氧化钒薄膜结构和性能研究
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摘要
二氧化钒(VO_2)是一种具有热致相变特性的金属氧化物,随着温度降低,大约在68℃附近,发生从金属到非金属(或半导体)的性质突变。由于相变温度接近室温,且相变前后光、电性能变化幅度较大,VO_2在很多领域具有重要的应用价值。
     近年来,薄膜VO_2材料的研究有了飞速的发展,特别是在应用方面,已成功应用于太阳能控制的智能窗、激光防护的保护膜和制造红外成像的非制冷红外焦平面阵列等。
     本论文研究了采用两种工艺方法制备VO_2薄膜:一种是在常温下利用脉冲磁控反应溅射沉积了高价态的氧化钒前驱薄膜,再通过真空热处理制备了VO_2薄膜;另一种是用射频磁控反应溅射沉积直接沉积VO_2薄膜。对氧化钒薄膜从物理化学性质、结构特征、热致相变特性、抗激光能力等方面进行了比较系统深入的研究。所开展的主要研究工作和所得到的研究结果有:
     (1)采用脉冲磁控溅射方法在常温下制备出V_2O_5薄膜,然后在真空中热处理还原制备出VO_2薄膜。实验研究和分析表明,要得到高质量的VO_2薄膜,溅射制备时的反应气体分压,真空退火处理时的退火温度与退火时间,以及退火的气氛种类等是影响VO_2薄膜结构和成分以及相变特性的关键工艺参数。
     (2)用X射线衍射、X射线光电子能谱、原子力显微镜等手段对脉冲磁控溅射结合真空退火制备的氧化钒薄膜的组分、晶相、表面形貌进行了分析,测试了薄膜的相变特性、光学和电学特性及其变化规律。分析表明,薄膜中氧化钒的价态主要是混合价态,多种相共存。结构为多晶,没有明显的取向生长。通过优化制备过程中的工艺参数,在衬底温度为500℃左右,氧分压约为8%时,获得了能够满足使用要求的VO_2敏感薄膜。在红外波段波数为2000 cm~(-1)处,光透过率从低温态的到高温态变化了35%,电阻变化最大达到3个数量级。
     (3)用射频磁控反应溅射方法沉积了VO_2红外敏感薄膜。研究了薄膜的沉积速率、电阻率变化、光学透过率变化和相结构变化规律。实验发现,在480℃的衬底温度下,当反应气体流量比O_2/Ar+O_2低于5%时,薄膜中的主要成分为金属钒;流量比处于6%~7.7%之间时主要为V_2O_3、V_2O_3+VO_2和低价氧化物;在7.8~8.5%时可以得到以VO_2为主要相的薄膜;处于9%~10%之间主要为混合相;大于10%主要为V_2O_5相。在反应气体流量比为
Vanadium dioxide is a kind of metallic compound which undergoes a metal-semiconductor phase transition near 68℃. The phase transition is accompanied by significant changes in optical and electrical properties. For the characteristics that its phase transition temperature is near to room temperature and its optical and electrical performance have changed much during phase transition, VO_2 has a great number of potential applications.Many studies have been conducted extensively during the past decades, especially in the films application and preparation process. This material has been taken in use as smart window for controlling solar radiation, protection film for laser shield and infra-red sensitive material in uncooled infra-red focal plane array (UFPA). Some preparation methods, such as organic sol-gel method, pulse laser deposition (PLD) and MOCVD have prepared high capability VO_2 films.The magnetron sputtering method was used in our research for preparation of VO_2 films. Research work has been done as follows in detail:(1) V_2O_5 films was deposited in room temperature substrate, then V_2O_5 films was changed into VO_2 films through heat-treatment. VO_2 films was received by accurate control of the vacuum pressure, heating-treatment temperature, time and gas.(2) How main process parameter of preparation partial pressure of reacting gas (oxygen), substrate temperature and sputtering power influence the properties of the films. And then found the proper experimental condition.(3) Vanadium dioxide(VO_2) thin films were grown onto quartz glass and silicon substrates by two deposition technique. X-ray diffraction, X-ray photoelectron spectroscopy are used to analyze the composition, phase structure, crystalline and valence state of the film. Atomic force spectroscopy is used to identify the film surface morphology. The variation of transmission of films from low temperature to high temperature were also measured. These investigation revealed that films have high purity and good crystallite.(4) Vanadium dioxide(VO_2) thin films by reactive sputtering deposited were endured attacking from infra laser.
