蓝宝石衬底上中波红外增透保护膜系的设计、制备及性能
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摘要
头罩是红外制导空-空导弹的重要部件,蓝宝石具有的一系列优异性能,决定了它是目前作为中波红外窗口/头罩的最佳材料。然而,限于目前的材料制备和加工技术水平,蓝宝石的红外透过率明显低于理论值并且透过率随着环境条件的恶化而降低。另外,蓝宝石的高温强度大幅度下降,大大限制了其抗热震性等其它性能的发挥。因此蓝宝石作为新一代窗口/头罩材料是有待于改善和提高的。在蓝宝石表面制备红外增透保护膜是提高其透过性能、改善其高温强度及提高其耐久性的有效方法。由于SiO_2膜折射率低(1.41)、可宽波段透过、吸收小、化学稳定性好等优良性能,而被用作蓝宝石的增透保护膜系。Si_3N_4膜的折射率稍大(1.99),可与低折射率的SiO_2膜结合用于红外增透保护膜系中。
     本论文把SiO_2、SiO_2/Si_3N_4用作蓝宝石衬底的红外增透保护膜系,采用射频磁控反应溅射法在蓝宝石衬底上设计并制备出SiO_2单层及SiO_2/Si_3N_4双层膜系,对薄膜的制备工艺及性能进行了系统研究。论文的主要研究内容和结果如下:
     在蓝宝石衬底上设计了SiO_2、SiO_2/Si_3N_4、SiO_2/Si_3N_4/SiO_2等单层及多层增透保护膜系。蓝宝石衬底双面镀单层及多层膜系,可实现3~5μm波段的宽波段增透,满足红外窗口对透过性能的使用要求。
     采用磁控反应溅射法在蓝宝石衬底上制备了SiO_2薄膜和Si_3N_4薄膜。揭示了主要工艺参数对SiO_2薄膜的沉积速率、附着性能、内应力和红外透过等性能的影响规律,优化出制备SiO_2薄膜的工艺参数。研究了主要工艺参数对Si_3N_4薄膜中O含量及薄膜红外光谱的影响规律,对Si_3N_4薄膜的成分、结构和性质进行分析,从而制备出低O含量、满足化学计量比的Si_3N_4薄膜。
     根掘膜系设计的结果,在蓝宝石衬底上双面制备出SiO_2单层增透膜系和SiO_2/Si_3N_4双层增透膜系。镀膜后蓝宝石在3~5μm波段的平均透过率净增加大于9.0%,均可满足使用需求。
     进行了蓝宝石头罩镀膜的试验研究。利用磁控反应溅射法成功地在蓝宝石头罩上镀制出SiO_2增透保护膜系。单面镀膜后头罩在3~5μm波段的平均透过率净增加大于4.0%,透过率的不均匀性小于2.0%,满足了使用要求。
     采用旋转臂雨蚀试验装置对SiO_2/Sapphire试样进行了雨蚀试验,并对试样表面的损伤情况进行了光学显微观察、对试样的红外透过率进行了研究。旋转臂雨蚀试验结果表明,SiO_2膜与蓝宝石衬底结合牢固,镀SiO_2膜蓝宝石试样在3~5μm波段的平均透过率下降量均小于1%,雨蚀测试后镀膜蓝宝石的平均透过率仍明显高于未镀膜蓝宝石的平均透过率,SiO_2膜系具有一定的抗雨蚀性。
     针对所制备的SiO_2薄膜及SiO_2/Si_3N_4双层膜系,测试了不同温度下镀膜与未镀膜蓝宝石的三点弯曲强度。发现在相同的测试温度下,镀膜蓝宝石的平均抗弯强度要高于未镀膜蓝宝石的平均抗弯强度。在800℃时,镀SiO_2/Si_3N_4膜蓝宝石试样的抗弯强度是未镀膜蓝宝石试样的1.4倍;镀SiO_2膜蓝宝石试样的抗弯强度为未镀膜蓝宝石试样的1.5倍。
     探讨了镀膜可以改善蓝宝石强度的机理。分析认为,在室温下镀膜对蓝宝石强度的改善主要有两方面的原因,一是改善了蓝宝石的表面质量,二是改变了蓝宝石的表面应力状态。在高温下镀膜除改善了蓝宝石的表面质量外,有效地降低了弯曲测试中的表面接触压缩应力,在一定程度上抑制了蓝宝石晶体中缺陷的产生,明显改善了蓝宝石的高温强度。
Domes are important components of infrared guide air-to-air missiles. Sapphire has many excellent properties that it is superior to other current and emerging materials for window and dome applications. However, the transmission in mid-wave IR of sapphire limited by the level of preparation and fabrication process can not reach what we expected and it decrease at harsh environments. In addition, the decrease in the mechanical strength of sapphire with increasing temperature is unusually rapid, in comparison to that in most ceramic materials. Resistance to thermal stress is limited by a loss of mechanical strength at elevated temperature. Hence, sapphire is a new window and dome material that needed to be refined and improved. Depositing IR antireflective and protective thin films on sapphire is an effective method to improve its IR transmittance, high temperature strength and durability. Silicon Dioxide films has been used as antireflective and protective thin film of sapphire because of its desirable properties, such as small refractive index, transparency over broad wave band, low absorption, and chemical stability, etc. Silicon Nitride has big refractive index of~1.99, and Si_3N_4 film can be used as antireflective film system by combination with SiO_2 film which has low refractive index.
     In this article, SiO_2 coatings and double layer films of SiO_2/Si_3N_4 are used as IR antireflective and protective film systems for sapphire. Single layer films of SiO_2 and two-layer films of SiO_2/Si_3N_4 have been designed and prepared on sapphire (α-Al_2O_3) by radio frequency magnetron reactive sputtering. The depositing processes and properties of the films are studied systematically. The main contents and results are listed as follows:
     Anti-reflective and protective films of SiO_2, SiO_2/Si_3N_4, and SiO_2/Si_3N_4/SiO_2 are designed on the sapphire substrate. The design results explain that sapphire coated on both sides can transmit over a wide waveband from 3 to 5urn for all the designs, which can meet the transmission requirements of missile dome in infrared application.
     SiO_2 and Si_3N_4 films have been prepared on sapphire substrate by radio frequency magnetron reactive sputtering. Preparations of SiO_2 films with RF magnetron reactive sputtering are studied systematically, influences of processing parameters on the deposition rate, adherence, internal stress, and infrared transmission of SiO_2 film are discovered, and optimized parameters are obtained. The influences of processing parameters on the oxygen content and the infrared spectra of sapphire coated with Si_3N_4 films were measured using a Fourier Transform Infrared (FTIR) spectrometer. Composition and structure of Si_3N_4 films was analyzed by X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD), respectively. The pure Si_3N_4 films have been obtained.
