容差模拟电路复杂故障的测试与诊断
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摘要
自二十世纪八十年代以来,模拟电路故障诊断已成为继网络分析和网络综合之后网络理论的第三大分支。其主要任务是根据激励信号和部分网络的响应,确定故障元件的位置和参数。
模拟电路故障诊断的研究,已经取得了不少进展,提出了很多诊断方法,大致可分为两大类:测试前模拟法和测试后模拟法。前者以故障字典法为代表。后者主要是沿着如下两个方向展开:参数识别法和故障验证法。故障字典法和故障验证法对容差电路无能为力,因为实际电路总是存在容差的。所以,这两个方法无法应用于实际电路的故障诊断。参数识别法虽然可以应用于容差电路,但其诊断方程的建立和求解十分困难,因此也影响了它在实际中的应用。
本文研究了容差模拟电路复杂故障的测试与诊断。保留了已有参数识别法能应用于容差电路的优点,改进了已有元件参数识别法故障诊断方程建立麻烦和非线性程度非常高的缺点。提出了基于节点电压方程的故障诊断方程,方便了方程的建立。将不可及节点电压作为辅助未知参量,降低了方程的非线性。采用改进的Newton-Raphson迭代法求解故障诊断方程,加快了求解速度。重点研究了线性电路的故障诊断,因为它是其他研究的基础。对于大规模线性电路和非线性电路也作了分析和讨论。研究大规模线性电路采用“分块诊断法”,力求将一个大规模的诊断问题转化为几个相对规模较小的诊断问题,然后再应用前面提出的线性电路故障诊断理论。对于非线性电路,分为两类问题:非线性静态电路和非线性动态电路。前者采用直流激励法,将非线性元件转化为直流等效电阻,从而电路退化为线性静态电路。后者采用两步法,通过施加不同的测试激励信号,将其分解成为两个相对简单的问题——非线性静态电路的故障诊断和线性动态电路的故障诊断。最后,诊断实例验证了本文提出的方法的可行性和有效性。
模拟电路故障诊断领域的研究是一个比较前沿的课题。本文提出的方法仍有不足之处,比如,对于非线性电路的故障诊断理论,还有待进一步的研究和改进。
Since the 1980's, fault diagnosis of analog circuits, other than network analysis and network synthesis, has become the third main branch in the network theory. The chief task in the fault diagnosis is to locate the fault components and determine their parameters in accordance with the excitation signal and the response of a part of the network.
There have been quite a lot of achievements in the research of the fault diagnosis of analog circuits. The existing diagnosis methods are basically in two categories, namely, the SBT (simulation before test) and the SAT (simulation after test). The fault dictionary method is the representative of the former, while the component parameter identification method and the fault verification method are the representatives of the latter. Since the fault dictionary method and the fault verification method are not feasible to circuits with tolerance, they cannot be applied to the fault diagnosis of practical circuits that are actually with tolerance always. Though the component parameter identification method is applicable to circuits with tolerance, it is difficult to establish and solve its diagnosis equation. Therefore, the feasibility of this method is much affected.
This thesis mainly deals with tests and diagnosis of complex faults in analog circuits with tolerance. It keeps the merits of the existing component parameter identification method that it is applicable to circuits with tolerance, while improves the drawback of this method that it is difficult to establish its fault diagnosis equation with a high nonlinearity. A fault diagnosis equation based on node voltage equations, which can be established with much ease, is proposed. With the inaccessible node voltages taken as the assistant unknowns, the nonlinearity of the equation is much reduced. The improved Newton-Raphson iteration algorithm speeds up the solution procedure. Fault diagnosis of linear analog circuits as the basic of other work is mainly researched, while large-scale linear circuits and nonlinear circuits are also analyzed and discussed. Decomposition diagnosis method is proposed to large-scale linear circuits, which transforms a large-scale diagnosis problem into some small-scale diagnosis problems, and the forenamed method to linear circuits is feasible to solve the problem. Nonlinear circuits include nonlinear static circuits and nonlinear dynamic circuits. DC excitation method is proposed to nonlinear static circuits, which transforms the nonlinear resistances into DC equivalent components, and the circuits degenerate to linear static circuits. Two steps method is proposed to nonlinear dynamic circuits. By add different test excitation signals, the nonlinear dynamic circuit is decomposed to two simple problems, namely, fault diagnosis of nonlinear static circuits and fault diagnosis of linear dynamic circuits. Finally, practical examples validate the feasibility and effectiveness of the proposed approach.