引文
[1]廖世明,柏谈论,国外钒冶金,冶金工业出版社,1985。
    [2]罗裕基,无机化学丛书 第八卷 钒分族[M].科学出版社.1998,9 第一版:224-233.
    [3]F.J.Morin. Oxides which show a metal-to-insulator tranaition at the neel temperature.Physical Review letters. Vol 3,1959,34-36
    [4]尹大川,许念坎,郑修麟.二氧化钒薄膜的性质及应用前景.功能材料,1995,26(增),400~402
    [5]单凡,黄祥成。二氧化钒薄膜的光学特性及应用前景。中国光学学会95年全国薄膜技术学术研讨会论文集。湖南省张家界,1995年10月,第141页。
    [6]A.Zylbersztejn,N.F.Mott. Metal-insulator transition in vanadium dioxide. Physical review B,1975,4383-4395
    [7]Elizabeth E.Chain. Optical properties of vanadium dioxide and vanadium pentoxide thin films. Appl.Optics, 30(19) (1991):2782-2785,.
    [8]A. Haras, M. Witko, D. R. Salahub, K. Hermann, R. Tokarz. Electronic properties of the VO2(011) surface: density functional cluster calculations[J]. Surface Science,491(2001),77-87
    [9]Mark A. Richardson, John A. Coath. Infrared optical modulators for missile testing [J]. Optics & Laser Technology,30(1998), 137-140
    [10]K.Kosuga. The phase diagram and phase transition of the V_2O_3-V_2O_5 system.J.Phys.Chem. S olids,28,(1967), 1613.
    [11]陈长琦,朱武,干蜀毅等.二氧化钒薄膜制备及其相变机理研究分析[J].真空科学与技术21(6)2001,:452-455
    [12徐时清,赵康,谷臣清等.掺杂VO_2相变薄膜的电阻突变特性研究[J].硅酸盐学报,第30卷,第5期,2002年,637-640
    [13]潘梅,陆卫,氧化钒热致变色薄膜的研究进展。激光与红外,第32卷6期,2002年,375—377。
    [14]A. Zylbersztejn, N.F.Mott. Metal-insulator transition in vanadium dioxide. Phys. Rev. B,11(11) 1975,: 4383~4394
    [15]Glen A, Nyberg and R. Buhrman. Preparation and optical properties of reactively evaporated VO_2 thin films. J. Vac. Technol, A2(2):1984, 301~302
    [16]Do Hong Thanh, Pham Duy Long. Structural formation and Raman scattering spectrum of vanadium oxide thin films made by electron beam deposition[J].Communications in Physics, Vol. 8, No. 3 (1998), 152-158
    [17]Frederic Guinneton, Jean-Christophe Valmalette, Jean-Raymond Gavarri. Nanocrystalline vanadium dioxide: synthesis and mid-infrared properties [J]. Optical Materials, 15 (2000) 111-114
    [18]陈长琦,方应翠,朱武等.二氧化钒相变分析及应用[J].2001年第6期,真空,9-13
    [19]S.M.BULANAM,T.S.ERIKS SON, G..A.NIKLAS SON and C.G..GRANQVIST. Thermochromic VO_2 films for energy-efficent windows. Solar Energy Material 16(1987)347-363
    [20]G.V.Jorgenson, J.C.Lee. Doped vanadium oxide for optical switching films. Solar Energy Materials, 14(1986): 205~214
    [21]Michael F. Becker, A. Bruce Buckman, Rodger M. walser. Femtosecond laser excitation of the semiconductor-metal phase transition in VO_2. Appl. Phys. Lett. 65 (12): 1994, 1507-1512.