     According to the films design, sapphires have been coated with single layer films of SiO_2 and two-layer films of SiO_2/Si_3N_4 on two sides. The average transmittance can be increased 9.0% at a wavelength from 3 to 5μm for all the coated sapphires. The transmission of coated sapphire can meet the requirements of missile dome in infrared application.
     Preparing films on sapphire domes have been studied. The SiO_2 films were firstly deposited on the dummy dome and sapphire dome by RRFS. The average transmittance in 3~5μm waveband of coated dome can increase 4.0%and the transmittance variation in whole dome area is less than 2.0%, all these meet the requirements of sapphire domes in infrared application.
     Rain erosion experiments were carried on a whirling arm rig provided by Chinese Aerodynamics Research Institute. Whirling-arm rain erosion results express that SiO_2 coating was strongly bonded to the sapphire substrate during impact. After rain erosion, the decreases in normalized transmission were less than 1%for designed SiO_2 films, and sapphires coated with SiO_2 films had a higher transmittance than uncoated ones. It explains that SiO_2 films can satisfy the rain-erosion-resistant requirements of sapphire substrate in use.
     For the two films design, the flexure strength of coated and uncoated sapphire samples has been studied by 3-point bending tests at room temperature and high temperatures. The designed single layer of SiO_2 film and two-layer of SiO_2/Si_3N_4 films can strengthen sapphire at the same test temperatures. Flexure tests reveal that SiO_2 coatings and SiO_2/Si_3N_4 films increase the strength of c-axis sapphire by a factor of about 1.5 and 1.4, respectively, at 800℃.
     The mechanism that films can strengthen sapphire were discussed and analyzed. Two factors could contribute to the effect of films increased the strength of sapphire at ambient temperature. The coatings can improve the surface morphology and reduce the surface roughness of sapphire substrate. A second effect could be that the stress state of sapphire surface is changed from tensile to compressive by the coatings. Films can improve the surface quality and reduce the contact compressive stress along the c-axis of sapphire samples at elevated temperatures, which maybe restrain the twins to be produced so as to increase the flexure strength of sapphire at high temperatures.
引文
[1] 任卫.“红外陶瓷”.武汉工业大学出版社,1999:3.
    [2] Amy Graham, Richard A, LeBlanc, Ray Hilton Sr. et al. "Low cost infrared glass for IR Imaging Applications". SPIE, 2003, 5078:216.
    [3] 方斌,陈天如.“空空导弹红外成像制导关键技术分析”.红外技术,2003,25(4):45.
    [4] 李程华.“先进红外制导导弹对抗方法研究”.光电技术应用,2003,4:8.
    [5] 张义广,丁明跃,周成平.“弹道导弹红外成像制导的关键技术”.制导与引信,2004,25(4):11.
    [6] 梅遂生,杨家德.“光电子技术”.国防工业出版社,1999:34.
    [7] Daniel C. Harris. "Materials for infrared windows and domes: properties and performance". Edition 2. SPIE Press, 1999: 2-4.
    [8] 白长城,张海兴,方湖宝.“红外物理”.电子工业出版社,1989:33-90.
    [9] 黄占杰.“中红外导流罩及窗口材料的发展趋势”.材料导报,1998,12(3):30.
    [10] 万全.“红外探测技术及其在军事上的应用”.国防技术基础,2004,1:19.
    [11] 张春霞,张鹏翔.“红外探测材料的发展状况及未来发展”.云南冶金,2004,33(1):35.
    [12] John M. Hall. "Army applications for multi-spectral windows". Proc. SPIE, 1997, 3060: 330.
    [13] A. Zachary Yropf, Michael E. Thomas, William J. Tropf. "Optical properties of KRS-5". Proc. SPIE, 1997, 3060: 344.
    [14] 张金全,张国英,樊寄松等.“红外窗口整流罩气动加热对红外热图像测量影响试验研究”.红外技术,2001,23(2):32.
    [15] Jitendra S. Goela, Brent Romero. "Effects of Defects on ZnSe Absorption and Transmission". SPIE, 1997, 3060: 366.
    [16] 张云,王淑岩,孙益善等.“超音速状态下整流罩红外窗口的选型问题研究”.红外技术,1999,21(2):11.
    [17] Tim P Mollart. "The development of CVD infrared optics from planar windows to missile domes". Proc. SPIE, 2003, 5078: 127.
    [18] Daniel C. Harris. "Infrared window and dome materials". Washington: SPIE Optical Engineering Press. 1992:45
    [19] 刘隆和.“双模复合寻的制导技术”.制导与引信,1999,2:33.
    [20] Daniel C. Harris. "Materials for infrared windows and domes: properties and performance". Edition 2. SPIE Press, 1999: 132.
    [21] Caspar C. Clark. "Solid particle erosion performance of a new ultradurable AR for silicon". Proc. SPIE, 2001, 4375: 275.
    [22] G. H. Jilbert, J. E. Field. "Synergistic effects of rain and sand erosion". Wear, 2000, 243: 6.
    [23] Daniel C. Harris. "Materials for infrared windows and domes: properties and performance". Edition 2. SPIE Press, 1999: 138, 215.
    [24] A. Deom, R. Gouyon, C. Berne. "Rain erosion resistance characterizations Link between on-ground experiments and in-flight specifications". Wear, 2005, 258: 545.
    [25] E. J. Coad, J. E. Field. "Liquid impact resistance of CVD diamond and other infrared materials". Proc. SPIE, 1997, 3060: 169.
    [26] B.C. Momachan, C.J. Kelly and E.M. Waddell. "Ultra-hard coating for I.R. materials". Proc. SPIE, 1989, 1112: 129.
    [27] D.R. Gibson and E.M. Waddell. "Advances in ultradurable phosphide-based broadband anti-reflective coatings for sand and rain erosion protection of infrared windows and domes". Proc. SPIE, 1994, 2286: 335.
    [28] R. Korenstein, L. Goldman and R. Hallock et el. "Diamond coated ZnS for improved erosion resistance". Proc. SPIE, 1997, 3060: 181.
    [29] Frederick Scgmid, Chandra P. Khattak, Henry H. Rogers, etal. "Current status of very large sapphire crystal growth for optical applications". SPIE, 1999, 3705: 70.