The research on fault diagnosis of analog circuits is a frontier of science. There are still some deficiencies of the methods proposed in the thesis, for example the theory about fault diagnosis of nonlinear circuits is still to be deeply researched and improved.
模拟电路故障诊断的研究,已经取得了不少进展,提出了很多诊断方法,大致可分为两大类:测试前模拟法和测试后模拟法。前者以故障字典法为代表。后者主要是沿着如下两个方向展开:参数识别法和故障验证法。故障字典法和故障验证法对容差电路无能为力,因为实际电路总是存在容差的。所以,这两个方法无法应用于实际电路的故障诊断。参数识别法虽然可以应用于容差电路,但其诊断方程的建立和求解十分困难,因此也影响了它在实际中的应用。
本文研究了容差模拟电路复杂故障的测试与诊断。保留了已有参数识别法能应用于容差电路的优点,改进了已有元件参数识别法故障诊断方程建立麻烦和非线性程度非常高的缺点。提出了基于节点电压方程的故障诊断方程,方便了方程的建立。将不可及节点电压作为辅助未知参量,降低了方程的非线性。采用改进的Newton-Raphson迭代法求解故障诊断方程,加快了求解速度。重点研究了线性电路的故障诊断,因为它是其他研究的基础。对于大规模线性电路和非线性电路也作了分析和讨论。研究大规模线性电路采用“分块诊断法”,力求将一个大规模的诊断问题转化为几个相对规模较小的诊断问题,然后再应用前面提出的线性电路故障诊断理论。对于非线性电路,分为两类问题:非线性静态电路和非线性动态电路。前者采用直流激励法,将非线性元件转化为直流等效电阻,从而电路退化为线性静态电路。后者采用两步法,通过施加不同的测试激励信号,将其分解成为两个相对简单的问题——非线性静态电路的故障诊断和线性动态电路的故障诊断。最后,诊断实例验证了本文提出的方法的可行性和有效性。
模拟电路故障诊断领域的研究是一个比较前沿的课题。本文提出的方法仍有不足之处,比如,对于非线性电路的故障诊断理论,还有待进一步的研究和改进。
Since the 1980's, fault diagnosis of analog circuits, other than network analysis and network synthesis, has become the third main branch in the network theory. The chief task in the fault diagnosis is to locate the fault components and determine their parameters in accordance with the excitation signal and the response of a part of the network.
There have been quite a lot of achievements in the research of the fault diagnosis of analog circuits. The existing diagnosis methods are basically in two categories, namely, the SBT (simulation before test) and the SAT (simulation after test). The fault dictionary method is the representative of the former, while the component parameter identification method and the fault verification method are the representatives of the latter. Since the fault dictionary method and the fault verification method are not feasible to circuits with tolerance, they cannot be applied to the fault diagnosis of practical circuits that are actually with tolerance always. Though the component parameter identification method is applicable to circuits with tolerance, it is difficult to establish and solve its diagnosis equation. Therefore, the feasibility of this method is much affected.
