用于瞬态波前检测的四波横向剪切干涉系统
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  • 英文篇名:Four-Wave Lateral Shearing Interferometry System for Transient Wavefront Measurement
  • 作者:朱文华 ; 陈磊 ; 谷晨风 ; 郑东晖 ; 李金鹏 ; 曹慧
  • 英文作者:Zhu Wenhua;Chen Lei;Gu Chenfeng;Zheng Donghui;Li Jinpeng;Cao Hui;School of Electronic and Optical Engineering, Nanjing University of Science and Technology;
  • 关键词:测量 ; 四波横向剪切干涉 ; 瞬态波前检测 ; 棋盘光栅 ; 剪切量标定
  • 英文关键词:measurement;;four-wave lateral shear interferometry;;transient wavefront measurement;;chessboard grating;;calibration of shear
  • 中文刊名:JGDJ
  • 英文刊名:Laser & Optoelectronics Progress
  • 机构:南京理工大学电子工程与光电技术学院;
  • 出版日期:2015-12-10
  • 出版单位:激光与光电子学进展
  • 年:2015
  • 期:v.52;No.599
  • 基金:国家自然科学基金(U1231111)
  • 语种:中文;
  • 页:JGDJ201512016
  • 页数:7
  • CN:12
  • ISSN:31-1690/TN
  • 分类号:105-111
摘要
为检测瞬态波前的三维分布,提出了一种共光路结构的剪切干涉测试系统。该系统使用棋盘光栅与光阑,将待测波前分解为四支互相错位的波前,这些波前两两相干,最终叠加形成一幅高载频的干涉图。根据光强传输方程以及傅里叶光学理论,建立了剪切干涉测试系统的理论模型,采用傅里叶变换算法提取待测波前。提出了一种剪切量标定算法,通过讨论线性载频的影响因素与光栅的衍射效率,给出了棋盘光栅的具体设计参数。实验搭建了瞬态波前检测装置,实现了自动化高精度测量,波面检测结果的峰谷(PV)值、均方根(RMS)值以及Zernike拟合系数均与SID4波前探测器所测波面结果一致。因此采用该技术能够实现瞬态波前检测。
        In order to detect the three-dimensional distribution of transient wavefront, a shearing interferometric measurement system with common path configuration is proposed. The system uses a chessboard grating and aperture to divide the wavefront under test into four replicas with shear. Each two of the replicas are coherent to form an interferogram with high carrier frequency. According to the transport of intensity equation and Fourier optics, the theoretical model of shearing interferometric measurement system is established and the wavefront under test is reconstructed by Fourier transform algorithm. A calibration method of shear is proposed. The design of chessboard grating is given by discussing linear carrier frequency and diffraction efficiency of the grating. Experimentally the proposed system is applied to measure transient wavefront, and automatic measurement with high precision is achieved. Peak-to-valley(PV) value, root-mean-square(RMS) value and Zernike fitting coefficient of the measured result are in good agreement with those obtained by SID4 wavefront sensor. This system can be applied to transient wavefront measurement.
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