    [30] Chandra P Khattak, Frederick Schmid and Maynard B Smith. "Correlation of sapphire quality with uniformity and optical properties". SPIE, 1997, 3060: 250.
    [31] P.A. Gurjiyants, M.Yu. Starostin, V.N. Kurlov, etal. "Effect of growth conditions on the strength of shaped sapphire". Journal of Crystal Growth. 1999, 198-199: 227.
    [32] Michael R. Borden and Joel Askinazi. "Improving sapphire window strength". SPIE, 1997, 3060: 246.
    [33] A. Kirkpatrick, D.C. Harris, L.F. Johnson. J. Mater. Sci., 2001, 26: 2195
    [34] W. J. Tropf, M.E. Thomas, R.K. Frazer. "Windows and domes: past, present, and future". SPIE, 2003, 5078: 80.
    [35] Daniel C. Harris, Frederick Schmid, David R. Black, etc. "Factors that influence mechanical failure of sapphire at high temperature". SPIE, 1997, 3060: 226.
    [36] 王英剑、王靖等.“白宝石窗口增透膜的研究”.中国激光.2001,28(8):765.
    [37] J. W. Locher, H. E. Bates, W. C. Severn, etc. "80mm-EFG sapphire dome blanks yield high quality, low cost single crystal domes". SPIE, 1992, 1760: 48.
    [38] Daniel C. Harris. "Overview of progress in strengthening sapphire at elevated temperature". SPIE, 1999, 3705: 2.
    [39] Frederick Schmid, Daniel C. Harris. "Effects of crystal orientation and temperature on the strength of sapphire". Journal of the American Ceramic Society. 1998, 81(4): 885.
    [40] W. D. Scott, "Rhombohedral twinning in Aluminum Oxide". Plenum press, New York, 1975: 151
    [41] W. D. Scott and K. K. Orr, "Rhombohedral twinning in Alumina". J. Am. Ceram. Soc., 1983, 66: 27
    [42] J. B. Bilde-Sorensen, B. F. Lawlor, T. Geipel, etal. "On basal slip and basal twinning in sapphire". Acta Mater., 1996, 44: 2145
    [43] Daniel C. Harris. "Materials for Infrared Windows and Domes". Bellingham, Washington USA: SPIE Optical Engineering Press. 1999:112
    [44] Frederick Schmid, Chandra P. Khattak, Keil A. Schmid, etal. "Increase of high temperature strength of sapphire by polishing, heat treatments and doping". SPIE, 2000, 4102: 43.
    [45] Daniel C. Harris. "High-temperature strength of sapphire". SPIE, 2000, 4102: 25.
    [46] Thomas M. Regan, Daniel C. Harris, Rhonda M. Stroud. et al. "Neutron irradiation of sapphire for compressive strengthening". Journal of Nuclear Materials. 2002, 300: 39.
    [47] Thomas M. Regan, Daniel C. Harris, Rhonda M. Stroud. et al. "Compressive strengthening of sapphire by neutron irradiation". SPIE, 2001, 4375: 31.
    [48] Linda F. Johnson and Mark B. Moran. "Compressive coatings for strengthened sapphire". SPIE, 1999, 3705: 130.
    [49] V. M. Bermudez, F. K. Perkins. "Preparation and properties of clean Si_3N_4". Applied Surface Science, 2004, 235: 406.
    [50] Sang-Bae Jung, Sung-Woo Park, Jun-Kyu Yang, et al. "Application of SiO_2 aerogel film for interlayer dielectric on GaAs with a barrier of Si_3N_4". Thin Solid Films. 2004, 447-448: 580.
    [51] S. Alexandrova, A. Szekeres, E. Halova, et al. "Oxide and interface charges in thin SiO_2 films thermally grown on RF plasma hydrogenated silicon". Vacuum. 2004, 75: 301.
    [52] Qinqin Wei, Chengshan xue, Zhencui, Sun et al. "Fabrication of large-scale -Si_3N_4 nanotubes on Si(1 1 1) by hot-wall chemical-vapor-deposition with the assistance of Ga_2O_3" Applied Surface Science, 2004, 229: 9.
    [53] 鲍云,蒋明,李伟等.“等离子体氧化制备超薄SiO_2层的性质”.半导体学报.2001,22(8):1011.
    [54] 何乐年,徐进,王德苗.“反应RF磁控溅射法制备非晶氧化硅薄膜及其特性研究”.真空.2001,3:16.
    [55] Y. P. Li, C. H. Henry. "Silica-based optical integrated circuits". IEE Proceeding of Optoelectronics. 1996, 143(5): 263.
    [56] 尹树百.“薄膜光学—理论与实践”.科学出版社,1987:17-23.
    [57] 宋建全,刘正堂,于忠奇等.“Ge_xC_(1-x)薄膜在红外增透保护膜系设计和制备中的应用”.红外与毫米波学报,2000,19(4):266.
    [58] 李良钰,朱健强,林大健.“在定域法中实现光学全局优化”.光子学报,2000,29(4):348.
    [59] Maria Luisa Rastello and Amedeo Premoli. "Continuation method for synthesizing antireflection coatings". Appl. Opt., 1992, 31(31): 6741.
    [60] Patrick A. Trotta. "Precision conformal optics technology program". Proc. SPIE, 2001, 4375: 96.
    [61] 宋建全,刘正堂,于忠奇等.“磁控溅射头罩镀膜膜厚分布模拟”.西北工业大学学报,2002,20(1):141.
    [62] David V. Tsu. "Obtaining optical constants of thin Ge_xSb_xTe_z films from measurements of reflection and transmission". J. Vac. Sci. Technol. A, 1999, 17(4): 1854.
    [63] Joge I. Cisneros. "Optical characterization of dielectric and semiconductor thin films by use of transmission data". Applied Optics, 1998, 37(22): 5262.
    [64] 周健,林永昌.“一种新的膜系设计方法-Needle法”.光学学报,1997,17(10):1445.
    [65] Milad F. Tabet and William A. McGahan. "Thickness and index measurement of transparent thin films using neural network processed reflectance data". J. Vac. Sci. Technol. A 1999, 17(4): 1836.
    [66] W. J. Wild and H Buhay. "Thin-film multiplayer design optimization using a Monte Carlo approach". Optical Society of America, 1986, 11(11): 745.
    [67] Z. Dashevsky, A. Belenchuk, E. Gartstein. "PbTe films grown by hot wall epitaxy on sapphire substrates". Thin Solid Films, 2004, 461:256.
    [68] I. Bertoti. "Characterization of nitride coatings by XPS". Surface and Coatings Technology, 2002, 151-152: 194.