This thesis mainly deals with tests and diagnosis of complex faults in analog circuits with tolerance. It keeps the merits of the existing component parameter identification method that it is applicable to circuits with tolerance, while improves the drawback of this method that it is difficult to establish its fault diagnosis equation with a high nonlinearity. A fault diagnosis equation based on node voltage equations, which can be established with much ease, is proposed. With the inaccessible node voltages taken as the assistant unknowns, the nonlinearity of the equation is much reduced. The improved Newton-Raphson iteration algorithm speeds up the solution procedure. Fault diagnosis of linear analog circuits as the basic of other work is mainly researched, while large-scale linear circuits and nonlinear circuits are also analyzed and discussed. Decomposition diagnosis method is proposed to large-scale linear circuits, which transforms a large-scale diagnosis problem into some small-scale diagnosis problems, and the forenamed method to linear circuits is feasible to solve the problem. Nonlinear circuits include nonlinear static circuits and nonlinear dynamic circuits. DC excitation method is proposed to nonlinear static circuits, which transforms the nonlinear resistances into DC equivalent components, and the circuits degenerate to linear static circuits. Two steps method is proposed to nonlinear dynamic circuits. By add different test excitation signals, the nonlinear dynamic circuit is decomposed to two simple problems, namely, fault diagnosis of nonlinear static circuits and fault diagnosis of linear dynamic circuits. Finally, practical examples validate the feasibility and effectiveness of the proposed approach.
The research on fault diagnosis of analog circuits is a frontier of science. There are still some deficiencies of the methods proposed in the thesis, for example the theory about fault diagnosis of nonlinear circuits is still to be deeply researched and improved.
引文
[1]邹锐.模拟电路故障诊断原理和方法[M].武汉:华中理工大学出版社,1989.
[2]杨士元.模拟系统的故障诊断与可靠性设计[M].北京:清华大学出版社,1993.
[3]杨士元.数字系统的故障诊断与可靠性设计[M].北京:清华大学出版社,2000.
[4]John W B,Aly E S.Fault Diagnosis of Analog Circuits[J].Proceedings of the IEEE,1985,73(8):1279-1325.
[5]Li F,Woo P Y.The Invariance of Node-Voltage Sensitivity Sequence and Its Application in a Unified Detection Dictionary Method[J].IEEE Trans on CAS-1,1999,46(10):1222-1227.
[6]Li F,Woo P Y.Fault Detection Method for the Subcircuits of a Cascade Linear Circuit[J].IEEE Trans on CAS-1,2000,47(8):1254-1258.
[7]Li F,Woo P Y.Fault Detection for Linear Analog IC-The Method of Short-Circuit Admittance Parameters[J].IEEE Trans on CAS-1,2002,49(1):105-108.
[8]Bandler J W,Salama A E.Fault Diagnosis of Analog Circuits[J].Proceeding of the IEEE,1985,73(8):1279-1325.
[9]Yunqing C.Experiment on Fault Location in Large-Scale Analog Circuits [J].IEEE Trans on Instrumentation and Measurement,1993,42(1):30-34.
[10]Robert S,Shambhu U.Linear Circuit Fault Diagnosis Using Neuromorphic Analyzers[J].IEEE Trans on CAS-2,1997,44(3):188-196.
[11]Sam D H,Seongwon K,Mani S,Jinyan Z.Automatic Analog Test Signal Generation Using Multifrequency Analysis[J].IEEE Trans on CAS-2,1999,46(5):565-576.
[12]Erika F C,Marcelo N,Luigi C,Marcelo L.A New Adaptive Analog Test and Diagnosis System[J].IEEE Trans on Instrumentation and Measurement,2000,49(2):223-227.
[13]Matthew W,Mike W T W.Non-linear analog circuit fault diagnosis with large change sensitivity[J].International Journal of Circuit Theory and Application,2000,28:281-303.
[14]Mahran A,Farzan A.Neural-Network Based Analog-Circuit Fault Diagnosis Using Wavelet Transform as Preprocessor[J].IEEE Trans on CAS-2,2000,47(2):151-156.
[15]Michal T,Stanislaw H,Marek K.An Algorithm for Soft-Fault Diagnosis of Linear and Nonlinear Circuits[J].IEEE Trans on CAS-1,2002,49(11):1648-1653.
[16]Grzechca D,Rutkowski J.New Concept to Analog Fault Diagnosis by Creating Two Fuzzy-Neural Dictionaries Test[J].IEEE Melecon,2004:115-118.
[17]Das S R.Getting errors to catch themselves—Self-testing of VLSI circuits with built-in hardware[J].IEEE Trans.on Instrum.Meas.,2005,54(3):941-955.