    [22]Glen A, Nyberg and R. Buhrman. High optical contrast in VO_2 thin film due to improved stoichiometry. Thin Solid Films, 147,1987:111~116
    [23]Robert J. Herring, Philip E. Howard. Design and performance of the ULTRA 320x240 uncooled focal plane array and sensor[J]. Proc. SPIE, 2746:1996, 3-10.
    [24]Bill Meyer, Robert Cannata, Arthur Stout, et al. Amber's Un—cooled Microbolometer LWIR Camera[J]. Proc. SPIE, 2746 : 1996, 13~22
    [25]Charls Marshall, Neal Butler, Richard Blackwell, et,al. Uncooled Infrared sensor With Digital Focal Plane Arry[J]. Proc. SPIE, 2746 1996,:25-32.
    [26]Hubert Jerominek, Francis Picaaard, Nicholas R.Swaart, et, al. Micromchined, uncooled,VO2-based, IR bolometer arrays [J], Proc. SPIE, 2746:1996, 61-69.
    [27]陈长虹,易新建,熊笔锋.基于VO_2薄膜非制冷红外探测器光电响应研究[J].物理学报,50(3):2001,451.
    [28]W.Burkhardt, T.Christmann, B.K.Meyer, "W-and F-doped VO_2 films studied by photoelectron spectrometry" [J],Thin Solid Films 345(1999) 230~235.
    [29]P.Jin, S. Nakao, S.Tanemura, "Tungsten doping into vanadium dioxide thermochromic films by high-energy ion implantation and thermal annealing" [JJ, Thin Solid Films 324(1998) 151~158
    [30] Masato Tazawa, Ping ]in, Takeshi Miki, Kazuki Yoshimura, Kazuo Igrashi, Sakae Tanemura "IR properties of SiO deposited on V_(1-x)W_xO_2 ermochromic films by vacuum evaporation." [J], Thin Solid Films 375(2000) 100-103.
    [31] C.Tang, P.Gorgopoulos, M.E.Fine, and J.B.Cohen "Local atomic and electronic arrangements in W_xV_(1-x)O_2" [J], Physical Review B, January. 15, 1985, 1002~1006.
    [32] T.Richardson, K.von Rottkay, "Tungsten-vanadium oxide sputtered films for electrochromic device" Thin Solid Films 330(1999)164~168
    [33] M.A.Sobhan , R.T.Kivaisi "Reactively Sputtered Thermochromic Tungsten Doped VO_2 Films ." [J], Spie Vol 2255/423.
    [34] P.Jin,S. Nakao, S.Tanemura, "Tungsten doping into vanadium dioxide thermochromic films by high-energy ion implantation and thermal annealing" [J], Thin Solid Films 324(1998) 151~158
    [35] A.M Andersson, CG Granqvist and JR Stevens. Electrochromic Li x WO_3/polymer laminate/ Li_yV_2O_5 device:toward an all-solid-state smart windows[J]. Appl. Opt., 1989, 28(15): 3295~3302
    [36] 汪志诚.热力学·统计物理(第二版)[M].高等教育出版社.1993
    [37] 周玉.陶瓷材料学[M].哈尔滨工业大学出版社.1995
    [38] E.Kusano, J.A.Theil, and John A.Thornton. Deposition of vanadium oxide films by direct-current magnetron reactive sputtering. J.Vac.Sci.Technol.A6(3), 1988,pp 1663-1667.
