analysis of performance-degradation data from accelerated tests.IEEE Transactions on Reliability,1981,30(2):149-154
[50]Lu,C.J.,Meeker,W.Q.Using Degradation Measures to Estimate a Time-to-Failure Distribution.Technometrics,1993,35(2):161-174
[51]Yu,H.F.,Tseng S.T.Designing a Screening Experiment for Highly Reliable Products.Naval Research Logistics,2002,(49):514-526
[52]Yang,K.,Yang G.Degradation Reliability Assessment Using Severe Critical Values.International Journal of Reliability,Quality and safety Engineering,1998,5(1):85-95
[53]Tseng,S.T.,Hamada M.S.,Chiao C.H.Using degradation data from a fractional factorial experiment to improve fluorescent lamp reliability.Journal of Quality Technology,1995,27(4):363-369
[54]Chuang,S.L.,Ishibashi A.Kinetic Model for Degradation of Light Emitting Diodes.IEEE Journal of Quantum Electronics,1997,33(6):970-979
[55]Chiao,C.H.,Hamada M.S.Robust reliability for light emitting diodes using degradation measurements.Quality & Reliability Engineering International,1996,(12):89-94
[56]Andonova,A.,Philippov,P.,Atanasova,N.Methodology of estimate reliability of highly reliable components by monitoring performance degradation.Electronics Technology:Concurrent Engineering in Electronic Packaging,2001.24th International Spring Seminar on.2001:125-128
[57]Shaw,S.R.Instrumentation for PEM fuel cell transient degradation monitoring.Power Engineering Society General Meeting,2004.IEEE.2004:1646-1649 Vol.2
[58]Crk,V.Reliability assessment from degradation data.Proceedings Annual Reliability and Maintainability Symposium.2000:155-161
[59]Zehua,C.,Shurong,Z.Lifetime distribution based degradation analysis.IEEE Transactions on Reliability,2005,54(1):3-10
[60]Carey,M.B.,Tortorella,M.Analysis of degradation data applied to MOS devices,the 6th International Conference on Reliability and Maintainability,Strasbourg,France.1988:
[61]Jiang,M.,Zhang,Y.Dynamic modeling of degradation data.Proceedings Annual Reliability and Maintainability Symposium.2002:607-611
[62]V.Lista,P.G.,T.Tomasi,M.Borgarino,F.Fantini,L.Gherardi,A.Righetti,M.Villa.Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications.Microelectronics Reliability,2002,(42):1389-1392
[63]William Q Meeker,N.D.,Gerald J Hahn.Using degradation data for product reliability analysis.Quality Progress,2001,34(6):60-65
[64]Jayaram,J.S.R.,Girish,T.Reliability prediction through degradation data modeling using a quasi-likelihood approach.Proceedings Annual Reliability and Maintainability Symposium.2005:193-199
[65]Peng,W.,Coit,D.W.Reliability prediction based on degradation modeling for systems with multiple degradation measures.Reliability and Maintainability,2004 Annual Symposium - RAMS.2004:302-307
[66]E.Ioannides,E.Beghini,G.Bergling et al.Cleanliness and its importance for bearing performance.Ball Bearing Journal,1993:242-248
[67]Carey,M.B.,Koenig R.H.Reliability assessment based on accelerated degradation:a case study.IEEE Transactions on Reliability,1991,40(5):499-506
[68]Meeker,W.Q.,Hamada,M.Statistical tools for the rapid development and evaluation of high-reliability products.IEEE Transactions on Reliability,1995,44(2):187-198
[69]T.S.Tseng,M.Hamada,C.H.Chiao.Using Degradation Data to Improve Fluorescent Lamp Reliability.Journal of Quality Technology,1995,27(4):195-206
[70]Feinberg,A.A.,Widom,A.Connecting Parametric Aging to Catastrophic Failure Through Thermodynamics.IEEE Transaction on Reliability,1996,45(1):28-33
[71]L.Gallais,Natoli,J.Y.,C.Amra.Statistical study of single and multiple pulse laser-induced damage in glasses.Optics Express,2002,10(25):2-6
[72]Viviane Ribeiro Branco de Oliveiral,E.A.o.C.Comparison of Methods to Estimate the Time-to-failure Distribution in Degradation Tests.Quality and Reliability Engineering International,2004,(20):363-373
[73]庄东辰.退化失效模型及其统计分析[博士学位论文].上海:华东师范大学研究生院,1994
[74]Meeker,W.Q.,Escobar,L.A.,C.,L.J.Accelerated degradation tests:modeling and analysis.Technometrics,1998,40(2):89-99
[75]Chan,C.K.,Boulanger,M.,Tortorella,M.Analysis of parameter-degradation data using life-data analysis programs.Proceedings Annual Reliability and Maintainability Symposium. 1994:288-291
[76]Meeker,W.Q.,Escobar,L.A.Statistical Methods for Reliability Data.New York:John Wiley & Sons,Inc.1998
[77]Lu,J.C.,Park J.,Yang Q.Statistical Inference of a Time-to-Failure Distribution Derived From Linear Degradation Data.Technometrics,1997,39(4):391-400
[78]Andonova,A.,Philippov,P.,Atanasova,N.Methodology of estimation reliability of highly reliable components by monitoring performance degradation.24th International Spring Seminar on Electronics Technology.2001:
[79]苏德清.微波低噪声GaAsFET加速寿命试验参数退化模型的研究报告.中国电子技术标准化研究所.1992
[80]Yang,G B.,Yang K.Accelerated Degradation Tests with Tightened Critical Values.IEEE Transactions on Reliability,2002,51(4):463-468.