[18]Sunil R D,Jila Z,Satyendra B etc.Testing Analog and Mixed-Signal Circuits With Built-In Hardware—A New Approach[J].IEEE Trans on Instrumentation and Measurement,2007,56(3):840-855.
[19]Hocchwald W,Bastian J O.A DC Approach for Analog Fault Dictionary Determination[J].IEEE Trans on CAS,1979,26:523-529.
[20]Lin P M,Elcherif Y S.DC Fault Diagnosis using Complementary pivot Theory [J].Proc.IEEE Int.Symp.Circuits and System,1982:146-149.
[21]Lin P M,Elcherif Y S.Analog Circuits Fault Dictionary—New Approaches and Implementation[J].Int.J.of Circuit Theory and Appl.,1985,13:149-172.
[22]Rapisarda L,Decarlo R A.Analog Multifrequency Fault Diagnosis[J].IEEE Trans on CAS,1983,30(4):223-234.
[23]Huang Z F,Lin C S,Liu R W.Node-Fault Diagnosis and a Design of Testability[J].IEEE Trans on CAS,1983,30(5):257-265.
[24]Guo Z,Savir J.Coefficient-Based Test of Parametric Faults in Analog Circuits[J].IEEE Trans on Instrumentation and Measurement,2006,55(1):150-157.
[25]Wu C C,Nakajima K etc.Analog Fault Diagnosis with Failure Bounds[J].IEEE Trans.on Circuits and System,1982,29(5):227-284.
[26]Togawa Y,Matsumoto T,Arai H.Linear Algorithm for Branch Fault Diagnosis of Analog circuits:T_F Equivalence-Class Approach[J].IEEE Trans.on Circuits System,1986,33(10):992-1009.
[27]杨士元.一种新的模拟电路K故障诊断方法[J].清华大学学报,1992,32(1):83-92.
[28]Rapisarda L,Decarlo R.Analog Multifrequency Fault Diagnosis[J].IEEE Trans.on CAS,1983,30:223-234.
[29]赵国南,郭裕顺.组件连接模型多频法模拟电路故障诊断[J].杭州电子工业学院学报,1985:59-74.
[30]郭裕顺,赵国南.元件参数识别及模拟电路故障诊断[J].电子学报,1986,12(1).
[31]邱关源.电路[M].北京:高等教育出版社,1999.
[32]徐士良.计算机常用算法[M].北京:清华大学出版社,1995.
[33]John H M,Kurtis D F.数值方法(MATLAB版)[M].北京:电子工业出版社,2002.
[34]夏承铨.非线性电路[M].北京:人民邮电出版社,1986.
[2]杨士元.模拟系统的故障诊断与可靠性设计[M].北京:清华大学出版社,1993.
[3]杨士元.数字系统的故障诊断与可靠性设计[M].北京:清华大学出版社,2000.
[4]John W B,Aly E S.Fault Diagnosis of Analog Circuits[J].Proceedings of the IEEE,1985,73(8):1279-1325.
[5]Li F,Woo P Y.The Invariance of Node-Voltage Sensitivity Sequence and Its Application in a Unified Detection Dictionary Method[J].IEEE Trans on CAS-1,1999,46(10):1222-1227.
[6]Li F,Woo P Y.Fault Detection Method for the Subcircuits of a Cascade Linear Circuit[J].IEEE Trans on CAS-1,2000,47(8):1254-1258.
[7]Li F,Woo P Y.Fault Detection for Linear Analog IC-The Method of Short-Circuit Admittance Parameters[J].IEEE Trans on CAS-1,2002,49(1):105-108.
[8]Bandler J W,Salama A E.Fault Diagnosis of Analog Circuits[J].Proceeding of the IEEE,1985,73(8):1279-1325.
[9]Yunqing C.Experiment on Fault Location in Large-Scale Analog Circuits [J].IEEE Trans on Instrumentation and Measurement,1993,42(1):30-34.
[10]Robert S,Shambhu U.Linear Circuit Fault Diagnosis Using Neuromorphic Analyzers[J].IEEE Trans on CAS-2,1997,44(3):188-196.