    [39] H.J. Schlag , W. Scherber. New sputter process for VO_2 thin films and examination with MIS elements and C-V-measurements[]]Thin Solid Films,366 (2000) 28-31
    [40] R. T. Kivaisi, M. samiji. Optical and electrical properties of vanadium dioxide films prepared under optimized RF sputtering conditions [J].Solar Energy Materials & Solar Cell,57(1999),141-152
    [41] 崔敬忠,达道安,姜万顺.磁控溅射制备VO_2热致变色薄膜的研究[J].真空与低温,1997年,第3期,128-131
    [42] Yuzo SHIGESATO, Mikikiko ENOMOTO and Hidehumi ODAKA. Thermochromic VO_2 Films Deposited by RF Magnetron Sputtering Using V_2O_3 or V_2O_5 Targets. Jpn.J.Appl.Phys. Vol. 39(2000). 6016-6024.
    [43] Yong Joon Park, Nam-Gyu Park, Kwang Sun Ryu, Soon Ho Chang. RF-Sputtered Vanadium oxide thin films;Effect of oxygen Partial pressure on structural and electronchemical properties.Bull.Korean Chem. Soc.2001 ,vol.22,NO.9,1015-1018
    [44] A.Razavi,T.Hughes,J.Antinovitch,and J.Hoffman. Temperature effects on structure and optical properties of radio-frequency sputtered VO_2. J.Vac.Sci.Technol.A7(3), 1989,1310-1313
    [45] F.C.Case. Influence of ion beam parameters on the electrical and optical properties of ion-assisted reactively evaporated vanadium dioxide thin films.J.Vac. S ci.Technol.A5 (4), 1987,1762-1766
    [46] D.P.Partlow, S.R.Gurkovich,K.C.Radford,and L.J.Denes. Switchable vanadium oxide films by a sol-gel process. J.Appl.Phys. 70(1), 1991,443-452
    [47] Yuan Ningyi, Li Jinhua, Lin chenglu. Valence reduction process from sol-gel V_2O_5 to VO_2 thin films. Applied Surface Science 191 (2002) 176-180
    [48] Nilgun Ozer . Electrochemical properties of sol-gel deposited vanadium pentoxide films. Thin Solid Films 305(1997)80-87.
    [49] 尹大川.无机溶胶凝胶技术制备二氧化钒薄膜的研究[D].西北工业大学博士学位论文,1996
    [50] 魏劲松.V_2O_5的还原机理与VO_2薄膜制备技术[D].西安理工大学硕士学位论文,2001.
    [51] Gaoling zhao, Hiromitsu Kozuka,Hong lin, Toshinobu Yoko,Sol-gel preparation of Ti_(1-x)V_xO_2 solid solution film electrodes with conspicuous photoreponse in the visible region. Thin solid films 339(1999)123-128
    [52] H.Biaslas, A. Dillenz. Epitaxial relationships and electrical properties of oxide films on r-cut sapphire[J].Thin solid films. Vol.3381999.60-63
    [53] D.H. Kim and H. S. Kwok Pulsed laser deposition of VO_2 thin films Appl.Phys.lett.65(25),3188~3190
    [54] H. Zhang, H. L. M. Chang, J. Guo, T. J. Zhang. Microstructure ofepitaxial VO_2 thin films deposited on (1120) sapphire by MOCVD[J]. Journal of Materials Research, Vol. 9, No. 9(1994), 2264-2268
    [55] M. Nagashima, H. Wada.The oxygen deficiency effect of VO_2 thin films prepared by laser ablation[J]. Journal of Materials Research, Vol. 12, No.2, (1996),416-419.
    [56] Elizabeth E.Chain. Optical Properties of Vanadium Dioxide and Vanadium Pentoxide Thin Films. Applied Optics, Vol.30,No.l9,1991,.2782-2785.
    [57] H.Miyazaki,F.Utsuno,Y.Shigesato,I.Yasui The structureal characteristics of VOx films prepared by He-introduced reactive RF unbalanced magnetron sputtering Thin Solid Films281 -282(1996)436-440
    [58] Songwei Lu,Lisong Hou,Fuxi Gan Surface analysis and phase transition of gel-derived VO2 thin films. Thin Solid Films 353(1999)40-44
    [59] Guo Jia Fang ,Z.L.Liu,Yu Wang,and Y.H.Liu . Synthesis and structural,electronchromic characterization of pulsed laser deposited vanadium oxide thin films J.Vac.Sci.Technol.A19(3),2001,887-892.
