X射线平板探测器背板工艺研究进展
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  • 英文篇名:Research Progresses of Backplane Technology of X-Ray Flat Panel Detector
  • 作者:卜倩倩 ; 胡伟频 ; 王丹 ; 孙晓 ; 邱云 ; 姜明宵
  • 英文作者:BU Qianqian;HU Weipin;WANG Dan;SUN Xiao;QIU Yun;JIANG Mingxiao;BOE Technol. Group Co.,Ltd.;
  • 关键词:平板探测器 ; 背板工艺 ; 性能提升
  • 英文关键词:flat panel detector;;backplane technology;;performance improvement
  • 中文刊名:BDTG
  • 英文刊名:Semiconductor Optoelectronics
  • 机构:京东方科技集团股份有限公司;
  • 出版日期:2018-06-11
  • 出版单位:半导体光电
  • 年:2018
  • 期:v.39;No.197
  • 语种:中文;
  • 页:BDTG201803002
  • 页数:6
  • CN:03
  • ISSN:50-1092/TN
  • 分类号:11-15+20
摘要
从高像素填充因子、低噪声、高帧频、高空间分辨率及柔性五个方面对近些年X射线平板探测器背板工艺的研究进展进行了综述。通过对研究过程中的材料选择、像素结构和读出电路优化的详细阐述,分析了X射线平板探测器背板工艺的研究现状及改善方向。文章同时从新结构、新材料、电路设计及三维探测设计四个方面给出了X射线平板探测背板技术未来的发展趋势。
        The recent progresses of the backplane technology of X-ray flat panel detector are reviewed,and the reasearch status of such indexes as high pixel fill factor,low noise,high frame rate,high spatial resolution and flexibility are discussed from the aspects of material,pixel structure,readout circuit and so on.The future trends are also put forward for backplane technology of X-ray flat panel detectors.
引文
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