    [69] Mohit Jain, Ganesh Skandan, Amit Singhal. "Processing of nanopowders into transparent ceramics for infrared windows". Proc. SPIE, 2003, 5078: 189.
    [70] K. Narasimha Rao. "Studies on single layer CeO_2 and SiO_2 films deposited by rotating crucible electron beam evaporation". Material Science and Engineering B, 2003, 98: 38.
    [71] Nick Brette, Paul Klocek. "Engineered polymeric IR-transparent protective coatings". Proc. SPIE, 1994, 2286: 325.
    [72] H. J. Fitting, T. Barfels, A.von Czarnowski, et al. "Electron beam induced optical and electronical properties of SiO_2". Material Science and Engineering B, 2000, 71: 109.
    [73] M. Vila, C. Prieto, P. Miranzo, et al. "Characterization of Si_3N_4 thin films prepared by r.f. magnetron sputtering". Surface and Coatings Technology, 2002, 151-152: 67.
    [74] A. M. Mahajan, L. S. Patil, J.P.Bange, et al. "Growth of SiO_2 films by TEOS-PECVD system for microelectronics applications". Surface and Coatings Technology, 2004, 183: 295.
    [75] S. S. Bayya, G. D. Chin, J. S. Sanghera, et al. "VIS-IR transmitting Glass windows". Proc. SPIE, 2003, 5078: 208.
    [76] M. Lattemann, E. Nold, S. Ulrich, et al. "Investigation and characterisation of silicon nitride and silicon carbide thin films". Surface and Coatings Technology, 2003, 174-175: 365.
    [77] R. Korenstein, P. Cremin, T. E. Varitimos, et al. "Optical properties of durable oxide coatings for infrared applications". Proc. SPIE, 2003, 5078: 169.
    [78] Lee M. Goldman, Randal W. Tustison. "High durability infrared transparent coatings". Proc. SPIE, 1994, 2286: 316.
    [79] 宋建全,刘正堂,耿东生等.“红外增透保护薄膜的进展”.材料导报,2001,15(12):35.
    [80] Joel Askinazi, Authi Narayanan. "Protective broadband window coatings". Proc. SPIE, 1997, 3060: 356.
    [81] Gibson D. R., Waddell E. M., Wilson A. D. et al. "Ultradurable phoshide-based antireflection coatings for sand and rain erosion protection". Opt Eng., 1994, 33(3):957.
    [82] M. L. Carasso, J. H. Adair, P. A. Demkowicz, et al. "Improving Electro-Optic Window Reliability with DIACER~(TM) Coatings". Proc. SPIE, 1997, 3060: 203.
    [83] SValette. "Si-based integrated optics technologies". Solid State Technology, 1989, 32: 69.
    [84] E.S. Kelly, R.J. Ondercin and J.A. Detrio et al. "Environmental testing of long wave infrared (LWIR) windows". Proc. SPIE, 1997, 3060: 68.
    [85] 李学丹,万学英,姜祥祺等.“真空沉积技术”.浙江大学出版社.1994:79
    [86] 王力衡,黄运添,郑海涛.“薄膜技术”.清华大学出版社.1991:50
    [87] 严一心,林鸿海.“薄膜技术”.国防工业出版社,1994:21
    [88] 杨邦昌,王文生.“薄膜物理与技术”.电子科技大学出版社,1994:60,93.
    [89] 陈国平.“薄膜科学与技术”.东南大学出版社,1993:44
    [90] H.A.Macleod.“光学薄膜技术”.周九林,尹树百(译).国防工业出版社,1974:11.
    [91] 薛增泉,吴全德,李浩.“薄膜物理”.电子工业出版社,1991:111.
    [92] K. Kawagishi, K. Komori, M. Fukutomi, et al. "Thickness and composition dependence of microwave properties of YBCO thin films on CeO_2-buffered sapphire substrates". Physica C, 2002, 372-376: 659.
    [93] Seungbum H., Eunah K., Byeong S. B., et al. "A Simulation model for thickness profile of the film deposited using planar circular type magnetron sputtering sources". J. Vac. Sci. Technol. 1996, A14(5): 2721.
    [94] M. Pal, T. Sasaki, and N. Koshizaki. "Preparation of Pd-TiO_2 nanocomposite by magnetron sputtering". Scripta Mater. 2001,44: 1817.
    [95] Qi-hua, Xiao-hong Chen, Ying Zhang. "Computer simulation of film thickness distribution in symmetrical magnetron sputtering". Vacuum, 1995, 46 (3): 229.
    [96] S Swann. "Film thickness distribution in magnetron sputtering". Vacuum, 1988, 38(10): 791.
    [97] A. Billard, C. Frantz. "Attempted modeling of thickness and chemical heterogeneity in coatings prepared by d.c. reactive magnetron sputtering". Surface and Coatings Technology, 1993, 59: 41.
    [98] Senugbum Hong, Eunah Kim, Byeong-Soo Bae, et al. "A simulation model for thickness profile of the film deposited using planar circular type magnetron sputtering source". J. Vac. Sci. Technol. 1996, A14(5): 2721.
    [99] Tihomir Car, Nikola Radio. "Film thickness variation in a cylindrical magnetron deposition device". Thin Solid Films, 1997, 293: 78.
    [100] M Shishkov, D Popov. "Thickness uniformity of thin films deposited on a flat substrate by sputtering of a target with rotational symmetry". Vacuum, 1991, 42 (15): 1005.
    [101] Y. Matsuda, M. Muta, H. Fujiyama. "Two-dimensional spatial distributions of sputtered particles produced in a planar magnetron discharge of indium-tin-oxide target". Thin Solid Films, 1999, 345: 167.
    [102] J. D. Kress, D. E. Hanson, A. F. Voter, et al. "Molecular dynamics simulation of Cu and Ar ion sputtering of Cu(111) surface". J. Vac. Sci. Technol. 1999, A17(5): 2819.
    [103] 宋建全.“ZnS头罩增透保护膜系的设计、制备及计算机模拟”.西北工业大学博士学位论文,2001:53-85.
    [104] 宋银锁.“导弹天线罩的雨蚀及试验研究”.制导与引信,1998,1:9.
    [105] William F. Adler. "Rain erosion testing". Proc. SPIE, 1989, 1112: 275.
    [106] Carolyn Westmark and G.Wm. Lawless. "A discussion of rain erosion testing at the United States Air Force rain erosion test facility". Wear, 1995, 186-187: 384.