    [60] YASUTAKA TAKAHASHI.MASAAKI KANAMORI. Prepration of VO2 Films by organometallic chemical vapour deposition and dip-coating Journal of materials science 24(1989)192-198.
    [61] Ioana C.Grigorescu, J.Ramirez,F.Salcedo,C.Weil. Tribological behaviour of vanadium oxicarbide coatings. Surface and Coating Technology 94-95(1997)437-440.
    [62] CHARLES B.GREENBERG. Undoped and doped VO2 films grown from VO(OC3H7)3 .Thin Solid Films, 110(1983)73-82.
    [63] YASUTAKA TAKAHASHI, MASAAKI KANAMORI. Preparation of VO2 films by organometallic chemical vapour deposition and dip-coating. Journal of materials science24(1989)192-198
    [64] Hirotoshi Nagata, Tadashi Tsukahara, Mamoru Yoshimoto and Hideomi Koinuma. Laser molecular beam epitaxy of single-crystal SrVO_(3-x) films. Thin Solid films.208(1992)264-268
    [65] F.C.Case. Influence of ion beam parameters on the electrical and optical properties of ion-assisted reactively evaporated vanadium dioxide thin films. J.Vac.Sci.Technol.A5(4),1987,1762-1766
    [66] K.D.RogersJ.A.Coath, and M.C.Lovell Characterization of epitaxially grown films of vanadium oxides . J.Appl.Phys.70(3),1991,1412-1415
    [67] Carolyn Rubin Aita and Mei lee kao. Low-temperature oxidation of nonstoichiometric sputter deposited vanadium pentoxide. J.Vac.Sci.Technol A5(4). 1987,2714-2717.
    [68]M.Benmoussa, A. Outzourhit, A.Bennouna, E.L.Ameziane. Electronchromism in sputtered V2O5 thin films: structural and optical studies. Thin Solid Films 405(2002)11-16.
    [69] Maria Losurdo, Davide Barreca, Giovanni Bruno, Eugenio Tondello. Spectroscopic ellipsometry investigation of V_2O_5 noncrystalline thin films. Thin Solid Films 384(2001)58-64.
    [70] A.D.Sayede, C.Mathieu,B.Khelifa,H.Aourag. Structural relationship between V_2O_5(001) surface and the bulk: cluster bulk termination models. Material Chemistry and Physics 81(2003)183-190.
    [71] Han-Kim, Tae-Yeon Seong. Structural study of amorphous vanadium oxide films for thin film microbattery. J.Vac. Sci.Technol.B 21 (2),2003,754-759
    [72] C.R.Aita.Phase formation in sputtering deposited metal(V, Nb,Zr, Y)oxides: Relationship to metal,metal-oxygen,and oxygen flux. J Vac Sci Technol, 11 (4)1540,(1993)
    [73] G.chiarello,D.Robba,G.D.Michele,et. An X-ray photoelectron spectroscopy study of the vanadia-titania catalysts. Appl Surf Sci,64:(1993)91,.
    [74] C.H Griffiths,H.K.Eastwood. Influence of stoichiometry on the metal-semiconductor transition in vanadium dioxide. J.Appl.Phys.45(5) (1974):2201,
    [75] L.Michailovits,I.Hevesi,L.Phan,and Zs.Varga. Thin Solid Films, 102,(1983),71
    [76] V.S.Pankajashau,K.Neelakanden,and C.S.Menon. Thin Solid Films,215,(1992),196.
