基于电子虚拟样板的非球面检测技术研究
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摘要
光学制造技术的发展,尤其是非球面加工技术的兴起,促进了空间光学的发展,大视场、高分辨率、长焦距的航天相机离轴三反系统设计的引进对非球面的加工和检测都是很大的挑战,非球面的检测技术越来越成为光学加工的瓶颈,
     本文从检测角度出发,提出了基于电子虚拟样板的非球面检测技术概念,建立电子虚拟样板的数学模型。在检测非球面波前时,我们改变以往传统的零位补偿检验手段,而利用高分辨率的CCD相机直接对被检非球面进行数据采样,并把获得的干涉条纹和预先储存在储存器里的参考干涉图进行叠加,从而得到电子莫尔条纹,然后对获得的电子莫尔条纹进行低通滤波,滤掉噪声中含有的高频成分,以提高图像的信噪比。
     接着,我们对滤波后的电子莫尔条纹经过四步数字相移,获得四幅数字干涉图;经模2π处理,并作位相展开,获得位相展开分布图;为了验证电子虚拟样板技术可行性,最后我们利用Zernike多项式拟合,得到Zernike多项式拟合后的面形。
     基于电子虚拟样板的非球面技术不需要补偿器进行补偿,这就避免了由于引进补偿器而给系统带来的误差和装调的难度。在电子莫尔虚拟样板中,改变了传统非球面检测Offner零位检测手段,而采用直接对被测表面进行采样,获得虚拟样板的检测技术。同时我们讨论了多种非零位检测技术,象Sub-Nyquist技术,高分辨率CCD直接采样技术。
Development of optical manufacturing, especially aspherical manufacturing, boosted the developing of space optics. Aspheric testing for large departures from reference wavefronts becomes the bottleneck of optical manufacturing. Off-axis TMA system presented in space cameras for large field, high resolution, long focal length challenges the manufacturing and testing for aspheric components .
    In this paper, we present the idea of virtual plate for aspheric testing based on moire phase-shifting technology, i.e. when testing steep aspheric wavefronts, interferometry directly used CCD camera for high resolution to obtain supervision with interferometry saved in the frame memory produces moire patterns. Finally, we cancel the noise (mainly in the high frequency) by means of low pass frequency .At last, we obtain digital four patterns by four step phase-shifting technology. Using modulo In to display phase, we got the fringe of the phase . In order to prove its feasibility , we contract the result of simulation with the result of the Zernike polynomial.
    The advantage of electronic moire phase-shifting technology is that sample directly avoids the system error and difficulty of calibration and aligning by optical compensators being applied.
    In electronic moire phase-shifting virtual plane technology, we began to research testing for the large departures from referent wavefronts and change the pattern of Offner Null testing in conventional aspheric testing, finally present the idea of electronic virtual plane. Meanwhile we discuss several types of aspheric non-null testing such as Sub-Nyquist, high-resolution CCD camera to sample directly.
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