    [107] G. H. Jilbert and J. E. Field. "Synergistic effects of rain and sand erosion". Wear, 2000, 243: 6.
    [108] E. J. Coad and J. E. Field. " Liquid impact resistance of CVD diamond and other infrared materials". Proc. SPIE, 1997, 3060: 169.
    [109] A. Deom, R. Gouyon, C. Berne. "Rain erosion resistance characterizations Link between on-ground experiments and in-flight specifications". Wear, 2005, 258: 545.
    [110] C. R. Seward, C.S.J. Pickles and J.E. Field, "Single and multiple impact jet apparatus and results". Proc. SPIE, 1990, 1326: 280.
    [111] C.R. Seward, E.J.Coad and C.S.J. Pickles et al. "The rain erosion resistance of diamond and other window materials". Proc. SPIE, 1994, 2286: 285.
    
    [112] J.E. Field. "Liquid impact: theory, experiment, applications". Wear, 1999, 233-235: 1.
    [113] Caspar C. Clark. "Solid particle erosion performance of a new ultradurable AR for silicon". Proc. SPIE, 2001,4375:275.
    [114] J.E. Field, R.J. Hand and CJ. Pickles. "Strength and rain erosion studes of I.R. materials". Proc. SPIE, 1989,1112: 306.
    [115] J.E. Field, Q. Sun and H. Gao. "Solid Particle erosion of infrared transmitting materials". Proc. SPIE, 1994,2286:301.
    [116] D.R. Andrews. "An analysis of solid particle erosion mechanisms". J. Phys. D: Appl. Phys., 1981,14: 1979.
    [117] Deniel C. Harris. "Side-by-side comparison of erosion-resistant coatings". Proc. SPIE, 1997, 3060: 17.
    [118] JM. Mackowski, B. Cimma and R. Pignard. "Rain erosion behavior of germanium carbide (GeC) films grown on ZnS substrates". Proc. SPIE, 1992,1760: 201.
    [1] Frederick Schmid, Chandra P. Khattak, Keil A. Schmid, etal. "Increase of high temperature strength of sapphire by polishing, heat treatments and doping". SPIE, 2000, 4102: 43.
    [2] W. J. Tropf, M.E. Thomas, R.K. Frazer. "Windows and domes: past, present, and future". SPIE, 2003, 5078: 80.
    [3] Thomas M. Regan, Daniel C. Harris, Rhonda M. Stroud. et al. "Neutron irradiation of sapphire for compressive strengthening". Journal of Nuclear Materials. 2002, 300: 39.
    [4] Daniel C. Harris. "High-temperature strength of sapphire". SPIE, 2000, 4102: 25.
    [5] 康晋发,顾培夫.薄膜光学与技术.北京:机械工业出版社,1989
    [6] 林永昌,卢维强.“光学薄膜原理”.国防工业出版社,1990:25-28.
    [7] 尹树百.薄膜光学—理论与实践.北京:科学出版社,1987
    [8] 林永昌,卢维强.“光学薄膜原理”.国防工业出版社,1990:185-237.
    [9] Maria Luisa Rastello, Amedeo Premoli. "Continuation method for synthesizing antireflection coatings". Applied Optics, 1992, 31(31): 6741.
    [10] 吴乐林,陈国平.“视保屏减反射膜系的设计”.电子器件,1999,22(2):99.
    [11] 周健,林永昌.“一种新的膜系设计方法—Neddle法”.光学学报,1997,17(10):1445.
    [12] 李芳,张诚,林永昌.“膜系优化设计中的模糊输入及评价函数的改进”.2000,29(1):68.
    [13] 李良钰,朱健强,林大健.“在定域法中实现光学全局优化”.光子学报,2000,29(4):348.
    [14] 王德育,袁春伟.“TiO_2薄膜厚度及其光学常数的测量”.东南大学学报,1999,29(5):105.
    [15] 宋建全,刘正堂,耿东生等.“红外增透保护膜系软件设计及应用”.红外技术,2001,3(2):1.
    [16] 周健,林永昌.“一种新的膜系设计方法Neddle法”.光学学报,1997,17(10):1445.
    [17] 林永昌,顾永琳,张诚等.“针法与初始膜系设计”.光学学报,19(10):27.
    [18] Daniel C. Harris. "Materials for Infrared Windows and Domes". Bellingham, Washington USA: SPIE Optical Engineering Press. 1999:352-365
    [19] 范志刚,张伟,李以贵等.“多层介质光学膜系的误差分析—膜层厚度变化的灵敏度因子”.激光技术,1996,20(4):236.
    [20] Milad F. Tabet, William A. McGahan. "Thickness and index measurement of transparent thin films using neural network processed reflectance data". J. Vac. Sci. Technol. 1999, A17(4): 1836.
    [21] 唐沪军,沈杰,陈华仙等.“介质薄膜的透射光谱测量及其光学参数分析”.真空科学与技术,1997,17(6):417。
    [22] 宋强,邢中菁,沈元华等.“类金刚石薄膜红外光学常数的计算机拟合”.光学学报,1995,15(8):140.
    [23] D.Y. Smith, M. Inokuti and W. Karstens. "A generalized Cauchy dispersion formula and the refractivity of elemental semiconductors". J. Phys.: Condens. Matter, 2001, 13: 3883.
    [24] J.C. Manifacier, J. Gasiot and J.P. Fillard. "A simple method for the determination of the optical constants and the thickness of a weakly absorbing film". J. Phys. E: Sc. Instrum., 1976, 9: 1002.
    [25] R. Swanepoel. "Determination of the thickness and optical constants of amorphous silicon". Phys. E: Sci. Instrum., 1983, 16: 1214.
    [1] H. J. Fitting, T. Barrels, A. von Czarnoeski, et al. "Electron beam induced optical and electronical properties of SiO_2". Mater. Sci. Eng. B. 2000, 71: 109.
    [2] Sang-Bae Jung, Sung-Woo Park, Jun-Kyu Yang, et al. "Application of SiO_2 aerogel film for interlayer dielectric on GaAs with a barrier of Si_3N_4". Thin Solid Films. 2004, 447-448: 580.
    [3] 陈立春,王向军,徐叙瑢等.“SiO_2薄膜的制备方法与性质”.发光学报.1995,16(3):249.
    [4] K. Narasimha Rao, L. Shivlingappa, S. Mohan, "Studies on single layer CeO_2 and SiO_2 films deposited by rotating crucible electron beam evaporation". Mater. Sci. Eng. B. 2003, 98: 38.