    [77] Yong Joon Park, Nam-Gyu Park, Kwang Sun Ryu, Soon Ho Chang. RF-Sputtered Vanadium oxide thin films;Effect of oxygen Partial pressure on structural and electronchemical properties. Bull.Korean Chem. Soc.2001 ,vol.22,NO. 9,1015-1018
    [78] 茹国平,曹永峰等,微测辐射热计用氧化钒薄膜制备及特性,微细加工技术,第4期,2002年,45—53
    [79] 卢勇,林理彬,廖志君,相变光透射特性具有窗口结构的VO_2薄膜,功能材料,33(1),107—109。
    [80] 卢勇,林理彬,廖志君,制备过程对VO_2薄膜热致相变光电性能的控制。激光杂志,第21卷5期,2000,19—21。
    [81] 卢勇,林理彬,真空还原制备的VO_2热致相变薄膜Raman光谱和红外光谱研究,功能材料,32(6),2001,657—659。
    [82] 卢勇,林理彬,1.7Mev电子束在VO_2热致相变薄膜中引起的结构和光电性能的变化,功能材料,32(5),2001,525—527。
    [83] 卢勇,林理彬,VO_2薄膜γ辐照过程的变价和退火现象,功能材料,33(1),2002,73—75。
    [84] 袁宁一,李金华,林成鲁。氧化钒薄膜的结构、性能及制备技术的相关性。功能材料,32(6),2001,572—575。
    [85] Han-Kim, Tae-Yeon Seong, Young Soo Yoon. Structural study of amorphous vanadium oxide films for thin film microbattery. J.Vac.Sci.Technol.B21 (2), 2003,754-758
    [86] Do Hong Thanh, Pham Duy Long, Vu Thi Bich and Nguyen Nang Dinh. Structural formation and raman scattering spectrum of vanadium oxide thin films made by electron beam deposition. Communication in Physics, vol.8,No,3(1998),152-158
    [87] X.J.Wang, H.D.Li, Y.J,Fei,et. XRD and Raman study of vanadium oxide thin films deposited on fused silica substrates by RF magnetron sputtering. Applied Surface Science 177(2001)8-14.
    [88] Jingzhong Cui,Daoan Da, Wanshun Jiang. Structure characterization of vanadium oxide thin films prepared by magnetron sputtering methods. Applied Surface Science133(1998)225-229
    [89] Ikuya TAKAHASHI, Mitsuhiro HIBINO and Tetsuichi KUDO. Thermochromic Properties of Double-Doped VO_2 Thin films prepared by a wet coating method using polyvanadate-Based Sols Containing W and Mo or W and Ti. Jpn.J.Appl.Phys.Vol40(2001)1391-1395.
    [90] Xujin Wang, Jinjie Xu,Yunjie FEI.et,Preparation of Thermochromic VO_2 Thin films On Fused Silica and Soda-Lime Glass by RF Magnetron Sputtering. Jpn.J.Appl.Phys.Vol 41 (2002)312-313.
    [91] U.Krause, M.List, H.Fuchs. Requirement of power supply parameters for high-power pulsed magnetron sputtering. Thin Solid Films 392(2001) 196-200.
    [92] Francine C.Case. Effects of low-energy low -flux ion bombardment on the properties of VO2 thin films, J.Vac.Sci.Technol.A7(3), 1989,1194-1198.
    [93] 李金华,袁宁一,林成鲁,用离子束增强沉积从V_2O_5粉末制备高热电阻温度系数VO_2薄膜,物理学报,第51卷8期,2002,1788—1792。
    [94] 周进,茹国平,氧化钒热敏薄膜的制备及其性质的研究,红外与毫米波学报,第20卷第4期,2001,291—295。
    [95] Carolyn Rubin. Phase formation in sputter deposited metal(V, Nb,Zr, Y) oxides: Relationship to metal, metal-oxygen, and oxygen flux. J.Vac.Sci.Technol.A 11 (4), 1993,1540-1547.
    [96] DAVLD ADLER. Mechanisms for Metal-Nonmetal Transitions in Transition-Metal Oxide and Sulfides. Reviews of modern physics, volume 40,no4,1968.714-726.