[81]Shiau,J.J.H.,Lin H.H.Analyzing accelerated degradation data by nonparametric regression.IEEE Transactions on Reliability,1999,48(2):149-158
[82]Hong,F.Y.,Sheng,T.T.On-Line Procedure for Terminating an Accelerated Degradation Test.Statistica Sinica,1998,(8):207-220
[83]Wendai,W.,Dragomir-Daescu,D.Reliability quantification of induction motors-accelerated degradation testing approach.Proceedings Annual Reliability and Maintainability Symposium.2002:325-331.
[84]Guangbin,Y.,Kai,Y.Accelerated degradation-tests with tightened critical values.IEEE Transactions on Reliability,2002,51(4):463-468
[85]Boulanger,M.,Escobar,L.A.Experimental design for a class of accelerated degradation tests.Technometdcs,1994,36(4):260-272
[86]Chang,D.S.Analysis of accelerated degradation data in a two-way design.Reliability Engineering and System Safety,1992,39(1):65-69
[87]Chang,L.C.T.D.S.Reliability prediction using nondestructive accelerated-degradation data:case study on power supplies.IEEE Transactions on Reliability,1995,44(4):562-566
[88]Yanagisawa,T.,Kojima,T.Degradation of InGaN blue light-emitting.diodes under continuous and low-speed pulse operations.Microelectronics Reliability,2003,43(6):977-980
[89]周源泉,翁朝曦.可靠性增长.北京:科学出版社.1992年01月第1版
[90]Gaudoin,O.,Bo,Y.,Min,X.A simple goodness-of-fit test for the power-law process,based on the Duane plot.IEEE Transactions on Reliability,2003,52(1):69-74
[91]Demko,E.On nonlinear reliability growth.Proceedings Annual Reliability and Maintainability Symposium.1993:411-416
[92]Crow,L.H.Estimation procedures for Duane model.ADA019372.1972
[93]Mortin,D.E.,McCarthy,M.J.,Querido,D.M.et al.Developing a subsystem reliability growth program.Proceedings Annual Reliability and Maintainability Symposium.1994:130-135
[94]Clark,J.A.Modeling reliability growth late in development.Proceedings Annual Reliability and Maintainability Symposium.1999:201-207
[95]Ziad,T.,Ellner,P.M.Statistical precision androbustness of the AMSAA continuous reliability growth estimators.Proceedings Annual Reliability and Maintainability Symposium.1990:210-214
[96]周源泉,翁朝曦.AMSAA模型对一次性使用产品的应用.质量与可靠性,1995,(6):30-34
[97]梅文华.利用AMSAA模型预测产品可靠性增长.空军工程大学学报:自然科学版,2003,4(2):81-83
[98]刘鸿翔,田国梁.AMSAA模型的参数估计方法.培训与研究:湖北教育学院学报,2003,20(2):4-9
[99]黄舜琪.AMSAA模型在飞机试飞阶段可靠性评定中的应用.飞行试验,2001,17(4):37-44
[100]董蕙茹,黄燕锋,等.AMSAA模型用于可靠性增长预测时的改进.空军工程大学学报:自然科学版,2002,3(5):79-82
[101]Duane,J.T.Learning curve approach to reliability monitoring.IEEE Transactions on Aerospace,1964,2(2):563-566
[102]Crow,L.H.AMSAA reliability growth symposium.ADA027053.1974
[103]Crow,L.H.Reliability analysis for complex,repairable system.ADA020296.1975
[104]Crow,L.H.Confidence interval procedures for reliability growth.analysis.ADA044788.1982
[105]Crow,L.H.Confidence interval procedures for the Weibull process with applications to reliability growth.Technometrics,1982,24(1):67-72
[106]周源泉,翁朝曦.可靠性增长管理的综合公式.系统工程与屯子技术,1992,(2):77-80,76
[107]姜同敏.可靠性增长技术的现状和发展.环境技术,1995,13(2):1-6
[108]Andonova,A.S.,Atanasova,N.G Accelerated reliability growth of electronic devices.27th International Spring Seminar on Electronics Technology:Meeting the Challenges of Electronics Technology Progress.2004,2:242-246.