    [5] 徐常明,王士维,黄校先等.“无压烧结制备Si_3N_4-SiO_2复合材料”.无机材料学报.2006,21(4):935.
    [6] Haruhisa Kinoshita, Toichi Murakami, Fumihiko Fukushima. "Chemical vapor deposition of SiO_2 films by TEOS/O_2 supermagnetron plasma". Vacuum. 2004, 76: 19.
    [7] 伍晓明.“电子束蒸镀厚SiO_2膜的工艺研究”.光电子激光.2001,12(6):569.
    [8] S. Alexandrova, A. Szekeres, E. Halova, et al. "Oxide and interface charges in thin SiO_2 films thermally grown on RF plasma hydrogenated silicon". Vacuum. 2004, 75: 301.
    [9] 鲍云,蒋明,李伟等.“等离子体氧化制备超薄SiO_2层的性质”.半导体学报.2001,22(8):1011.
    [10] 何乐年,徐进,王德苗.“反应RF磁控溅射法制备非晶氧化硅薄膜及其特性研究”.真空.2001,3:16.
    [11] 杨邦昌,王文生.“薄膜物理与技术”.电子科技大学出版社.1994:52.
    [12] 李学丹,万学英,姜祥祺等.“真空沉积技术”.浙江大学出版社.1994:78.
    [13] 吴自勤,王兵.“薄膜生长”.北京:科学出版社.2001:86.
    [14] 严一心,林鸿海.“薄膜技术”.国防工业出版社.1994:112.
    [15] 张随新,陈国平.“磁控反应溅射氧化锡膜的工艺研究”.真空科学与技术.1995,15(6):415
    [16] F.Shinoki and A.Itoh. "Mechanism of RF Reactive Sputtering". J. Appl. Phys. 1975, 46(8): 3381.
    [17] 王家祥,黄燕清.“硬质薄膜附着力的研究”.薄膜科学与技术,1990,3(2):12.
    [18] 周志峰,范玉殿.“薄膜内应力的研究”.真空科学与技术.1996,14(1):352.
    [19] Linda F. Johnson and Mark B. Moran. "Compressive Coatings for Strengthened Sapphire". SPIE, 1999, 3705: 130.
    [20] 关振铎,张中太,焦金生.“无机材料物理性能”.清华大学出版社,2004:178.
    [21] 周玉.“陶瓷材料学”.哈尔滨工业大学出版社.1995:332.
    [22] 方亮,王万录,王健等.“金刚石薄膜内应力研究现状”.材料导报.1999,13(6):39.
    [23] 于映,陈跃.“氮化硅介质薄膜内应力的实验研究”.真空科学与技术.2001,21(1):51.
    [24] 曲喜新,过璧君.“薄膜物理”.电子工业出版社.1994:67
    [25] 唐伟忠.“薄膜材料制备原理、技术及应用”.冶金工业出版社.1998:142.
    [26] 田民波,刘得令.“薄膜科学与技术手册”.机械工业出版社.1991:72.
    [27] D. C. Harris. Materials for Infrared Windows and Domes. Bellingham, Washington USA: SPIE Optical Engineering Press. 1999: 42.
    [28] C. M. Freeland. "High Temparature transmission Measurement of IR Windows Materials". SPIE, 1988, 929: 79.
    [29] M. E. Thomas, R. I. Joseph, W. J. Tropf. "Infrared Transmission properties of Sapphire, Spinel, Yttia and AION as a function of temperature and frequency". Appl. opt. 1988, 27: 239.
    [30] 任卫.“红外陶瓷”.武汉工业大学出版社.1999:109.
    [31] Daniel C. Harris. "Materials for Infrared Windows and Domes". Bellingham, Washingtor USA: SPIE Optical Engineering Press. 1999:51.
    [32] M. E. Thomas and R. I. Joseph. "the Infrared Properties of Window Materials". Appl. Phys. Tech. 1988, 9: 328.
    [33] D. R. Gibson, E. M. Waddell. "Advances in ultradurable phosphide-based broadband anti-reflection coationgs for sand and rain erosion protection of infrared windows and domes". Proc. SPIE. 1994, 2286: 335.
    [34] 宋建全,刘正堂,于忠奇等,“磁控溅射头罩镀膜膜厚分布模拟”.西北工业大学学报.2002,20(1):141.
    [35] E M. Waddle, D. R. Gibson, M. Wilson. "Broadband IR transparent rain and sand erosion protective coating for the F14 aircraft infrared search & track germanium dome". Proc. SPIE 1994, 2286: 376.
    [1] Collin Mui, Yuniarto Widjaja, Jeung Ku Keng, et al. "Surface reaction mechanisms for atomic layer deposition of silicon nitride". Surface Science. 2004, 557: 159.
    [2] M. Naich, G. Rosenman, Ya. Roizin, et al. "Exoelectron emission studies of trap spectrum in ultrathin amorphous Si_3N_4 films". Solid-State Electronics. 2004, 48: 477.
    [3] S. Osono, Y. Uchiyama, M. Kitazoe, et al. "Coverage properties of silicon nitride film prepared by the Cat-CVD method". Thin Solid Films. 2003, 430: 165.
    [4] George T. Yu, S. K. Yen. "Hydrogen ion diffusion coefficient of silicon nitride thin films". Applied Surface Science. 2002, 202: 68.
    [5] P. K. Pandey, L. S. Patil, Jaspal P. Bange, et al. "Growth and characterization of silicon nitride films for optoelectronics applications". Optical Materials. 2004, 27: 139.
    [6] H. F. Sterling and R. C. G. Swarm. "Chemical vapour deposition promoted by r. f. discharge". Solid State Electronics. 1965, (8): 653.
    [7] M.J.Loboda, J.A.Seifferly. "Chemical influence of inert gas on the thin films stress in plasma-enhanced chemical vapor deposited α-SiN:H films". J. Mater. Res. 1996, 11(2): 391.
    [8] 杨爱龄.“PECVD氮化硅膜的性质与生长条件的关系”.杭州大学学报,1990,17(2):174.
    [9] 周平南,王建锋,菜珣.“离子束增强沉积氮化硅薄膜的超显微硬度”.理化检验-物理分册,1995,31(6):31.
    [10] 邱春文,陈雄文,石旺舟等.“磁控反应溅射法低温制备氮化硅薄膜”.汕头大学学报,2003,18(2):35.
    [11] 吴大维,范湘军等.“PECVD法氮化硅薄膜的研究”.材料科学与工程.1997,15(1):46.
    [12] 叶超等.“永磁微波ECR等离子体CVD低温淀积SiN_x薄膜”.功能材料,1996,27(4):339.