    [97] D.D.Eden. Some application involving the semiconductor-to-metal phase transition in VO2. SPIE vol 185,optical Processing Systems, 1979,97-102
    [98] V.Keppens.D.Mandrus, and L.A.Boatner. Chemical and Sonochemical Approaches to the Formation of VO2 and VO2-Impregnated Materials. Materials Research Society Fall Metting Boston,MA,Dec. 1-5,1997
    [99] Yuzo SHIGESATO, Mikiko ENOMOTO and Hidehumi ODAKA. Thermochromic VO2 Films Deposited by RF Magnetron Sputtering Using V2O3 or V2O5 Targets. Jpn.J.Appl.Phys. vol39(2000)6016-6024
    [100] F.Guinneton, L.Sauques,J.C.Valmalette,F.Cros,J.R.Gavarri. Comparative study between nanocrystalline powder and thin film of vanadium dioxide VO2: electrical and infrared properties. Journal of Physics and Chemistry of solids 62(2001)1229-1238.
    [101] B.Felde, W.Niessner,D.Schalch,A.Scharmann, M.Werling. Plasmon excitation in vanadium dioxide films. Thin Solid Films305(1997)61-65.
    [102] Mark Borek, F.Qian, V.Nagabushnam, and R.K.Singh. Pulsed laser deposition of oriented VO2 thin films on R-cut sappire. Appl.Phys.lett.63(24) 1993,3288-3290.
    [103] Michael F.Becker, A.Bruce Buckman, and Rodger M.Walser .Femtosecond laser excitation of the semiconductor-metal phase transition in VO2. Appl.Phys.lett.65(12)1994,pp1507-1509.
    [104] Eiji Kusano and Jeremy A.Theil. Effects of microstructure and nonstoichiometry on electrical properties of vanadium dioxide films. J.Vac.Sci.Technol A7(3), 1989,1314-1317.
    [105] G.A.Rozgonyi and D.H.Hensler. Structural and Electrical Properties of Vanadium Dioxide Thin Films. The journal of vacuum science and technology, vol 5,no 6 ,194-199
    [106] C.H.Griffith, H.K.Eastwood. Influence of stoichiometry on the metal-semiconductor transition in vanadium dioxide. Journal of Applied Physics, vol 45,No 5,1974,2201-2206.
    [107] J.F.De Natale, P.J.Hood, and A.B.Harker. Formation and characterization of grain-oriented VO2 thin films. J.Appl.Phys.66(12),1989,5844-5850.
    [108] Elizabeth E.Chain. Optical properties of vanadium dioxide and vanadium pentoxide thin films. Applied optics, vol 30,No.l9,1991,pp2782-2787.
    [109] K.L.Lewis. Deposition and characterisation of sputtered vanadium dioxide films. SPIE,vol 1270 Optical Thin films and Application, 1990,222-234.
    [110] M.Nagashima and H.Wada. Real-time observation of VO2 thin films in phase transition by laser scanning microscopy. J.vac.Sci.Technol.A16(1), 1998,pp45-49.
    [111] A.I.Sidorov. Switching dynamics of VO_2 mirrors in a laser with a conjugate cavity. J.Opt.Technol 65(1), 1998,21-24.
    [112] S.D.Hansen and C.R.Aita. Low temperature reactive sputter deposition of vanadium oxide. J.Vac.Sci.Technol A3 (3). 1985,660-663.
    [113] Yong-Hee Han,In-Hoon Choi,Ho-Kwan Kang, Jong-Yeon Park, Sung Moon. Fabrication of vanadium oxide thin film with high-temperature coefficient of resistance using V_2O_5/V/V_2O_5 multi-layers for uncooled microbolometers. Thin Solid Films 425(2003)260-264.
    [114] M.Najbar, A.Gora, A.Bialas,A.Weselucha-Birczynska. Low-temperature reactivity of the surface species of vanadia-tungsta catalyst. Solid state Ionics 141-142(2001)499-506.