[109]Klyatis,L.M.Step-by-step accelerated testing.Proceedings Annual Reliability and Maintainability Symposium.1999:57-61
[110]Klyatis,L.M.Conditions of environmental accelerated testing.Proceedings Annual Reliability and Maintainability Symposium.1998:372-377
[111]陈循,陶俊勇,张春华.可靠性强化试验与加速寿命试验综述.国防科技大学学报,2002,24(4):29-32
[112]杨宇航,周源泉.加速寿命试验的理论基础(Ⅰ).推进技术,2001,22(4):276-278,318
[113]杨宇航,周源泉.加速寿命试验的理论基础(Ⅱ).推进技术,2001,22(5):353-356
[114]Mingxiao,J.,Yongcang,z.Dynamic modeling of degradation data.Proceedings Annual Reliability and Maintainability Symposium.2002:607-611
[115]Boulanger,M.,Escobar L.A.Experimental design for a class of accelerated degradation tests.Technometrics,1994,36(4):260-272
[116]Tang,L.C.,Yang,G.Y.,Xie,M.Planning of step-stress accelerated degradation test.Reliability and Maintainability,2004 Annual Symposium - RAMS.2004:287-292
[117]Gregg,K.H.Accelerated Reliability Engineering:HALT and HASS:Chichester:John Wiley & Sons LTD.2000
[118]褚卫华,陈循,陶俊勇等.高加速寿命试验(HALT)与高加速应力筛选(HAss).强度与环境,2002,29(4):23-37
[119]蒋培,陈循,张春华.可靠性强化试验技术综述.强度与环境,2003,30(1):58-64
[120]Robert,W.D.,Edward,O.M.Reliability Enhancement Testing.Proceedings Annual Reliability and Maintainability Symposium.1994:91-98
[121]陈奇妙.国外可靠性强化试验技术文集.国防科工委质量与可靠性研究中心.1998年3月
[122]陈奇妙.美国可靠性强化试验技术发展点评.质量与可靠性,1998,(4):44-47
[123]Ascarrunz,C.HALT:bridging the gap between theory and practice.Test Conference,1994.Proceedings.,International.1994:548-554
[124]Munikoti,R.,Dhar,P.Highly accelerated life testing(HALT)for multilayer ceramic capacitor qualification.Components,Hybrids,and Manufacturing Technology,IEEE Transactions on[see also IEEE Trans.on Components,Packaging,and Manufacturing Technology,Part A,B,C],1988,11(4):342-345
[125]Polcawich,R.G.,Feng,C.,Vanatta,P.et al.Highly accelerated lifetime testing(HALT)of lead zirconate titanate(PZT)thin films.Applications of Ferroelectrics,2000.ISAF 2000.Proceedings of the 2000 12th IEEE International Symposium on.2000,1:357-360 vol.1
[126]Wang,E F.Modified highly accelerated life test for aerospace electronics.Thermal and Thermomechanical Phenomena in Electronic Systems,2002.ITHERM 2002.The Eighth Intersociety Conference on.2002:940-945
[127]Rahe,D.The HASS development process.Reliability and Maintainability Symposium,2000.Proceedi gs.Annual.2000:389-394
[128]Silverman,M.HAS S development method:screen development,change schedule,and reprove schedule.Proceedings Annual Reliability and Maintainability Symposium.2000:245-247
[129]Anderson,J.A.,Poikinghorne,M.N.Application of HALT and HASS techniques in an advanced factory environment.Factory 2000 - The Technology Exploitation Process,Fifth International Conference on(Conf.Publ.No.435).1997:223-228
[130]Silverman,M.Summary of HALT and HASS results at an accelerated reliability test center.Proceedings Annual Reliability and Maintainability Symposium.1998:30-36
[131]http://www.computer.com/literature/pg170_oem750_series.htm.
[132]http://www.msl.com/about_msl/about.html.
[133]http://www.tnacorp.com/about.asp.