    [13] G. E. Dufour et al. "Electrical properties of silicon nitride films grown on a SiGe layer by distributed ECR-PECVD ". Thin Solid Films. 1997, 294: 214.
    [14] 任兆杏.“ECR-PECVD制备Si_3N_4薄膜的特性及其应用的研究”.电子学报,1996,24(2):56.
    [15] 吴大兴,杨川,高国庆.“用DC-PCVD装置对钢沉积Si_3N_4薄膜”.金属学报.1997,33(3):320.
    [16] S. E. Alexandrov et al. "Remote plasma-enhanced cvd of fluorinated silicon nitride films". Chemical Vapor Deposition. 1997, 3(3): 111.
    [17] 翟光杰,杨建树,陈显邦等.“Si(111)表面在NH_3气氛下形成Si_3N_4薄膜的STM研究”.物理学报,2000,49(2):215.
    [18] K. Elgaid, H. Zhou, C. D. W. Wilkinson, et al. "High density Si_3N_4 MIM capacitor technology for MMMIC applications". Microelectronic Engineering. 2004, 73-74: 452.
    [19] 李强.改善蓝宝石高温强度和透过率的镀膜技术研究.西北工业大学硕士论文.2006
    [20] E. Rille and M. Huter. "Optical properties of Si_3N_4 thin films produced by reactive d.c.-magnetron sputtering". Proc. SPIE 1994, 2253: 1338.
    [21] David R. McKenzie, Wei-Tang Li, William D. McFall, et al. "Effect of sputtering-gas pressure on properties of silicon nitride films produced by helicon plasma sputtering". Thin Solid Films, 2001,384: 46.
    [22] Daniel C. Harris. "Materials for Infrared Windows and Domes". Bellingham, Washington USA: SPIE Optical Engineering Press. 1999:17.
    [23] E D Nicholson, C S J Pickles, J E Field. "The mechanical properties of thin films for aerospace applications". Proc. SPIE. 1994, 2286: 275.
    [1] 彭望泽.防空导弹天线罩.北京:宇航工业出版社,1993
    
    [2] Carolyn Westmark, G. Wm. Lawless. "A discussion of rain erosion testing at the United States air force rain erosion test facility". Wear, 1995,186-187:384.
    [3] E M Waddell and B C Monachan, "Rain erosion protection of IR materials using boron phosphide coatings". SPIE, 1990,1326:144.
    [4] JM Mackowski, B Cimma and R Pignard. "Rain erosion behavior of Germanium Carbide films grown on ZnS substrate." SPIE, 1992,1760:201.
    
    [5] J.E. Field. "Liquid impact: theory, experiment, applications". Wear, 1999,233-235: 1.
    [6] E.J. Coad and J.E. Field. "Liquid impact resistance of CVD diamond and other infrared materials". SPIE, 1997, 3060: 169.
    [7] F.P. Bowden and J.E. Field. "The brittle fracture of solid by liquid impact, by solid impact, and by shock". Proc. Roy. Soc. Lond., 1964, A282: 331.
    
    [8] G.H. Jilbert and J.E. Field. "Synergistic effects of rain and sand erosion". Wear, 2000,243: 6.
    [9] J.P. Dear and J.E. Field. "High-speed photography of surface geometry effects in liquid/solid impact". J. Appl. Phys. 2002, 63(4): 1015.
    [10] J.E. Field, R.J. Hand and C.J. Pickles et al. "Rain erosion studies of I.R. materials". SPIE, 1989,1191: 100.
    [11] G.F. Miller and H. Perser. "On the partition of energy between elastic waves in a semi-infinite solid". Proc. Roy. Soc. A, 1961,263:433.
    [12] M.J. Jackson and J.E. Field. "Liquid impact erosion of single-crystal magnesium oxide". Wear, 1999, 39-50: 233.
    [13] M B Lesser. "Analytic solutions of liquid-drop impact problems". Proc. Roy. Soc, 1979, A377: 289
    [14] C.R. Seward, E.J. Coad and C.S.J. Pickles et al. "The rain erosion of diamond and other window materials". SPIE, 1994, 2286: 285.
    [15] T. Obara, N.K. Bourne and J.E. Field. "Liquid-jet impact on liquid and solid surfaces". Wear, 1995,186-187: 388.
    
    [16] William F.Adler."Rain impact retrospective and vision for the future".Wear,1999, 233-235: 25
    [17] P.N.H. Davides and J.E. Field. "Multiple impact jet apparatus (MIJA): application to rain erosion studies". SPIE, 1989,1112: 316.
    [18] C.R. Seward, C.S.J. Pickels and R. Marrah et al. "Rain erosion data on window and dome materials". SPIE, 1992,1760: 280.
    
    [19] W.F. Adler. "Rain erosion testing". SPIE, 1989,1112: 275.
    [20] D.R. Gibson and E.M. Waddell. "Advances in ultradurable phosphide-based broadband anti-reflection coatings for sand and rain erosion protection of infrared windows and domes". SPIE, 1994,2286:335.
    
    [21] D.C. Harris. "Side-by-side comparison of erosion-resistant coatings". SPIE, 1997, 3060: 17.
    [22] Shay Joseph, Orna Marcovitch, Ygal Yadin et al. "Improved rain erosion protection for multi-spectral ZnS". SPIE, 2005, 5786: 373.
    [23] M.K. Lee, W.W. Kim and C.K. Rhee et al. "Liquid Impact Erosion Mechanism and Theoretical Impact Stress Analysis in TiN-Coated Steam Turbine Blade Materials". Metallurgical and Materials Transactions A, 1999,30A: 961.
    [24] E.M. Waddell and D.R. Gibson. "Broadband IR transparent rain and sand erosion protective coating for the F14 aircraft infra-red search & track germanium dome" SPIE, 1994, 2286:376.
    [25] E.S. Kelly and R.J. Onderich. "Environmental testing of long wave infrared (LW1R) windows". SPIE, 1997, 3060: 68.
    [26] M. wilson, M. Thomas and I. Perez. "Impact damage as a function of crystal orientation in Ge IR windows employing durable phosphide coatings". SPIE, 1994, 2286: 108.
    [1] 郭景坤等译.陶瓷的结构与性能.北京:科学出版社,1998,451.
    [2] Daniel C. Harris. "High-temperature Strength of Sapphire". SPIE, 2000, 4102: 25.
