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Elsevier电子期刊(8)

在“Elsevier电子期刊”中，命中：8条，耗时：小于0.01 秒

在所有数据库中总计命中：12条

1.Electrical properties of templateless electrodeposited ZnO nanowires

作者：Elena Matei¹ ; Andreea Costas¹ ; Camelia Florica ; Monica Enculescu ; Ioana Pintilie ; Lucian Pintilie ; Ionut Enculescu ; ^{encu@infim.ro" class="auth_mail" title="E-mail the corresponding author}

关键词：ZnO nanowires ; Electrodeposition ; ZnO transport ; ZnO ; Luminescence

刊名：Materials Science in Semiconductor Processing

出版年：2016

2.Simulation of the capacitance-voltage characteristic in the case of epitaxial ferroelectric films with Schottky contacts

作者：Lucian D. Filip ; ^{lucian.filip@infim.ro" class="auth_mail" title="E-mail the corresponding author} ; Lucian Pintilie ; Viorica Stancu ; Ioana Pintilie

关键词：Ferroelectrics ; Capacitance ; Hysteresis ; Interfaces

刊名：Thin Solid Films

出版年：2015

3.Radiation damage in n-type silicon diodes after electron irradiation with energies between 1.5 MeV and 15 MeV

作者：Roxana Radu ; Eckhart Fretwurst ; Robert Klanner ; Gunnar Lindstroem ; Ioana Pintilie

关键词：Silicon detector ; Electron irradiation ; Radiation damage ; TSC measurement ; DLTS measurement

刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

出版年：1 December, 2013

4.Study of high-dose X-ray radiation damage of silicon sensors

作者：Robert Klanner ; Eckhart Fretwurst ; Ioana Pintilie ; Joern Schwt ; Jiaguo Zhang

关键词：XFEL ; Silicon pixel sensor ; Plasma effect ; X-ray radiation damage ; Sensor optimization

刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

出版年：21 December, 2013

5.Challenges for silicon pixel sensors at the European XFEL

作者：Robert Klanner ; Julian Becker ; Eckhart Fretwurst ; Ioana Pintilie ; Thomas P枚hlsen ; Joern Schwt ; Jiaguo Zhang

关键词：XFEL ; Silicon-pixel sensor ; Plasma effect ; Charge losses ; X-ray-radiation damage ; Sensor optimization

刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

出版年：1 December, 2013

6.Annealing study of a bistable cluster defect

作者：Alex ; ra Junkes ; Doris Eckstein ; Ioana Pintilie ; Leonid F. Makarenko ; Eckhart Fretwurst

关键词：Silicon detector ; Radiation damage ; Cluster related defect ; Neutron irradiation ; Proton irradiation ; TSC ; DLTS

刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

出版年：2010

7.Radiation-induced point- and cluster-related defects with strong impact on damage properties of silicon detectors

作者：Ioana Pintilie ; Gunnar Lindstroem ; Alex ; ra Junkes ; Eckhart Fretwurst

关键词：Silicon detectors ; EPI ; FZ ; MCz ; Defect analysis ; TSC measurements ; N_eff predictions ; S-LHC tracker

刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

出版年：2009

8.Epitaxial silicon detectors for particle tracking—Radiation tolerance at extreme hadron fluences

作者：Gunnar Lindström ; Irena Dolenc ; Eckhart Fretwurst ; Frank Hö ; nniger ; Gregor Kramberger ; Michael Moll ; Elsbieta Nossarzewska ; Ioana Pintilie and Ralf Rö ; der

关键词：Tracking detectors ; Epitaxial silicon ; Neutron and proton damage ; Radiation tolerance for S-LHC ; Defect spectroscopy ; Shallow-donor creation ; Oxygen dimers ; Depletion voltage ; Annealing ; Charge collection efficiency ; Current-related damage rate

刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

出版年：2006

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2027年及以后(1)

2016年(1)

2015年(1)

2010年(1)

2009年(1)

2006年(1)

2000年及以前(2)

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