导电玻璃和硅上热壁外延生长砷化镓薄膜的研究
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摘要
本文介绍以Si和SnO_2/Glass两种材料为衬底,采用热壁外延的方法得到结构良好的,适合作GaAs太阳电池的GaAs多晶薄膜。采用电子探针(EPMA)测定薄膜的组份,表面与剖面形貌,X射线衍射(XRD)分析生长薄膜的结构,Raman散射(RSS)、光致发光光谱(PL)分析其光学性质,并且测定了薄膜的导电类型和方块电阻两个基本的电学参数。结构表明该薄膜性能良好,表面呈绒面结构,晶粒为柱状结构,适合制作GaAs薄膜太阳电池。全面分析了现有制备工艺条件对GaAs薄膜性能的影响,得出最佳的生长条件。
     SnO_2/Glass:源温为930℃,衬底温度为500℃,生长时间4小时
     Si:源温为900℃,衬底温度为700℃,生长时间3小时
GaAs polycrytalline thin films with good performance were prepared on conducting glass and Si by hot wall epitaxy (HWE) , which were suitable for solar cell . Electron probe micro-analyzer (EPMA)was applied for the component , surface and cross-section mrophology of grown films , and X-ray diffraction (XRD) for their structure ; Raman scattering spectrum(RSS) and photoluminescene(PL) were used for evaluating their optical
    characteristics . We also study electrical characteristics of films. The results are shown that , there is textured surface and columnar grain of grown GaAs polycrystalline thin films , which are greatly promising to become the candidate of solar cell with low cost and high efficiency. Meanwhile, by analyzing the effect of procedure on films feature all-sidely , it was obtained , that is source temperature should be 930℃, substrate temperature
    should be 500℃ for conducting glass and source temperature should be 900 ℃ , substrate temperature should be 700℃ for Si.
引文
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