    [3] Frederick Schmid, Chandra P. Khattak, Keil A. Schmid, etal. "Increase of High Temperature Strength of Sapphire by Polishing, Heat Treatments and Doping". SPIE, 2000, 4102: 43.
    [4] H.P. Kirchner, R. M. Gruver, and R. E. Walker. "Strengthening Sapphire by Compressive Surface Layers ". Journal of applied physics, 1969, 40(9): 3445.
    [5] Linda F. Johnson and Mark B. Moran. "Compressive Coatings for Strengthened Sapphire". SPIE, 1999, 3705: 130.
    [6] 龚江宏.陶瓷材料断裂力学.北京:清华大学出版社,2001,6.
    [7] E Orowan. "Fracture and strength of solids". Rep. Prog. Phy., 1949, 12, 18
    [8] 赵建生.断裂力学及断裂物理.湖北:华中科技大学出版社,2003,103.
    [9] 张玉军,张伟儒等.陶瓷材料及其应用结构.北京:化学工业出版社.2005,46
    [10] 赵程,杨建民.机械工程材料.北京:机械工业出版社,2003,4.
    [11] 顾宜.材料科学与工程基础.北京:化学工业出版社,2002,282.
    [12] Frederick Schmid, Daniel C. Harris. "Effects of Crystal Orientation and Temperature on the Strength of Sapphire". Journal of the American Ceramic Society. 1998, 81(4): 885.
    [13] P.A. Gurjiyants, M.Yu. Starostin, V.N. Kurlov, et al. "Effect of Growth Conditions on the Strength of Shaped Sapphire". Journal of Crystal Growth. 1999, 198/199: 227.
    [14] 郑修麟.材料的力学性能.西安:西北工业大学出版社,2002,34.
    [15] A. G. Evans, D. R. Biswas, and R M Fulrath. "Some effects of cavities on the fracture of ceramics". Journal of the American Ceramic Society, 1979, 62: 95.
    [16] R. F. Cook, B. R Lawn, T. P. Dabbs, and P. Chantikul. "Effect of machining damage on the strength of a glass-ceramic". Journal of the American Ceramic Society, 1981, 64: 121.
    [17] M. G. Gee, R. Morrell. "Fracture mechanics and microstructure". Fracture Mechanics of Ceramics, 1986, 8: 1.
    [18] 金宗哲,包亦望.脆性材料力学性能评价与设计.北京:中国铁道出版社.1996.110.
    [19] 上海硅酸盐研究所五室编译,“陶瓷的力学性质”.上海科技文献出版社,1981
    [20] M. Lattemann, E. Nold, S. Ulrich, et al. "Investigation and characterisation of silicon nitride and silicon carbide thin films". Surface and Coatings Technology. 2003, 174-175: 365.
    [21] 高玲,赵世坤,杜大明等.“氮化硅陶瓷的残余应力和抗弯强度特性”.材料工艺.2003.20(3):161.
    [22] B. R. Lawn, E. R. Fuller, Jr. "Measurement of thin-layer surface stresses by indentation fracture". J. Mater. Sci., 1984, 19: 4061.
    [23] 董海,张弘韬.“测定工程陶瓷已加工表面残余应力的几种方法”.磨床与磨削.2000,1:72.
    [24] M Munawar Chaudhri and Martin A Phillips. "Quasi-static Indentation Cracking of Thermally Tempered Soda-lime Glass with Spherical and Vickers Indenters". Philosophical Magazine A, 1990, 62 (1): 1.
    [25] S. Chandrasekar and M. M Chaudhri. "Indentation Cracking in Soda-lime Glass and Ni-Zn Ferrite under Knoop and Conical Indenters and Residual Stress Measurements". Philosophical Magazine A, 1993, 67 (5): 1187.
    [26] M. F. Gruninger, B. R. Lawn, E. N. Farabrugh, John B., et al. "Measurement of residual stresses in coatings brittle substrates by indentation fracture". Journal of the American Ceramic Society, 1987, 70(5): 344.
    [27] T. Y. Zhang, L. Q. Chen and R. FU. "Measurement of residual stresses in thin films deposited on silicon wafers by indentation fracture". Acta Mater., 1999, 47(14): 3869.
    [28] 关振铎,张中太,焦金生.“无机材料物理性能”.清华大学出版社,2004,178
    [29] Daniel C. Harris. Materials for Infrared Windows and Domes. Bellingham, Washington USA, SPIE Optical Engineering Press, 1999, 135.
    [30] Frederick Scgmid, Chandra P. Khattak, Henry H. Rogers, et al. "Current status of very large sapphire crystal growth for optical applications". SPIE, 1999,3705: 70.
    [31] John W. Fischer, W. R. Compton, Nancy A. Jaeger, etc. "Strength of Sapphire as a Function of Temperature and Crystal Orientation". SPIE, 1996,1326: 11.
    [32] Michael R. Borden and Joel Askinazi. "Improving Sapphire Window Strength". SPIE, 1997, 3060: 246.
    [33] Daniel C. Harris, Frederick Schmid, David R. Black, etc. "Factors that Influence Mechanical Failure of Sapphire at High Temperature". SPIE, 1997,3060: 226.
    
    [34] W. C. Young. Roark's Formulas for Stress and Strain. McGraw-Hill, New York, 1989, 650.
    [35] J. B. Wachtman Jr. and D. G. Lam Jr, J.Am.Ceram. Soc, 1959, 42: 254.
    [36] W. J. Tropf, M. E. Thomas, and T. J. Harris. Properties of Crystals and Glasses. McGraw-Hill, New York, 1995,33.
    [37] Daniel C. Harris. Materials for Infrared Windows and Domes. Bellingham, Washington USA, SPIE Optical Engineering Press, 1999, 135.
    
    [38] Daniel C. Harris. "High-temperature Strength of Sapphire". SPIE, 2000, 4102: 25.
    [39] T. Geipel, K. P. D. Lagerlof, P. Pirouz, and A. H. Heuer, "A Zonal Dislocation Mechanism for Rhombohedral Twinning in Sapphire". Acta Metall. Mater., 1994, 42, 1367.
    [40] Daniel C. Harris. "Overview of Progress in Strengthening Sapphire at Elevated Temperature". SPIE, 1999,3705:2.
    [41] K. P. D. Lagerlof, A. H. Heuer, J. Castaing, and J. P. Riviere, and T. E. Mitchell, "Slip and Twinning in Sapphire". Journal of the American Ceramic Society, 1994, 77, 385.
    [42] W.D. Scott and K.K. Orr, "Rhombohedral twinning in alumina". J. Am. Ceram. Soc 66 1983, 27.

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