一种适于缝隙等表面缺陷类目标的评估方法
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  • 英文篇名:Assessment Method for Gaps and Other Surface Defects
  • 作者:赵京 ; 付鑫如 ; 杨涛 ; 高旭 ; 艾俊强
  • 英文作者:ZHAO Jingcheng;FU Xinru;YANG Tao;GAO Xu;AI Junqiang;School of Electronics and Information Engineering, Beihang University;Avic The First Aircraft Institute;
  • 关键词:雷达散射截面 ; 矢量对消 ; 电磁缺陷 ; 数值计算 ; 实验测量
  • 英文关键词:Radar Cross Section(RCS);;Vector cancellation;;Electromagnetic defect;;Numerical calculation;;Experimental measurement
  • 中文刊名:DZYX
  • 英文刊名:Journal of Electronics & Information Technology
  • 机构:北京航空航天大学电子信息工程学院;航空工业第一飞机设计研究院;
  • 出版日期:2018-11-19 16:16
  • 出版单位:电子与信息学报
  • 年:2019
  • 期:v.41
  • 语种:中文;
  • 页:DZYX201902007
  • 页数:7
  • CN:02
  • ISSN:11-4494/TN
  • 分类号:53-59
摘要
缝隙等表面缺陷类目标对飞行器的隐身性能具有重要影响。根据缝隙等表面缺陷类目标的散射机理,该文提出一种载体背景对消方法,用于评估表面缺陷类目标散射。该方法将载体作为目标背景的一部分,通过矢量场相减的方式对消掉载体的自身散射影响,特别是载体强散射角域的散射影响,从而获得了全角域范围内表面缺陷类目标的散射特性数据,解决了使用常规方法目标受载体影响无法获得完整散射特性的问题。通过数值计算和实验测量的结果对比表明:该方法可以对缺陷类目标的电磁散射特性进行有效评估。对消后载体散射得到了极大程度的降低,有效提高了缺陷类目标的计算或测量精度;同时由于排除载体自身散射的影响,避免了对载体尺寸、超低散射特性的要求,有效降低了载体的加工设计成本。
        Surface defects such as gaps have a significant impact on the stealth performance of the aircraft.According to the scattering mechanism of surface defects such as gaps, a method of evaluating the surface defect targets based on vector cancellation is proposed. The carrier is regarded as the target background and is subtracted the scattering effect of the carrier, especially the strong scattering angle of the carrier, and then the scattering characteristic data of the surface defect class target in the whole angle range are obtained, which solves the problem that the complete scattering characteristic can not be obtained using the conventional method. The comparison between the numerical calculation and the experimental results shows that the vector cancellation method can effectively evaluate the electromagnetic scattering characteristics of defective targets.After vector cancellation, the scattering of the carrier is greatly reduced, and the calculation or measurement accuracy of the defective target is effectively improved. At the same time, due to reducing the influence of the scattering of the carrier itself, this method avoids the requirement of the carrier size and ultra-low scattering characteristics, and reduces effectively the processing cost of the carrier.
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