[134]姜同敏.可靠性强化试验.环境技术,2000,18(1):3-6
[135]姜同敏,金玫.可靠性强化试验技术及在航空工程中的应用.航空工程与维修,2000,(1):32-34
[136]褚卫华.模块级电子产品可靠性强化试验方法研究[博士学位论文].长沙:国防科学技术大学研究生院,2004
[137]蒋培.全轴随机振动环境的疲劳强化机理研究[博士学位论文].长沙:国防科学技术大学研究生院,2004
[138]孙炜.插装型电子元器件强化振动试验疲劳仿真研究[硕士学位论文].长沙:国防科学技术大学研究生院,2004
[139]朱文献.印制电路板可靠性强化试验技术与应用[硕士学位论文].长沙:国防科学技术大学研究生院,2002
[140]蒋瑜.频谱可控的超高斯随机振动环境模拟技术及其应用研究[博士学位论文].长沙:国防科学技术大学研究生院,2005
[141]Kececioglu,D.B.Reliability Engineering Handbook,Vol.1.New Jersey:PTR Prentice Hall.1991
[142]Misra,K.B.Reliability Analysis and Prediction.New York:Elsevier.1992
[143]Di,X.,Wenbiao,Z.Reliability prediction using multivariate degradation data.Proceedings Annual Reliability and Maintainability Symposium.2005:337-341
[144]Lu,J.C.,Meeker,W.Q.Using degradation measures to estimate a time-to-failure distribution.Technometdcs,1993,35(2):161-174
[145]Meeker,W.Q.,Escobar,L.A.A review of research and current issues in accelerated testing.International Statistical Review,1993,(61):147-168
[146]Carey,M.B,Challenges of reliability assessment based on degradation data:an example.the American Statistical Association 150th Annual Meeting,Washington,D.C.1989:
[147]Elsayed,E.A.,Liao,H.T.A Geometric Brownian Motion model for field degradation data.International Journal of Material and Product Technology,2003,19(6):9-12
[148]Meeker,W.Q.,Hamada,M.Statistical Tools for Rapid Development & Evaluation of High-Reliability Products.IEEE Transactions on Reliability,1995,44(2):187-198
[149]张苹苹.航空产品加速寿命试验研究及应用.北京航空航天大学学报,1995,21(4):124-129
[150][日]盐见弘.可靠性工程基础.北京:科学出版社.1982年03月第1版
[151]Pieruschka,E.Relation Between Lifetime Distribution and the Stress Level Causing Failure,LMSD-400800.Located Missile and Space Division,Sunnyvale,California.1961
[152]Nelson,W.Accelerated Testing:Statistical Methods,Test Plans,and data Analysis.New York:John Wiley.1990
[153]张春华.步降应力加速寿命试验的理论和方法[博士学位论文].长沙:国防科学技术大学研究生院,2002
[154][日]盐见弘.失效物理基础.北京:科学出版社.1982年11月第1版
[155]胡寿昌.航天可靠性设计手册.北京:机械工业出版社.1999
[156]胡寿昌.可靠性工程-设计、试验、分析、管理.北京:宇航出版社.1989
[157]陈循,朱文献,陶俊勇.可靠性强化试验应力剖面的研究.电子产品可靠性与环境试验,2003,(1):46-50
[158]中华人民共和国国家军用标准(GJB150-86).军用设备环境试验方法.国防科学技术工业委员会.1986
[159]何国伟,戴慈庄.可靠性试验技术.北京:国防工业出版社.1996年07月第1版
[160]Bloch,M.,Mancini,O.,McClelland,T.Performance of rubidium and quartz clocks in space.Frequency Control Symposium and PDA Exhibition,2002.IEEE International.2002:505-509
[161]Couplet,C.,Rochat,P.,Mileti,G.et al.Miniaturized rubidium clocks for space and industrial applications.Frequency Control Symposium,1995.49th.,Proceedings of the 1995 IEEE International.1995:53-59
[162]Daly,P.,Kitching,I.D.Characterization of NAVSTAR GPS and GLONASS on-board clocks.Aerospace and Electronic Systems Magazine,IEEE,1990,5(7):3-9
[163]Gevorkyan,A.G.,Smirnova,G.M.,Khutorshikov,V.I.On the development of the rubidium frequency standards.Conference on Precision Electromagnetic Measurements.1994:443-444
[164]Riley,W.J.Rubidium atomic frequency standards for GPS Block ⅡR.Proceedings of the 22nd Annual Precise Time and Time Interval(PTT1)Applications and Planning Meeting.1990:221-230
[165]A.Jeanmaire,Rochat,P.,Emma,F.Rubidium Atomic Clock for Galileo.Proceedings of the 31st PTTI Applications and Planning Meeting.1999,31:627-639