[11]Sam D H,Seongwon K,Mani S,Jinyan Z.Automatic Analog Test Signal Generation Using Multifrequency Analysis[J].IEEE Trans on CAS-2,1999,46(5):565-576.
[12]Erika F C,Marcelo N,Luigi C,Marcelo L.A New Adaptive Analog Test and Diagnosis System[J].IEEE Trans on Instrumentation and Measurement,2000,49(2):223-227.
[13]Matthew W,Mike W T W.Non-linear analog circuit fault diagnosis with large change sensitivity[J].International Journal of Circuit Theory and Application,2000,28:281-303.
[14]Mahran A,Farzan A.Neural-Network Based Analog-Circuit Fault Diagnosis Using Wavelet Transform as Preprocessor[J].IEEE Trans on CAS-2,2000,47(2):151-156.
[15]Michal T,Stanislaw H,Marek K.An Algorithm for Soft-Fault Diagnosis of Linear and Nonlinear Circuits[J].IEEE Trans on CAS-1,2002,49(11):1648-1653.
[16]Grzechca D,Rutkowski J.New Concept to Analog Fault Diagnosis by Creating Two Fuzzy-Neural Dictionaries Test[J].IEEE Melecon,2004:115-118.
[17]Das S R.Getting errors to catch themselves—Self-testing of VLSI circuits with built-in hardware[J].IEEE Trans.on Instrum.Meas.,2005,54(3):941-955.
[18]Sunil R D,Jila Z,Satyendra B etc.Testing Analog and Mixed-Signal Circuits With Built-In Hardware—A New Approach[J].IEEE Trans on Instrumentation and Measurement,2007,56(3):840-855.
[19]Hocchwald W,Bastian J O.A DC Approach for Analog Fault Dictionary Determination[J].IEEE Trans on CAS,1979,26:523-529.
[20]Lin P M,Elcherif Y S.DC Fault Diagnosis using Complementary pivot Theory [J].Proc.IEEE Int.Symp.Circuits and System,1982:146-149.
[21]Lin P M,Elcherif Y S.Analog Circuits Fault Dictionary—New Approaches and Implementation[J].Int.J.of Circuit Theory and Appl.,1985,13:149-172.
[22]Rapisarda L,Decarlo R A.Analog Multifrequency Fault Diagnosis[J].IEEE Trans on CAS,1983,30(4):223-234.
[23]Huang Z F,Lin C S,Liu R W.Node-Fault Diagnosis and a Design of Testability[J].IEEE Trans on CAS,1983,30(5):257-265.
[24]Guo Z,Savir J.Coefficient-Based Test of Parametric Faults in Analog Circuits[J].IEEE Trans on Instrumentation and Measurement,2006,55(1):150-157.
[25]Wu C C,Nakajima K etc.Analog Fault Diagnosis with Failure Bounds[J].IEEE Trans.on Circuits and System,1982,29(5):227-284.
[26]Togawa Y,Matsumoto T,Arai H.Linear Algorithm for Branch Fault Diagnosis of Analog circuits:T_F Equivalence-Class Approach[J].IEEE Trans.on Circuits System,1986,33(10):992-1009.
[27]杨士元.一种新的模拟电路K故障诊断方法[J].清华大学学报,1992,32(1):83-92.
[28]Rapisarda L,Decarlo R.Analog Multifrequency Fault Diagnosis[J].IEEE Trans.on CAS,1983,30:223-234.
[29]赵国南,郭裕顺.组件连接模型多频法模拟电路故障诊断[J].杭州电子工业学院学报,1985:59-74.
[30]郭裕顺,赵国南.元件参数识别及模拟电路故障诊断[J].电子学报,1986,12(1).
[31]邱关源.电路[M].北京:高等教育出版社,1999.
[32]徐士良.计算机常用算法[M].北京:清华大学出版社,1995.
[33]John H M,Kurtis D F.数值方法(MATLAB版)[M].北京:电子工业出版社,2002.
[34]夏承铨.非线性电路[M].北京:人民邮电出版社,1986.