信号调制系统实现角位移测量(英文)
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  • 英文篇名:Development of capacitive sensor signal conditioning system for angular displacement measurement using timer IC LM555 and UFDC
  • 作者:Sumitesh ; Majumder ; T ; K ; Maiti
  • 英文作者:Sumitesh Majumder;T K Maiti;Dept.of Applied Electronics and Instrumentation Engineering, Netaji Subhash Engineering College;Dept.of Instrumentation Engineering, Central Institute of Technology Kokrajhar;
  • 关键词:变面积式电容传感器 ; 定时器电路 ; 传感器连接 ; 非稳态多谐振荡器 ; 通用频数转换器
  • 英文关键词:variable area type capacitive sensor;;timer circuit;;sensor interfacing;;astable multivibrator;;universal frequency to digital converter(UFDC)
  • 中文刊名:CSKX
  • 英文刊名:测试科学与仪器(英文版)
  • 机构:内达斯·苏巴斯工程学院应用电子与仪器工程系;科克拉贾尔中央理工学院仪器工程系;
  • 出版日期:2019-03-15
  • 出版单位:Journal of Measurement Science and Instrumentation
  • 年:2019
  • 期:v.10;No.37
  • 语种:英文;
  • 页:CSKX201901007
  • 页数:6
  • CN:01
  • ISSN:14-1357/TH
  • 分类号:53-58
摘要
采用基于定时器LM555的非稳态多谐振荡器和通用频数转换设计了一种变面积式电容传感器信号调制系统用于角位移测量。变面积式电容器连接在基于定时器的非稳态电路内,其角位移的变化引起电容的变化,进而引起定时器电路输出时间周期的变化。定时器电路输出波形的时间周期与电容呈线性关系,因而与角位移也是线性关系。定时器输出经通用频数转换器进一步处理后可用于测量。实验结果显示,时间周期与角位移在0-180°范围内呈线性关系,将不确定度与平均时间周期相关联,即为平均标准差,亦称为标准误差,其值为±0.023μs。该测量系统使用简单,可用于电子和工业仪器中。
        In this research paper, we have presented variable area type capacitive sensor signal conditioning system for angular displacement measurement and for this purpose we have used timer LM555 based astable multivibrator and universal frequency to digital converter(UFDC). Due to variation in angular displacement in the variable area type capacitor which is connected in the timer based astable circuit, capacitance changes which in turn changes the time period of the timer circuit output. The time period of the timer output waveform is linear with the capacitance and hence linear with angular displacement. The timer output is further processed with UFDC for the measurement. The experimental results show that the time period is linear with the angular displacement in the range of 0-180° and the uncertainty we should associate it with this average time period value is the standard deviation of the mean, often called the standard error(SE), which is ± 0.023 μs. Because of the simplicity, this measurement system can be used in both electronic and industrial instrumentation.
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