[166]Bloch,M.,Pascaru,I.,Stone,C.et al.Subminiature rubidium frequency standard for commercial applications.Frequency Control Symposium,1993.47th.,Proceedings of the 1993 IEEE International.1993:164-177
[167]Davidovits,P.,Novick,R.The optically pumped rubidium maser.Proceedings of the IEEE,1966,54(2):155-170
[168]McClelland,T.A.,Pascaru,I.,Meirs,M.Development of Rubidium Frequency Standard for the Milstar Satellite System.Proceedings of the 41 st Annual Symposium on Frequency Control.1987:66-74
[169]Mileti,G.,Deng,J.Q.,Walls,F.L.et al.Recent progress in laser-pumped rubidium gas-cell frequency standards.Frequency Control Symposium,1996.50th.,Proceedings of the 1996 IEEE International.1996:1066-1072
[170]董太乾.被动式铷原子频标近十余年来发展概况.陕西天文台台刊,1994,17(A00):24-26
[171]刘淑琴,董太乾.利用慢波结构的小型化铷原子频标.计量学报,1991,12(2):157-158
[172]刘淑琴,秦守正.铷原子频标中微波功率频移的实验研究.计量学报,1996,17(1): 67-69
[173]王玉泰.铷原子频标调频电路的研究.山东师范大学学报:自然科学版,1998,13(3):279-281
[174]王玉泰,聂士忠.铷原子频标长期稳定度的研究.山东建材学院学报,1999,13(2):117-118,127
[175]夏白桦,钟达,安绍锋等.一种新型铷原子频标腔泡系统的光频移研究.波谱学杂志,2004,21(1):41-48
[176]夏萍,刘淑琴.铷原子频标中的微波慢波结构.计量学报,1990,11(2):92-93,100
[177]赵家铭,周善钰.铷原子频标物理部分的小型化.计量学报,1992,13(3):226-227
[178]周忠石,王亮,郭鹏翔.铷原子频率标准的小型化研究.宇航计测技术,2002,22(1):1-6,12
[179]王义遒,王庆吉,傅济时等.量子频标原理.北京:科学出版社.1986
[180]邓爱民,陈循,张春华等.星载铷钟的故障模式及影响分析.国防科技大学学报,2005,27(2):102-106
[181]陈志红,管妮娜.星载铷原子频标功耗研究.空间电子技术,2001,(1):100.106
[182]Frueholz,R.P.,Wun-fogle,M.Lamp Reliability Studies for Improved Satellite Rubidium Frequency Standard.Proceedings of the 13th Annual Precise Time and Time Interval(FTTI)Applications and Planning Meeting.1981:767-788
[183]McClelland,T.A.Reliability Studies of Lamp Cells for Use in Rubidium Vapor Frequency Standards.Proceedings of the 21st Annual Precise Time and Time Interval(PTTI)Applications and Planning Meeting.1989:431-443
[184]Volk,C.H.,Frueholz,R.F.,English,T.C.et al.Lifetime and Reliability of Rubidium Discharge Lamps for Use Atomic Frequency Standards.Proceedings of the 38th Annual Symposium on Frequency Control.1984:387-400
[185]黄本诚,马有礼.航天器空间环境试验技术.北京:国防工业出版社.2002
[186]Riley,W.J.The Physics of the Environmental Sensitivity of Rubidium Gas Cell Atomic Frequency Standards.Proceedings of the 22rid Annual Precise Time and Time Interval(PTTI)Applications and Planning Meeting.1990:441-452
[187]Riley,W.J.,Jr.The physics of the environmental sensitivity of rubidium gas cell atomic frequency standards.Ultrasonics,Ferroelectrics and Frequency Control,IEEE Transactions on,1992,39(2):232-240
[188]Weidemann,W.Application critical parameters for rubidium standards.Frequency Control Symposium,1998.Proceedings of the 1998 IEEE International.1998:84-87
[189]邓爱民,陈循,张春华等.星载铷原子频标的可靠性强化试验.宇航学报,2005,26(6):598-603
[190]Beard,R.,Buisson,J.,Danzy,F.et al.GPS Block ⅡR Rubidium Frequency Standard Life Test Results.IEEE International Frequency Control Symposium and PDA Exhibition.2002:499-504
[191]Bhaskar,N.D.,Matt,A.D.,Russo,N.et al.On-orbit performance of Milstar rubidium and quartz frequency standards.Frequency Control Symposium,1997.,Proceedings of the 1997 IEEE International.1997:329-337
[192]Oyamada,H.,Takahashi,K.,Sato,Y.et al.Rubidium Lamp Stability and Reliability for Rubidium Frequency Standard.Proceedings of the 28th Annual Symposium on Frequency Control.1974:340-343