    [115] C.V.Ramana, O.M.Hussain, R.Pinto,C.M.Julien. Microstructural features of pulsed-laser deposited V_2O_5 thin films. Applied Surface Science 207(2003) 135-138.
    [116] See-Hee Lee, Hyeonsik M.Cheong. Microstucture study of amorphous vanadium oxide thin films using raman spectroscopy. Journal of applied physics.vol 92,2002,1893-1897.
    [117] Yashitaka FUJITA, katsuhiro MIYAZAKI and Chiei TATSUYAMA. On the Electrochromism of Evaporated V_2O_5 films. Japanese. Joural of Applied Physics. Vol.24.No. 8.1985,pp 1082-1086.
    [118] A.M.Abo EI Sound, B.Mansour and L.I.Soliman. Optical and electrical properties of V205 thin films. Thin Solid films.247(1994)140-143.
    [119] Carolyn Rubin Aita, Ying-Li liu, Mei lee Kao, and Steven D.Hansen. Optical behavior of sputter-deposited vanadium pentoxide. J.Appl.Phys.60(2), 1986,749-753.
    [120] Stuart F. Cogan, Nguyet M. Nguyen, Stephen J. Perrotti, and R.David Rauh. Optical properties of electrochromic vanadium pentoxide. J.Appl.Phys.66(3). 1989,1333-1337.
    [121] M.Benmoussa,E.Ibnouelghazi,A.Bennouna,E.LAmeziane. Structural,electrical and optical properties of sputtered vanadium pentoxide thin films. Thin Solid films 265(1995)22-28.
    [122] C.V.Ramana, O.M.Hussain, B.Srinivasulu Naidu,P.J.Reddy. Spectroscopic characterization of electron-beam evaporated V_2O_5 thin films. Thin Solid films 305(1997)219-226.
    [123] 查子忠,王军。VO_2薄膜对TEACO_2激光响应特性的实验研究。光学学报,(ACTAOPTICA SINICA)第16卷,1996,1173—1176
    [124] 张赛金。光学和光电装置的激光防护。现代防御技术。1995年,第6期,P26。
    [125] F.R.Stonesifer, P.W.Randles and J.A.Nemes. Assessment of Single-Pulse Laser Damage to Structure Material for Spacecraft.AD-A259387,1992
    [126] S.V.Garnov, S.M.Klimentov, A.A. Said and M.J.Soileau. Laser Damage of HR,AR-coatings,Monolayers and Bare surface at 1064nm. NASA-CR-192156
    [127] KentJ.Kogler. Laser Damage in Thin Film optical Coating.AD-A259425
    [128] Laser Induced Damage in Optical Material. Fifteenth ASTM Symposium, 1983.
    [129] Laser Induced Damage in Optical Material. eighteenth ASTM Symposium, 1986.
    [130] 胡建平,李伟。氧化物薄膜抗1064nm脉冲激光损伤的特性研究。光学学报,第20卷,2000,262—266
    [131] 钟海荣,刘天华,陆启生等,激光对光电探测器的破坏机理研究综术。强激光与粒子束。第12卷,2000,423—428。
    [132] F.Bartoli,et al, Irreversible damage in IR detector materials,Appl.Opt. 1997,16:2934
    [133] Xiao-Wu Ni,et al, The thermal destruction mechanism of PIN-junction photoelectronic diode by laser, SPIE 1998,2551:301
    [134] F.Bartoli,et al, A generalize in thermal model for laser damage in infrared dectectors, J.Appl.Phys. 1976,47:2875
    [135] 陈德章,李林等,激光对光电探测器的损伤阈值研究 激光技术,第19卷3期,1995,135—139
    [136] 刘天华,陆启生,钟海荣等,光电探测器的激光破坏机理研究。激光杂志。第22卷6期,2001,5—8。
    [137] 许旻,邱家稳等。卫星激光防护技术。现代防御技术 vol.29,6 2001,43~46。
    [138] 许旻,邱家稳等。卫星光电遥感仪器激光防护总结报告。国防预研基金验收报告。2002年。

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